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Xiaoqing Wen

D-Index & Metrics

Discipline name D-Index World Ranking Current World Ranking National Ranking Current National Ranking Publications Citations
Engineering and Technology 44 5881 5673 105 102 273 6689

Xiaoqing Wen publications per year

The chart shows the history of publications by Xiaoqing Wen between 1990 and 2025, highlighting the no. of papers published in each year and offering an overview of the publication velocity of this scholar. Xiaoqing Wen published across 36 years, from 1990 to 2025, averaging 10.1 papers a year. Output peaked at 37 publications in 2023. 62 of the 364 publications appeared in the last two years.

No. of publications
10 20 30
Bar chart. Horizontal axis: year, 1990 to 2025. Vertical axis: number of publications, 0 to 37. Peak 37 publications in 2023. 1990: 2 publications 1991: 0 publications 1992: 1 publication 1993: 0 publications 1994: 1 publication 1995: 2 publications 1996: 2 publications 1997: 4 publications 1998: 3 publications 1999: 1 publication 2000: 0 publications 2001: 2 publications 2002: 10 publications 2003: 4 publications 2004: 7 publications 2005: 15 publications 2006: 18 publications 2007: 11 publications 2008: 18 publications 2009: 11 publications 2010: 19 publications 2011: 19 publications 2012: 9 publications 2013: 5 publications 2014: 5 publications 2015: 6 publications 2016: 13 publications 2017: 6 publications 2018: 3 publications 2019: 12 publications 2020: 14 publications 2021: 19 publications 2022: 23 publications 2023: 37 publications 2024: 26 publications 2025: 36 publications
1990 2025

364 publications in total across all disciplines

View publications per year as a table
Xiaoqing Wen: publications per year, 1990 to 2025
Year Publications
1990 2
1991 0
1992 1
1993 0
1994 1
1995 2
1996 2
1997 4
1998 3
1999 1
2000 0
2001 2
2002 10
2003 4
2004 7
2005 15
2006 18
2007 11
2008 18
2009 11
2010 19
2011 19
2012 9
2013 5
2014 5
2015 6
2016 13
2017 6
2018 3
2019 12
2020 14
2021 19
2022 23
2023 37
2024 26
2025 36
Total 364
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Xiaoqing Wen publication distribution in Engineering and Technology in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where Xiaoqing Wen sits on this spectrum.

No. of scientists
100 200 300 400
Bar chart with 78 bars. Horizontal axis: publications, 38–47 to 804+. Vertical axis: number of scientists, 0 to 457. Most scientists, 457, have 148–157 publications. The last bar groups every scientist with 804 publications or more. The highlighted bar, 268–277 publications, is where this scientist sits. 38–47 publications: 20 scientists 48–57 publications: 35 scientists 58–67 publications: 96 scientists 68–77 publications: 135 scientists 78–87 publications: 190 scientists 88–97 publications: 259 scientists 98–107 publications: 283 scientists 108–117 publications: 369 scientists 118–127 publications: 341 scientists 128–137 publications: 386 scientists 138–147 publications: 372 scientists 148–157 publications: 457 scientists 158–167 publications: 415 scientists 168–177 publications: 407 scientists 178–187 publications: 421 scientists 188–197 publications: 378 scientists 198–207 publications: 403 scientists 208–217 publications: 317 scientists 218–227 publications: 346 scientists 228–237 publications: 321 scientists 238–247 publications: 260 scientists 248–257 publications: 280 scientists 258–267 publications: 240 scientists 268–277 publications: 214 scientists 278–287 publications: 242 scientists 288–297 publications: 203 scientists 298–307 publications: 166 scientists 308–317 publications: 154 scientists 318–327 publications: 175 scientists 328–337 publications: 159 scientists 338–347 publications: 99 scientists 348–357 publications: 131 scientists 358–367 publications: 106 scientists 368–377 publications: 118 scientists 378–387 publications: 97 scientists 388–397 publications: 108 scientists 398–407 publications: 82 scientists 408–417 publications: 71 scientists 418–427 publications: 64 scientists 428–437 publications: 55 scientists 438–447 publications: 54 scientists 448–457 publications: 60 scientists 458–467 publications: 47 scientists 468–477 publications: 40 scientists 478–487 publications: 30 scientists 488–497 publications: 29 scientists 498–507 publications: 38 scientists 508–517 publications: 40 scientists 518–527 publications: 32 scientists 528–537 publications: 23 scientists 538–547 publications: 28 scientists 548–557 publications: 23 scientists 558–567 publications: 19 scientists 568–577 publications: 16 scientists 578–587 publications: 17 scientists 588–597 publications: 18 scientists 598–607 publications: 22 scientists 608–617 publications: 15 scientists 618–627 publications: 9 scientists 628–637 publications: 11 scientists 638–647 publications: 21 scientists 648–657 publications: 12 scientists 658–667 publications: 9 scientists 668–677 publications: 11 scientists 678–687 publications: 9 scientists 688–697 publications: 6 scientists 698–707 publications: 14 scientists 708–717 publications: 7 scientists 718–727 publications: 8 scientists 728–737 publications: 10 scientists 738–747 publications: 9 scientists 748–757 publications: 5 scientists 758–767 publications: 5 scientists 768–777 publications: 11 scientists 778–787 publications: 7 scientists 788–797 publications: 2 scientists 798–803 publications: 4 scientists 804+ publications: 100 scientists
38–47 publications 804+

This scientist: 273 publications — 70th percentile

70% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 804 publications or more.

View publications distribution as a table
Number of Engineering and Technology scientists by publication count, Research.com 2026 ranking edition. Based on 9,796 ranked scientists.
Publications Scientists This scientist
38–47 20
48–57 35
58–67 96
68–77 135
78–87 190
88–97 259
98–107 283
108–117 369
118–127 341
128–137 386
138–147 372
148–157 457
158–167 415
168–177 407
178–187 421
188–197 378
198–207 403
208–217 317
218–227 346
228–237 321
238–247 260
248–257 280
258–267 240
268–277 214 273
278–287 242
288–297 203
298–307 166
308–317 154
318–327 175
328–337 159
338–347 99
348–357 131
358–367 106
368–377 118
378–387 97
388–397 108
398–407 82
408–417 71
418–427 64
428–437 55
438–447 54
448–457 60
458–467 47
468–477 40
478–487 30
488–497 29
498–507 38
508–517 40
518–527 32
528–537 23
538–547 28
548–557 23
558–567 19
568–577 16
578–587 17
588–597 18
598–607 22
608–617 15
618–627 9
628–637 11
638–647 21
648–657 12
658–667 9
668–677 11
678–687 9
688–697 6
698–707 14
708–717 7
718–727 8
728–737 10
738–747 9
748–757 5
758–767 5
768–777 11
778–787 7
788–797 2
798–803 4
804+ 100
Download as CSV

Xiaoqing Wen D-index placement in Engineering and Technology in 2026

The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where Xiaoqing Wen sits on this spectrum.

No. of scientists
100 200 300 400
Bar chart with 78 bars. Horizontal axis: D-Index, 30 to 107+. Vertical axis: number of scientists, 0 to 426. Most scientists, 426, have 42 D-Index. The last bar groups every scientist with 107 D-Index or more. The highlighted bar, 44 D-Index, is where this scientist sits. 30 D-Index: 59 scientists 31 D-Index: 114 scientists 32 D-Index: 129 scientists 33 D-Index: 189 scientists 34 D-Index: 200 scientists 35 D-Index: 262 scientists 36 D-Index: 311 scientists 37 D-Index: 312 scientists 38 D-Index: 350 scientists 39 D-Index: 385 scientists 40 D-Index: 348 scientists 41 D-Index: 362 scientists 42 D-Index: 426 scientists 43 D-Index: 380 scientists 44 D-Index: 310 scientists 45 D-Index: 341 scientists 46 D-Index: 301 scientists 47 D-Index: 306 scientists 48 D-Index: 271 scientists 49 D-Index: 246 scientists 50 D-Index: 210 scientists 51 D-Index: 253 scientists 52 D-Index: 213 scientists 53 D-Index: 221 scientists 54 D-Index: 195 scientists 55 D-Index: 186 scientists 56 D-Index: 170 scientists 57 D-Index: 167 scientists 58 D-Index: 166 scientists 59 D-Index: 144 scientists 60 D-Index: 152 scientists 61 D-Index: 141 scientists 62 D-Index: 138 scientists 63 D-Index: 131 scientists 64 D-Index: 118 scientists 65 D-Index: 114 scientists 66 D-Index: 119 scientists 67 D-Index: 95 scientists 68 D-Index: 87 scientists 69 D-Index: 77 scientists 70 D-Index: 89 scientists 71 D-Index: 69 scientists 72 D-Index: 54 scientists 73 D-Index: 46 scientists 74 D-Index: 55 scientists 75 D-Index: 54 scientists 76 D-Index: 49 scientists 77 D-Index: 53 scientists 78 D-Index: 46 scientists 79 D-Index: 28 scientists 80 D-Index: 39 scientists 81 D-Index: 36 scientists 82 D-Index: 24 scientists 83 D-Index: 26 scientists 84 D-Index: 36 scientists 85 D-Index: 18 scientists 86 D-Index: 25 scientists 87 D-Index: 19 scientists 88 D-Index: 26 scientists 89 D-Index: 27 scientists 90 D-Index: 23 scientists 91 D-Index: 15 scientists 92 D-Index: 12 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 13 scientists 97 D-Index: 13 scientists 98 D-Index: 9 scientists 99 D-Index: 7 scientists 100 D-Index: 7 scientists 101 D-Index: 8 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 9 scientists 105 D-Index: 6 scientists 106 D-Index: 9 scientists 107+ D-Index: 99 scientists
30 D-Index 107+

This scientist: 44 D-Index — 42nd percentile

42% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 107 D-Index or more.

View D-Index distribution as a table
Number of Engineering and Technology scientists by D-index, Research.com 2026 ranking edition. Based on 9,796 ranked scientists.
D-Index Scientists This scientist
30 59
31 114
32 129
33 189
34 200
35 262
36 311
37 312
38 350
39 385
40 348
41 362
42 426
43 380
44 310 44
45 341
46 301
47 306
48 271
49 246
50 210
51 253
52 213
53 221
54 195
55 186
56 170
57 167
58 166
59 144
60 152
61 141
62 138
63 131
64 118
65 114
66 119
67 95
68 87
69 77
70 89
71 69
72 54
73 46
74 55
75 54
76 49
77 53
78 46
79 28
80 39
81 36
82 24
83 26
84 36
85 18
86 25
87 19
88 26
89 27
90 23
91 15
92 12
93 9
94 15
95 10
96 13
97 13
98 9
99 7
100 7
101 8
102 7
103 7
104 9
105 6
106 9
107+ 99
Download as CSV

Overview

Xiaoqing Wen is affiliated with the Kyushu Institute of Technology in Japan and has contributed extensively to research in engineering and computer science. Their publication record spans several subfields including electrical and electronic engineering, hardware and architecture, computer networks and communications, computational theory and mathematics, and molecular biology.

Their research primarily focuses on topics related to radiation effects in electronics, VLSI and analog circuit testing, semiconductor materials and devices, integrated circuits and semiconductor failure analysis, low-power high-performance VLSI design, advancements in semiconductor devices and circuit design, and physical unclonable functions (PUFs) and hardware security.

Wen has authored or co-authored numerous papers with frequent collaborators including Aibin Yan, Zhengfeng Huang, Tianming Ni, Patrick Girard, and Jie Cui.

They have published in a variety of reputable outlets, with frequent publications in:

  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems (14 publications)
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (13 publications)
  • IEEE Transactions on Aerospace and Electronic Systems (8 publications)
  • Microelectronics Journal (4 publications)
  • SSRN Electronic Journal (4 publications)

Representative papers include:

  • A Secure and Multiobjective Virtual Machine Placement Framework for Cloud Data Center, 2021, IEEE Systems Journal
  • Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment, 2020, IEEE Transactions on Computers
  • Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments, 2020, IEEE Transactions on Emerging Topics in Computing
  • Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets, 2020, IEEE Transactions on Circuits and Systems I Regular Papers
  • Quadruple and Sextuple Cross-Coupled SRAM Cell Designs With Optimized Overhead for Reliable Applications, 2022, IEEE Transactions on Device and Materials Reliability

Best Publications

  • VLSI Test Principles and Architectures: Design for Testability

    Laung-Terng Wang;Cheng-Wen Wu;Xiaoqing Wen

  • VLSI Test Principles and Architectures

    Laung Terng Wang;Cheng Wen Wu;Xiaoqing Wen

  • On low-capture-power test generation for scan testing

    Xiaoqing Wen;Y. Yamashita;S. Kajihara;Laung-Terng Wang

  • Computer-aided design system to automate scan synthesis at register-transfer level

    Laung-Terng Wang;Xiaoqing Wen

  • Low-capture-power test generation for scan-based at-speed testing

    Xiaoqing Wen;Y. Yamashita;S. Morishima;S. Kajihara

  • VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

    Laung-Terng Wang;Cheng-Wen Wu;Xiaoqing Wen

  • Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (dfd) techniques

    Laung-Terng (L.-T.) Wang;Ming-Tung Chang;Shyh-Horng Lin;Hao-Jan Chao

  • Power-Aware Testing and Test Strategies for Low Power Devices

    Dimitris Gizopoulos;Kaushik Roy;Patrick Girard;Nicola Nicolici

  • Design for Testability

    Laung-Terng (L.-T.) Wang;Xiaoqing Wen;Khader S. Abdel-Hafez

  • VirtualScan: a new compressed scan technology for test cost reduction

    L.-T. Wang;Xiaoqing Wen;H. Furukawa;Fei-Sheng Hsu

  • A new ATPG method for efficient capture power reduction during scan testing

    Xiaoqing Wen;S. Kajihara;K. Miyase;T. Suzuki

  • Multiple-capture dft system for detecting or locating crossing clock-domain faults during self-test or scan test

    Laung-Terng Wang;Po-Ching Hsu;Shih-Chia F No. Kao;Meng-Chyi Lin

  • Power-Aware Testing and Test Strategies for Low Power Devices

    Patrick Girard;Nicola Nicolici;Xiaoqing Wen

  • Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits

    Khader S. Abdel-Hafez;Xiaoqing Wen;Laung-Terng Wang;Po-Ching Hsu

  • A novel scheme to reduce power supply noise for high-quality at-speed scan testing

    Xiaoqing Wen;K. Miyase;S. Kajihara;T. Suzuki

  • Mask network design for scan-based integrated circuits

    Laung-Terng L-T Wang;Khader S Abdel-Hafez;Xiaoqing Wen;Boryau Jack Sheu

  • Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS

    Aibin Yan;Chaoping Lai;Yinlei Zhang;Jie Cui

  • Quadruple and Sextuple Cross-Coupled SRAM Cell Designs With Optimized Overhead for Reliable Applications

    Unknown

  • Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment

    Aibin Yan;Yuanjie Hu;Jie Cui;Zhili Chen

  • Mehrfacherfassungs-dft-system für integrierte schaltungen auf scan-basis

    Laung-Terng Wang;Shih-Chia Kao;Meng-Chyi Lin;Hsin-Po Wang

  • Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments

    Aibin Yan;Xiangfeng Feng;Yuanjie Hu;Chaoping Lai

  • Critical-path-aware X-filling for effective IR-drop reduction in at-speed scan testing

    Xiaoqing Wen;Kohei Miyase;Tatsuya Suzuki;Seiji Kajihara

Frequent Co-Authors

Seiji Kajihara
Seiji Kajihara Kyushu Institute of Technology
Patrick Girard
Patrick Girard Montpellier Laboratory of Informatics, Robotics and Microelectronics
Kewal K. Saluja
Kewal K. Saluja University of Wisconsin–Madison
Jie Cui
Jie Cui University of Science and Technology of China
Mohammad Tehranipoor
Mohammad Tehranipoor University of Florida
Hans-Joachim Wunderlich
Hans-Joachim Wunderlich University of Stuttgart
Yu Hu
Yu Hu Institute Of Computing Technology
Nicola Nicolici
Nicola Nicolici McMaster University
Tsutomu Sasao
Tsutomu Sasao Meiji University
Bernd Becker
Bernd Becker University of Freiburg

External Links

Personal website of Xiaoqing Wen Google Scholar page

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