World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
88
Citations
27683
World Ranking
330
National Ranking
156

Ronald D. Schrimpf publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Ronald D. Schrimpf sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 855 publications — 97th percentile

97% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Ronald D. Schrimpf D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Ronald D. Schrimpf sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 88 D-Index — 95th percentile

95% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2000 - IEEE Fellow For contributions to the understanding and the modeling of physical mechanisms governing the response of semiconductor devices to radiation exposure.

Overview

Ronald D. Schrimpf is affiliated with Vanderbilt University in the United States. Their primary field of study is Engineering, with a focus on Electrical and Electronic Engineering as the predominant subfield. Additional subfields in their research portfolio include Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Materials Chemistry, and Atomic and Molecular Physics, and Optics.

The scientist's research explores various topics related to semiconductor technology and radiation effects in electronics. Key topics addressed in their work include:

  • Semiconductor materials and devices
  • Radiation Effects in Electronics
  • Advancements in Semiconductor Devices and Circuit Design
  • Integrated Circuits and Semiconductor Failure Analysis
  • GaN-based semiconductor devices and materials
  • Ga2O3 and related materials
  • Silicon Carbide Semiconductor Technologies

They have contributed significantly to the literature on radiation effects and semiconductor devices, with notable recent publications including:

  • "Radiation Effects in AlGaN/GaN HEMTs," 2022, IEEE Transactions on Nuclear Science
  • "Effects of Breakdown Voltage on Single-Event Burnout Tolerance of High-Voltage SiC Power MOSFETs," 2021, IEEE Transactions on Nuclear Science
  • "Low-Energy Ion-Induced Single-Event Burnout in Gallium Oxide Schottky Diodes," 2023, IEEE Transactions on Nuclear Science
  • "Atomic-displacement threshold energies and defect generation in irradiated β-Ga2O3: A first-principles investigation," 2023, Journal of Applied Physics
  • "Impact of Heavy-Ion Range on Single-Event Effects in Silicon Carbide Power Junction Barrier Schottky Diodes," 2023, IEEE Transactions on Nuclear Science

Frequent collaborators include Robert A. Reed, Daniel M. Fleetwood, En Xia Zhang, Michael L. Alles, and Dennis R. Ball. This network of coauthors reflects ongoing collaboration in the fields of semiconductor device reliability and radiation effects.

The most common publication venues for their research are:

  • IEEE Transactions on Nuclear Science
  • Journal of Applied Physics
  • IEEE Transactions on Electron Devices
  • Applied Physics Letters
  • IEEE Transactions on Device and Materials Reliability

Ronald D. Schrimpf's contributions have been recognized by the IEEE, who named them an IEEE Fellow in 2000 for their work advancing the understanding and modeling of physical mechanisms governing semiconductor device responses to radiation exposure.

Best Publications

  • Charge Collection and Charge Sharing in a 130 nm CMOS Technology

    O.A. Amusan;A.F. Witulski;L.W. Massengill;B.L. Bhuva

  • Response of advanced bipolar processes to ionizing radiation

    E.W. Enlow;R.L. Pease;W. Combs;R.D. Schrimpf

  • Physical mechanisms contributing to enhanced bipolar gain degradation at low dose rates

    D.M. Fleetwood;S.L. Kosier;R.N. Nowlin;R.D. Schrimpf

  • Physical model for enhanced interface-trap formation at low dose rates

    S.N. Rashkeev;C.R. Cirba;D.M. Fleetwood;R.D. Schrimpf

  • Monte Carlo Simulation of Single Event Effects

    Robert A Weller;Marcus H Mendenhall;Robert A Reed;Ronald D Schrimpf

  • ELDRS in Bipolar Linear Circuits: A Review

    R.L. Pease;R.D. Schrimpf;D.M. Fleetwood

  • Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies

    B. Narasimham;B.L. Bhuva;R.D. Schrimpf;L.W. Massengill

  • Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

    B.D. Sierawski;J.A. Pellish;R.A. Reed;R.D. Schrimpf

  • Unified model of hole trapping, 1/f noise, and thermally stimulated current in MOS devices

    D.M. Fleetwood;H.D. Xiong;Z.-Y. Lu;C.J. Nicklaw

  • Radiation effects at low electric fields in thermal, SIMOX, and bipolar-base oxides

    D.M. Fleetwood;L.C. Riewe;J.R. Schwank;S.C. Witczak

  • Single event transient pulse widths in digital microcircuits

    M.J. Gadlage;R.D. Schrimpf;J.M. Benedetto;P.H. Eaton

  • Trends in the total-dose response of modern bipolar transistors

    S.L. Kosier;W.E. Combs;A. Wei;R.A. Schrimpf

  • The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

    K.M. Warren;R.A. Weller;M.H. Mendenhall;R.A. Reed

  • Proton-irradiation effects on AlGaN/AlN/GaN high electron mobility transistors

    Xinwen Hu;A.P. Karmarkar;Bongim Jun;D.M. Fleetwood

  • Reactions of hydrogen with Si-SiO/sub 2/ interfaces

    S.T. Pantelides;S.N. Rashkeev;R. Buczko;D.M. Fleetwood

  • The structure, properties, and dynamics of oxygen vacancies in amorphous SiO/sub 2/

    C.J. Nicklaw;Z.-Y. Lu;D.M. Fleetwood;R.D. Schrimpf

  • Hardness assurance testing of bipolar junction transistors at elevated irradiation temperatures

    S.C. Witczak;R.D. Schrimpf;D.M. Fleetwood;K.F. Galloway

  • Nonuniform total-dose-induced charge distribution in shallow-trench isolation oxides

    M. Turowski;A. Raman;R.D. Schrimpf

  • Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

    Ronald D. Schrimpf;Daniel M. Fleetwood

  • Analysis of single-event transients in analog circuits

    P. Adell;R.D. Schrimpf;H.J. Barnaby;R. Marec

  • Defects in microelectronic materials and devices

    D. M. Fleetwood;Sokrates T. Pantelides;Ronald D Schrimpf

Frequent Co-Authors

Daniel M. Fleetwood
Daniel M. Fleetwood Vanderbilt University
Robert A. Reed
Robert A. Reed Vanderbilt University
Sokrates T. Pantelides
Sokrates T. Pantelides Vanderbilt University
Kenneth F. Galloway
Kenneth F. Galloway Vanderbilt University
Robert A. Weller
Robert A. Weller Woods Hole Oceanographic Institution
Lloyd W. Massengill
Lloyd W. Massengill Vanderbilt University
Bharat L. Bhuva
Bharat L. Bhuva Vanderbilt University
M. L. Alles
M. L. Alles Vanderbilt University
Arthur F. Witulski
Arthur F. Witulski Vanderbilt University
Andrew L. Sternberg
Andrew L. Sternberg Vanderbilt University

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