World's Best Scientists 2026 revealed!
Alessandro Paccagnella

Alessandro Paccagnella

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
49
Citations
9454
World Ranking
2947
National Ranking
76

Alessandro Paccagnella publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Alessandro Paccagnella sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 529 publications — 86th percentile

86% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Alessandro Paccagnella D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Alessandro Paccagnella sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 49 D-Index — 58th percentile

58% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Alessandro Paccagnella is affiliated with the University of Padua in Italy and specializes in the field of Engineering. Their research primarily focuses on Electrical and Electronic Engineering, with significant contributions in Biomedical Engineering, Molecular Biology, Nuclear and High Energy Physics, and Astronomy and Astrophysics.

Their work covers a variety of topics, notably Radiation Effects in Electronics, Semiconductor materials and devices, and Advancements in Semiconductor Devices and Circuit Design. Additional research areas include Advanced biosensing and bioanalysis techniques, Biosensors and Analytical Detection, Integrated Circuits and Semiconductor Failure Analysis, and Advanced Sensor and Energy Harvesting Materials.

Among recent publications, some key papers include:

  • Fermi Large Area Telescope Performance after 10 Years of Operation, 2021, The Astrophysical Journal Supplement Series
  • Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh Doses, 2020, IEEE Transactions on Nuclear Science
  • A plug, print & play inkjet printing and impedance-based biosensing technology operating through a smartphone for clinical diagnostics, 2021, Biosensors and Bioelectronics
  • TID Degradation Mechanisms in 16-nm Bulk FinFETs Irradiated to Ultrahigh Doses, 2021, IEEE Transactions on Nuclear Science
  • Thermal Neutron-Induced SEUs in the LHC Accelerator Environment, 2020, IEEE Transactions on Nuclear Science

Frequent coauthors in their work include:

  • Stefano Bonaldo
  • Simone Gerardin
  • Marta Bagatin
  • S. Mattiazzo
  • Lara Franchin

The primary venues for Alessandro Paccagnella's publications are:

  • IEEE Transactions on Nuclear Science
  • IEEE Sensors Journal
  • Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
  • Biosensors and Bioelectronics
  • Electronics

Best Publications

  • Layout techniques to enhance the radiation tolerance of standard CMOS technologies demonstrated on a pixel detector readout chip

    W. Snoeys;F. Faccio;M. Burns;M. Campbell

  • SVX', the new CDF silicon vertex detector

    P. Azzi;N. Bacchetta;B.A. Barnett;M. Bailey

  • Radiation-Induced Short Channel (RISCE) and Narrow Channel (RINCE) Effects in 65 and 130 nm MOSFETs

    F. Faccio;S. Michelis;D. Cornale;A. Paccagnella

  • Present and Future Non-Volatile Memories for Space

    Simone Gerardin;Alessandro Paccagnella

  • Ionizing radiation induced leakage current on ultra-thin gate oxides

    A. Scarpa;A. Paccagnella;F. Montera;G. Ghibaudo

  • Radiation induced leakage current and stress induced leakage current in ultra-thin gate oxides

    M. Ceschia;A. Paccagnella;A. Cester;A. Scarpa

  • Errata to “Identification and Classification of Single-Event Upsets in the Configuration Memory of SRAM-Based FPGAs”

    M. Ceschia;M. Violante;M. SonzaReorda;A. Paccagnella

  • Radiation Effects in Flash Memories

    S. Gerardin;M. Bagatin;A. Paccagnella;K. Grurmann

  • Aspect ratio calculation in n-channel MOSFETs with a gate-enclosed layout

    A Giraldo;A Paccagnella;A Minzoni

  • Evaluating the effects of SEUs affecting the configuration memory of an SRAM-based FPGA

    M. Bellato;P. Bernardi;D. Bortolato;A. Candelori

  • Radiation effects on floating-gate memory cells

    G. Cellere;P. Pellati;A. Chimenton;J. Wyss

  • Influence of LDD Spacers and H + Transport on the Total-Ionizing-Dose Response of 65-nm MOSFETs Irradiated to Ultrahigh Doses

    Federico Faccio;Giulio Borghello;Edoardo Lerario;Daniel M. Fleetwood

  • A New Hardware/Software Platform and a New 1/E Neutron Source for Soft Error Studies: Testing FPGAs at the ISIS Facility

    M. Violante;L. Sterpone;A. Manuzzato;S. Gerardin

  • Low field leakage current and soft breakdown in ultra-thin gate oxides after heavy ions, electrons or X-ray irradiation

    M. Ceschia;A. Paccagnella;S. Sandrin;G. Ghidini

  • Impact ionization and light emission in AlGaAs/GaAs HEMT's

    E. Zanoni;M. Manfredi;S. Bigliardi;A. Paccagnella

  • Transient conductive path induced by a Single ion in 10 nm SiO/sub 2/ Layers

    G. Cellere;A. Paccagnella;A. Visconti;M. Bonanomi

  • A model for TID effects on floating Gate Memory cells

    G. Cellere;A. Paccagnella;A. Visconti;M. Bonanomi

  • Heavy ion irradiation of thin gate oxides

    M. Ceschia;A. Paccagnella;M. Turrini;A. Candelori

  • Properties of SiO2/Si/GaAs structures formed by solid phase epitaxy of amorphous Si on GaAs

    A. Callegari;D. K. Sadana;D. A. Buchanan;A. Paccagnella

  • A model of radiation induced leakage current (RILC) in ultra-thin gate oxides

    L. Larcher;A. Paccagnella;M. Ceschia;G. Ghidini

  • Anomalous charge loss from floating-gate memory cells due to heavy ions irradiation

    G. Cellere;A. Paccagnella;L. Larcher;A. Chimenton

Frequent Co-Authors

Claudio Canali
Claudio Canali University of Modena and Reggio Emilia
Gaudenzio Meneghesso
Gaudenzio Meneghesso University of Padua
Enrico Zanoni
Enrico Zanoni University of Padua
Luca Larcher
Luca Larcher University of Modena and Reggio Emilia
Massimo Violante
Massimo Violante Polytechnic University of Turin

If you think any of the details on this page are incorrect, let us know.

Report an issue

We appreciate your kind effort to assist us to improve this page, it would be helpful providing us with as much detail as possible in the text box below:

Related Online Degrees & Career Pathways

For those interested in Electronics and Electrical Engineering, exploring related online degrees and career pathways can broaden opportunities. Many universities now offer flexible online programs with weekly start dates, making it easier for students to begin their studies without waiting for traditional semester schedules. Programs highlighted in best online colleges with weekly start dates offer this convenience, allowing learners to balance education alongside other commitments.

In addition to full degree programs, short-term options like short term certificate programs can provide practical skills and credentials in as little as six months. These certificates can boost employability by focusing on specialized areas within electrical engineering and electronics.

For individuals who prefer roles that suit introverted work styles, certain career paths within this field can be both rewarding and financially promising. The article on high paying careers for introverts offers insight into such opportunities, highlighting positions where deep focus and analytical skills are valued.

Moreover, combining engineering expertise with leadership skills can accelerate career growth. Online options like the fast track project management degree online enable professionals to acquire project management credentials quickly, preparing them for supervisory roles in engineering projects and beyond.

Best Scientists Citing Alessandro Paccagnella

Trending Scientists

Recently Published Articles