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Eric Beyne

Eric Beyne

D-Index & Metrics

Discipline name D-Index World Ranking Current World Ranking National Ranking Current National Ranking Publications Citations
Electronics and Electrical Engineering 59 1726 1653 38 35 727 14816

Eric Beyne publications per year

The chart shows the history of publications by Eric Beyne between 1985 and 2025, highlighting the no. of papers published in each year and offering an overview of the publication velocity of this scholar. Eric Beyne published across 41 years, from 1985 to 2025, averaging 20.7 papers a year. Output peaked at 50 publications in 2024. 77 of the 847 publications appeared in the last two years.

No. of publications
10 20 30 40 50
Bar chart. Horizontal axis: year, 1985 to 2025. Vertical axis: number of publications, 0 to 50. Peak 50 publications in 2024. 1985: 1 publication 1986: 0 publications 1987: 0 publications 1988: 3 publications 1989: 2 publications 1990: 0 publications 1991: 1 publication 1992: 2 publications 1993: 5 publications 1994: 5 publications 1995: 5 publications 1996: 9 publications 1997: 9 publications 1998: 15 publications 1999: 18 publications 2000: 34 publications 2001: 11 publications 2002: 14 publications 2003: 27 publications 2004: 27 publications 2005: 16 publications 2006: 26 publications 2007: 13 publications 2008: 23 publications 2009: 15 publications 2010: 28 publications 2011: 31 publications 2012: 45 publications 2013: 24 publications 2014: 44 publications 2015: 39 publications 2016: 45 publications 2017: 26 publications 2018: 33 publications 2019: 40 publications 2020: 37 publications 2021: 33 publications 2022: 29 publications 2023: 35 publications 2024: 50 publications 2025: 27 publications
1985 2025

847 publications in total across all disciplines

View publications per year as a table
Eric Beyne: publications per year, 1985 to 2025
Year Publications
1985 1
1986 0
1987 0
1988 3
1989 2
1990 0
1991 1
1992 2
1993 5
1994 5
1995 5
1996 9
1997 9
1998 15
1999 18
2000 34
2001 11
2002 14
2003 27
2004 27
2005 16
2006 26
2007 13
2008 23
2009 15
2010 28
2011 31
2012 45
2013 24
2014 44
2015 39
2016 45
2017 26
2018 33
2019 40
2020 37
2021 33
2022 29
2023 35
2024 50
2025 27
Total 847
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Eric Beyne publications per year - data summary

  • Eric Beyne, a Electronics and Electrical Engineering scholar from Imec, has 847 publications recorded across 41 years, from 1985 to 2025.
  • The oldest publication on record dates to 1985 and the most recent to 2025.
  • The most productive year is 2024, with 50 publications.
  • The least productive years with any output are 1985 and 1991, with 1 publication each.
  • 3 of the 41 years in the span carry no publications at all (1986, 1987 and 1990).
  • The rate of publication averages 20.7 papers per year over the whole span, or 22.3 per year counting only the 38 years with at least one publication.
  • The last 5 years on the chart (2021-2025) hold 174 publications, 21% of the career total.
  • Split into equal eras - 1985-1998: 57 publications (4.1 per year); 1999-2012: 328 publications (23.4 per year); 2013-2025: 462 publications (35.5 per year).
  • Comparing the opening and closing eras, the overall trend of publication is rising.

Eric Beyne publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Eric Beyne sits on this spectrum.

No. of scientists
100 200 300 400
Bar chart with 53 bars. Horizontal axis: publications, 34–53 to 1,065+. Vertical axis: number of scientists, 0 to 445. Most scientists, 445, have 174–193 publications. The last bar groups every scientist with 1,065 publications or more. The highlighted bar, 714–733 publications, is where this scientist sits. 34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34–53 publications 1,065+

This scientist: 727 publications — 95th percentile

95% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

View publications distribution as a table
Number of Electronics and Electrical Engineering scientists by publication count, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
Publications Scientists This scientist
34–53 24
54–73 52
74–93 114
94–113 203
114–133 269
134–153 355
154–173 403
174–193 445
194–213 430
214–233 431
234–253 399
254–273 366
274–293 335
294–313 300
314–333 276
334–353 250
354–373 214
374–393 187
394–413 152
414–433 169
434–453 147
454–473 111
474–493 117
494–513 103
514–533 99
534–553 92
554–573 75
574–593 58
594–613 69
614–633 50
634–653 62
654–673 54
674–693 44
694–713 37
714–733 28 727
734–753 26
754–773 26
774–793 19
794–813 23
814–833 20
834–853 16
854–873 20
874–893 11
894–913 11
914–933 16
934–953 13
954–973 10
974–993 11
994–1,013 9
1,014–1,033 9
1,034–1,053 10
1,054–1,064 6
1,065+ 99
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Eric Beyne publication distribution in Electronics and Electrical Engineering in 2026 - data summary

  • The chart plots the publication count of all 6,875 Electronics and Electrical Engineering scientists ranked by Research.com in 2026, grouped into 53 ranges running from 34–53 to 1,065+ publications.
  • Eric Beyne, a Electronics and Electrical Engineering scholar from Imec, records 727 publications - the 95th percentile of the discipline.
  • 95% of ranked Electronics and Electrical Engineering scientists score the same or lower than Eric Beyne, and about 5% score higher.
  • The median of the discipline falls in the 254–273 publications range, and Eric Beyne ranks above the median.
  • The most crowded range is 174–193 publications, holding 445 scientists (6% of the field).
  • 60% of the field sits in the lowest quarter of the value range (up to 294–313 publications), so the distribution is heavily right-skewed and high scores are rare.
  • The final bar has no upper bound: it groups every scientist with 1,065 publications or more, 99 scientists in all (1% of the field).

Eric Beyne D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Eric Beyne sits on this spectrum.

No. of scientists
50 100 150 200 250
Bar chart with 82 bars. Horizontal axis: D-Index, 30 to 111+. Vertical axis: number of scientists, 0 to 263. Most scientists, 263, have 32 D-Index. The last bar groups every scientist with 111 D-Index or more. The highlighted bar, 59 D-Index, is where this scientist sits. 30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 59 D-Index — 75th percentile

75% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

View D-Index distribution as a table
Number of Electronics and Electrical Engineering scientists by D-index, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
D-Index Scientists This scientist
30 178
31 257
32 263
33 262
34 244
35 236
36 211
37 220
38 214
39 214
40 205
41 187
42 194
43 201
44 155
45 189
46 148
47 160
48 134
49 130
50 141
51 156
52 108
53 130
54 112
55 97
56 111
57 102
58 108
59 120 59
60 103
61 93
62 92
63 74
64 77
65 73
66 64
67 69
68 60
69 39
70 57
71 59
72 46
73 49
74 38
75 35
76 32
77 35
78 31
79 22
80 34
81 31
82 34
83 23
84 18
85 30
86 19
87 19
88 20
89 8
90 17
91 7
92 14
93 9
94 15
95 10
96 12
97 10
98 10
99 12
100 16
101 5
102 7
103 7
104 8
105 9
106 13
107 4
108 5
109 10
110 8
111+ 96
Download as CSV

Eric Beyne D-index placement in Electronics and Electrical Engineering in 2026 - data summary

  • The chart plots the discipline H-index (D-index) of all 6,875 Electronics and Electrical Engineering scientists ranked by Research.com in 2026, grouped into 82 ranges running from 30 to 111+ D-Index.
  • Eric Beyne, a Electronics and Electrical Engineering scholar from Imec, records 59 D-Index - the 75th percentile of the discipline.
  • 75% of ranked Electronics and Electrical Engineering scientists score the same or lower than Eric Beyne, and about 25% score higher.
  • The median of the discipline falls in the 46 D-Index range, and Eric Beyne ranks above the median.
  • The most crowded range is 32 D-Index, holding 263 scientists (4% of the field).
  • 60% of the field sits in the lowest quarter of the value range (up to 50 D-Index), so the distribution is heavily right-skewed and high scores are rare.
  • The final bar has no upper bound: it groups every scientist with 111 D-Index or more, 96 scientists in all (1% of the field).

Overview

Eric Beyne is affiliated with Imec in Belgium and has contributed extensively to the field of engineering, with a particular focus on electrical and electronic engineering. Their research encompasses multiple subfields including biomedical engineering, mechanical engineering, atomic and molecular physics and optics, as well as electronic, optical, and magnetic materials.

The core topics of Eric Beyne's research involve advanced integration technologies and semiconductor innovations. These main topics include:

  • 3D IC and TSV technologies
  • Electronic Packaging and Soldering Technologies
  • Semiconductor materials and devices
  • Advanced Surface Polishing Techniques
  • Integrated Circuits and Semiconductor Failure Analysis
  • Advancements in Semiconductor Devices and Circuit Design
  • Electromagnetic Compatibility and Noise Suppression

Eric Beyne has contributed to several scientific publications over recent years, with selected papers reflecting their focus on 3D integration and device technologies:

  • "Buried Power Rails and Nano-Scale TSV: Technology Boosters for Backside Power Delivery Network and 3D Heterogeneous Integration" (2022), published in 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
  • "3D SoC integration, beyond 2.5D chiplets" (2021), published in 2021 IEEE International Electron Devices Meeting (IEDM)
  • "Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance" (2023), published in ECS Journal of Solid State Science and Technology
  • "Power, Performance, Area and Thermal Analysis of 2D and 3D ICs at A14 Node Designed with Back-side Power Delivery Network" (2022), published in 2022 International Electron Devices Meeting (IEDM)
  • "Entire Domain Basis Function Expansion of the Differential Surface Admittance for Efficient Broadband Characterization of Lossy Interconnects" (2020), published in IEEE Transactions on Microwave Theory and Techniques

Frequent co-authors collaborating with Eric Beyne include:

  • Geert Van der Plas
  • Gerald Beyer
  • Alain Phommahaxay
  • Anne Jourdain
  • Serena Iacovo

Eric Beyne's work has been published often in multiple venues, which serve as key platforms for disseminating research in electronics packaging, device technologies, and integrated circuits. These frequent publication venues include:

  • IEEE Transactions on Components Packaging and Manufacturing Technology
  • 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
  • ECS Journal of Solid State Science and Technology
  • 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
  • Microelectronic Engineering

Best Publications

  • Design Issues and Considerations for Low-Cost 3-D TSV IC Technology

    G Van der Plas;P Limaye;I Loi;A Mercha

  • MEMS for wireless communications: 'from RF-MEMS components to RF-MEMS-SiP'

    Harrie A C Tilmans;Walter De Raedt;Eric Beyne

  • Method of fabrication of a microstructure having an internal cavity

    Hendrikus A. C. Tilmans;Eric Beyne;Myriam Van de Peer

  • 3D integration by Cu-Cu thermo-compression bonding of extremely thinned bulk-Si die containing 10 μm pitch through-Si vias

    B. Swinnen;W. Ruythooren;P. De Moor;L. Bogaerts

  • Image sensor ball grid array package and the fabrication thereof

    Eric Beyne;Steve Lerner

  • System for fabrication of integrated tunable/switchable passive microwave and millimeter wave modules

    Hendrikus Tilmans;Eric Beyne;Henri Jansen;Walter De Raedt

  • 3D System Integration Technologies

    Eric Beyne

  • Method of transferring ultra-thin substrates and application of the method to the manufacture of a multi-layer thin film device

    Eric Beyne;Augustin Coello-Vera;Olivier Vendier

  • 3-D Technology Assessment: Path-Finding the Technology/Design Sweet-Spot

    P. Marchal;B. Bougard;G. Katti;M. Stucchi

  • 3D stacked IC demonstration using a through Silicon Via First approach

    J. Van Olmen;A. Mercha;G. Katti;C. Huyghebaert

  • The 3-D Interconnect Technology Landscape

    Eric Beyne

  • Thermal cycling reliability of SnAgCu and SnPb solder joints: A comparison for several IC-packages.

    Bart Vandevelde;Mario Gonzalez;Paresh Limaye;Petar Ratchev

  • The rise of the 3rd dimension for system intergration

    E. Beyne

  • Hermal cycling reliability of snagcu and snpb solder joints: a comparison for several ic-packages

    B. Vandevelde;M. Gonzalez;P. Limaye;P. Ratchev

  • Cu pumping in TSVs: Effect of pre-CMP thermal budget

    I. De Wolf;K. Croes;O. Varela Pedreira;R. Labie

  • Bow-tie slot antenna fed by CPW

    E.A Soliman;S Brebels;Peter Delmotte;Guy Vandenbosch

  • Multilayer thin-film MCM-D for the integration of high-performance RF and microwave circuits

    G. Carchon;K. Vaesen;S. Brebels;W. De Raedt

  • Comprehensive analysis of the impact of single and arrays of through silicon vias induced stress on high-k / metal gate CMOS performance

    A. Mercha;G. Van der Plas;V. Moroz;I. De Wolf

  • Method for producing electrical through hole interconnects and devices made thereof

    Eric Beyne;Riet Labie

  • The indent reflow sealing (IRS) technique-a method for the fabrication of sealed cavities for MEMS devices

    H.A.C. Tilmans;D.J. van de Peer;E. Beyne

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