Robert A. Reed mostly deals with Electronic engineering, Single event upset, CMOS, Static random-access memory and Upset. His Electronic engineering research incorporates elements of Space environment, Computational physics, Electronic circuit and Sensitivity. The Single event upset study combines topics in areas such as Nuclear physics, Ionization, Simulation and Order of magnitude.
His CMOS study is concerned with the field of Optoelectronics as a whole. His Optoelectronics study integrates concerns from other disciplines, such as Heterojunction bipolar transistor, Gallium nitride and MOSFET. His study in Static random-access memory is interdisciplinary in nature, drawing from both Node, Heavy ion, Irradiation and Muon.
His primary scientific interests are in Optoelectronics, Electronic engineering, Electrical engineering, CMOS and Transistor. His Optoelectronics study combines topics from a wide range of disciplines, such as Heterojunction bipolar transistor, Proton and Absorbed dose, Irradiation. His Proton research includes elements of Ionization and Heterojunction.
His study explores the link between Irradiation and topics such as Radiation that cross with problems in Detector. His work in the fields of Single event upset and Soft error overlaps with other areas such as Upset. His CMOS course of study focuses on Static random-access memory and Neutron.
Robert A. Reed mainly investigates Optoelectronics, Irradiation, Absorbed dose, Diode and Silicon. The concepts of his Optoelectronics study are interwoven with issues in Transistor, Silicon carbide and Logic gate. He focuses mostly in the field of Transistor, narrowing it down to matters related to CMOS and, in some cases, X-ray.
His research integrates issues of Wide-bandgap semiconductor, Radiation, Transconductance and Proton in his study of Irradiation. He has included themes like Ionization, Nand flash memory, Network layer and Static random-access memory in his Proton study. In his research on the topic of Noise, Electronic engineering, Redundancy and Spontaneous emission is strongly related with Silicon on insulator.
His primary areas of investigation include Optoelectronics, Irradiation, Diode, Indium gallium arsenide and Transistor. His study deals with a combination of Optoelectronics and Planar. The various areas that Robert A. Reed examines in his Irradiation study include Gallium nitride, Logic gate, Dielectric and Photoluminescence.
His Diode research incorporates themes from Computational physics, Silicon carbide, Photodiode and Deposition. His study on Subthreshold conduction and High-electron-mobility transistor is often connected to Coupling and Boltzmann equation as part of broader study in Transistor. The study incorporates disciplines such as Electronic engineering and Microelectromechanical systems in addition to Piezoresistive effect.
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Monte Carlo Simulation of Single Event Effects
Robert A Weller;Marcus H Mendenhall;Robert A Reed;Ronald D Schrimpf.
IEEE Transactions on Nuclear Science (2010)
Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions
B.D. Sierawski;J.A. Pellish;R.A. Reed;R.D. Schrimpf.
IEEE Transactions on Nuclear Science (2009)
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM
K.M. Warren;R.A. Weller;M.H. Mendenhall;R.A. Reed.
IEEE Transactions on Nuclear Science (2005)
Impact of Ion Energy and Species on Single Event Effects Analysis
R.A. Reed;R.A. Weller;M.H. Mendenhall;J.-M. Lauenstein.
IEEE Transactions on Nuclear Science (2007)
Heavy ion and proton-induced single event multiple upset
R.A. Reed;M.A. Carts;P.W. Marshall;C.J. Marshall.
IEEE Transactions on Nuclear Science (1997)
Multiple-Bit Upset in 130 nm CMOS Technology
A.D. Tipton;J.A. Pellish;R.A. Reed;R.D. Schrimpf.
IEEE Transactions on Nuclear Science (2006)
Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process
O.A. Amusan;L.W. Massengill;M.P. Baze;B.L. Bhuva.
IEEE Transactions on Device and Materials Reliability (2009)
Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits
P.E. Dodd;J.R. Schwank;M.R. Shaneyfelt;J.A. Felix.
IEEE Transactions on Nuclear Science (2007)
Muon-Induced Single Event Upsets in Deep-Submicron Technology
Brian D Sierawski;Marcus H Mendenhall;Robert A Reed;Michael A Clemens.
IEEE Transactions on Nuclear Science (2010)
Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates
P.W. Marshall;M.A. Carts;A. Campbell;D. McMorrow.
IEEE Transactions on Nuclear Science (2000)
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