World's Best Scientists 2026 revealed!
Julien Ryckaert

Julien Ryckaert

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
40
Citations
6294
World Ranking
4516
National Ranking
96

Julien Ryckaert publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Julien Ryckaert sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 213 publications — 33rd percentile

33% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Julien Ryckaert D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Julien Ryckaert sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 40 D-Index — 36th percentile

36% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Julien Ryckaert is affiliated with Imec in Belgium and specializes in the field of engineering, particularly within electrical and electronic engineering. Their research spans a wide array of topics including semiconductor materials and devices, advancements in semiconductor devices and circuit design, low-power high-performance VLSI design, 3D IC and TSV technologies, ferroelectric and negative capacitance devices, integrated circuits and semiconductor failure analysis, and VLSI and analog circuit testing.

Their publication record demonstrates active contribution to several leading venues in electronics and semiconductor research. Frequent publication outlets include:

  • IEEE Transactions on Electron Devices
  • 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • arXiv (Cornell University)
  • 2022 International Electron Devices Meeting (IEDM)

Julien's recent papers cover topics central to nanoscale semiconductor device technology and system design, including:

  • A Comprehensive Study of Nanosheet and Forksheet SRAM for Beyond N5 Node (2021, IEEE Transactions on Electron Devices)
  • PPAC of sheet-based CFET configurations for 4 track design with 16nm metal pitch (2022, 2022 IEEE Symposium on VLSI Technology and Circuits)
  • A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options Done by Virtual Fabrication (2020, IEEE Journal of the Electron Devices Society)
  • CFET SRAM DTCO, Interconnect Guideline, and Benchmark for CMOS Scaling (2023, IEEE Transactions on Electron Devices)
  • The Complementary FET (CFET) 6T-SRAM (2021, IEEE Transactions on Electron Devices)

Their work often involves collaboration with a focused group of co-authors, including:

  • Geert Hellings
  • Pieter Weckx
  • P. Schuddinck
  • A. Veloso
  • Shairfe Muhammad Salahuddin

Julien Ryckaert's research primarily contributes to advancing knowledge in semiconductor materials and devices, with a particular emphasis on complementary field-effect transistor (CFET) technologies and SRAM design. Their publications reflect an ongoing engagement with challenges surrounding transistor scalability, circuit design, and device benchmarking within the context of emerging semiconductor fabrication nodes.

Best Publications

  • Ultra-wideband channel model for communication around the human body

    A. Fort;J. Ryckaert;C. Desset;P. De Doncker

  • Channel model for wireless communication around human body

    J. Ryckaert;P. De Doncker;R. Meys;A. de Le Hoye

  • Ultra-wide-band transmitter for low-power wireless body area networks: design and evaluation

    J. Ryckaert;C. Desset;A. Fort;M. Badaroglu

  • Human++: autonomous wireless sensors for body area networks

    B. Gyselinckx;C. Van Hoof;J. Ryckaert;R.F. Yazicioglu

  • The Complementary FET (CFET) for CMOS scaling beyond N3

    J. Ryckaert;P. Schuddinck;P. Weckx;G. Bouche

  • Characterization of the ultra wideband body area propagation channel

    A. Fort;C. Desset;J. Ryckaert;P. De Doncker

  • A 0.65-to-1.4 nJ/Burst 3-to-10 GHz UWB All-Digital TX in 90 nm CMOS for IEEE 802.15.4a

    J. Ryckaert;G. Van der Plas;V. De Heyn;C. Desset

  • A 2-mm $^{2}$ 0.1–5 GHz Software-Defined Radio Receiver in 45-nm Digital CMOS

    V. Giannini;P. Nuzzo;C. Soens;K. Vengattaramane

  • Human++: Emerging Technology for Body Area Networks

    Bert Gyselinckx;Ruud Vullers;Chris Van Hoof;Julien Ryckaert

  • Ultra wide-band body area channel model

    A. Fort;C. Desset;J. Ryckaert;P. De Doncker

  • Future Logic Scaling: Towards Atomic Channels and Deconstructed Chips

    S. B. Samavedam;J. Ryckaert;E. Beyne;K. Ronse

  • A 2.4 GHz Low-Power Sixth-Order RF Bandpass $\Delta\Sigma$ Converter in CMOS

    J. Ryckaert;J. Borremans;B. Verbruggen;L. Bos

  • Design technology co-optimization for a robust 10nm Metal1 solution for logic design and SRAM

    Boris Vandewalle;Bharani Chava;Sushil Sakhare;Julien Ryckaert

  • Novel forksheet device architecture as ultimate logic scaling device towards 2nm

    P. Weckx;M. Gupta;Y. Oniki;L.-A. Ragnarsson

  • First Monolithic Integration of 3D Complementary FET (CFET) on 300mm Wafers

    S. Subramanian;M. Hosseini;T. Chiarella;S. Sarkar

  • A CMOS Ultra-Wideband Receiver for Low Data-Rate Communication

    J. Ryckaert;M. Verhelst;M. Badaroglu;S. D'Amico

  • SOP integration and codesign of antennas

    S. Brebels;J. Ryckaert;B. Come;S. Donnay

  • RF-to-Baseband Digitization in 40 nm CMOS With RF Bandpass $\Delta\Sigma$ Modulator and Polyphase Decimation Filter

    E. Martens;A. Bourdoux;A. Couvreur;R. Fasthuber

  • Multirate Cascaded Discrete-Time Low-Pass ΔΣ Modulator for GSM/Bluetooth/UMTS

    Lynn Bos;Gerd Vandersteen;Pieter Rombouts;Arnd Geis

  • Enabling Sub-5nm CMOS Technology Scaling Thinner and Taller!

    J. Ryckaert;R. Baert;D. Verkest;M. H. Na

  • A 16mA UWB 3-to-5GHz 20Mpulses/s Quadrature Analog Correlation Receiver in 0.18/spl mu/m CMOS

    J. Ryckaert;M. Badaroglu;V. De Heyn;G. Van der Plas

  • Challenges and opportunities in applying grapho-epitaxy DSA lithography to metal cut and contact/via applications

    Yuansheng Ma;J. Andres Torres;Germain Fenger;Yuri Granik

  • Implementation of templated DSA for via layer patterning at the 7nm node

    Roel Gronheid;Jan Doise;Jan Doise;Joost Bekaert;Boon Teik Chan

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