D-Index & Metrics Best Publications

D-Index & Metrics D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines.

Discipline name D-index D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines. Citations Publications World Ranking National Ranking
Electronics and Electrical Engineering D-index 39 Citations 6,639 240 World Ranking 2941 National Ranking 1153

Overview

What is he best known for?

The fields of study he is best known for:

  • Semiconductor
  • Transistor
  • Electrical engineering

His main research concerns Optoelectronics, Nanowire, Electrical engineering, Layer and Nanotechnology. His research investigates the connection between Optoelectronics and topics such as Field-effect transistor that intersect with problems in Insulator. His work carried out in the field of Nanowire brings together such families of science as Capacitance, Wafer, Inverter and Doping.

His Layer research includes elements of Threshold voltage, Transistor and Gate stack. He studied CMOS and Node that intersect with Integrated circuit layout. His Silicon on insulator research integrates issues from Metal gate and Logic gate.

His most cited work include:

  • Stable SRAM cell design for the 32 nm node and beyond (531 citations)
  • High performance and highly uniform gate-all-around silicon nanowire MOSFETs with wire size dependent scaling (199 citations)
  • High-performance cmos soi device on hybrid crystal-oriented substrates (176 citations)

What are the main themes of his work throughout his whole career to date?

His primary areas of study are Optoelectronics, Electrical engineering, Nanowire, Layer and Field-effect transistor. The study incorporates disciplines such as Gate dielectric, Electronic engineering and Gate oxide in addition to Optoelectronics. When carried out as part of a general Electrical engineering research project, his work on Transistor, CMOS, Gate stack and Static random-access memory is frequently linked to work in Communication channel, therefore connecting diverse disciplines of study.

Jeffrey W. Sleight combines subjects such as Wafer, Semiconductor and Epitaxy with his study of Nanowire. His work in the fields of Layer, such as Substrate, Semiconductor device and Etching, overlaps with other areas such as Conformal map. His Field-effect transistor study incorporates themes from Semiconductor materials, Substrate, Doping and Integrated circuit.

He most often published in these fields:

  • Optoelectronics (83.91%)
  • Electrical engineering (40.23%)
  • Nanowire (36.02%)

What were the highlights of his more recent work (between 2013-2017)?

  • Optoelectronics (83.91%)
  • Nanowire (36.02%)
  • Layer (30.65%)

In recent papers he was focusing on the following fields of study:

His primary areas of investigation include Optoelectronics, Nanowire, Layer, Wafer and Nanotechnology. The study incorporates disciplines such as Field-effect transistor, Electronic engineering and Substrate, Gate oxide in addition to Optoelectronics. To a larger extent, Jeffrey W. Sleight studies Electrical engineering with the aim of understanding Field-effect transistor.

His Layer research is multidisciplinary, incorporating perspectives in Silicon on insulator, Bipolar junction transistor and Germanium. His Wafer research incorporates themes from Trench and Doping. His Nanotechnology study integrates concerns from other disciplines, such as Electron beam processing and Transistor.

Between 2013 and 2017, his most popular works were:

  • Investigating surface loss effects in superconducting transmon qubits (55 citations)
  • Local germanium condensation for suspended nanowire and finFET devices (13 citations)
  • Stacked planar double-gate lamellar field-effect transistor (12 citations)

In his most recent research, the most cited papers focused on:

  • Semiconductor
  • Transistor
  • Integrated circuit

Jeffrey W. Sleight mostly deals with Optoelectronics, Nanowire, Layer, Wafer and Nanotechnology. His Optoelectronics study combines topics from a wide range of disciplines, such as Field-effect transistor, Electronic engineering, Electrical engineering and Gate oxide. His Electronic engineering research includes themes of Silicon and Dielectric.

The various areas that Jeffrey W. Sleight examines in his Gate oxide study include Gate dielectric and CMOS. His studies deal with areas such as Semiconductor device and Semiconductor as well as Nanowire. His Nanotechnology research is multidisciplinary, relying on both Band gap and Insulator.

This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.

Best Publications

Stable SRAM cell design for the 32 nm node and beyond

L. Chang;D.M. Fried;J. Hergenrother;J.W. Sleight.
symposium on vlsi technology (2005)

810 Citations

High performance and highly uniform gate-all-around silicon nanowire MOSFETs with wire size dependent scaling

S. Bangsaruntip;G. M. Cohen;A. Majumdar;Y. Zhang.
international electron devices meeting (2009)

471 Citations

Gate-all-around silicon nanowire 25-stage CMOS ring oscillators with diameter down to 3 nm

S. Bangsaruntip;A. Majumdar;G. M. Cohen;S. U. Engelmann.
symposium on vlsi technology (2010)

221 Citations

High-performance cmos soi device on hybrid crystal-oriented substrates

Bruce B. Doris;Kathryn W. Guarini;Meikei Ieong;Shreesh Narasimha.
(2003)

199 Citations

Nanowire field-effect transistors

Sarunya Bangsaruntip;Guy M. Cohen;Shreesh Narasimha;Jeffrey W. Sleight.
(2012)

192 Citations

Hybrid CMOS technology with nanowire devices and double gated planar devices

Sarunya Bangsaruntip;Josephine B. Chang;Leland Chang;Jeffrey W. Sleight.
(2012)

188 Citations

Field-effect transistor inverter and fabricating method thereof

Josephine Chang;Paul Chang;Guillorn Michael A;Jeffrey Sleight.
(2010)

169 Citations

Measurement of Carrier Mobility in Silicon Nanowires

Oki Gunawan;Lidija Sekaric;Amlan Majumdar;Michael Rooks.
Nano Letters (2008)

167 Citations

Universality of Short-Channel Effects in Undoped-Body Silicon Nanowire MOSFETs

Sarunya Bangsaruntip;Guy M Cohen;Amlan Majumdar;Jeffrey W Sleight.
IEEE Electron Device Letters (2010)

150 Citations

Hybrid crystal orientation cmos structure for adaptive well biasing and for power and performance enhancement

Kerry Bernstein;Min Yang.
(2006)

143 Citations

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