What is she best known for?
The fields of study she is best known for:
- Algorithm
- Statistics
- Artificial intelligence
Algorithm, Automatic test pattern generation, Fault coverage, Sequential logic and Fault are her primary areas of study.
The concepts of her Algorithm study are interwoven with issues in Test set and Fault detection and isolation.
Her Automatic test pattern generation research is multidisciplinary, incorporating perspectives in Electronic engineering, Benchmark and Stuck-at fault.
In Fault coverage, Irith Pomeranz works on issues like Reliability engineering, which are connected to Measure, Automatic test equipment and Structural engineering.
The various areas that she examines in her Sequential logic study include State, Synchronization, Test strategy, Simulation and Sequence.
Irith Pomeranz interconnects Computation and Resolution in the investigation of issues within Fault.
Her most cited work include:
- Techniques for minimizing power dissipation in scan and combinational circuits during test application (311 citations)
- Transient-fault recovery for chip multiprocessors (280 citations)
- Transient-fault recovery using simultaneous multithreading (268 citations)
What are the main themes of her work throughout her whole career to date?
Irith Pomeranz mainly investigates Algorithm, Fault coverage, Automatic test pattern generation, Fault and Test set.
Her Algorithm study combines topics from a wide range of disciplines, such as Test, Electronic circuit, Benchmark and Fault detection and isolation.
Her research in Electronic circuit intersects with topics in Electronic engineering and Logic gate.
Her work in Fault coverage tackles topics such as Stuck-at fault which are related to areas like Fault indicator and Fault model.
In her study, Boundary scan is strongly linked to Scan chain, which falls under the umbrella field of Automatic test pattern generation.
The study incorporates disciplines such as Very-large-scale integration and Computation in addition to Test set.
She most often published in these fields:
- Algorithm (67.89%)
- Fault coverage (46.39%)
- Automatic test pattern generation (43.59%)
What were the highlights of her more recent work (between 2015-2021)?
- Algorithm (67.89%)
- Benchmark (19.59%)
- Test set (31.52%)
In recent papers she was focusing on the following fields of study:
Her scientific interests lie mostly in Algorithm, Benchmark, Test set, Electronic circuit and Fault coverage.
Her Algorithm study combines topics from a wide range of disciplines, such as Fault, Sequence, Very-large-scale integration and Volume.
Her Test set research is multidisciplinary, incorporating elements of Test, Compaction, Fault detection and isolation, Scan chain and Computation.
In her study, which falls under the umbrella issue of Electronic circuit, Mode is strongly linked to Electronic engineering.
Irith Pomeranz has included themes like Computational complexity theory, Automatic test pattern generation and Test sequence in her Fault coverage study.
Her work in Automatic test pattern generation addresses issues such as Stuck-at fault, which are connected to fields such as Fault indicator.
Between 2015 and 2021, her most popular works were:
- A Test Selection Procedure for Improving the Accuracy of Defect Diagnosis (9 citations)
- New Techniques to Reduce the Execution Time of Functional Test Programs (8 citations)
- Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm (8 citations)
In her most recent research, the most cited papers focused on:
- Algorithm
- Statistics
- Artificial intelligence
Her main research concerns Algorithm, Benchmark, Fault, Test set and Fault coverage.
Her Algorithm research integrates issues from Test compression and Very-large-scale integration.
Irith Pomeranz has researched Fault in several fields, including Sequential logic and Flexibility.
The various areas that she examines in her Test set study include Test and Data collection.
Her Fault coverage research is multidisciplinary, relying on both Computational complexity theory, Cube and Automatic test pattern generation.
Her research integrates issues of Reliability engineering and Stuck-at fault in her study of Automatic test pattern generation.
This overview was generated by a machine learning system which analysed the scientist’s
body of work. If you have any feedback, you can
contact us
here.
