World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
62
Citations
12364
World Ranking
1480
National Ranking
611

Robert A. Reed publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Robert A. Reed sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 436 publications — 78th percentile

78% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Robert A. Reed D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Robert A. Reed sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 62 D-Index — 80th percentile

80% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Robert A. Reed is affiliated with Vanderbilt University in the United States. Their research primarily falls within the field of Engineering, with a significant focus on Electrical and Electronic Engineering. The subfields also include Materials Chemistry, Plant Science, Electronic, Optical and Magnetic Materials, and Condensed Matter Physics.

The scientist's research topics cover multiple aspects of semiconductor and radiation effects, specifically:

  • Radiation Effects in Electronics
  • Semiconductor materials and devices
  • Integrated Circuits and Semiconductor Failure Analysis
  • Advancements in Semiconductor Devices and Circuit Design
  • Silicon Carbide Semiconductor Technologies
  • Electrostatic Discharge in Electronics
  • Ga2O3 and related materials

Robert A. Reed has published extensively in the venue IEEE Transactions on Nuclear Science, which accounts for the majority of their publications, along with several papers in arXiv (Cornell University), IEEE Transactions on Electron Devices, IEEE Transactions on Plasma Science, and Veterinary Anaesthesia and Analgesia.

Recent significant publications include:

  • "Effects of Breakdown Voltage on Single-Event Burnout Tolerance of High-Voltage SiC Power MOSFETs," 2021, IEEE Transactions on Nuclear Science
  • "Low-Energy Ion-Induced Single-Event Burnout in Gallium Oxide Schottky Diodes," 2023, IEEE Transactions on Nuclear Science
  • "Impact of Heavy-Ion Range on Single-Event Effects in Silicon Carbide Power Junction Barrier Schottky Diodes," 2023, IEEE Transactions on Nuclear Science
  • "LET and Voltage Dependence of Single-Event Burnout and Single-Event Leakage Current in High-Voltage SiC Power Devices," 2024, IEEE Transactions on Nuclear Science
  • "Inclusion of Radiation Environment Variability for Reliability Estimates for SiC Power MOSFETs," 2020, IEEE Transactions on Nuclear Science

Collaboration is a notable element in Robert A. Reed's research, with frequent co-authors including Ronald D. Schrimpf, En Xia Zhang, Daniel M. Fleetwood, Michael L. Alles, and Dennis R. Ball.

The focus of their work often revolves around the reliability and failure mechanisms of semiconductor devices, particularly in high-voltage power MOSFETs and Schottky diodes made from silicon carbide and gallium oxide materials. Their publications reflect in-depth studies on single-event burnout, leakage currents, and radiation environment variability in electronics.

Best Publications

  • Monte Carlo Simulation of Single Event Effects

    Robert A Weller;Marcus H Mendenhall;Robert A Reed;Ronald D Schrimpf

  • Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

    B.D. Sierawski;J.A. Pellish;R.A. Reed;R.D. Schrimpf

  • The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

    K.M. Warren;R.A. Weller;M.H. Mendenhall;R.A. Reed

  • Impact of Ion Energy and Species on Single Event Effects Analysis

    R.A. Reed;R.A. Weller;M.H. Mendenhall;J.-M. Lauenstein

  • Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

    P.E. Dodd;J.R. Schwank;M.R. Shaneyfelt;J.A. Felix

  • Radiation Effects in Advanced Multiple Gate and Silicon-on-Insulator Transistors

    E. Simoen;M. Gaillardin;P. Paillet;R. A. Reed

  • Heavy ion and proton-induced single event multiple upset

    R.A. Reed;M.A. Carts;P.W. Marshall;C.J. Marshall

  • Muon-Induced Single Event Upsets in Deep-Submicron Technology

    Brian D Sierawski;Marcus H Mendenhall;Robert A Reed;Michael A Clemens

  • Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process

    O.A. Amusan;L.W. Massengill;M.P. Baze;B.L. Bhuva

  • Multiple-Bit Upset in 130 nm CMOS Technology

    A.D. Tipton;J.A. Pellish;R.A. Reed;R.D. Schrimpf

  • Emerging radiation hardness assurance (RHA) issues: a NASA approach for space flight programs

    K.A. LaBel;A.H. Johnston;J.L. Barth;R.A. Reed

  • A Single-Event-Hardened Phase-Locked Loop Fabricated in 130 nm CMOS

    T.D. Loveless;L.W. Massengill;B.L. Bhuva;W.T. Holman

  • Effect of Well and Substrate Potential Modulation on Single Event Pulse Shape in Deep Submicron CMOS

    S. DasGupta;A.F. Witulski;B.L. Bhuva;M.L. Alles

  • The Effect of Layout Topology on Single-Event Transient Pulse Quenching in a 65 nm Bulk CMOS Process

    J R Ahlbin;M J Gadlage;D R Ball;A W Witulski

  • Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates

    P.W. Marshall;M.A. Carts;A. Campbell;D. McMorrow

  • Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

    D. R. Ball;J. M. Hutson;A. Javanainen;J.-M. Lauenstein

  • Scaling Trends in SET Pulse Widths in Sub-100 nm Bulk CMOS Processes

    M J Gadlage;J R Ahlbin;B Narasimham;B L Bhuva

  • Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)

    P. Marshall;M. Carts;S. Currie;R. Reed

  • Analysis of multiple bit upsets (MBU) in CMOS SRAM

    O. Musseau;F. Gardic;P. Roche;T. Corbiere

  • Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection

    J.D. Black;D.R. Ball;W.H. Robinson;D.M. Fleetwood

  • Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future

    R.A. Reed;J. Kinnison;J.C. Pickel;S. Buchner

Frequent Co-Authors

Ronald D. Schrimpf
Ronald D. Schrimpf Vanderbilt University
Robert A. Weller
Robert A. Weller Woods Hole Oceanographic Institution
Paul W. Marshall
Paul W. Marshall United States Naval Research Laboratory
Daniel M. Fleetwood
Daniel M. Fleetwood Vanderbilt University
John D. Cressler
John D. Cressler Georgia Institute of Technology
Lloyd W. Massengill
Lloyd W. Massengill Vanderbilt University
Guofu Niu
Guofu Niu Auburn University
Bharat L. Bhuva
Bharat L. Bhuva Vanderbilt University
Dale McMorrow
Dale McMorrow United States Naval Research Laboratory
M. L. Alles
M. L. Alles Vanderbilt University

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