World's Best Scientists 2026 revealed!
Daniel M. Fleetwood

Daniel M. Fleetwood

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
95
Citations
28824
World Ranking
242
National Ranking
124

Materials Science

D-Index
96
Citations
29509
World Ranking
1292
National Ranking
413

Physics

D-Index
96
Citations
29802
World Ranking
1887
National Ranking
976

Daniel M. Fleetwood publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Daniel M. Fleetwood sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 730 publications — 95th percentile

95% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Daniel M. Fleetwood D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Daniel M. Fleetwood sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 95 D-Index — 97th percentile

97% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2019 - Fellow of the American Association for the Advancement of Science (AAAS)
  • 2001 - Fellow of American Physical Society (APS) Citation For important and broadbased contributions to the understanding of radiation effects and lowfrequency noise in microelectronic materials and devices
  • 1997 - IEEE Fellow For contributions to the field of electronic devices and materials.

Overview

Daniel M. Fleetwood is affiliated with Vanderbilt University in the United States. Their primary field of study is Engineering, with a focus on Electrical and Electronic Engineering. The research work encompasses a range of specialized subfields, including Condensed Matter Physics, Atomic and Molecular Physics and Optics, Electronic, Optical and Magnetic Materials, and Materials Chemistry.

The core topics covered in their research include Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design, Radiation Effects in Electronics, GaN-based semiconductor devices and materials, Integrated Circuits and Semiconductor Failure Analysis, Ga2O3 and related materials, and Radio Frequency Integrated Circuit Design.

Notable recent publications by Daniel M. Fleetwood include:

  • "Total-Ionizing-Dose Effects, Border Traps, and 1/f Noise in Emerging MOS Technologies" (2020) in IEEE Transactions on Nuclear Science
  • "Radiation Effects in a Post-Moore World" (2021) in IEEE Transactions on Nuclear Science
  • "Radiation Effects in AlGaN/GaN HEMTs" (2022) in IEEE Transactions on Nuclear Science

Frequently collaborating co-authors include Ronald D. Schrimpf, En Xia Zhang, Robert A. Reed, Sokrates T. Pantelides, and Michael L. Alles.

The most common publication venues for their work are:

  • IEEE Transactions on Nuclear Science
  • IEEE Transactions on Electron Devices
  • Applied Physics Letters
  • Journal of Applied Physics
  • IEEE Transactions on Device and Materials Reliability

Daniel M. Fleetwood has received several awards throughout their career, including being named a Fellow of the American Association for the Advancement of Science (AAAS) in 2019. They were also recognized as a Fellow of the American Physical Society (APS) in 2001 for contributions to the understanding of radiation effects and low-frequency noise in microelectronic materials and devices. Earlier, in 1997, they became an IEEE Fellow for contributions to the field of electronic devices and materials.

Best Publications

  • Radiation Effects in MOS Oxides

    J.R. Schwank;M.R. Shaneyfelt;D.M. Fleetwood;J.A. Felix

  • Effects of oxide traps, interface traps, and ‘‘border traps’’ on metal‐oxide‐semiconductor devices

    D. M. Fleetwood;P. S. Winokur;R. A. Reber;T. L. Meisenheimer

  • 'Border traps' in MOS devices

    D.M. Fleetwood

  • Total Ionizing Dose Effects in MOS and Low-Dose-Rate-Sensitive Linear-Bipolar Devices

    D. M. Fleetwood

  • Physical mechanisms contributing to enhanced bipolar gain degradation at low dose rates

    D.M. Fleetwood;S.L. Kosier;R.N. Nowlin;R.D. Schrimpf

  • Physical model for enhanced interface-trap formation at low dose rates

    S.N. Rashkeev;C.R. Cirba;D.M. Fleetwood;R.D. Schrimpf

  • An overview of high-temperature electronic device technologies and potential applications

    P.L. Dreike;D.M. Fleetwood;D.B. King;D.C. Sprauer

  • Using laboratory X-ray and cobalt-60 irradiations to predict CMOS device response in strategic and space environments

    D.M. Fleetwood;P.S. Winokur;J.R. Schwank

  • 1/f noise and radiation effects in MOS devices

    D.M. Fleetwood;T.L. Meisenheimer;J.H. Scofield

  • Charge yield for cobalt-60 and 10-keV X-ray irradiations of MOS devices

    M.R. Shaneyfelt;D.M. Fleetwood;J.R. Schwank;K.L. Hughes

  • Defect generation by hydrogen at the Si- SiO(2) interface.

    S. N. Rashkeev;D. M. Fleetwood;R. D. Schrimpf;S. T. Pantelides;S. T. Pantelides

  • Charge separation for bipolar transistors

    S.L. Kosier;R.D. Shrimpf;R.N. Nowlin;D.M. Fleetwood

  • Structure, properties, and dynamics of oxygen vacancies in amorphous SiO2.

    Zhong-Yi Lu;C. J. Nicklaw;D. M. Fleetwood;R. D. Schrimpf

  • Border traps: issues for MOS radiation response and long-term reliability

    D.M. Fleetwood;M.R. Shaneyfelt;W.L. Warren;J.R. Schwank

  • ELDRS in Bipolar Linear Circuits: A Review

    R.L. Pease;R.D. Schrimpf;D.M. Fleetwood

  • Unified model of hole trapping, 1/f noise, and thermally stimulated current in MOS devices

    D.M. Fleetwood;H.D. Xiong;Z.-Y. Lu;C.J. Nicklaw

  • Radiation effects at low electric fields in thermal, SIMOX, and bipolar-base oxides

    D.M. Fleetwood;L.C. Riewe;J.R. Schwank;S.C. Witczak

  • Non-volatile memory device based on mobile protons in SiO 2 thin films

    K. Vanheusden;W. L. Warren;R. A. B. Devine;D. M. Fleetwood

  • Evidence that similar point defects cause 1/f noise and radiation-induced-hole trapping in metal-oxide-semiconductor transistors.

    D. M. Fleetwood;John H. Scofield

  • Trends in the total-dose response of modern bipolar transistors

    S.L. Kosier;W.E. Combs;A. Wei;R.A. Schrimpf

Frequent Co-Authors

Ronald D. Schrimpf
Ronald D. Schrimpf Vanderbilt University
Sokrates T. Pantelides
Sokrates T. Pantelides Vanderbilt University
Robert A. Reed
Robert A. Reed Vanderbilt University
Marty R. Shaneyfelt
Marty R. Shaneyfelt Sandia National Laboratories
P.S. Winokur
P.S. Winokur Sandia National Laboratories
J.R. Schwank
J.R. Schwank Sandia National Laboratories
William L. Warren
William L. Warren Sanofi Pasteur
Robert A. Weller
Robert A. Weller Woods Hole Oceanographic Institution
R.L. Pease
R.L. Pease Independent Scientist / Consultant, US
Kenneth F. Galloway
Kenneth F. Galloway Vanderbilt University

If you think any of the details on this page are incorrect, let us know.

Report an issue

We appreciate your kind effort to assist us to improve this page, it would be helpful providing us with as much detail as possible in the text box below:

Related Online Degrees & Career Pathways

Pursuing a degree in Electronics and Electrical Engineering opens doors to various career opportunities. For students seeking flexibility, many online colleges that start immediately offer programs allowing quick enrollment and personalized pacing. This is especially helpful for those eager to jumpstart their education without waiting for traditional semester start dates.

In addition to degree programs, short certificate programs provide a fast-track option to gain practical skills. Some of the short certificate programs can be completed in six months or less and lead to well-paying roles in the industry. These credentials are perfect for those looking to enhance their resume or pivot careers efficiently.

Career pathways in this field often suit individuals who prefer focused, technical work environments. Many high-paying roles align well with the preferences of introverts, as highlighted in the list of high paying jobs for introverts, making Electronics and Electrical Engineering a promising choice for such candidates.

Furthermore, complementing your technical expertise with leadership skills can be a game-changer. Exploring the best online accelerated project management degree programs can equip you to manage engineering projects effectively and advance your career in niche areas of the industry.

Best Scientists Citing Daniel M. Fleetwood

Trending Scientists