World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
67
Citations
15163
World Ranking
1099
National Ranking
463

Materials Science

D-Index
68
Citations
15710
World Ranking
4893
National Ranking
1292

Bruce B. Doris publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Bruce B. Doris sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 477 publications — 82nd percentile

82% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Bruce B. Doris D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Bruce B. Doris sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 67 D-Index — 85th percentile

85% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

What is he best known for?

The fields of study he is best known for:

  • Semiconductor
  • Optoelectronics
  • Transistor

His primary scientific interests are in Optoelectronics, Electrical engineering, CMOS, Layer and Silicon on insulator. His Optoelectronics research is multidisciplinary, incorporating perspectives in Field-effect transistor, Substrate, Gate oxide and Semiconductor device. His work carried out in the field of Substrate brings together such families of science as Ultimate tensile strength, Stress, Etching, Electronic engineering and Nitride.

The concepts of his CMOS study are interwoven with issues in Electronic circuit, Nanotechnology, NMOS logic, Second source and PMOS logic. Undercut is closely connected to Communication channel in his research, which is encompassed under the umbrella topic of Silicon on insulator. His Gate dielectric research is multidisciplinary, incorporating elements of High-κ dielectric and Metal gate.

His most cited work include:

  • Silicon device scaling to the sub-10-nm regime. (453 citations)
  • Smooth and vertical semiconductor fin structure (235 citations)
  • Hybrid planar and FinFET CMOS devices (215 citations)

What are the main themes of his work throughout his whole career to date?

Bruce B. Doris spends much of his time researching Optoelectronics, Layer, Electrical engineering, Electronic engineering and Substrate. His Optoelectronics research includes elements of Semiconductor device and Gate oxide. In Gate oxide, Bruce B. Doris works on issues like Gate dielectric, which are connected to High-κ dielectric.

His study in the field of Etching and Substrate is also linked to topics like Stack. Bruce B. Doris focuses mostly in the field of Electronic engineering, narrowing it down to topics relating to Fin and, in certain cases, Structural engineering. His research in Substrate intersects with topics in Trench and Stress.

He most often published in these fields:

  • Optoelectronics (80.33%)
  • Layer (35.37%)
  • Electrical engineering (27.11%)

What were the highlights of his more recent work (between 2014-2021)?

  • Optoelectronics (80.33%)
  • Layer (35.37%)
  • Electronic engineering (25.62%)

In recent papers he was focusing on the following fields of study:

Bruce B. Doris focuses on Optoelectronics, Layer, Electronic engineering, Substrate and Semiconductor device. His work in Optoelectronics covers topics such as Epitaxy which are related to areas like Doping. His studies deal with areas such as Structural engineering and Dielectric as well as Layer.

His research on Electronic engineering also deals with topics like

  • Fin together with Communication channel,
  • Semiconductor materials which connect with Semiconductor structure. The various areas that Bruce B. Doris examines in his Substrate study include Stress and Dopant. His studies in Semiconductor device integrate themes in fields like Oxide, Nanosheet, Substrate, MOSFET and Gate stack.

Between 2014 and 2021, his most popular works were:

  • Nanosheet MOSFET with full-height air-gap spacer (86 citations)
  • Finfet structures having silicon germanium and silicon fins (71 citations)
  • Atomic layer deposition sealing integration for nanosheet complementary metal oxide semiconductor with replacement spacer (47 citations)

In his most recent research, the most cited papers focused on:

  • Semiconductor
  • Transistor
  • Electrical engineering

His primary areas of study are Optoelectronics, Electronic engineering, Layer, Semiconductor device and Substrate. His study in Optoelectronics is interdisciplinary in nature, drawing from both Electrical engineering, Fin and Epitaxy. His Electronic engineering research includes elements of Semiconductor structure, Substrate, Dielectric layer, Silicon-germanium and Fin.

Bruce B. Doris focuses mostly in the field of Layer, narrowing it down to matters related to Oxide and, in some cases, Diffusion capacitance. His Semiconductor device research includes themes of Nanosheet, Insulator and MOSFET. His Substrate research incorporates elements of Etching and Wafer.

Best Publications

  • Silicon Device Scaling to the Sub-10-nm Regime

    Meikei Ieong;Bruce Doris;Jakub Kedzierski;Ken Rim

  • Smooth and vertical semiconductor fin structure

    Kangguo Cheng;Bruce B. Doris;Johnathan E. Faltermeier;Ying Zhang

  • Extreme scaling with ultra-thin Si channel MOSFETs

    B. Doris;Meikei Ieong;T. Kanarsky;Ying Zhang

  • A Comparative Study of NBTI and PBTI (Charge Trapping) in SiO2/HfO2 Stacks with FUSI, TiN, Re Gates

    S. Zafar;Y.H. Kim;V. Narayanan;C. Cabral

  • Hybrid planar and FinFET CMOS devices

    Bruce B. Doris;Diane C. Boyd;Meikei Ieong;Thomas S. Kanarsky

  • Structure and method to improve channel mobility by gate electrode stress modification

    Michael P. Belyansky;Dureseti Chidambarrao;Omer H. Dokumaci;Bruce B. Doris

  • Stress leading space layer

    Chadanbalao D;Documach O H;Duoris B B

  • Integrated circuit with a thin body field effect transistor and capacitor

    Kangguo Cheng;Bruce Doris;Ali Khakifirooz;Ghavam G. Shahidi

  • Extrem-dünner-Halbleiter-auf-Isolator(ETSOI)-FET mit einem Rück-Gate und verringerter Parasitärkapazität sowie Verfahren zu dessen Herstellung

    Khakifirooz Ali;Doris Bruce B;Cheng Kangguo

  • High-k/metal gate cmos finfet with improved pfet threshold voltage

    Veeraraghavan S. Basker;Kangguo Cheng;Bruce B. Doris;Johnathan E. Faltermeier

  • High-performance cmos soi device on hybrid crystal-oriented substrates

    Bruce B. Doris;Kathryn W. Guarini;Meikei Ieong;Shreesh Narasimha

  • Field effect transistor with stressed channel and producing method thereof

    Doris Brews B;Zidambarao Dursedi

  • Challenges and solutions of FinFET integration in an SRAM cell and a logic circuit for 22 nm node and beyond

    H. Kawasaki;V. S. Basker;T. Yamashita;C.-H. Lin

  • Structures and methods for making strained mosfets

    Huilong Zhu;Steven W. Bedell;Bruce B. Doris;Ying Zhang

  • Strained finfet cmos device structures

    Bruce B. Doris;Dureseti Chidambarrao;Meikei Ieong;Jack A. Mandelman

  • Extremely thin SOI (ETSOI) CMOS with record low variability for low power system-on-chip applications

    K. Cheng;A. Khakifirooz;P. Kulkarni;S. Ponoth

  • Ultra thin body fully-depleted soi mosfets

    Bruce B. Doris;Meikei Ieong;Zhibin Ren;Paul M. Solomon

  • Method and manufacture of thin silicon on insulator (SOI) with recessed channel

    Huilong Zhu;Bruce B. Doris;Werner A. Rausch;Ying Zhang

  • Isolation structure for applying stress pattern

    Chidanbalrao D;Docunmatz O H;Doris B B

  • Method for fabricating an integrated circuit

    Bruce Doris;Ying Zhang;Kangguo Cheng

Frequent Co-Authors

Kangguo Cheng
Kangguo Cheng IBM (United States)
Ali Khakifirooz
Ali Khakifirooz Intel (United States)
Alexander Reznicek
Alexander Reznicek IBM (United States)
Ghavam G. Shahidi
Ghavam G. Shahidi IBM (United States)
Vamsi K. Paruchuri
Vamsi K. Paruchuri IBM (United States)
Huilong Zhu
Huilong Zhu Chinese Academy of Sciences
Meikei Ieong
Meikei Ieong Simbury Limited
Vijay Narayanan
Vijay Narayanan IBM (United States)
Oleg Gluschenkov
Oleg Gluschenkov IBM (United States)
Steven J. Holmes
Steven J. Holmes IBM (United States)

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