Richard F. Haglund is affiliated with Vanderbilt University in the United States. Their research spans the fields of Engineering and Materials Science with a focus on several specialized subfields including Electrical and Electronic Engineering, Polymers and Plastics, Biomedical Engineering, Electronic, Optical and Magnetic Materials, and Artificial Intelligence.
The scientist's work concentrates on topics such as Transition Metal Oxide Nanomaterials, Photonic and Optical Devices, Neural Networks and Reservoir Computing, Advanced Electron Microscopy Techniques and Applications, Nonlinear Optical Materials Studies, Gold and Silver Nanoparticles Synthesis and Applications, and Electron and X-Ray Spectroscopy Techniques.
Frequently collaborating with other researchers, Richard F. Haglund has coauthored numerous papers with:
The scientist has published several recent papers, some of which include:
Their work is commonly featured in the following publication venues:
Hiram J. Conley;Bin Wang;Bin Wang;Jed I. Ziegler;Jed I. Ziegler;Richard F. Haglund;Richard F. Haglund
C. Kübler;H. Ehrke;Rupert Huber;R. Lopez;R. Lopez
J. Y. Suh;R. Lopez;L. C. Feldman;R. F. Haglund
Rene Lopez;T. E. Haynes;L. A. Boatner;L. C. Feldman
Peter Uhd Jepsen;Bernd M. Fischer;Andreas Thoman;Hanspeter Helm
A. Meldrum;R. F. Jr. Haglund;L. A. Boatner;C. W. White
Daniel Wegkamp;Marc Herzog;Lede Xian;Matteo Gatti
Unknown
Ricardo Ruiz;Bert Nickel;Norbert Koch;Leonard C. Feldman
Kannatassen Appavoo;Dang Yuan Lei;Yannick Sonnefraud;Bin Wang
Zhihua Zhu;Philip G. Evans;Richard F. Haglund;Jason G. Valentine
Alexej Pashkin;Carl Kübler;Henri Ehrke;Ricardo Lopez;Ricardo Lopez
Matteo Rini;Andrea Cavalleri;Robert W. Schoenlein;René López
A.K.M. Newaz;D. Prasai;J.I. Ziegler;D. Caudel;D. Caudel
Ricardo Ruiz;Bert Nickel;Norbert Koch;Leonard C. Feldman
Petr Markov;Robert E. Marvel;Hiram J. Conley;Kevin J. Miller
R. H. Magruder;Li Yang;R. F. Haglund;C. W. White
Rene Lopez;L. A. Boatner;T. E. Haynes;L. C. Feldman
Dang Yuan Lei;Antonio I. Fernández-Domínguez;Yannick Sonnefraud;Kannatassen Appavoo
R.F. Haglund;Li Yang;R.H. Magruder;C.W. White
G. S. Edwards;R. H. Austin;F. E. Carroll;M. L. Copeland
T. G. Folland;A. Fali;S. T. White;J. R. Matson
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