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Felice Crupi

D-Index & Metrics

Discipline name D-Index World Ranking Current World Ranking National Ranking Current National Ranking Publications Citations
Electronics and Electrical Engineering 36 5376 5162 223 221 287 4985

Felice Crupi publications per year

The chart shows the history of publications by Felice Crupi between 1998 and 2025, highlighting the no. of papers published in each year and offering an overview of the publication velocity of this scholar. Felice Crupi published across 28 years, from 1998 to 2025, averaging 11.1 papers a year. Output peaked at 35 publications in 2017. 10 of the 312 publications appeared in the last two years.

No. of publications
10 20 30
Bar chart. Horizontal axis: year, 1998 to 2025. Vertical axis: number of publications, 0 to 35. Peak 35 publications in 2017. 1998: 6 publications 1999: 9 publications 2000: 5 publications 2001: 6 publications 2002: 8 publications 2003: 5 publications 2004: 7 publications 2005: 7 publications 2006: 13 publications 2007: 15 publications 2008: 13 publications 2009: 11 publications 2010: 15 publications 2011: 9 publications 2012: 12 publications 2013: 9 publications 2014: 11 publications 2015: 12 publications 2016: 20 publications 2017: 35 publications 2018: 16 publications 2019: 22 publications 2020: 7 publications 2021: 13 publications 2022: 10 publications 2023: 6 publications 2024: 6 publications 2025: 4 publications
1998 2025

312 publications in total across all disciplines

View publications per year as a table
Felice Crupi: publications per year, 1998 to 2025
Year Publications
1998 6
1999 9
2000 5
2001 6
2002 8
2003 5
2004 7
2005 7
2006 13
2007 15
2008 13
2009 11
2010 15
2011 9
2012 12
2013 9
2014 11
2015 12
2016 20
2017 35
2018 16
2019 22
2020 7
2021 13
2022 10
2023 6
2024 6
2025 4
Total 312
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Felice Crupi publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Felice Crupi sits on this spectrum.

No. of scientists
100 200 300 400
Bar chart with 53 bars. Horizontal axis: publications, 34–53 to 1,065+. Vertical axis: number of scientists, 0 to 445. Most scientists, 445, have 174–193 publications. The last bar groups every scientist with 1,065 publications or more. The highlighted bar, 274–293 publications, is where this scientist sits. 34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34–53 publications 1,065+

This scientist: 287 publications — 54th percentile

54% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

View publications distribution as a table
Number of Electronics and Electrical Engineering scientists by publication count, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
Publications Scientists This scientist
34–53 24
54–73 52
74–93 114
94–113 203
114–133 269
134–153 355
154–173 403
174–193 445
194–213 430
214–233 431
234–253 399
254–273 366
274–293 335 287
294–313 300
314–333 276
334–353 250
354–373 214
374–393 187
394–413 152
414–433 169
434–453 147
454–473 111
474–493 117
494–513 103
514–533 99
534–553 92
554–573 75
574–593 58
594–613 69
614–633 50
634–653 62
654–673 54
674–693 44
694–713 37
714–733 28
734–753 26
754–773 26
774–793 19
794–813 23
814–833 20
834–853 16
854–873 20
874–893 11
894–913 11
914–933 16
934–953 13
954–973 10
974–993 11
994–1,013 9
1,014–1,033 9
1,034–1,053 10
1,054–1,064 6
1,065+ 99
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Felice Crupi D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Felice Crupi sits on this spectrum.

No. of scientists
50 100 150 200 250
Bar chart with 82 bars. Horizontal axis: D-Index, 30 to 111+. Vertical axis: number of scientists, 0 to 263. Most scientists, 263, have 32 D-Index. The last bar groups every scientist with 111 D-Index or more. The highlighted bar, 36 D-Index, is where this scientist sits. 30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 36 D-Index — 24th percentile

24% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

View D-Index distribution as a table
Number of Electronics and Electrical Engineering scientists by D-index, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
D-Index Scientists This scientist
30 178
31 257
32 263
33 262
34 244
35 236
36 211 36
37 220
38 214
39 214
40 205
41 187
42 194
43 201
44 155
45 189
46 148
47 160
48 134
49 130
50 141
51 156
52 108
53 130
54 112
55 97
56 111
57 102
58 108
59 120
60 103
61 93
62 92
63 74
64 77
65 73
66 64
67 69
68 60
69 39
70 57
71 59
72 46
73 49
74 38
75 35
76 32
77 35
78 31
79 22
80 34
81 31
82 34
83 23
84 18
85 30
86 19
87 19
88 20
89 8
90 17
91 7
92 14
93 9
94 15
95 10
96 12
97 10
98 10
99 12
100 16
101 5
102 7
103 7
104 8
105 9
106 13
107 4
108 5
109 10
110 8
111+ 96
Download as CSV

Overview

Felice Crupi is affiliated with the University of Calabria in Italy and has a focus on engineering, particularly within electrical and electronic engineering. Their research spans multiple subfields, including hardware and architecture, biomedical engineering, atomic and molecular physics, optics, and surgery.

The main topics of Crupi's work include:

  • Advanced Memory and Neural Computing
  • Ferroelectric and Negative Capacitance Devices
  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Semiconductor materials and devices
  • Advancements in Semiconductor Devices and Circuit Design
  • Magnetic properties of thin films
  • Integrated Circuits and Semiconductor Failure Analysis

Frequent coauthors collaborating with Crupi are:

  • Raffaele De Rose
  • Marco Lanuzza
  • Massimo Vatalaro
  • Esteban Garzón
  • Lionel Trojman

Research findings by Crupi have been published in a variety of venues, with the most frequent being:

  • Solid-State Electronics
  • IEEE Transactions on Circuits & Systems II Express Briefs
  • Università della Calabria
  • IEEE Journal of Solid-State Circuits
  • IEEE Journal of Electromagnetics RF and Microwaves in Medicine and Biology

Some recent papers authored or co-authored by Crupi include:

  • "Trimming-Less Voltage Reference for Highly Uncertain Harvesting Down to 0.25 V, 5.4 pW," 2021, published in IEEE Journal of Solid-State Circuits
  • "A Robust, High-Speed and Energy-Efficient Ultralow-Voltage Level Shifter," 2020, published in IEEE Transactions on Circuits & Systems II Express Briefs
  • "Exploiting STT-MRAMs for Cryogenic Non-Volatile Cache Applications," 2021, published in IEEE Transactions on Nanotechnology
  • "A 0.05 mm², 350 mV, 14 nW Fully-Integrated Temperature Sensor in 180-nm CMOS," 2021, published in IEEE Transactions on Circuits & Systems II Express Briefs
  • "Assessment of STT-MRAMs based on double-barrier MTJs for cache applications by means of a device-to-system level simulation framework," 2020, published in Integration

Best Publications

  • A 2.6 nW, 0.45 V Temperature-Compensated Subthreshold CMOS Voltage Reference

    L Magnelli;F Crupi;P Corsonello;C Pace

  • $1/f$ Noise in Drain and Gate Current of MOSFETs With High- $k$ Gate Stacks

    P. Magnone;F. Crupi;G. Giusi;C. Pace

  • On the properties of the gate and substrate current after soft breakdown in ultrathin oxide layers

    F. Crupi;R. Degraeve;G. Groeseneken;T. Nigam

  • Design of a 75-nW, 0.5-V subthreshold complementary metal-oxide-semiconductor operational amplifier

    Luca Magnelli;Francesco A. Amoroso;Felice Crupi;Gregorio Cappuccino

  • Impact strain engineering on gate stack quality and reliability

    Corneel Claeys;Eddy Simoen;Sofie Put;G. Giusi

  • An Ultralow-Voltage Energy-Efficient Level Shifter

    Marco Lanuzza;Felice Crupi;Sandro Rao;Raffaele De Rose

  • Correlation between Stress-Induced Leakage Current (SILC) and the HfO/sub 2/ bulk trap density in a SiO/sub 2//HfO/sub 2/ stack

    F. Crupi;R. Degraeve;A. Kerber;D.H. Kwak

  • Degradation and hard breakdown transient of thin gate oxides in metal–SiO2–Si capacitors: Dependence on oxide thickness

    S. Lombardo;A. La Magna;C. Spinella;C. Gerardi

  • A Sub- ${oldsymbol kT}/oldsymbol q$ Voltage Reference Operating at 150 mV

    Domenico Albano;Felice Crupi;Francesca Cucchi;Giuseppe Iannaccone

  • Impact of TFET Unidirectionality and Ambipolarity on the Performance of 6T SRAM Cells

    Sebastiano Strangio;Pierpaolo Palestri;David Esseni;Luca Selmi

  • Mixed Tunnel-FET/MOSFET Level Shifters: A New Proposal to Extend the Tunnel-FET Application Domain

    Marco Lanuzza;Sebastiano Strangio;Felice Crupi;Pierpaolo Palestri

  • Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies

    P. Magnone;F. Crupi;N. Wils;R. Jain

  • Digital and analog TFET circuits: Design and benchmark

    Sebastiano Strangio;Sebastiano Strangio;Francesco Settino;Francesco Settino;P. Palestri;M. Lanuzza

  • Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics

    Gino Giusi;F. Crupi;C. Pace;C. Ciofi

  • Impact of the interfacial layer on the low-frequency noise (1/f) behavior of MOSFETs with advanced gate stacks

    F. Crupi;P. Srinivasan;P. Magnone;E. Simoen

  • Electrical and thermal transient during dielectric breakdown of thin oxides in metal-SiO2-silicon capacitors

    S. Lombardo;F. Crupi;A. La Magna;C. Spinella

  • Understanding the Potential and Limitations of Tunnel FETs for Low-Voltage Analog/Mixed-Signal Circuits

    Francesco Settino;Marco Lanuzza;Sebastiano Strangio;Felice Crupi

  • Positive Bias Temperature Instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics

    F. Crupi;C. Pace;G. Cocorullo;G. Groeseneken

  • Structural and electrical analysis of the atomic layer deposition of HfO2/n-In0.53Ga0.47As capacitors with and without an Al2O3 interface control layer

    Aileen O'Mahony;Scott Monaghan;G. Provenzano;Ian M. Povey

  • Observation of hot-carrier-induced nFET gate-oxide breakdown in dynamically stressed CMOS circuits

    B. Kaczer;F. Crupi;R. Degraeve;Ph. Roussel

  • On the Temperature and Field Dependence of Trap-Assisted Tunneling Current in Ge $\hbox{p}^{+}\hbox{n}$ Junctions

    E. Simoen;F. De Stefano;G. Eneman;B. De Jaeger

Frequent Co-Authors

Guido Groeseneken
Guido Groeseneken Imec
Giuseppe Iannaccone
Giuseppe Iannaccone University of Pisa
Eddy Simoen
Eddy Simoen Ghent University
Massimo Alioto
Massimo Alioto National University of Singapore
Jacopo Franco
Jacopo Franco Imec
Jerome Mitard
Jerome Mitard Imec
Pierpaolo Palestri
Pierpaolo Palestri University of Udine
Cor Claeys
Cor Claeys KU Leuven
Ben Kaczer
Ben Kaczer Imec
David Esseni
David Esseni University of Udine

External Links

Personal website of Felice Crupi

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Related Online Degrees & Career Pathways

For those studying Electronics and Electrical Engineering in the USA, pursuing related online degrees can open up diverse career options. Many professionals complement their technical skills with certifications; for instance, short certificate programs that pay well offer a quick way to boost employability and income without extensive time investment.

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To enhance leadership and management capabilities, many choose to enroll in an accelerated online project management degree. This approach is ideal for those aiming to quickly gain skills to oversee complex technical projects while balancing work and study.

Alternatively, earning a project manager bachelor degree online can provide a solid foundation in managing teams and resources efficiently, a valuable complement to engineering expertise. Such degrees are designed to be flexible and accessible for working professionals.

Best Scientists Citing Felice Crupi

Eddy Simoen

Eddy Simoen

Ghent University

Publications: 89

Guido Groeseneken

Guido Groeseneken

Imec

Publications: 63

Cor Claeys

Cor Claeys

KU Leuven

Publications: 52

Ben Kaczer

Ben Kaczer

Imec

Publications: 38

Jerome Mitard

Jerome Mitard

Imec

Publications: 32

Robin Degraeve

Robin Degraeve

Imec

Publications: 32

Naoto Horiguchi

Naoto Horiguchi

Imec

Publications: 31

Enrique Miranda

Enrique Miranda

Autonomous University of Barcelona

Publications: 31

Montserrat Nafría

Montserrat Nafría

Autonomous University of Barcelona

Publications: 30

Paul K. Hurley

Paul K. Hurley

Tyndall National Institute

Publications: 28

Kin Leong Pey

Kin Leong Pey

Singapore University of Technology and Design

Publications: 28

Gerard Ghibaudo

Gerard Ghibaudo

Grenoble Alpes University

Publications: 28

Nadine Collaert

Nadine Collaert

Imec

Publications: 27

Geert Eneman

Geert Eneman

Imec

Publications: 20

Tibor Grasser

Tibor Grasser

TU Wien

Publications: 18

Giuseppe Iannaccone

Giuseppe Iannaccone

University of Pisa

Publications: 18

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