World's Best Scientists 2026 revealed!
Carl-Mikael Zetterling

Carl-Mikael Zetterling

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
34
Citations
4715
World Ranking
5821
National Ranking
94

Carl-Mikael Zetterling publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Carl-Mikael Zetterling sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 265 publications — 49th percentile

49% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Carl-Mikael Zetterling D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Carl-Mikael Zetterling sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 34 D-Index — 18th percentile

18% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Carl-Mikael Zetterling is affiliated with the Royal Institute of Technology in Sweden. Their research focuses primarily on engineering, with a strong emphasis on electrical and electronic engineering.

Their work spans several subfields including:

  • Electrical and Electronic Engineering
  • Biomedical Engineering
  • Mechanics of Materials
  • Civil and Structural Engineering
  • Atomic and Molecular Physics, and Optics

The main topics of research covered by Zetterling include:

  • Silicon Carbide Semiconductor Technologies
  • Semiconductor materials and devices
  • Radiation Effects in Electronics
  • Nanowire Synthesis and Applications
  • Integrated Circuits and Semiconductor Failure Analysis
  • Thin-Film Transistor Technologies
  • Ultrasonics and Acoustic Wave Propagation

Zetterling has contributed to various publication venues, including:

  • IEEE Journal of the Electron Devices Society
  • Sensors
  • IEEE Spectrum
  • IEEE Transactions on Nuclear Science
  • Materials Science in Semiconductor Processing

Among recent papers associated with Zetterling's research area are:

  • "A Silicon Carbide 256 Pixel UV Image Sensor Array Operating at 400 °C", 2020, IEEE Journal of the Electron Devices Society
  • "Venus Calling Silicon Carbide Radio Circuits Can Take The Heat Needed To Phone Home From Our Hellish Sister Planet", 2021, IEEE Spectrum
  • "In Situ Gamma Irradiation Effects on 4H-SiC Bipolar Junction Transistors", 2023, IEEE Transactions on Nuclear Science
  • "SHM System for Composite Material Based on Lamb Waves and Using Machine Learning on Hardware", 2024, Sensors
  • "Self-aligned contacts to ion implanted S/D regions in 4H-SiC", 2023, Materials Science in Semiconductor Processing

Frequent co-authors include:

  • Alex Metreveli
  • Mattias Ekström
  • B. Gunnar Malm
  • Anders Hallén
  • Ilaria Di Sarcina

Best Publications

  • Process technology for silicon carbide devices

    Carl-Mikael Zetterling

  • SiC power devices — Present status, applications and future perspective

    Mikael Ostling;Reza Ghandi;Carl-Mikael Zetterling

  • Inductively coupled plasma etching of bulk 6H-SiC and thin-film SiCN in NF3 chemistries

    J. J. Wang;E. S. Lambers;S. J. Pearton;Mikael Östling

  • 500 $^{\circ}{ m C}$ Bipolar Integrated OR/NOR Gate in 4H-SiC

    Luigia Lanni;Bengt Gunnar Malm;Mikael Ostling;Carl-Mikael Zetterling

  • A Monolithic, 500 degrees C Operational Amplifier in 4H-SiC Bipolar Technology

    Raheleh Hedayati;Luigia Lanni;Saul Rodriguez;Bengt Gunnar Malm

  • Investigation of aluminum nitride grown by metal–organic chemical-vapor deposition on silicon carbide

    Carl-Mikael Zetterling;Mikael Östling;K. Wongchotigul;M. G. Spencer

  • Ohmic contact properties of magnetron sputtered Ti3SiC2 on n- and p-type 4H-silicon carbide

    K. Buchholt;R. Ghandi;M. Domeij;C.-M. Zetterling

  • A 2.8kV, Forward Drop JBS Diode with Low Leakage

    Fanny Dahlquist;J. O Svedberg;Carl-Mikael Zetterling;Mikael Östling

  • High-Voltage 4H-SiC PiN Diodes With Etched Junction Termination Extension

    R. Ghandi;B. Buono;M. Domeij;G. Malm

  • Low resistivity ohmic titanium carbide contacts to n- and p-type 4H-silicon carbide

    S. K. Lee;Carl-Mikael Zetterling;Mikael Östling;J. P. Palmquist

  • Reduction of the Schottky barrier height on silicon carbide using Au nano-particles

    SK Lee;CM Zetterling;M Ostling;I Åberg

  • Ultradeep, low-damage dry etching of SiC

    H. Cho;P. Leerungnawarat;D. C. Hays;S. J. Pearton

  • Surface-Passivation Effects on the Performance of 4H-SiC BJTs

    R Ghandi;B Buono;M Domeij;R Esteve

  • Geometrical effects in high current gain 1100-V 4H-SiC BJTs

    M. Domeij;H.-S. Lee;E. Danielsson;C.-M. Zetterling

  • 1200-V 5.2- $\hbox{m}\Omega\cdot\hbox{cm}^{2}$ 4H-SiC BJTs With a High Common-Emitter Current Gain

    Hyung-Seok Lee;M. Domeij;C.-M. Zetterling;M. Ostling

  • Modeling and Characterization of Current Gain Versus Temperature in 4H-SiC Power BJTs

    B. Buono;R. Ghandi;M. Domeij;B.G. Malm

  • ICP etching of SiC

    J. J. Wang;E. S. Lambers;S. J. Pearton;Mikael Östling

  • High density plasma via hole etching in SiC

    H. Cho;K. P. Lee;P. Leerungnawarat;S. N. G. Chu

  • Junction Barrier Schottky Diodes in 4H-SiC and 6H-SiC

    Fanny Dahlquist;Carl Mikael Zetterling;Mikael Östling;K. Rottner

  • Design and Characterization of High-Temperature ECL-Based Bipolar Integrated Circuits in 4H-SiC

    Luigia Lanni;R. Ghandi;B. G. Malm;C. Zetterling

  • Schottky barrier height dependence on the metal work function for p-type 4H-silicon carbide

    S.-K. Lee;C.-M. Zetterling;M. Östling

Frequent Co-Authors

Mikael Östling
Mikael Östling Royal Institute of Technology
Anders Hallén
Anders Hallén Royal Institute of Technology
Takeshi Ohshima
Takeshi Ohshima Japan Atomic Energy Agency
Fan Ren
Fan Ren University of Florida
Stephen J. Pearton
Stephen J. Pearton University of Florida
Ulf Jansson
Ulf Jansson Uppsala University
Erik Janzén
Erik Janzén Linköping University
Jun Lu
Jun Lu Zhejiang University
Robert F. Davis
Robert F. Davis Carnegie Mellon University
Kevin J. Linthicum
Kevin J. Linthicum MACOM (United States)

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