The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Patrick M. Lenahan sits on this spectrum.
This scientist: 342 publications — 69th percentile
69% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 1,163 publications or more.
The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Patrick M. Lenahan sits on this spectrum.
This scientist: 59 D-Index — 44th percentile
44% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 165 D-Index or more.
Patrick M. Lenahan is affiliated with Pennsylvania State University in the United States and is recognized primarily within the field of engineering, with a focus on electrical and electronic engineering. Their research spans several subfields including atomic and molecular physics, materials chemistry, biophysics, and radiology, nuclear medicine and imaging.
The scientist's work concentrates heavily on semiconductor materials and devices, documenting 36 publications in this area. Other main research topics include advancements in semiconductor devices and circuit design, quantum and electron transport phenomena, integrated circuits and semiconductor failure analysis, silicon and solar cell technologies, electron spin resonance studies, and ZnO doping and properties.
Frequent publication venues for Lenahan include:
Frequent co-authors working alongside Lenahan are:
Recent significant papers authored or co-authored by Lenahan include:
Lenahan has been recognized as an IEEE Fellow since 2010 for contributions to the understanding of radiation damage and reliability of metal-oxide semiconductor devices. This distinction reflects involvement in research relevant to semiconductor device reliability and radiation effects.
Patrick M. Lenahan;P. V. Dressendorfer
Patrick M. Lenahan;J. F. Conley
D. T. Krick;P. M. Lenahan;J. Kanicki
G. Bersuker;C. S. Park;J. Barnett;P. S. Lysaght
P. M. Lenahan;P. V. Dressendorfer
Yong Yun Kim;P. M. Lenahan
Z. E. Smith;S. Aljishi;D. Slobodin;V. Chu
William L. Warren;Patrick M. Lenahan;Sean E. Curry
P. M. Lenahan;P. V. Dressendorfer
A. Y. Kang;P. M. Lenahan;J. F. Conley
P. M. Lenahan;P. V. Dressendorfer
P. M. Lenahan;Sean E. Curry
J.P. Campbell;P.M. Lenahan;C.J. Cochrane;A.T. Krishnan
H. S. Witham;P. M. Lenahan
C. J. Cochrane;P. M. Lenahan;A. J. Lelis
D. T. Krick;P. M. Lenahan;J. Kanicki
C. Jeffrey Brinker;Keith D. Keefer;Patrick M. Lenahan
William L. Warren;Patrick M. Lenahan
J. F. Conley;P. M. Lenahan
J. P. Campbell;Patrick M. Lenahan
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