World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
46
Citations
10327
World Ranking
3337
National Ranking
1236

Materials Science

D-Index
47
Citations
10524
World Ranking
11025
National Ranking
2593

Overview

Matthew T. Currie is affiliated with Morgan, Lewis & Bockius LLP in the United States. The professional background positions them within a prominent law firm, indicating a career likely intersecting with legal research or academic inquiry related to the legal field.

There are no recent papers, co-authors, or publication venues listed for Matthew T. Currie.

There are also no main fields or subfields of study documented, nor are there records of book publications or numbered topics of work available.

Information on awards or honors attributed to Matthew T. Currie is not present.

Best Publications

  • Strained Si, SiGe, and Ge channels for high-mobility metal-oxide-semiconductor field-effect transistors

    Minjoo L. Lee;Eugene A. Fitzgerald;Mayank T. Bulsara;Matthew T. Currie

  • Controlling threading dislocation densities in Ge on Si using graded SiGe layers and chemical-mechanical polishing

    M. T. Currie;S. B. Samavedam;T. A. Langdo;C. W. Leitz

  • Semiconductor structures employing strained material layers with defined impurity gradients and methods for fabricating same

    Matthew T. Currie;Anthony J. Lochtefeld;Richard Hammond;Eugene A. Fitzgerald

  • Strained-semiconductor-on-insulator device structures

    Anthony Lochtefeld;Thomas Langdo;Richard Hammond;Matthew Currie

  • Strained Ge channel p-type metal–oxide–semiconductor field-effect transistors grown on Si1−xGex/Si virtual substrates

    Minjoo L. Lee;C. W. Leitz;Z. Cheng;A. J. Pitera

  • Methods of Forming Strained-Semiconductor-on-Insulator Device Structures

    Thomas A. Langdo;Matthew T. Currie;Richard Hammond;Anthony J. Lochtefeld

  • Hybrid fin field-effect transistor structures and related methods

    Matthew T. Currie

  • Carrier mobilities and process stability of strained Si n- and p-MOSFETs on SiGe virtual substrates

    M. T. Currie;C. W. Leitz;T. A. Langdo;G. Taraschi

  • Lattice-Mismatched Semiconductor Structures with Reduced Dislocation Defect Densities and Related Methods for Device Fabrication

    Anthony J. Lochtefeld;Matthew T. Currie;Zhiyuan Cheng;James Fiorenza

  • High quality Ge on Si by epitaxial necking

    T. A. Langdo;C. W. Leitz;M. T. Currie;E. A. Fitzgerald

  • Electron mobility enhancement in strained-Si n-MOSFETs fabricated on SiGe-on-insulator (SGOI) substrates

    Zhi-Yuan Cheng;M.T. Currie;C.W. Leitz;G. Taraschi

  • Hole mobility enhancements in strained Si/Si1-yGey p-type metal-oxide-semiconductor field-effect transistors grown on relaxed Si1-xGex (x<y) virtual substrates

    C. W. Leitz;M. T. Currie;Minjoo Lawrence Lee;Z. Y. Cheng

  • High-quality germanium photodiodes integrated on silicon substrates using optimized relaxed graded buffers

    S. B. Samavedam;M. T. Currie;T. A. Langdo;E. A. Fitzgerald

  • Hole mobility enhancements and alloy scattering-limited mobility in tensile strained Si/SiGe surface channel metal-oxide-semiconductor field-effect transistors

    C. W. Leitz;M. T. Currie;Minjoo Lawrence Lee;Z. Y. Cheng

  • Shallow trench isolation process

    Matthew T. Currie;Anthony J. Lochtefeld

  • Method of selective removal of SiGe alloys

    Richard Hammond;Matthew Currie

  • Dislocation dynamics in relaxed graded composition semiconductors

    E.A Fitzgerald;A.Y Kim;M.T Currie;T.A Langdo

  • Methods for fabricating strained layers on semiconductor substrates

    Eugene Fitzgerald;Matthew Currie

  • Crack formation in GaAs heteroepitaxial films on Si and SiGe virtual substrates

    V. K. Yang;M. Groenert;C. W. Leitz;A. J. Pitera

  • RF Circuits Including Transistors Having Strained Material Layers

    Glyn Braithwaite;Richard Hammond;Matthew T. Currie

Frequent Co-Authors

anthony j lochtefeld
anthony j lochtefeld Taiwan Semiconductor Manufacturing Company (United States)
Minjoo Larry Lee
Minjoo Larry Lee University of Illinois at Urbana-Champaign
Steven A. Ringel
Steven A. Ringel The Ohio State University
Jeffrey T. Borenstein
Jeffrey T. Borenstein Draper Laboratory
Joseph C. Woicik
Joseph C. Woicik National Institute of Standards and Technology
Mantu K. Hudait
Mantu K. Hudait Virginia Tech
Qi Xiang
Qi Xiang Xilinx (United States)

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Best Scientists Citing Matthew T. Currie