Julien Ryckaert is affiliated with Imec in Belgium and specializes in the field of engineering, particularly within electrical and electronic engineering. Their research spans a wide array of topics including semiconductor materials and devices, advancements in semiconductor devices and circuit design, low-power high-performance VLSI design, 3D IC and TSV technologies, ferroelectric and negative capacitance devices, integrated circuits and semiconductor failure analysis, and VLSI and analog circuit testing.
Their publication record demonstrates active contribution to several leading venues in electronics and semiconductor research. Frequent publication outlets include:
Julien's recent papers cover topics central to nanoscale semiconductor device technology and system design, including:
Their work often involves collaboration with a focused group of co-authors, including:
Julien Ryckaert's research primarily contributes to advancing knowledge in semiconductor materials and devices, with a particular emphasis on complementary field-effect transistor (CFET) technologies and SRAM design. Their publications reflect an ongoing engagement with challenges surrounding transistor scalability, circuit design, and device benchmarking within the context of emerging semiconductor fabrication nodes.
A. Fort;J. Ryckaert;C. Desset;P. De Doncker
J. Ryckaert;P. De Doncker;R. Meys;A. de Le Hoye
J. Ryckaert;C. Desset;A. Fort;M. Badaroglu
B. Gyselinckx;C. Van Hoof;J. Ryckaert;R.F. Yazicioglu
J. Ryckaert;P. Schuddinck;P. Weckx;G. Bouche
A. Fort;C. Desset;J. Ryckaert;P. De Doncker
J. Ryckaert;G. Van der Plas;V. De Heyn;C. Desset
V. Giannini;P. Nuzzo;C. Soens;K. Vengattaramane
Bert Gyselinckx;Ruud Vullers;Chris Van Hoof;Julien Ryckaert
A. Fort;C. Desset;J. Ryckaert;P. De Doncker
S. B. Samavedam;J. Ryckaert;E. Beyne;K. Ronse
J. Ryckaert;J. Borremans;B. Verbruggen;L. Bos
Boris Vandewalle;Bharani Chava;Sushil Sakhare;Julien Ryckaert
P. Weckx;M. Gupta;Y. Oniki;L.-A. Ragnarsson
S. Subramanian;M. Hosseini;T. Chiarella;S. Sarkar
J. Ryckaert;M. Verhelst;M. Badaroglu;S. D'Amico
S. Brebels;J. Ryckaert;B. Come;S. Donnay
E. Martens;A. Bourdoux;A. Couvreur;R. Fasthuber
Lynn Bos;Gerd Vandersteen;Pieter Rombouts;Arnd Geis
J. Ryckaert;R. Baert;D. Verkest;M. H. Na
J. Ryckaert;M. Badaroglu;V. De Heyn;G. Van der Plas
Yuansheng Ma;J. Andres Torres;Germain Fenger;Yuri Granik
Roel Gronheid;Jan Doise;Jan Doise;Joost Bekaert;Boon Teik Chan
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