World's Best Scientists 2026 revealed!

D-Index & Metrics

Materials Science

D-Index
47
Citations
8696
World Ranking
11097
National Ranking
2612

Joseph C. Woicik publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Joseph C. Woicik sits on this spectrum.

50–69 publications: 28 scientists 70–89 publications: 152 scientists 90–109 publications: 356 scientists 110–129 publications: 487 scientists 130–149 publications: 723 scientists 150–169 publications: 835 scientists 170–189 publications: 850 scientists 190–209 publications: 891 scientists 210–229 publications: 862 scientists 230–249 publications: 766 scientists 250–269 publications: 726 scientists 270–289 publications: 665 scientists 290–309 publications: 593 scientists 310–329 publications: 537 scientists 330–349 publications: 477 scientists 350–369 publications: 440 scientists 370–389 publications: 356 scientists 390–409 publications: 321 scientists 410–429 publications: 256 scientists 430–449 publications: 246 scientists 450–469 publications: 216 scientists 470–489 publications: 212 scientists 490–509 publications: 174 scientists 510–529 publications: 194 scientists 530–549 publications: 162 scientists 550–569 publications: 131 scientists 570–589 publications: 111 scientists 590–609 publications: 103 scientists 610–629 publications: 99 scientists 630–649 publications: 77 scientists 650–669 publications: 92 scientists 670–689 publications: 56 scientists 690–709 publications: 53 scientists 710–729 publications: 53 scientists 730–749 publications: 38 scientists 750–769 publications: 52 scientists 770–789 publications: 43 scientists 790–809 publications: 38 scientists 810–829 publications: 34 scientists 830–849 publications: 25 scientists 850–869 publications: 18 scientists 870–889 publications: 20 scientists 890–909 publications: 24 scientists 910–929 publications: 27 scientists 930–949 publications: 20 scientists 950–969 publications: 17 scientists 970–989 publications: 10 scientists 990–1,009 publications: 16 scientists 1,010–1,029 publications: 13 scientists 1,030–1,049 publications: 12 scientists 1,050–1,069 publications: 9 scientists 1,070–1,089 publications: 8 scientists 1,090–1,109 publications: 7 scientists 1,110–1,129 publications: 9 scientists 1,130–1,149 publications: 2 scientists 1,150–1,162 publications: 5 scientists 1,163+ publications: 100 scientists
50 publications 1,163+

This scientist: 306 publications — 61st percentile

61% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,163 publications or more.

Joseph C. Woicik D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Joseph C. Woicik sits on this spectrum.

40–41 D-Index: 211 scientists 42–43 D-Index: 450 scientists 44–45 D-Index: 612 scientists 46–47 D-Index: 612 scientists 48–49 D-Index: 598 scientists 50–51 D-Index: 657 scientists 52–53 D-Index: 667 scientists 54–55 D-Index: 621 scientists 56–57 D-Index: 597 scientists 58–59 D-Index: 610 scientists 60–61 D-Index: 587 scientists 62–63 D-Index: 606 scientists 64–65 D-Index: 533 scientists 66–67 D-Index: 490 scientists 68–69 D-Index: 469 scientists 70–71 D-Index: 378 scientists 72–73 D-Index: 421 scientists 74–75 D-Index: 359 scientists 76–77 D-Index: 323 scientists 78–79 D-Index: 299 scientists 80–81 D-Index: 230 scientists 82–83 D-Index: 210 scientists 84–85 D-Index: 195 scientists 86–87 D-Index: 203 scientists 88–89 D-Index: 175 scientists 90–91 D-Index: 175 scientists 92–93 D-Index: 142 scientists 94–95 D-Index: 121 scientists 96–97 D-Index: 117 scientists 98–99 D-Index: 107 scientists 100–101 D-Index: 88 scientists 102–103 D-Index: 85 scientists 104–105 D-Index: 68 scientists 106–107 D-Index: 62 scientists 108–109 D-Index: 57 scientists 110–111 D-Index: 45 scientists 112–113 D-Index: 49 scientists 114–115 D-Index: 50 scientists 116–117 D-Index: 34 scientists 118–119 D-Index: 38 scientists 120–121 D-Index: 37 scientists 122–123 D-Index: 29 scientists 124–125 D-Index: 28 scientists 126–127 D-Index: 24 scientists 128–129 D-Index: 33 scientists 130–131 D-Index: 28 scientists 132–133 D-Index: 21 scientists 134–135 D-Index: 20 scientists 136–137 D-Index: 23 scientists 138–139 D-Index: 17 scientists 140–141 D-Index: 12 scientists 142–143 D-Index: 17 scientists 144–145 D-Index: 21 scientists 146–147 D-Index: 13 scientists 148–149 D-Index: 11 scientists 150–151 D-Index: 14 scientists 152–153 D-Index: 13 scientists 154–155 D-Index: 9 scientists 156–157 D-Index: 10 scientists 158–159 D-Index: 7 scientists 160–161 D-Index: 4 scientists 162–163 D-Index: 4 scientists 164 D-Index: 3 scientists 165+ D-Index: 98 scientists
40 D-Index 165+

This scientist: 47 D-Index — 15th percentile

15% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 165 D-Index or more.

Overview

Joseph C. Woicik is affiliated with the National Institute of Standards and Technology in the United States. Their research focuses primarily on materials science, engineering, and physics and astronomy, with significant contributions in related subfields such as materials chemistry, electrical and electronic engineering, surfaces, coatings and films, atomic and molecular physics and optics, and condensed matter physics.

Woicik's work concentrates on several key topics, including semiconductor materials and devices, electronic and structural properties of oxides, electron and x-ray spectroscopy techniques, x-ray spectroscopy and fluorescence analysis, semiconductor materials and interfaces, x-ray diffraction in crystallography, and analytical chemistry and sensors.

The scientist has published research across a range of reputable venues, including Physical Review B, Applied Physics Letters, Materials Advances, ACS Applied Materials & Interfaces, and Physical Chemistry Chemical Physics. Physical Review B is the most frequent venue, hosting six of their publications.

Recent notable papers by Joseph C. Woicik include:

  • Charge-transfer satellites and chemical bonding in photoemission and x-ray absorption of SrTiO3 and rutile TiO2: Experiment and first-principles theory with general application to spectroscopic analysis, 2020, Physical Review B
  • Core hole processes in x-ray absorption and photoemission by resonant Auger-electron spectroscopy and first-principles theory, 2020, Physical Review B

Other papers connected to Woicik's research area, though led by different authors, include:

  • Local ordering in Ge/Ge-Sn semiconductor alloy core/shell nanowires revealed by extended x-ray absorption fine structure (EXAFS), 2023, Applied Physics Letters
  • Analysing trimethylaluminum infiltration into polymer brushes using a scalable area selective vapor phase process, 2020, Materials Advances
  • Identification of structural phases in ferroelectric hafnium zirconium oxide by density-functional-theory-assisted EXAFS analysis, 2021, Applied Physics Letters

Frequent coauthors collaborating with Joseph C. Woicik include:

  • Conan Weiland
  • Eric L. Shirley
  • G. Hughes
  • Robert O'Connor
  • Abdul K. Rumaiz

Best Publications

  • Relation between the redox state of iron-based nanoparticles and their cytotoxicity toward Escherichia coli.

    Mélanie Auffan;Wafa Achouak;Jérôme Rose;Marie-Anne Roncato

  • A Ferroelectric Oxide Made Directly on Silicon

    Maitri P. Warusawithana;Cheng Cen;Charles R. Sleasman;Joseph C. Woicik

  • Diffraction anomalous fine structure: A new x-ray structural technique.

    H. Stragier;J. O. Cross;J. J. Rehr;Larry B. Sorensen

  • Effect of Vinylene Carbonate and Fluoroethylene Carbonate on SEI Formation on Graphitic Anodes in Li-Ion Batteries

    Mengyun Nie;Julien Demeaux;Benjamin T. Young;David R. Heskett

  • Structural changes underlying the diffuse dielectric response in AgNbO 3

    Igor Levin;Victor Krayzman;Joseph C. Woicik;Jenia Karapetrova

  • Origin of the Bipolar Doping Behavior of SnO from X-ray Spectroscopy and Density Functional Theory

    N. F. Quackenbush;J. P. Allen;D. O. Scanlon;S. Sallis

  • Surface extended-x-ray-absorption fine structure and scanning tunneling microscopy of Si(001)2×1-Sb

    M. Richter;J. C. Woicik;J. Nogami;P. Pianetta

  • Dopant location identification in Nd 3 + -doped Ti O 2 nanoparticles

    W. Li;A. I. Frenkel;J. C. Woicik;C. Ni

  • Hybridization and bond-orbital components in site-specific X-ray photoelectron spectra of rutile TiO2.

    J. C. Woicik;E. J. Nelson;Leeor Kronik;Manish Jain

  • c-axis oriented epitaxial BaTiO3 films on (001) Si

    V. Vaithyanathan;V. Vaithyanathan;V. Vaithyanathan;J. Lettieri;J. Lettieri;W. Tian;W. Tian;A. Sharan

  • Correlations between the magnetic and structural properties of Ca-doped BiMnO 3

    H Woo;T A. Tyson;Mark Croft;S W. Cheong;S W. Cheong

  • Hard X-ray Photoelectron Spectroscopy (HAXPES

    Joseph C. Woicik

  • Hard X-ray Photoelectron Spectroscopy (HAXPES) Investigation of the Silicon Solid Electrolyte Interphase (SEI) in Lithium-Ion Batteries

    Benjamin T Young;David R Heskett;Cao Cuong Nguyen;Mengyun Nie

  • Direct Observation of Electrostatically Driven Band Gap Renormalization in a Degenerate Perovskite Transparent Conducting Oxide

    Z. Lebens-Higgins;D. O. Scanlon;H. Paik;S. Sallis

  • Effect of Sr Content and Strain on Sr Surface Segregation of La1-xSrxCo0.2Fe0.8O3-δ as Cathode Material for Solid Oxide Fuel Cells.

    Yang Yu;Karl F. Ludwig;Joseph C. Woicik;Srikanth Gopalan

  • Bonding at the K/Si(100) 2×1 interface: A surface extended x-ray-absorption fine-structure study

    T. Kendelewicz;P. Soukiassian;P. Soukiassian;R.S. List;J.C. Woicik

  • Local atomic order and hierarchical polar nanoregions in a classical relaxor ferroelectric

    M. Eremenko;V. Krayzman;A. Bosak;H. Y. Playford

  • Nature of the metal insulator transition in ultrathin epitaxial vanadium dioxide.

    N. F. Quackenbush;J. W. Tashman;J. A. Mundy;S. Sallis

  • Local-structure origins of the sustained Curie temperature in (Ba,Ca)TiO3 ferroelectrics

    Igor Levin;Victor Krayzman;Joseph C. Woicik

  • Character of the insulating state in NiO : A mixture of charge-transfer and Mott-Hubbard character

    T. M. Schuler;D. L. Ederer;S. Itza-Ortiz;G. T. Woods

  • La-doped BaSnO3—Degenerate perovskite transparent conducting oxide: Evidence from synchrotron x-ray spectroscopy

    S. Sallis;D. O. Scanlon;S. C. Chae;N. F. Quackenbush

  • Gold-induced germanium crystallization

    Zhengquan Tan;S. M. Heald;M. Rapposch;C. E. Bouldin

  • Near-neighbor mixing and bond dilation in mechanically alloyed Cu-Fe

    V. G. Harris;K. M. Kemner;B. N. Das;N. C. Koon

Frequent Co-Authors

W. E. Spicer
W. E. Spicer Stanford University
Igor Levin
Igor Levin National Institute of Standards and Technology
Daniel A. Fischer
Daniel A. Fischer National Institute of Standards and Technology
Darrell G. Schlom
Darrell G. Schlom Cornell University
Louis F. J. Piper
Louis F. J. Piper University of Warwick
Michael J. Bedzyk
Michael J. Bedzyk Northwestern University
Matthew G. Tucker
Matthew G. Tucker Oak Ridge National Laboratory
Brett L. Lucht
Brett L. Lucht University of Rhode Island
Paul Kirsch
Paul Kirsch Samsung Austin Semiconductor
David A. Muller
David A. Muller Cornell University

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