World's Best Scientists 2026 revealed!
Jeffrey W. Sleight

Jeffrey W. Sleight

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
46
Citations
7754
World Ranking
3416
National Ranking
1256

Jeffrey W. Sleight publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Jeffrey W. Sleight sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 253 publications — 45th percentile

45% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Jeffrey W. Sleight D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Jeffrey W. Sleight sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 46 D-Index — 52nd percentile

52% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

What is he best known for?

The fields of study he is best known for:

  • Semiconductor
  • Transistor
  • Electrical engineering

His main research concerns Optoelectronics, Nanowire, Electrical engineering, Layer and Nanotechnology. His research investigates the connection between Optoelectronics and topics such as Field-effect transistor that intersect with problems in Insulator. His work carried out in the field of Nanowire brings together such families of science as Capacitance, Wafer, Inverter and Doping.

His Layer research includes elements of Threshold voltage, Transistor and Gate stack. He studied CMOS and Node that intersect with Integrated circuit layout. His Silicon on insulator research integrates issues from Metal gate and Logic gate.

His most cited work include:

  • Stable SRAM cell design for the 32 nm node and beyond (531 citations)
  • High performance and highly uniform gate-all-around silicon nanowire MOSFETs with wire size dependent scaling (199 citations)
  • High-performance cmos soi device on hybrid crystal-oriented substrates (176 citations)

What are the main themes of his work throughout his whole career to date?

His primary areas of study are Optoelectronics, Electrical engineering, Nanowire, Layer and Field-effect transistor. The study incorporates disciplines such as Gate dielectric, Electronic engineering and Gate oxide in addition to Optoelectronics. When carried out as part of a general Electrical engineering research project, his work on Transistor, CMOS, Gate stack and Static random-access memory is frequently linked to work in Communication channel, therefore connecting diverse disciplines of study.

Jeffrey W. Sleight combines subjects such as Wafer, Semiconductor and Epitaxy with his study of Nanowire. His work in the fields of Layer, such as Substrate, Semiconductor device and Etching, overlaps with other areas such as Conformal map. His Field-effect transistor study incorporates themes from Semiconductor materials, Substrate, Doping and Integrated circuit.

He most often published in these fields:

  • Optoelectronics (83.91%)
  • Electrical engineering (40.23%)
  • Nanowire (36.02%)

What were the highlights of his more recent work (between 2013-2017)?

  • Optoelectronics (83.91%)
  • Nanowire (36.02%)
  • Layer (30.65%)

In recent papers he was focusing on the following fields of study:

His primary areas of investigation include Optoelectronics, Nanowire, Layer, Wafer and Nanotechnology. The study incorporates disciplines such as Field-effect transistor, Electronic engineering and Substrate, Gate oxide in addition to Optoelectronics. To a larger extent, Jeffrey W. Sleight studies Electrical engineering with the aim of understanding Field-effect transistor.

His Layer research is multidisciplinary, incorporating perspectives in Silicon on insulator, Bipolar junction transistor and Germanium. His Wafer research incorporates themes from Trench and Doping. His Nanotechnology study integrates concerns from other disciplines, such as Electron beam processing and Transistor.

Between 2013 and 2017, his most popular works were:

  • Investigating surface loss effects in superconducting transmon qubits (55 citations)
  • Local germanium condensation for suspended nanowire and finFET devices (13 citations)
  • Stacked planar double-gate lamellar field-effect transistor (12 citations)

In his most recent research, the most cited papers focused on:

  • Semiconductor
  • Transistor
  • Integrated circuit

Jeffrey W. Sleight mostly deals with Optoelectronics, Nanowire, Layer, Wafer and Nanotechnology. His Optoelectronics study combines topics from a wide range of disciplines, such as Field-effect transistor, Electronic engineering, Electrical engineering and Gate oxide. His Electronic engineering research includes themes of Silicon and Dielectric.

The various areas that Jeffrey W. Sleight examines in his Gate oxide study include Gate dielectric and CMOS. His studies deal with areas such as Semiconductor device and Semiconductor as well as Nanowire. His Nanotechnology research is multidisciplinary, relying on both Band gap and Insulator.

Best Publications

  • Stable SRAM cell design for the 32 nm node and beyond

    L. Chang;D.M. Fried;J. Hergenrother;J.W. Sleight

  • High performance and highly uniform gate-all-around silicon nanowire MOSFETs with wire size dependent scaling

    S. Bangsaruntip;G. M. Cohen;A. Majumdar;Y. Zhang

  • Gate-all-around silicon nanowire 25-stage CMOS ring oscillators with diameter down to 3 nm

    S. Bangsaruntip;A. Majumdar;G. M. Cohen;S. U. Engelmann

  • Microfabrication of a Mechanically Controllable Break Junction in Silicon

    C. Zhou;C. J. Muller;M. R. Deshpande;J. W. Sleight

  • Universality of Short-Channel Effects in Undoped-Body Silicon Nanowire MOSFETs

    Sarunya Bangsaruntip;Guy M Cohen;Amlan Majumdar;Jeffrey W Sleight

  • High-performance cmos soi device on hybrid crystal-oriented substrates

    Bruce B. Doris;Kathryn W. Guarini;Meikei Ieong;Shreesh Narasimha

  • Nanowire field-effect transistors

    Sarunya Bangsaruntip;Guy M. Cohen;Shreesh Narasimha;Jeffrey W. Sleight

  • Hybrid CMOS technology with nanowire devices and double gated planar devices

    Sarunya Bangsaruntip;Josephine B. Chang;Leland Chang;Jeffrey W. Sleight

  • Measurement of Carrier Mobility in Silicon Nanowires

    Oki Gunawan;Lidija Sekaric;Amlan Majumdar;Michael Rooks

  • Field-effect transistor inverter and fabricating method thereof

    Josephine Chang;Paul Chang;Guillorn Michael A;Jeffrey Sleight

  • Nanowire Mesh FET with Multiple Threshold Voltages

    Josephine B. Chang;Paul Chang;Michael A. Guillorn;Jeffrey W. Sleight

  • Role of oxygen vacancies in V/sub FB//V/sub t/ stability of pFET metals on HfO/sub 2/

    E. Cartier;F.R. McFeely;V. Narayanan;P. Jamison

  • Techniques for metal gate workfunction engineering to enable multiple threshold voltage FINFET devices

    Josephine B. Chang;Isaac Lauer;Chung-Hsun Lin;Jeffrey W. Sleight

  • Investigating surface loss effects in superconducting transmon qubits

    Jay M. Gambetta;Conal E. Murray;Y.-K.-K. Fung;Douglas T. McClure

  • Method for manufacturing strain silicon mixing underlay and silicon mixing underlay

    Meikei Ieong;Shreesh Narasimha;Alexander Reznicek;Kern Rim

  • High-performance high-κ/metal gates for 45nm CMOS and beyond with gate-first processing

    M. Chudzik;B. Doris;R. Mo;J. Sleight

  • Ultra-thin SOI CMOS with raised epitaxial source and drain and embedded SiGe PFET extension

    Amlan Majumdar;Gen Pei;Zhibin Ren;Dinkar Singh

  • Maskless process for suspending and thinning nanowires

    Sarunya Bangsaruntip;Guy Cohen;Jeffrey W. Sleight

  • Density scaling with gate-all-around silicon nanowire MOSFETs for the 10 nm node and beyond

    S. Bangsaruntip;K. Balakrishnan;S.-L Cheng;J. Chang

  • Nanomesh SRAM cell

    Josephine Chang;Paul Chang;Michael A. Guillorn;Jeffrey Sleight

  • Silicon nanotube mosfet

    Daniel Tekleab;Hung H. Tran;Jeffrey W. Sleight;Dureseti Chidambarrao

Frequent Co-Authors

Josephine B. Chang
Josephine B. Chang Northrop Grumman (United States)
Leland Chang
Leland Chang IBM Research - Thomas J. Watson Research Center
Michael A. Guillorn
Michael A. Guillorn IBM (United States)
Guy M. Cohen
Guy M. Cohen IBM (United States)
Wilfried Haensch
Wilfried Haensch Argonne National Laboratory
Ghavam G. Shahidi
Ghavam G. Shahidi IBM (United States)
Meikei Ieong
Meikei Ieong Simbury Limited
Martin M. Frank
Martin M. Frank IBM (United States)
Vijay Narayanan
Vijay Narayanan IBM (United States)
Bruce B. Doris
Bruce B. Doris IBM (United States)

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