World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
44
Citations
7768
World Ranking
3739
National Ranking
1350

Paul W. Marshall publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Paul W. Marshall sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 259 publications — 47th percentile

47% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Paul W. Marshall D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Paul W. Marshall sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 44 D-Index — 47th percentile

47% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Paul W. Marshall is affiliated with the United States Naval Research Laboratory in the United States. Their research spans multiple areas within health professions and psychology, with a focus on mental health and patient involvement, digital mental health interventions, schizophrenia research and treatment, suicide and self-harm studies, social media in health education, health policy implementation science, and mental health treatment and access.

The main fields of study for Paul W. Marshall are Health Professions and Psychology. Within these, the subfields include General Health Professions, Psychiatry and Mental Health, Clinical Psychology, Applied Psychology, and Social Psychology.

Paul W. Marshall has published numerous papers in diverse academic journals. Recent publications include:

  • Understanding the Impacts of Online Mental Health Peer Support Forums: Realist Synthesis, 2024, JMIR Mental Health
  • Caring for a friend or family member who has experienced suicidal behaviour: A systematic review and qualitative synthesis, 2023, Psychology and Psychotherapy Theory Research and Practice
  • Improving Peer Online Forums (iPOF): protocol for a realist evaluation of peer online mental health forums to inform practice and policy, 2023, BMJ Open
  • The interplay between suicidal experiences, psychotic experiences and interpersonal relationships: a qualitative study, 2023, BMC Psychiatry
  • Personal recovery in bipolar disorder: Systematic review and "best fit" framework synthesis of qualitative evidence - a POETIC adaptation of CHIME, 2021, Journal of Affective Disorders

Paul W. Marshall frequently publishes in several venues, including:

  • JMIR Mental Health
  • BMJ Open
  • International Journal of Environmental Research and Public Health
  • bioRxiv (Cold Spring Harbor Laboratory)
  • Journal of Affective Disorders

Collaborations have been a consistent part of their work. Notable frequent coauthors include Fiona Lobban, Steven Jones, Zoe Glossop, Heather Robinson, and Karen Machin.

Best Publications

  • Review of displacement damage effects in silicon devices

    J.R. Srour;C.J. Marshall;P.W. Marshall

  • Correlation of Particle-Induced Displacement Damage in Silicon

    G. P. Summers;E. A. Burke;C. J. Dale;E. A. Wolicki

  • Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

    D.F. Heidel;P.W. Marshall;J.A. Pellish;K.P. Rodbell

  • Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

    D.F. Heidel;P.W. Marshall;K.A. LaBel;J.R. Schwank

  • Heavy ion and proton-induced single event multiple upset

    R.A. Reed;M.A. Carts;P.W. Marshall;C.J. Marshall

  • Multiple-Bit Upset in 130 nm CMOS Technology

    A.D. Tipton;J.A. Pellish;R.A. Reed;R.D. Schrimpf

  • Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates

    P.W. Marshall;M.A. Carts;A. Campbell;D. McMorrow

  • Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)

    P. Marshall;M. Carts;S. Currie;R. Reed

  • High energy electron induced displacement damage in silicon

    Unknown

  • A comparison of Monte Carlo and analytic treatments of displacement damage in Si microvolumes

    C.J. Dale;L. Chen;P.J. McNulty;P.W. Marshall

  • Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future

    R.A. Reed;J. Kinnison;J.C. Pickel;S. Buchner

  • Displacement damage in GaAs structures

    Unknown

  • Evidence for angular effects in proton-induced single-event upsets

    R.A. Reed;P.W. Marshall;H.S. Kim;P.J. McNulty

  • An investigation of the origins of the variable proton tolerance in multiple SiGe HBT BiCMOS technology generations

    J.D. Cressler;R. Krithivasan;Gang Zhang;Guofu Niu

  • The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate

    N. A. Dodds;M. J. Martinez;P. E. Dodd;M. R. Shaneyfelt

  • Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-/spl mu/m SiGe heterojunction bipolar transistors and circuits

    R.A. Reed;P.W. Marshall;J.C. Pickel;M.A. Carts

  • Displacement damage extremes in silicon depletion regions

    Unknown

  • Single Event Upset cross sections at various data rates

    R.A. Reed;M.A. Carts;P.W. Marshall;C.J. Marshall

  • Emerging optocoupler issues with energetic particle-induced transients and permanent radiation degradation

    R.A. Reed;P.W. Marshall;A.H. Johnston;J.L. Barth

  • Current single event effects and radiation damage results for candidate spacecraft electronics

    M.V. O'Bryan;K.A. LaBel;R.L. Ladbury;C. Poivey

  • An SEU hardening approach for high-speed SiGe HBT digital logic

    R. Krithivasan;G. Niu;J.D. Cressler;S.M. Currie

  • An Evaluation of Transistor-Layout RHBD Techniques for SEE Mitigation in SiGe HBTs

    A.K. Sutton;M. Bellini;J.D. Cressler;J.A. Pellish

  • Energy dependence of proton damage in AlGaAs light-emitting diodes

    R.A. Reed;P.W. Marshall;C.J. Marshall;R.L. Ladbury

Frequent Co-Authors

Robert A. Reed
Robert A. Reed Vanderbilt University
John D. Cressler
John D. Cressler Georgia Institute of Technology
Guofu Niu
Guofu Niu Auburn University
Ronald D. Schrimpf
Ronald D. Schrimpf Vanderbilt University
Paul E. Dodd
Paul E. Dodd Sandia National Laboratories
Robert A. Weller
Robert A. Weller Woods Hole Oceanographic Institution
Dale McMorrow
Dale McMorrow United States Naval Research Laboratory
Alvin J. Joseph
Alvin J. Joseph GlobalFoundries (United States)
Marty R. Shaneyfelt
Marty R. Shaneyfelt Sandia National Laboratories
S. P. Buchner
S. P. Buchner United States Naval Research Laboratory

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