Terence B. Hook is affiliated with IBM in the United States, where they conduct research in the field of engineering, with a primary focus on electrical and electronic engineering. Their work emphasizes advancements in semiconductor technology and integrated circuit design.
The main topics of Terence B. Hook's research include:
They have contributed scholarly work primarily published in the venue IEEE Transactions on Electron Devices.
One of their recent papers is titled Impact of Hot-Carrier Degradation on Drain-Induced Barrier Lowering in Multifin SOI n-Channel FinFETs With Self-Heating, published in 2020 in IEEE Transactions on Electron Devices.
Terence B. Hook collaborates frequently with several researchers including:
Their research involves detailed analysis of semiconductor device performance and reliability, focusing on effects such as hot-carrier degradation in nanoscale device architectures. This work contributes to understanding how semiconductor devices behave under electrical stress and how these phenomena affect device stability and circuit functionality.
N. Loubet;T. Hook;P. Montanini;C.-W. Yeung
Terence B. Hook
R. Xie;P. Montanini;K. Akarvardar;N. Tripathi
Henry A. Bonges;David L. Harmon;Terence B. Hook;Wing L. Lai
Seong-Dong Kim;Michael Guillorn;Isaac Lauer;Phil Oldiges
T.B. Hook;J. Brown;P. Cottrell;E. Adler
V. Chan;R. Rengarajan;N. Rovedo;Wei Jin
T.B. Hook;E. Adler;F. Guarin;J. Lukaitis
Wilfried Haensch;Terence B. Hook;Louis C. Hsu;Rajiv V. Joshi
Z. Luo;A. Steegen;M. Eller;R. Mann
S.V. Kosonocky;M. Irnmediato;P. Cottrell;T. Hook
K. I. Seo;B. Haran;D. Gupta;D. Guo
Zhi Cheng Yuan;Shahriar Rizwan;Michael Wong;Kyle Holland
C.-H. Lin;R. Kambhampati;R. J. Miller;T. B. Hook
Chuan Hsi Liu;Ming T. Lee;Chih Yung Lin;Jenkon Chen
Joel T. Ficke;William E. Hall;Terence B. Hook;Michael A. Sperling
C.H. Liu;M.T. Lee;Chih-Yung Lin;J. Chen
L. Grenouillet;M. Vinet;J. Gimbert;B. Giraud
Xiaobin Yuan;Jae-Eun Park;Jing Wang;Enhai Zhao
T.G. Ference;J.S. Burnham;W.F. Clark;T.B. Hook
Terence B. Hook;T. P. Ma
Q. Liu;F. Monsieur;A. Kumar;T. Yamamoto
D. Guo;G. Karve;G. Tsutsui;K-Y Lim
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