Leonard C. Feldman

Research.com Recognitions

• 2014 - Fellow of the Materials Research Society
• 1999 - David Adler Lectureship Award in the Field of Materials Physics

Overview

Best Publications

• Fundamentals of Surface and Thin Film Analysis

  Leonard C. Feldman;James W. Mayer;M. Grasserbauer

  2093
  Citations

• Materials Analysis by Ion Channeling: Submicron Crystallography

  Leonard C. Feldman;James W. Mayer;S. T. Picraux

  1625
  Citations

• Materials analysis by ion channeling

  Leonard C. Feldman

  1147
  Citations

• GexSi1−x/Si strained‐layer superlattice grown by molecular beam epitaxy

  J. C. Bean;Leonard C Feldman;A. T. Fiory;S. Nakahara

  1064
  Citations

• Electronic thin film science : for electrical engineers and materials scientists

  K. N. Tu;James W. Mayer;Leonard C. Feldman

  997
  Citations

• Improved inversion channel mobility for 4H-SiC MOSFETs following high temperature anneals in nitric oxide

  G.Y. Chung;C.C. Tin;J.R. Williams;K. McDonald

  870
  Citations

• Clustering on surfaces

  Martin Zinke-Allmang;Leonard C. Feldman;Marcia H. Grabow

  845
  Citations

• Equilibrium shape of Si.

  D. J. Eaglesham;A. E. White;L. C. Feldman;N. Moriya

  683
  Citations

• Effect of nitric oxide annealing on the interface trap densities near the band edges in the 4H polytype of silicon carbide

  G. Y. Chung;C. C. Tin;J. R. Williams;K. McDonald

  606
  Citations

• Observation of long-range exciton diffusion in highly ordered organic semiconductors

  H. Najafov;B. Lee;Q. Zhou;L. C. Feldman

  574
  Citations

• Semiconductor to metal phase transition in the nucleation and growth of VO2 nanoparticles and thin films

  J. Y. Suh;R. Lopez;L. C. Feldman;R. F. Haglund

  460
  Citations

• Size effects in the structural phase transition of VO 2 nanoparticles

  Rene Lopez;T. E. Haynes;L. A. Boatner;L. C. Feldman

  455
  Citations

• Structurally induced optical transitions in Ge-Si superlattices.

  T. P. Pearsall;J. Bevk;L. C. Feldman;J. M. Bonar

  412
  Citations

• Homogeneously Alloyed CdSxSe1-x Nanocrystals: Synthesis, Characterization, and Composition/Size-Dependent Band Gap

  Laura A. Swafford;Lauren A. Weigand;Michael J. Bowers;James R. McBride

  378
  Citations

• Extremely high electron mobility in Si/GexSi1−x structures grown by molecular beam epitaxy

  Y. J. Mii;Y. H. Xie;E. A. Fitzgerald;Don Monroe

  364
  Citations

• Positron-annihilation momentum profiles in aluminum: Core contribution and the independent-particle model

  K. G. Lynn;J. R. MacDonald;R. A. Boie;L. C. Feldman

  342
  Citations

• Modified Deal Grove model for the thermal oxidation of silicon carbide

  Y. Song;S. Dhar;L. C. Feldman;G. Chung

  335
  Citations

• Pseudomorphic growth of GexSi1−x on silicon by molecular beam epitaxy

  J. C. Bean;T. T. Sheng;Leonard C Feldman;A. T. Fiory

  329
  Citations

• Size-dependent optical properties of VO2 nanoparticle arrays

  Rene Lopez;Leonard C. Feldman;Richard F. Haglund Jr.

  318
  Citations

• Structural basis for near unity quantum yield core/shell nanostructures.

  James McBride;Joe Treadway;L. C. Feldman;Stephen J. Pennycook

  305
  Citations

• Fundamentals of surface and thin film analysis : North Holland, Amsterdam, 1986 (ISBN 0-444-00989-2). xviii + 352 pp. Price Dfl. 125.00.

  Leonard C. Feldman;James W. Mayer;M. Grasserbauer

  57
  Citations