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Valeri Afanas'ev

Valeri Afanas'ev

D-Index & Metrics

Materials Science

D-Index
67
Citations
17981
World Ranking
5063
National Ranking
51

Overview

Valeri Afanas'ev is a researcher affiliated with KU Leuven in Belgium, specializing in fields that bridge engineering and materials science. Their work significantly focuses on electrical and electronic engineering as well as materials chemistry, with additional contributions in atomic and molecular physics, optics, nuclear and high energy physics, and the mechanics of materials.

The scientific topics in their research include ferroelectric and negative capacitance devices, graphene research and applications, 2D materials and their applications, semiconductor materials and devices, topological materials and phenomena, ferroelectric and piezoelectric materials, and advanced condensed matter physics.

Valeri Afanas'ev has contributed to numerous scholarly publications, with some of the frequent venues for their research including arXiv (Cornell University), Journal of Applied Physics, IEEE Electron Device Letters, Mining Journal of Kryvyi Rih National University, and npj 2D Materials and Applications.

Selected recent papers authored or co-authored by Afanas'ev include:

  • Search for sterile neutrinos with the Neutrino-4 experiment and measurement results, 2021, Physical review. D/Physical review. D.
  • Two-dimensional honeycomb-kagome V2O3: a robust room-temperature magnetic Chern insulator interfaced with graphene, 2021, arXiv (Cornell University)
  • Ferromagnetism and half-metallicity in two-dimensional M O (M=Ga, In) monolayers induced by hole doping, 2020, Physical Review Materials
  • Two-dimensional gallium and indium oxides from global structure searching: Ferromagnetism and half metallicity via hole doping, 2020, Journal of Applied Physics
  • Quarter-filled Kane-Mele Hubbard model: Dirac half metals, 2021, Physical review. B./Physical review. B

Collaborations form a distinctive part of Afanas'ev's scientific output. Frequent co-authors include Michel Houssa, Ruishen Meng, Jean-Pierre Locquet, Gouri Sankar Kar, and Jan Van Houdt.

Best Publications

  • Intrinsic SiC/SiO2 Interface States

    Valeri Afanas'ev;M. Bassler;G. Pensl;M. J. Schulz

  • Strain-induced semiconductor to metal transition in the two-dimensional honeycomb structure of MoS2

    Emilio Scalise;Michel Houssa;Geoffrey Pourtois;Geoffrey Pourtois;Valery Afanas’ev

  • Electronic properties of hydrogenated silicene and germanene

    Michel Houssa;Emilio Scalise;Kiroubanand Sankaran;Geoffrey Pourtois

  • Trap-assisted tunneling in high permittivity gate dielectric stacks

    Michel Houssa;M Tuominen;M Naili;Valeri Afanas'ev

  • High-k dielectrics for future generation memory devices (Invited Paper)

    J. A. Kittl;K. Opsomer;M. Popovici;N. Menou

  • Band offsets and electronic structure of SiC/SiO2 interfaces

    Valeri Afanas'ev;M. Bassler;G. Pensl;M. Schulz

  • Band alignments in metal–oxide–silicon structures with atomic-layer deposited Al2O3 and ZrO2

    Valeri Afanas'ev;Michel Houssa;Andre Stesmans;MM Heyns

  • Mechanisms responsible for improvement of 4H-SiC/SiO2 interface properties by nitridation

    V. V. Afanas'ev;A. Stesmans;F. Ciobanu;G. Pensl

  • Can silicon behave like graphene? A first-principles study

    Michel Houssa;Geoffrey Pourtois;Valeri Afanas'ev;Andre Stesmans

  • Variation in the fixed charge density of SiOx/ZrO2 gate dielectric stacks during postdeposition oxidation

    Michel Houssa;Valeri Afanas'ev;Andre Stesmans;MM Heyns

  • Internal photoemission of electrons and holes from (100)Si into HfO2

    Valeri Afanas'ev;Andre Stesmans;F Chen;X Shi

  • Vibrational properties of silicene and germanene

    Emilio Scalise;Michel Houssa;Geoffrey Pourtois;Geoffrey Pourtois;B. van den Broek

  • Electron spin resonance features of interface defects in thermal (100)Si/SiO2

    Andre Stesmans;Valeri Afanas'ev

  • Band alignment between (100)Si and complex rare earth∕transition metal oxides

    Valeri Afanas'ev;Andre Stesmans;C Zhao;M Caymax

  • Ternary rare-earth metal oxide high-k layers on silicon oxide

    C Zhao;T Witters;B Brijs;H Bender

  • Electron energy barriers between (100)Si and ultrathin stacks of SiO2, Al2O3, and ZrO2 insulators

    Valeri Afanas'ev;Michel Houssa;Andre Stesmans;MM Heyns

  • Shallow electron traps at the 4H–SiC/SiO2 interface

    Valeri Afanas'ev;Andre Stesmans;M Bassler;G Pensl

  • Interface traps and dangling-bond defects in (100)Ge/HfO2

    Valeri Afanas'ev;YG Fedorenko;Andre Stesmans

  • Band alignment and defect states at SiC/oxide interfaces

    Valeri Afanas'ev;F Ciobanu;S Dimitrijev;G Pensl

  • Passivation of Ge ( 100 ) ∕ GeO2 ∕ high-κ Gate Stacks Using Thermal Oxide Treatments

    F. Bellenger;M. Houssa;A. Delabie;V. Afanasiev

  • Electrical activity of interfacial paramagnetic defects in thermal (100) Si/SiO2

    Andre Stesmans;Valeri Afanas'ev

Frequent Co-Authors

Michel Houssa
Michel Houssa KU Leuven
Gerhard Pensl
Gerhard Pensl University of Erlangen-Nuremberg
Stephen A. Campbell
Stephen A. Campbell University of Minnesota
M.M. Heyns
M.M. Heyns KU Leuven
Alexander L. Shluger
Alexander L. Shluger University College London

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