The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Terence B. Hook sits on this spectrum.
This scientist: 135 publications — 10th percentile
10% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 1,065 publications or more.
The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Terence B. Hook sits on this spectrum.
This scientist: 30 D-Index — 3rd percentile
3% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 111 D-Index or more.
Terence B. Hook is affiliated with IBM in the United States, where they conduct research in the field of engineering, with a primary focus on electrical and electronic engineering. Their work emphasizes advancements in semiconductor technology and integrated circuit design.
The main topics of Terence B. Hook's research include:
They have contributed scholarly work primarily published in the venue IEEE Transactions on Electron Devices.
One of their recent papers is titled Impact of Hot-Carrier Degradation on Drain-Induced Barrier Lowering in Multifin SOI n-Channel FinFETs With Self-Heating, published in 2020 in IEEE Transactions on Electron Devices.
Terence B. Hook collaborates frequently with several researchers including:
Their research involves detailed analysis of semiconductor device performance and reliability, focusing on effects such as hot-carrier degradation in nanoscale device architectures. This work contributes to understanding how semiconductor devices behave under electrical stress and how these phenomena affect device stability and circuit functionality.
N. Loubet;T. Hook;P. Montanini;C.-W. Yeung
Terence B. Hook
R. Xie;P. Montanini;K. Akarvardar;N. Tripathi
Henry A. Bonges;David L. Harmon;Terence B. Hook;Wing L. Lai
Seong-Dong Kim;Michael Guillorn;Isaac Lauer;Phil Oldiges
T.B. Hook;J. Brown;P. Cottrell;E. Adler
V. Chan;R. Rengarajan;N. Rovedo;Wei Jin
T.B. Hook;E. Adler;F. Guarin;J. Lukaitis
Wilfried Haensch;Terence B. Hook;Louis C. Hsu;Rajiv V. Joshi
Z. Luo;A. Steegen;M. Eller;R. Mann
S.V. Kosonocky;M. Irnmediato;P. Cottrell;T. Hook
K. I. Seo;B. Haran;D. Gupta;D. Guo
Zhi Cheng Yuan;Shahriar Rizwan;Michael Wong;Kyle Holland
C.-H. Lin;R. Kambhampati;R. J. Miller;T. B. Hook
Chuan Hsi Liu;Ming T. Lee;Chih Yung Lin;Jenkon Chen
Joel T. Ficke;William E. Hall;Terence B. Hook;Michael A. Sperling
C.H. Liu;M.T. Lee;Chih-Yung Lin;J. Chen
L. Grenouillet;M. Vinet;J. Gimbert;B. Giraud
Xiaobin Yuan;Jae-Eun Park;Jing Wang;Enhai Zhao
T.G. Ference;J.S. Burnham;W.F. Clark;T.B. Hook
Terence B. Hook;T. P. Ma
Q. Liu;F. Monsieur;A. Kumar;T. Yamamoto
D. Guo;G. Karve;G. Tsutsui;K-Y Lim
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