World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
54
Citations
10885
World Ranking
2293
National Ranking
55

Luca Larcher publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Luca Larcher sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 316 publications — 61st percentile

61% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Luca Larcher D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Luca Larcher sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 54 D-Index — 68th percentile

68% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Luca Larcher is affiliated with the University of Modena and Reggio Emilia in Italy and has contributed extensively to the field of engineering, with a particular focus on electrical and electronic engineering. Their body of work encompasses topics such as semiconductor materials and devices, advanced memory and neural computing, and ferroelectric and negative capacitance devices.

Their research interests also cover advancements in semiconductor devices and circuit design, phase-change materials and chalcogenides, quantum and electron transport phenomena, and integrated circuits and semiconductor failure analysis.

Among the frequent coauthors collaborating with Luca Larcher are Andrea Padovani, Paolo La Torraca, Jack Strand, Alexander L. Shluger, and Milan Pešić.

Larcher has published in multiple venues with repeated contributions to the following:

  • IEEE Transactions on Electron Devices
  • IEEE Electron Device Letters
  • Journal of Applied Physics
  • Nature Reviews Materials
  • 2022 IEEE International Reliability Physics Symposium (IRPS)

Recent research articles include the following publications:

  • "Standards for the Characterization of Endurance in Resistive Switching Devices," 2021, ACS Nano
  • "Dielectric breakdown in HfO2 dielectrics: Using multiscale modeling to identify the critical physical processes involved in oxide degradation," 2022, Journal of Applied Physics
  • "Effect of electric field on defect generation and migration in HfO2," 2020, Physical Review B
  • "Electron trapping in ferroelectric HfO2," 2021, Physical Review Materials
  • "Dielectric breakdown of oxide films in electronic devices," 2024, Nature Reviews Materials

Best Publications

  • Physical Mechanisms behind the Field-Cycling Behavior of HfO2-Based Ferroelectric Capacitors

    Milan Pešić;Franz Paul Gustav Fengler;Luca Larcher;Andrea Padovani

  • Recommended Methods to Study Resistive Switching Devices

    Mario Lanza;H.-S. Philip Wong;Eric Pop;Daniele Ielmini

  • Metal oxide resistive memory switching mechanism based on conductive filament properties

    G. Bersuker;D. C. Gilmer;D. Veksler;P. Kirsch

  • Modeling and Optimization of a Solar Energy Harvester System for Self-Powered Wireless Sensor Networks

    D. Dondi;A. Bertacchini;D. Brunelli;L. Larcher

  • A Physical Model of the Temperature Dependence of the Current Through $\hbox{SiO}_{2}\hbox{/}\hbox{HfO}_{2}$ Stacks

    L. Vandelli;A. Padovani;L. Larcher;R. G. Southwick

  • Coexistence of Grain-Boundaries-Assisted Bipolar and Threshold Resistive Switching in Multilayer Hexagonal Boron Nitride

    Chengbin Pan;Yanfeng Ji;Na Xiao;Fei Hui

  • Standards for the Characterization of Endurance in Resistive Switching Devices.

    Mario Lanza;Rainer Waser;Rainer Waser;Daniele Ielmini;J. Joshua Yang

  • Analysis of reliability and power efficiency in cascode class-E PAs

    A. Mazzanti;L. Larcher;R. Brama;F. Svelto

  • Microscopic Modeling of HfO x RRAM Operations: From Forming to Switching

    Andrea Padovani;Luca Larcher;Onofrio Pirrotta;Luca Vandelli

  • Grain boundary-driven leakage path formation in HfO2 dielectrics

    G. Bersuker;J. Yum;L. Vandelli;A. Padovani

  • Metal oxide RRAM switching mechanism based on conductive filament microscopic properties

    G. Bersuker;D. C. Gilmer;D. Veksler;J. Yum

  • Impact of programming charge distribution on threshold voltage and subthreshold slope of NROM memory cells

    L. Larcher;G. Verzellesi;P. Pavan;E. Lusky

  • Statistical simulation of leakage currents in MOS and flash memory devices with a new multiphonon trap-assisted tunneling model

    L. Larcher

  • A Complete Statistical Investigation of RTN in HfO 2 -Based RRAM in High Resistive State

    Francesco Maria Puglisi;Luca Larcher;Andrea Padovani;Paolo Pavan

  • A solar energy harvesting circuit for low power applications

    D. Dondi;A. Bertacchini;L. Larcher;P. Pavan

  • A microscopic mechanism of dielectric breakdown in SiO2 films: An insight from multi-scale modeling

    A. Padovani;D. Z. Gao;A. L. Shluger;A. L. Shluger;L. Larcher

  • Boron nitride as two dimensional dielectric: Reliability and dielectric breakdown

    Yanfeng Ji;Chengbin Pan;Meiyun Zhang;Shibing Long

  • Radiation effects on floating-gate memory cells

    G. Cellere;P. Pellati;A. Chimenton;J. Wyss

  • Carbon-doped GeTe: A promising material for Phase-Change Memories

    G. Betti Beneventi;L. Perniola;V. Sousa;E. Gourvest;E. Gourvest

  • Experimental and theoretical study of electrode effects in HfO 2 based RRAM

    C. Cagli;J. Buckley;V. Jousseaume;T. Cabout

Frequent Co-Authors

Paolo Pavan
Paolo Pavan University of Modena and Reggio Emilia
Gennadi Bersuker
Gennadi Bersuker The Aerospace Corporation
Alessandro Paccagnella
Alessandro Paccagnella University of Padua
Paolo Lugli
Paolo Lugli Free University of Bozen-Bolzano
Paul Kirsch
Paul Kirsch Samsung Austin Semiconductor
Alexander L. Shluger
Alexander L. Shluger University College London
Mario Lanza
Mario Lanza National University of Singapore
Francesco Svelto
Francesco Svelto University of Pavia
B. De Salvo
B. De Salvo Meta for Business
Andrea Mazzanti
Andrea Mazzanti University of Pavia

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