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Patricia M. Mooney

Patricia M. Mooney

D-Index & Metrics

Materials Science

D-Index
55
Citations
10550
World Ranking
8630
National Ranking
152

Research.com Recognitions

  • 2013 - Fellow of the Materials Research Society
  • 2013 - Fellow of the Royal Society of Canada Academy of Science
  • 1998 - Fellow of the American Association for the Advancement of Science (AAAS)

Overview

Patricia M. Mooney is affiliated with Simon Fraser University in Canada. Their research primarily spans the field of Engineering, with specific contributions in the subfields of Biomedical Engineering and Electrical and Electronic Engineering.

Their recent publication track records include work such as:

  • Strain relaxation of semiconductor membranes: insights from finite element modeling, 2023, Semiconductor Science and Technology

Mooney's main topics of research focus on:

  • Nanowire Synthesis and Applications
  • Advanced MEMS and NEMS Technologies
  • Advanced Sensor and Energy Harvesting Materials

Their scholarly output is published in venues including Semiconductor Science and Technology.

Awards received by Patricia M. Mooney include:

  • Fellow of the Royal Society of Canada, 2013 (Academy of Science)
  • Fellow of the Materials Research Society, 2013
  • Fellow of the American Association for the Advancement of Science (AAAS), 1998

Best Publications

  • Deep donor levels (DX centers) in III‐V semiconductors

    P. M. Mooney

  • Measurements of alloy composition and strain in thin GexSi1−x layers

    J. C. Tsang;P. M. Mooney;F. Dacol;J. O. Chu

  • Characteristics and device design of sub-100 nm strained Si N- and PMOSFETs

    K. Rim;J. Chu;H. Chen;K.A. Jenkins

  • Defect energy levels in boron-doped silicon irradiated with 1-MeV electrons

    P. M. Mooney;L. J. Cheng;M. Süli;J. D. Gerson

  • High performance CMOS fabricated on hybrid substrate with different crystal orientations

    M. Yang;M. Ieong;L. Shi;K. Chan

  • Controllable valley splitting in silicon quantum devices

    Srijit Goswami;K. A. Slinker;Mark Friesen;L. M. McGuire

  • Strained Si NMOSFETs for high performance CMOS technology

    K. Rim;S. Koester;M. Hargrove;J. Chu

  • Influence of misfit dislocations on the surface morphology of Si1−xGex films

    M. A. Lutz;R. M. Feenstra;F. K. LeGoues;P. M. Mooney

  • Electron localization by a metastable donor level in n-GaAs: A new mechanism limiting the free-carrier density.

    T. N. Theis;P. M. Mooney;S. L. Wright

  • Relaxed SiGe layers on Si or silicon-on-insulator substrates by ion implantation and thermal annealing

    Silke H. Christiansen;Jack O. Chu;Alfred Grill;Patricia M. Mooney

  • Strain relaxation and dislocations in SiGe/Si structures

    P.M. Mooney

  • Properties of high‐purity AlxGa1−xAs grown by the metalorganic vapor‐phase‐epitaxy technique using methyl precursors

    T. F. Kuech;D. J. Wolford;E. Veuhoff;V. Deline

  • Raman scattering analysis of relaxed GexSi1−x alloy layers

    P. M. Mooney;F. H. Dacol;J. C. Tsang;J. O. Chu

  • Identification of a mobility-limiting scattering mechanism in modulation-doped Si/SiGe heterostructures.

    K. Ismail;F. K. LeGoues;K. L. Saenger;M. Arafa

  • The capture barrier of the DX center in Si‐doped AlxGa1−xAs

    P. M. Mooney;N. S. Caswell;S. L. Wright

  • Method for fabrication of relaxed SiGe buffer layers on silicon-on-insulators and structures containing the same

    Silke H. Christiansen;Alfred Grill;Patricia M. Mooney

  • Carrier mobility enhancement in strained Si-on-insulator fabricated by wafer bonding

    L.-J. Huang;J.O. Chu;S. Goma;C.P. D'Emic

  • Spin-Based Quantum Dot Quantum Computing in Silicon

    Mark A. Eriksson;Mark Friesen;Susan N. Coppersmith;Robert Joynt

  • Electron and hole mobility enhancement in strained SOI by wafer bonding

    Lijuan Huang;J.O. Chu;S.A. Goma;C.P. D'Emic

  • Effect of local alloy disorder on emission kinetics of deep donors (DX centers) in AlxGa1−xAs of low Al content

    P. M. Mooney;T. N. Theis;S. L. Wright

  • Strained Si CMOS (SS CMOS) technology: Opportunities and challenges

    K. Rim;R. Anderson;D. Boyd;F. Cardone

  • Assessment of oxygen in gallium arsenide by infrared local vibrational mode spectroscopy

    J. Schneider;B. Dischler;H. Seelewind;P. M. Mooney

Frequent Co-Authors

John A. Ott
John A. Ott IBM (United States)
Steven J. Koester
Steven J. Koester University of Minnesota
Francoise K. LeGoues
Francoise K. LeGoues IBM (United States)
Leonard C. Feldman
Leonard C. Feldman Rutgers, The State University of New Jersey
John R. Williams
John R. Williams Auburn University
jack o chu
jack o chu IBM (United States)
Guy M. Cohen
Guy M. Cohen IBM (United States)
Silke Christiansen
Silke Christiansen Fraunhofer Society
Thomas Tiedje
Thomas Tiedje University of Victoria
Bernard S. Meyerson
Bernard S. Meyerson IBM (United States)

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