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D-Index & Metrics

Electronics and Electrical Engineering

D-Index
44
Citations
7353
World Ranking
3754
National Ranking
1354

Overview

S. P. Buchner is affiliated with the United States Naval Research Laboratory in the United States. Their research primarily focuses on engineering, with specific contributions in the fields of electrical and electronic engineering as well as computational mechanics.

The scientist's work addresses several main topics, including:

  • Radiation Effects in Electronics
  • Integrated Circuits and Semiconductor Failure Analysis
  • Ion-surface interactions and analysis

S. P. Buchner has contributed to scholarly publications such as:

  • Simulation of Pulsed-Laser-Induced Testing in Microelectronic Devices, 2021, IEEE Transactions on Nuclear Science

Frequent coauthors collaborating with Buchner include:

  • Landen D. Ryder
  • Kaitlyn L. Ryder
  • Andrew L. Sternberg
  • John A. Kozub
  • Ani Khachatrian

The primary venue for publication has been the IEEE Transactions on Nuclear Science. Their research outputs have engaged with topics relevant to radiation effects and failure analysis in semiconductor devices, particularly using computational and experimental approaches.

Best Publications

  • Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies

    J.S. Melinger;S. Buchner;D. McMorrow;W.J. Stapor

  • Comparison of error rates in combinational and sequential logic

    S. Buchner;M. Baze;D. Brown;D. McMorrow

  • Subbandgap laser-induced single event effects: carrier generation via two-photon absorption

    D. McMorrow;W.T. Lotshaw;J.S. Melinger;S. Buchner

  • Application of a pulsed laser for evaluation and optimization of SEU-hard designs [CMOS]

    D. McMorrow;J.S. Melinger;S. Buchner;T. Scott

  • Pulsed-Laser Testing for Single-Event Effects Investigations

    S. P. Buchner;F. Miller;V. Pouget;D. P. McMorrow

  • A digital CMOS design technique for SEU hardening

    M.P. Baze;S.P. Buchner;D. McMorrow

  • Heavy ion and proton-induced single event multiple upset

    R.A. Reed;M.A. Carts;P.W. Marshall;C.J. Marshall

  • Three-dimensional mapping of single-event effects using two photon absorption

    D. McMorrow;W.T. Lotshaw;J.S. Melinger;S. Buchner

  • Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates

    P.W. Marshall;M.A. Carts;A. Campbell;D. McMorrow

  • Fault Simulation and Emulation Tools to Augment Radiation-Hardness Assurance Testing

    H. M. Quinn;D. A. Black;W. H. Robinson;S. P. Buchner

  • Laboratory tests for single-event effects

    S. Buchner;D. McMorrow;J. Melinger;A.B. Camdbell

  • Pulsed laser-induced single event upset and charge collection measurements as a function of optical penetration depth

    Joseph S. Melinger;Dale McMorrow;A. B. Campbell;Stephen Buchner

  • Analysis of multiple bit upsets (MBU) in CMOS SRAM

    O. Musseau;F. Gardic;P. Roche;T. Corbiere

  • Demonstration of single-event effects induced by through-wafer two-photon absorption

    D. McMorrow;S. Buchner;W.T. Lotshaw;J.S. Melinger

  • Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future

    R.A. Reed;J. Kinnison;J.C. Pickel;S. Buchner

  • Single-Event Transients in Bipolar Linear Integrated Circuits

    S. Buchner;D. McMorrow

  • The effects of radiation on MEMS accelerometers

    A.R. Knudson;S. Buchner;P. McDonald;W.J. Stapor

  • Evidence for angular effects in proton-induced single-event upsets

    R.A. Reed;P.W. Marshall;H.S. Kim;P.J. McNulty

  • Theoretical Investigation of an Equivalent Laser LET

    Vincent Pouget;Hervé Lapuyade;Pascal Fouillat;Dean Lewis

  • Single Event Upset cross sections at various data rates

    R.A. Reed;M.A. Carts;P.W. Marshall;C.J. Marshall

Frequent Co-Authors

Dale McMorrow
Dale McMorrow United States Naval Research Laboratory
Lloyd W. Massengill
Lloyd W. Massengill Vanderbilt University
Robert A. Reed
Robert A. Reed Vanderbilt University
R.L. Pease
R.L. Pease Independent Scientist / Consultant, US
Paul W. Marshall
Paul W. Marshall United States Naval Research Laboratory
Ronald D. Schrimpf
Ronald D. Schrimpf Vanderbilt University
John D. Cressler
John D. Cressler Georgia Institute of Technology
Paul E. Dodd
Paul E. Dodd Sandia National Laboratories
J.R. Schwank
J.R. Schwank Sandia National Laboratories
Bharat L. Bhuva
Bharat L. Bhuva Vanderbilt University

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