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D-Index & Metrics

Discipline name D-Index World Ranking Current World Ranking National Ranking Current National Ranking Publications Citations
Electronics and Electrical Engineering 56 2032 1947 45 42 1386 15726

Eddy Simoen publications per year

The chart shows the history of publications by Eddy Simoen between 1982 and 2025, highlighting the no. of papers published in each year and offering an overview of the publication velocity of this scholar. Eddy Simoen published across 44 years, from 1982 to 2025, averaging 33 papers a year. Output peaked at 82 publications in 2011. 12 of the 1,454 publications appeared in the last two years.

No. of publications
20 40 60 80
Bar chart. Horizontal axis: year, 1982 to 2025. Vertical axis: number of publications, 0 to 82. Peak 82 publications in 2011. 1982: 2 publications 1983: 0 publications 1984: 0 publications 1985: 2 publications 1986: 2 publications 1987: 1 publication 1988: 3 publications 1989: 4 publications 1990: 6 publications 1991: 12 publications 1992: 17 publications 1993: 21 publications 1994: 20 publications 1995: 27 publications 1996: 22 publications 1997: 27 publications 1998: 24 publications 1999: 28 publications 2000: 23 publications 2001: 38 publications 2002: 36 publications 2003: 33 publications 2004: 30 publications 2005: 51 publications 2006: 65 publications 2007: 78 publications 2008: 60 publications 2009: 77 publications 2010: 50 publications 2011: 82 publications 2012: 76 publications 2013: 79 publications 2014: 65 publications 2015: 63 publications 2016: 71 publications 2017: 50 publications 2018: 42 publications 2019: 34 publications 2020: 43 publications 2021: 33 publications 2022: 19 publications 2023: 26 publications 2024: 4 publications 2025: 8 publications
1982 2025

1,454 publications in total across all disciplines

View publications per year as a table
Eddy Simoen: publications per year, 1982 to 2025
Year Publications
1982 2
1983 0
1984 0
1985 2
1986 2
1987 1
1988 3
1989 4
1990 6
1991 12
1992 17
1993 21
1994 20
1995 27
1996 22
1997 27
1998 24
1999 28
2000 23
2001 38
2002 36
2003 33
2004 30
2005 51
2006 65
2007 78
2008 60
2009 77
2010 50
2011 82
2012 76
2013 79
2014 65
2015 63
2016 71
2017 50
2018 42
2019 34
2020 43
2021 33
2022 19
2023 26
2024 4
2025 8
Total 1,454
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Eddy Simoen publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Eddy Simoen sits on this spectrum.

No. of scientists
100 200 300 400
Bar chart with 53 bars. Horizontal axis: publications, 34–53 to 1,065+. Vertical axis: number of scientists, 0 to 445. Most scientists, 445, have 174–193 publications. The last bar groups every scientist with 1,065 publications or more. The highlighted bar, 1,065+ publications, is where this scientist sits. 34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34–53 publications 1,065+

This scientist: 1,386 publications — 100th percentile

100% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

View publications distribution as a table
Number of Electronics and Electrical Engineering scientists by publication count, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
Publications Scientists This scientist
34–53 24
54–73 52
74–93 114
94–113 203
114–133 269
134–153 355
154–173 403
174–193 445
194–213 430
214–233 431
234–253 399
254–273 366
274–293 335
294–313 300
314–333 276
334–353 250
354–373 214
374–393 187
394–413 152
414–433 169
434–453 147
454–473 111
474–493 117
494–513 103
514–533 99
534–553 92
554–573 75
574–593 58
594–613 69
614–633 50
634–653 62
654–673 54
674–693 44
694–713 37
714–733 28
734–753 26
754–773 26
774–793 19
794–813 23
814–833 20
834–853 16
854–873 20
874–893 11
894–913 11
914–933 16
934–953 13
954–973 10
974–993 11
994–1,013 9
1,014–1,033 9
1,034–1,053 10
1,054–1,064 6
1,065+ 99 1,386
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Eddy Simoen D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Eddy Simoen sits on this spectrum.

No. of scientists
50 100 150 200 250
Bar chart with 82 bars. Horizontal axis: D-Index, 30 to 111+. Vertical axis: number of scientists, 0 to 263. Most scientists, 263, have 32 D-Index. The last bar groups every scientist with 111 D-Index or more. The highlighted bar, 56 D-Index, is where this scientist sits. 30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 56 D-Index — 71st percentile

71% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

View D-Index distribution as a table
Number of Electronics and Electrical Engineering scientists by D-index, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
D-Index Scientists This scientist
30 178
31 257
32 263
33 262
34 244
35 236
36 211
37 220
38 214
39 214
40 205
41 187
42 194
43 201
44 155
45 189
46 148
47 160
48 134
49 130
50 141
51 156
52 108
53 130
54 112
55 97
56 111 56
57 102
58 108
59 120
60 103
61 93
62 92
63 74
64 77
65 73
66 64
67 69
68 60
69 39
70 57
71 59
72 46
73 49
74 38
75 35
76 32
77 35
78 31
79 22
80 34
81 31
82 34
83 23
84 18
85 30
86 19
87 19
88 20
89 8
90 17
91 7
92 14
93 9
94 15
95 10
96 12
97 10
98 10
99 12
100 16
101 5
102 7
103 7
104 8
105 9
106 13
107 4
108 5
109 10
110 8
111+ 96
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Overview

Eddy Simoen is a researcher affiliated with Ghent University in Belgium, specializing in fields related to engineering, particularly electrical and electronic engineering. Their work spans various subfields including biomedical engineering, condensed matter physics, atomic and molecular physics, optics, and materials chemistry.

The researcher's focus covers numerous topics within semiconductor technology and device research. These topics include:

  • Semiconductor materials and devices
  • Advancements in semiconductor devices and circuit design
  • GaN-based semiconductor devices and materials
  • Nanowire synthesis and applications
  • Integrated circuits and semiconductor failure analysis
  • Silicon carbide semiconductor technologies
  • Ferroelectric and negative capacitance devices

Several recent papers illustrate the scope and depth of their research activity:

  • "Mitigating Dark Current for High-Performance Near-Infrared Organic Photodiodes via Charge Blocking and Defect Passivation", 2021, ACS Applied Materials & Interfaces
  • "Low-Frequency Noise Investigation of GaN/AlGaN Metal-Oxide-Semiconductor High-Electron-Mobility Field-Effect Transistor With Different Gate Length and Orientation", 2020, IEEE Transactions on Electron Devices
  • "Defect profiling in FEFET Si:HfO2 layers", 2020, Applied Physics Letters
  • "Analog Figures of Merit of Vertically Stacked Silicon Nanosheets nMOSFETs With Two Different Metal Gates for the Sub-7 nm Technology Node Operating at High Temperatures", 2021, IEEE Transactions on Electron Devices
  • "Low-Frequency Noise in Vertically Stacked Si n-Channel Nanosheet FETs", 2020, IEEE Electron Device Letters

Their frequent co-authors reflect a collaborative research approach. Notable co-authors include:

  • A. Veloso
  • Cor Claeys
  • João Antônio Martino
  • Paula Ghedini Der Agopian
  • B. Cretu

Publications by Eddy Simoen are often found in specialized academic venues related to electronics and semiconductor devices. These venues include:

  • Solid-State Electronics
  • Journal of Integrated Circuits and Systems
  • ECS Meeting Abstracts
  • IEEE Transactions on Electron Devices
  • ECS Transactions

Their research contributions are situated primarily within engineering, highlighting electrical and electronic engineering as the dominant field of study. Specific interest is seen in semiconductor materials and device performance, especially for advanced device technologies and circuit design.

Best Publications

  • On the flicker noise in submicron silicon MOSFETs

    Eddy Simoen;Cor Claeys

  • Origin of NBTI variability in deeply scaled pFETs

    B. Kaczer;T. Grasser;Ph. J. Roussel;J. Franco

  • Explaining the amplitude of RTS noise in submicrometer MOSFETs

    E. Simoen;B. Dierickx;C.L. Claeys;G.J. Declerck

  • Diffusion, activation and recrystallization of boron implanted in preamorphized and crystalline germanium

    A. Satta;E. Simoen;T. Clarysse;T. Janssens

  • "Linear kink effect" induced by electron valence band tunneling in ultrathin gate oxide bulk and SOI MOSFETS

    A. Mercha;J.M. Rafi;E. Simoen;E. Augendre

  • Ion-implantation issues in the formation of shallow junctions in germanium

    Eddy Simoen;Alessandra Satta;Antonio D'Amore;Tom Janssens

  • $1/f$ Noise in Drain and Gate Current of MOSFETs With High- $k$ Gate Stacks

    P. Magnone;F. Crupi;G. Giusi;C. Pace

  • Radiation Effects in Advanced Multiple Gate and Silicon-on-Insulator Transistors

    E. Simoen;M. Gaillardin;P. Paillet;R. A. Reed

  • Low-frequency noise behavior of SiO/sub 2/--HfO/sub 2/ dual-layer gate dielectric nMOSFETs with different interfacial oxide thickness

    E. Simoen;A. Mercha;L. Pantisano;C. Claeys

  • NBTI from the perspective of defect states with widely distributed time scales

    B. Kaczer;T. Grasser;J. Martin-Martinez;E. Simoen

  • Diffusion, activation, and regrowth behavior of high dose P implants in Ge

    Alessandra Satta;Eddy Simoen;Ray Duffy;Tom Janssens

  • Impact strain engineering on gate stack quality and reliability

    Corneel Claeys;Eddy Simoen;Sofie Put;G. Giusi

  • Low-Frequency Noise Analysis and Modeling in Vertical Tunnel FETs With Ge Source

    Felipe S. Neves;Paula G. D. Agopian;Joao Antonio Martino;Bogdan Cretu

  • Model for hysteresis and kink behavior of MOS transistors operating at 4.2 K

    B. Dierickx;L. Warmerdam;E.R. Simoen;J. Vermeiren

  • Shallow Junction Ion Implantation in Ge and Associated Defect Control

    A. Satta;E. Simoen;T. Janssens;T. Clarysse

  • Impact of Donor Concentration, Electric Field, and Temperature Effects on the Leakage Current in Germanium p $+/$ n Junctions

    G. Eneman;M. Wiot;A. Brugere;O.S.I. Casain

  • Challenges and opportunities in advanced Ge pMOSFETs

    E Simoen;J Mitard;Geert Hellings;Geert Eneman

  • Impact of Fe and Cu Contamination on the Minority Carrier Lifetime of Silicon Substrates

    A. L. P. Rotondaro;T. Q. Hurd;A. Kaniava;J. Vanhellemont

  • Border Traps in Ge/III–V Channel Devices: Analysis and Reliability Aspects

    Eddy Simoen;Dennis Han-Chung Lin;A. Alian;G. Brammertz

  • Random Telegraph Signal: a local probe for single point defect studies in solid-state devices

    E. Simoen;C. Claeys

  • The kink-related excess low-frequency noise in silicon-on-insulator MOST's

    E. Simoen;U. Magnusson;A.L.P. Rotondaro

  • The low-frequency noise behaviour of silicon-on-insulator technologies

    Eddy Simoen;Cor Claeys

  • Experimental Comparison Between Trigate p-TFET and p-FinFET Analog Performance as a Function of Temperature

    Paula Ghedini Der Agopian;Joao Antonio Martino;Rita Rooyackers;Anne Vandooren

  • Brother Silicon, Sister Germanium

    Unknown

Frequent Co-Authors

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