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Eric Beyne

Eric Beyne

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
59
Citations
14816
World Ranking
1726
National Ranking
38

Overview

Eric Beyne is affiliated with Imec in Belgium and has contributed extensively to the field of engineering, with a particular focus on electrical and electronic engineering. Their research encompasses multiple subfields including biomedical engineering, mechanical engineering, atomic and molecular physics and optics, as well as electronic, optical, and magnetic materials.

The core topics of Eric Beyne's research involve advanced integration technologies and semiconductor innovations. These main topics include:

  • 3D IC and TSV technologies
  • Electronic Packaging and Soldering Technologies
  • Semiconductor materials and devices
  • Advanced Surface Polishing Techniques
  • Integrated Circuits and Semiconductor Failure Analysis
  • Advancements in Semiconductor Devices and Circuit Design
  • Electromagnetic Compatibility and Noise Suppression

Eric Beyne has contributed to several scientific publications over recent years, with selected papers reflecting their focus on 3D integration and device technologies:

  • "Buried Power Rails and Nano-Scale TSV: Technology Boosters for Backside Power Delivery Network and 3D Heterogeneous Integration" (2022), published in 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
  • "3D SoC integration, beyond 2.5D chiplets" (2021), published in 2021 IEEE International Electron Devices Meeting (IEDM)
  • "Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance" (2023), published in ECS Journal of Solid State Science and Technology
  • "Power, Performance, Area and Thermal Analysis of 2D and 3D ICs at A14 Node Designed with Back-side Power Delivery Network" (2022), published in 2022 International Electron Devices Meeting (IEDM)
  • "Entire Domain Basis Function Expansion of the Differential Surface Admittance for Efficient Broadband Characterization of Lossy Interconnects" (2020), published in IEEE Transactions on Microwave Theory and Techniques

Frequent co-authors collaborating with Eric Beyne include:

  • Geert Van der Plas
  • Gerald Beyer
  • Alain Phommahaxay
  • Anne Jourdain
  • Serena Iacovo

Eric Beyne's work has been published often in multiple venues, which serve as key platforms for disseminating research in electronics packaging, device technologies, and integrated circuits. These frequent publication venues include:

  • IEEE Transactions on Components Packaging and Manufacturing Technology
  • 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
  • ECS Journal of Solid State Science and Technology
  • 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
  • Microelectronic Engineering

Best Publications

  • Design Issues and Considerations for Low-Cost 3-D TSV IC Technology

    G Van der Plas;P Limaye;I Loi;A Mercha

  • MEMS for wireless communications: 'from RF-MEMS components to RF-MEMS-SiP'

    Harrie A C Tilmans;Walter De Raedt;Eric Beyne

  • Method of fabrication of a microstructure having an internal cavity

    Hendrikus A. C. Tilmans;Eric Beyne;Myriam Van de Peer

  • 3D integration by Cu-Cu thermo-compression bonding of extremely thinned bulk-Si die containing 10 μm pitch through-Si vias

    B. Swinnen;W. Ruythooren;P. De Moor;L. Bogaerts

  • Image sensor ball grid array package and the fabrication thereof

    Eric Beyne;Steve Lerner

  • System for fabrication of integrated tunable/switchable passive microwave and millimeter wave modules

    Hendrikus Tilmans;Eric Beyne;Henri Jansen;Walter De Raedt

  • 3D System Integration Technologies

    Eric Beyne

  • Method of transferring ultra-thin substrates and application of the method to the manufacture of a multi-layer thin film device

    Eric Beyne;Augustin Coello-Vera;Olivier Vendier

  • 3-D Technology Assessment: Path-Finding the Technology/Design Sweet-Spot

    P. Marchal;B. Bougard;G. Katti;M. Stucchi

  • 3D stacked IC demonstration using a through Silicon Via First approach

    J. Van Olmen;A. Mercha;G. Katti;C. Huyghebaert

  • The 3-D Interconnect Technology Landscape

    Eric Beyne

  • Thermal cycling reliability of SnAgCu and SnPb solder joints: A comparison for several IC-packages.

    Bart Vandevelde;Mario Gonzalez;Paresh Limaye;Petar Ratchev

  • The rise of the 3rd dimension for system intergration

    E. Beyne

  • Hermal cycling reliability of snagcu and snpb solder joints: a comparison for several ic-packages

    B. Vandevelde;M. Gonzalez;P. Limaye;P. Ratchev

  • Cu pumping in TSVs: Effect of pre-CMP thermal budget

    I. De Wolf;K. Croes;O. Varela Pedreira;R. Labie

  • Bow-tie slot antenna fed by CPW

    E.A Soliman;S Brebels;Peter Delmotte;Guy Vandenbosch

  • Multilayer thin-film MCM-D for the integration of high-performance RF and microwave circuits

    G. Carchon;K. Vaesen;S. Brebels;W. De Raedt

  • Comprehensive analysis of the impact of single and arrays of through silicon vias induced stress on high-k / metal gate CMOS performance

    A. Mercha;G. Van der Plas;V. Moroz;I. De Wolf

  • Method for producing electrical through hole interconnects and devices made thereof

    Eric Beyne;Riet Labie

  • The indent reflow sealing (IRS) technique-a method for the fabrication of sealed cavities for MEMS devices

    H.A.C. Tilmans;D.J. van de Peer;E. Beyne

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