World's Best Scientists 2026 revealed!
Erik Jan Marinissen

Erik Jan Marinissen

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
49
Citations
10124
World Ranking
2926
National Ranking
63

Erik Jan Marinissen publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Erik Jan Marinissen sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 233 publications — 40th percentile

40% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Erik Jan Marinissen D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Erik Jan Marinissen sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 49 D-Index — 58th percentile

58% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2011 - IEEE Fellow For contributions to modular testing of core-based system chips

Overview

Erik Jan Marinissen is affiliated with Imec in Belgium, focusing on research in engineering and computer science, with an emphasis on electrical and electronic engineering and hardware architecture. Their work spans topics including VLSI and analog circuit testing, integrated circuits and semiconductor failure analysis, 3D IC and TSV technologies, as well as magnetic properties of thin films and semiconductor materials and devices.

Their recent publications highlight a focus on advanced semiconductor device testing, modeling, and design. Notable papers include:

  • "Survey on STT-MRAM Testing: Failure Mechanisms, Fault Models, and Tests" (2020, arXiv (Cornell University))
  • "A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability" (2021, IEEE Transactions on Circuits & Systems II Express Briefs)
  • "MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design" (2022, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems)
  • "IEEE Standard 1838 Is on the Move" (2021, Computer)
  • "Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs" (2021, IEEE Transactions on Computers)

Frequent publication venues for Marinissen include:

  • IEEE Design and Test
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • IEEE Transactions on Circuits & Systems II Express Briefs
  • IEEE Transactions on Computers
  • Computer

Collaborations form an integral part of Marinissen's work. Frequent co-authors include Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Said Hamdioui, and Francesco Lorenzelli.

Marinissen's research contributions have been recognized by the IEEE, where they were named an IEEE Fellow in 2011 for contributions to modular testing of core-based system chips.

Best Publications

  • Testing embedded-core-based system chips

    Y. Zorian;E.J. Marinissen;S. Dey

  • Test wrapper and test access mechanism co-optimization for system-on-chip

    V. Iyengar;K. Chakrabarty;E.J. Marinissen

  • A structured and scalable mechanism for test access to embedded reusable cores

    E.J. Marinissen;R. Arendsen;G. Bos;H. Dingemanse

  • A set of benchmarks for modular testing of SOCs

    E.J. Marinissen;V. Iyengar;K. Chakrabarty

  • Testing 3D chips containing through-silicon vias

    Erik Jan Marinissen;Yervant Zorian

  • Wrapper design for embedded core test

    E.J. Marinissen;S.K. Goel;M. Lousberg

  • Scan chain design for test time reduction in core-based ICs

    J. Aerts;E.J. Marinissen

  • Effective and efficient test architecture design for SOCs

    S.K. Goel;E.J. Marinissen

  • On using rectangle packing for SOC wrapper/TAM co-optimization

    V. Iyengar;K. Chakrabarty;E.J. Marinissen

  • Towards a standard for embedded core test: an example

    E.J. Marinissen;Y. Zorian;R. Kapur;T. Taylor

  • A structured and scalable test access architecture for TSV-based 3D stacked ICs

    Erik Jan Marinissen;Jouke Verbree;Mario Konijnenburg

  • On IEEE P1500's Standard for Embedded Core Test

    Erik Jan Marinissen;Rohit Kapur;Maurice Lousberg;Teresa McLaurin

  • Test access mechanism optimization, test scheduling, and tester data volume reduction for system-on-chip

    Vikram lyengar;Krishnendu Chakrabarty;E.J. Marinissen

  • SOC test architecture design for efficient utilization of test bandwidth

    Sandeep Kumar Goel;Erik Jan Marinissen

  • The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs

    Erik Jan Marinissen

  • Challenges in Embedded Memory Design and Test

    Erik Jan Marinissen;Betty Prince;Doris Keitel-Schulz;Yervant Zorian

  • Application of deterministic logic BIST on industrial circuits

    G. Kiefer;H. Vranken;E.J. Marinissen;H.-J. Wunderlich

  • Impact of 3D design choices on manufacturing cost

    Dimitrios Velenis;Michele Stucchi;Erik Jan Marinissen;Bart Swinnen

  • Efficient Wrapper/TAM Co-Optimization for Large SOCs

    V. Iyengar;K. Chakrabarty;E.J. Marinissen

  • Challenges and emerging solutions in testing TSV-based 2 1 over 2D- and 3D-stacked ICs

    Erik Jan Marinissen

Frequent Co-Authors

Krishnendu Chakrabarty
Krishnendu Chakrabarty Arizona State University
Said Hamdioui
Said Hamdioui Delft University of Technology
Kees Goossens
Kees Goossens Eindhoven University of Technology
Cheng-Wen Wu
Cheng-Wen Wu National Tsing Hua University
Paul D. Franzon
Paul D. Franzon North Carolina State University
Sujit Dey
Sujit Dey University of California, San Diego

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