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Materials Science

D-Index
47
Citations
8696
World Ranking
11099
National Ranking
2615

Overview

Joseph C. Woicik is affiliated with the National Institute of Standards and Technology in the United States. Their research focuses primarily on materials science, engineering, and physics and astronomy, with significant contributions in related subfields such as materials chemistry, electrical and electronic engineering, surfaces, coatings and films, atomic and molecular physics and optics, and condensed matter physics.

Woicik's work concentrates on several key topics, including semiconductor materials and devices, electronic and structural properties of oxides, electron and x-ray spectroscopy techniques, x-ray spectroscopy and fluorescence analysis, semiconductor materials and interfaces, x-ray diffraction in crystallography, and analytical chemistry and sensors.

The scientist has published research across a range of reputable venues, including Physical Review B, Applied Physics Letters, Materials Advances, ACS Applied Materials & Interfaces, and Physical Chemistry Chemical Physics. Physical Review B is the most frequent venue, hosting six of their publications.

Recent notable papers by Joseph C. Woicik include:

  • Charge-transfer satellites and chemical bonding in photoemission and x-ray absorption of SrTiO3 and rutile TiO2: Experiment and first-principles theory with general application to spectroscopic analysis, 2020, Physical Review B
  • Core hole processes in x-ray absorption and photoemission by resonant Auger-electron spectroscopy and first-principles theory, 2020, Physical Review B

Other papers connected to Woicik's research area, though led by different authors, include:

  • Local ordering in Ge/Ge-Sn semiconductor alloy core/shell nanowires revealed by extended x-ray absorption fine structure (EXAFS), 2023, Applied Physics Letters
  • Analysing trimethylaluminum infiltration into polymer brushes using a scalable area selective vapor phase process, 2020, Materials Advances
  • Identification of structural phases in ferroelectric hafnium zirconium oxide by density-functional-theory-assisted EXAFS analysis, 2021, Applied Physics Letters

Frequent coauthors collaborating with Joseph C. Woicik include:

  • Conan Weiland
  • Eric L. Shirley
  • G. Hughes
  • Robert O'Connor
  • Abdul K. Rumaiz

Best Publications

  • Relation between the redox state of iron-based nanoparticles and their cytotoxicity toward Escherichia coli.

    Mélanie Auffan;Wafa Achouak;Jérôme Rose;Marie-Anne Roncato

  • A Ferroelectric Oxide Made Directly on Silicon

    Maitri P. Warusawithana;Cheng Cen;Charles R. Sleasman;Joseph C. Woicik

  • Diffraction anomalous fine structure: A new x-ray structural technique.

    H. Stragier;J. O. Cross;J. J. Rehr;Larry B. Sorensen

  • Effect of Vinylene Carbonate and Fluoroethylene Carbonate on SEI Formation on Graphitic Anodes in Li-Ion Batteries

    Mengyun Nie;Julien Demeaux;Benjamin T. Young;David R. Heskett

  • Structural changes underlying the diffuse dielectric response in AgNbO 3

    Igor Levin;Victor Krayzman;Joseph C. Woicik;Jenia Karapetrova

  • Origin of the Bipolar Doping Behavior of SnO from X-ray Spectroscopy and Density Functional Theory

    N. F. Quackenbush;J. P. Allen;D. O. Scanlon;S. Sallis

  • Surface extended-x-ray-absorption fine structure and scanning tunneling microscopy of Si(001)2×1-Sb

    M. Richter;J. C. Woicik;J. Nogami;P. Pianetta

  • Dopant location identification in Nd 3 + -doped Ti O 2 nanoparticles

    W. Li;A. I. Frenkel;J. C. Woicik;C. Ni

  • Hybridization and bond-orbital components in site-specific X-ray photoelectron spectra of rutile TiO2.

    J. C. Woicik;E. J. Nelson;Leeor Kronik;Manish Jain

  • c-axis oriented epitaxial BaTiO3 films on (001) Si

    V. Vaithyanathan;V. Vaithyanathan;V. Vaithyanathan;J. Lettieri;J. Lettieri;W. Tian;W. Tian;A. Sharan

  • Correlations between the magnetic and structural properties of Ca-doped BiMnO 3

    H Woo;T A. Tyson;Mark Croft;S W. Cheong;S W. Cheong

  • Hard X-ray Photoelectron Spectroscopy (HAXPES

    Joseph C. Woicik

  • Hard X-ray Photoelectron Spectroscopy (HAXPES) Investigation of the Silicon Solid Electrolyte Interphase (SEI) in Lithium-Ion Batteries

    Benjamin T Young;David R Heskett;Cao Cuong Nguyen;Mengyun Nie

  • Direct Observation of Electrostatically Driven Band Gap Renormalization in a Degenerate Perovskite Transparent Conducting Oxide

    Z. Lebens-Higgins;D. O. Scanlon;H. Paik;S. Sallis

  • Effect of Sr Content and Strain on Sr Surface Segregation of La1-xSrxCo0.2Fe0.8O3-δ as Cathode Material for Solid Oxide Fuel Cells.

    Yang Yu;Karl F. Ludwig;Joseph C. Woicik;Srikanth Gopalan

  • Bonding at the K/Si(100) 2×1 interface: A surface extended x-ray-absorption fine-structure study

    T. Kendelewicz;P. Soukiassian;P. Soukiassian;R.S. List;J.C. Woicik

  • Local atomic order and hierarchical polar nanoregions in a classical relaxor ferroelectric

    M. Eremenko;V. Krayzman;A. Bosak;H. Y. Playford

  • Nature of the metal insulator transition in ultrathin epitaxial vanadium dioxide.

    N. F. Quackenbush;J. W. Tashman;J. A. Mundy;S. Sallis

  • Local-structure origins of the sustained Curie temperature in (Ba,Ca)TiO3 ferroelectrics

    Igor Levin;Victor Krayzman;Joseph C. Woicik

  • Character of the insulating state in NiO : A mixture of charge-transfer and Mott-Hubbard character

    T. M. Schuler;D. L. Ederer;S. Itza-Ortiz;G. T. Woods

  • La-doped BaSnO3—Degenerate perovskite transparent conducting oxide: Evidence from synchrotron x-ray spectroscopy

    S. Sallis;D. O. Scanlon;S. C. Chae;N. F. Quackenbush

  • Gold-induced germanium crystallization

    Zhengquan Tan;S. M. Heald;M. Rapposch;C. E. Bouldin

  • Near-neighbor mixing and bond dilation in mechanically alloyed Cu-Fe

    V. G. Harris;K. M. Kemner;B. N. Das;N. C. Koon

Frequent Co-Authors

W. E. Spicer
W. E. Spicer Stanford University
Igor Levin
Igor Levin National Institute of Standards and Technology
Daniel A. Fischer
Daniel A. Fischer National Institute of Standards and Technology
Darrell G. Schlom
Darrell G. Schlom Cornell University
Louis F. J. Piper
Louis F. J. Piper University of Warwick
Michael J. Bedzyk
Michael J. Bedzyk Northwestern University
Matthew G. Tucker
Matthew G. Tucker Oak Ridge National Laboratory
Brett L. Lucht
Brett L. Lucht University of Rhode Island
Paul Kirsch
Paul Kirsch Samsung Austin Semiconductor
David A. Muller
David A. Muller Cornell University

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