His primary scientific interests are in Optoelectronics, Electrical engineering, CMOS, Layer and Silicon on insulator. His Optoelectronics research is multidisciplinary, incorporating perspectives in Field-effect transistor, Substrate, Gate oxide and Semiconductor device. His work carried out in the field of Substrate brings together such families of science as Ultimate tensile strength, Stress, Etching, Electronic engineering and Nitride.
The concepts of his CMOS study are interwoven with issues in Electronic circuit, Nanotechnology, NMOS logic, Second source and PMOS logic. Undercut is closely connected to Communication channel in his research, which is encompassed under the umbrella topic of Silicon on insulator. His Gate dielectric research is multidisciplinary, incorporating elements of High-κ dielectric and Metal gate.
Bruce B. Doris spends much of his time researching Optoelectronics, Layer, Electrical engineering, Electronic engineering and Substrate. His Optoelectronics research includes elements of Semiconductor device and Gate oxide. In Gate oxide, Bruce B. Doris works on issues like Gate dielectric, which are connected to High-κ dielectric.
His study in the field of Etching and Substrate is also linked to topics like Stack. Bruce B. Doris focuses mostly in the field of Electronic engineering, narrowing it down to topics relating to Fin and, in certain cases, Structural engineering. His research in Substrate intersects with topics in Trench and Stress.
Bruce B. Doris focuses on Optoelectronics, Layer, Electronic engineering, Substrate and Semiconductor device. His work in Optoelectronics covers topics such as Epitaxy which are related to areas like Doping. His studies deal with areas such as Structural engineering and Dielectric as well as Layer.
His research on Electronic engineering also deals with topics like
His primary areas of study are Optoelectronics, Electronic engineering, Layer, Semiconductor device and Substrate. His study in Optoelectronics is interdisciplinary in nature, drawing from both Electrical engineering, Fin and Epitaxy. His Electronic engineering research includes elements of Semiconductor structure, Substrate, Dielectric layer, Silicon-germanium and Fin.
Bruce B. Doris focuses mostly in the field of Layer, narrowing it down to matters related to Oxide and, in some cases, Diffusion capacitance. His Semiconductor device research includes themes of Nanosheet, Insulator and MOSFET. His Substrate research incorporates elements of Etching and Wafer.
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Silicon Device Scaling to the Sub-10-nm Regime
Meikei Ieong;Bruce Doris;Jakub Kedzierski;Ken Rim.
Science (2004)
Smooth and vertical semiconductor fin structure
Kangguo Cheng;Bruce B. Doris;Johnathan E. Faltermeier;Ying Zhang.
(2008)
Extreme scaling with ultra-thin Si channel MOSFETs
B. Doris;Meikei Ieong;T. Kanarsky;Ying Zhang.
international electron devices meeting (2002)
A Comparative Study of NBTI and PBTI (Charge Trapping) in SiO2/HfO2 Stacks with FUSI, TiN, Re Gates
S. Zafar;Y.H. Kim;V. Narayanan;C. Cabral.
symposium on vlsi technology (2006)
Hybrid planar and FinFET CMOS devices
Bruce B. Doris;Diane C. Boyd;Meikei Ieong;Thomas S. Kanarsky.
(2005)
Structure and method to improve channel mobility by gate electrode stress modification
Michael P. Belyansky;Dureseti Chidambarrao;Omer H. Dokumaci;Bruce B. Doris.
(2005)
Stress leading space layer
Chadanbalao D;Documach O H;Duoris B B.
(2004)
Structure and method to improve channel mobility by gate electrode stress modification
Belyansky Michael P;Deris Bruce B;Oleg Gluschenkov;Dokumaci Omer H.
(2005)
Integrated circuit with a thin body field effect transistor and capacitor
Kangguo Cheng;Bruce Doris;Ali Khakifirooz;Ghavam G. Shahidi.
(2012)
High-k/metal gate cmos finfet with improved pfet threshold voltage
Veeraraghavan S. Basker;Kangguo Cheng;Bruce B. Doris;Johnathan E. Faltermeier.
(2009)
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