World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
49
Citations
7882
World Ranking
2985
National Ranking
1118

Sei-Hyung Ryu publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Sei-Hyung Ryu sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 239 publications — 41st percentile

41% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Sei-Hyung Ryu D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Sei-Hyung Ryu sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 49 D-Index — 58th percentile

58% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Sei-Hyung Ryu is affiliated with Wolfspeed, Inc. in the United States and has focused research efforts primarily in engineering, with a specialization in electrical and electronic engineering. Their work spans several subfields including electronic, optical and magnetic materials, materials chemistry, atomic and molecular physics, and computational mechanics.

The scientist's research contributions have been published extensively in areas related to semiconductor technologies and device engineering. Main topics of their work include silicon carbide semiconductor technologies, semiconductor materials and devices, electromagnetic compatibility and noise suppression, advancements in semiconductor devices and circuit design, electrostatic discharge in electronics, copper interconnects and reliability, and radiation effects in electronics.

Sei-Hyung Ryu has authored multiple papers, some of which include:

  • Negative Gate Bias TDDB evaluation of n-Channel SiC Vertical Power MOSFETs, 2022, 2022 IEEE International Reliability Physics Symposium (IRPS)
  • Improvements to the Analytical Model to Describe UIS Events, 2022, IEEE Transactions on Electron Devices
  • Outlook for Dielectric/SiC Interfaces for Future Generation MOSFETs, 2023, Materials science forum
  • Study of Dopant Activation and Ionization for Phosphorus in 4H-SiC, 2024, Journal of Electronic Materials
  • Modeling methodology for thermo-structural analysis of V-NAND flash memory structure, 2025, Scientific Reports

Frequent coauthors in their research include Daniel J. Lichtenwalner, Brett Hull, Hemant Dixit, Jae Hyung Park, and Suman Das.

Sei-Hyung Ryu's work has appeared repeatedly in several publication venues such as Materials science forum, Diffusion and defect data along with solid state phenomena, Key engineering materials, Journal of Electronic Materials, and IEEE Transactions on Electron Devices.

Best Publications

  • Silicon carbide power MOSFETs: Breakthrough performance from 900 V up to 15 kV

    J. W. Palmour;L. Cheng;V. Pala;E. V. Brunt

  • Silicon Carbide Power MOSFET Model and Parameter Extraction Sequence

    T.R. McNutt;A.R. Hefner;H.A. Mantooth;D. Berning

  • A New Degradation Mechanism in High-Voltage SiC Power MOSFETs

    A. Agarwal;H. Fatima;S. Haney;Sei-Hyung Ryu

  • 1800 V NPN bipolar junction transistors in 4H-SiC

    Sei-Hyung Ryu;A.K. Agarwal;R. Singh;J.W. Palmour

  • SiC Power Devices for Microgrids

    Qingchun Zhang;R Callanan;M K Das;Sei-Hyung Ryu

  • 10-kV, 123-m/spl Omega//spl middot/cm/sup 2/ 4H-SiC power DMOSFETs

    Sei-Hyung Ryu;S. Krishnaswami;M. O'Loughlin;J. Richmond

  • Comparative Evaluation of 15-kV SiC MOSFET and 15-kV SiC IGBT for Medium-Voltage Converter Under the Same dv/dt Conditions

    Kasunaidu Vechalapu;Subhashish Bhattacharya;Edward Van Brunt;Sei-Hyung Ryu

  • Silicon carbide power devices with self-aligned source and well regions

    Sei-Hyung Ryu

  • High-resolution alpha-particle spectrometry using 4H silicon carbide semiconductor detectors

    F.H. Ruddy;J.G. Seidel;Haoqian Chen;A.R. Dulloo

  • Recent progress in SiC DMOSFETs and JBS diodes at Cree

    R.J. Callanan;A. Agarwal;A. Burk;M. Das

  • The fast neutron response of 4H silicon carbide semiconductor radiation detectors

    F.H. Ruddy;A.R. Dulloo;J.G. Seidel;M.K. Das

  • Characterization of 15 kV SiC n-IGBT and its application considerations for high power converters

    Arun Kadavelugu;Subhashish Bhattacharya;Sei-Hyung Ryu;Edward Van Brunt

  • 1000-V, 30-A 4H-SiC BJTs with high current gain

    S. Krishnaswami;A. Agarwal;Sei-Hyung Ryu;C. Capell

  • Relationship between 4H-SiC∕SiO2 transition layer thickness and mobility

    T. L. Biggerstaff;C. L. Reynolds;T. Zheleva;A. Lelis

  • METHOD OF PROCESSING SEMICONDUCTOR WAFER HAVING SILICON CARBIDE POWER DEVICE

    Agarwal Anant;Ryu Si Hoon;Matt Donofrio

  • Digital CMOS IC's in 6H-SiC operating on a 5-V power supply

    Sei-Hyung Ryu;K.T. Kornegay;J.A. Cooper;M.R. Melloch

  • 10 kV, 5A 4H-SiC Power DMOSFET

    Sei-Hyung Ryu;S. Krishnaswami;B. Hull;J. Richmond

  • Reliability and stability of SiC power mosfets and next-generation SiC MOSFETs

    B. Hull;S. Allen;Q. Zhang;D. Gajewski

  • 22 kV, 1 cm 2 , 4H-SiC n-IGBTs with improved conductivity modulation

    E. V. Brunt;L. Cheng;M. O'Loughlin;C. Capell

  • High Temperature, High Current, 4H-SiC Accu-DMOSFET

    Ranbir Singh;Sei Hyung Ryu;John W. Palmour

  • Comparative evaluation of 15 kV SiC MOSFET and 15 kV SiC IGBT for medium voltage converter under same dv/dt conditions

    Kasunaidu Vechalapu;Subhashish Bhattacharya;Edward Van Brunt;Sei-Hyung Ryu

Frequent Co-Authors

Anant K. Agarwal
Anant K. Agarwal The Ohio State University
Subhashish Bhattacharya
Subhashish Bhattacharya North Carolina State University
Sokrates T. Pantelides
Sokrates T. Pantelides Vanderbilt University
Ronald D. Schrimpf
Ronald D. Schrimpf Vanderbilt University
Ranbir Singh
Ranbir Singh Indian Institute of Technology Mandi
Daniel M. Fleetwood
Daniel M. Fleetwood Vanderbilt University
John R. Williams
John R. Williams Auburn University
T.P. Chow
T.P. Chow Rensselaer Polytechnic Institute
Alex Q. Huang
Alex Q. Huang The University of Texas at Austin
Leonard C. Feldman
Leonard C. Feldman Rutgers, The State University of New Jersey

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Related Online Degrees & Career Pathways

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Finally, a bachelor's in project management offers a comprehensive foundation for those aiming to lead teams and oversee large-scale engineering projects. Combining this degree with an electronics or electrical engineering background can significantly boost career prospects and leadership potential in various industries.

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