World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
57
Citations
12618
World Ranking
1964
National Ranking
773

Computer Science

D-Index
57
Citations
13057
World Ranking
3843
National Ranking
1824

Irith Pomeranz publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Irith Pomeranz sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 751 publications — 95th percentile

95% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Irith Pomeranz D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Irith Pomeranz sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 57 D-Index — 72nd percentile

72% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 1999 - IEEE Fellow For contributions to the area of test generation for digital logic circuits.

Overview

Irith Pomeranz is affiliated with Purdue University West Lafayette in the United States. Their research primarily focuses on engineering and computer science, with a specialization in electrical and electronic engineering and hardware architecture. Their work covers extensive aspects of VLSI and analog circuit testing, integrated circuits and semiconductor failure analysis, and radiation effects in electronics.

Their body of published work includes contributions to multiple fields and subfields such as low-power high-performance VLSI design, VLSI and FPGA design techniques, software testing and debugging techniques, advancements in photolithography techniques, control and systems engineering, and computer networks and communications.

Notable recent papers include:

  • "Maximal Independent Fault Set for Gate-Exhaustive Faults" (2020), IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • "Storage-Based Built-In Self-Test for Gate-Exhaustive Faults" (2020), IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • "Functional Constraints in the Selection of Two-Cycle Gate-Exhaustive Faults for Test Generation" (2021), IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • "Hybrid Pass/Fail and Full Fail Data for Reduced Fail Data Volume" (2020), IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • "In-Field Testing of Functionally-Possible Transition Faults With High Activation Frequencies" (2024), IEEE Transactions on Device and Materials Reliability

Frequent co-authors in their research work include:

  • Y. Zorian
  • M. Enamul Amyeen
  • Hari Addepalli
  • Srikanth Venkataraman
  • Xijiang Lin

Pomeranz's publications commonly appear in venues such as:

  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • ACM Transactions on Design Automation of Electronic Systems
  • IEEE Access
  • Proceedings of the Great Lakes Symposium on VLSI 2022

The scope of their research topics encompasses:

  • VLSI and Analog Circuit Testing
  • Integrated Circuits and Semiconductor Failure Analysis
  • Radiation Effects in Electronics
  • Low-power high-performance VLSI design
  • VLSI and FPGA Design Techniques
  • Software Testing and Debugging Techniques
  • Advancements in Photolithography Techniques

In recognition of their contributions to digital logic circuit testing, Irith Pomeranz was named an IEEE Fellow in 1999.

Best Publications

  • COMPACTEST: a method to generate compact test sets for combinational circuits

    I. Pomeranz;L.N. Reddy;S.M. Reddy

  • Transient-fault recovery for chip multiprocessors

    Mohamed Gomaa;Chad Scarbrough;T. N. Vijaykumar;Irith Pomeranz

  • Transient-fault recovery using simultaneous multithreading

    T. N. Vijaykumar;Irith Pomeranz;Karl Cheng

  • Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits

    S. Kajihara;I. Pomeranz;K. Kinoshita;S.M. Reddy

  • Techniques for minimizing power dissipation in scan and combinational circuits during test application

    V. Dabholkar;S. Chakravarty;I. Pomeranz;S. Reddy

  • Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs

    Santiago Remersaro;Xijiang Lin;Zhuo Zhang;Sudhakar Reddy

  • On test data volume reduction for multiple scan chain designs

    Sudhakar M. Reddy;Kohei Miyase;Seiji Kajihara;Irith Pomeranz

  • On n-detection test sets and variable n-detection test sets for transition faults

    I. Pomeranz;S.M. Reddy

  • 3-weight pseudo-random test generation based on a deterministic test set for combinational and sequential circuits

    I. Pomeranz;S.M. Reddy

  • A Low Power Pseudo-Random BIST Technique

    Nadir Z. Basturkmen;Sudhakar M. Reddy;Irith Pomeranz

  • On static compaction of test sequences for synchronous sequential circuits

    Irith Pomeranz;Sudhakar M. Reddy

  • Vector restoration based static compaction of test sequences for synchronous sequential circuits

    I. Pomeranz;S.M. Reddy

  • Fault dictionary compression and equivalence class computation for sequential circuits

    Paul G. Ryan;W. Kent Fuchs;Irith Pomeranz

  • LOCSTEP: a logic-simulation-based test generation procedure

    I. Pomeranz;S.M. Reddy

  • Classification of faults in synchronous sequential circuits

    I. Pomeranz;S.M. Reddy

  • On the generation of scan-based test sets with reachable states for testing under functional operation conditions

    Irith Pomeranz

  • On reducing peak current and power during test

    Wei Li;S.M. Reddy;I. Pomeranz

  • Generation of Functional Broadside Tests for Transition Faults

    I. Pomeranz;S.M. Reddy

  • On-chip compression of output responses with unknown values using lfsr reseeding

    M. Naruse;I. Porneranz;S.M. Reddy;S. Kundu

  • NEST: a nonenumerative test generation method for path delay faults in combinational circuits

    I. Pomeranz;S.M. Reddy;P. Uppaluri

  • 3-Weight Pseudo-Random Test Generation Based on a Deterministic Test Set

    I. Pomeranz;S.M. Reddy

Frequent Co-Authors

Sudhakar M. Reddy
Sudhakar M. Reddy University of Iowa
Janusz Rajski
Janusz Rajski Siemens (Germany)
Bernd Becker
Bernd Becker University of Freiburg
Seiji Kajihara
Seiji Kajihara Kyushu Institute of Technology
Sandip Kundu
Sandip Kundu University of Massachusetts Amherst
W.K. Fuchs
W.K. Fuchs University of Florida
T. N. Vijaykumar
T. N. Vijaykumar Purdue University West Lafayette
Ilia Polian
Ilia Polian University of Stuttgart
Jerzy Tyszer
Jerzy Tyszer Poznań University of Technology
Kwang-Ting Cheng
Kwang-Ting Cheng Hong Kong University of Science and Technology

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