World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
44
Citations
6689
World Ranking
5881
National Ranking
105

Xiaoqing Wen publication distribution in Engineering and Technology in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where Xiaoqing Wen sits on this spectrum.

38–47 publications: 20 scientists 48–57 publications: 35 scientists 58–67 publications: 96 scientists 68–77 publications: 135 scientists 78–87 publications: 190 scientists 88–97 publications: 259 scientists 98–107 publications: 283 scientists 108–117 publications: 369 scientists 118–127 publications: 341 scientists 128–137 publications: 386 scientists 138–147 publications: 372 scientists 148–157 publications: 457 scientists 158–167 publications: 415 scientists 168–177 publications: 407 scientists 178–187 publications: 421 scientists 188–197 publications: 378 scientists 198–207 publications: 403 scientists 208–217 publications: 317 scientists 218–227 publications: 346 scientists 228–237 publications: 321 scientists 238–247 publications: 260 scientists 248–257 publications: 280 scientists 258–267 publications: 240 scientists 268–277 publications: 214 scientists 278–287 publications: 242 scientists 288–297 publications: 203 scientists 298–307 publications: 166 scientists 308–317 publications: 154 scientists 318–327 publications: 175 scientists 328–337 publications: 159 scientists 338–347 publications: 99 scientists 348–357 publications: 131 scientists 358–367 publications: 106 scientists 368–377 publications: 118 scientists 378–387 publications: 97 scientists 388–397 publications: 108 scientists 398–407 publications: 82 scientists 408–417 publications: 71 scientists 418–427 publications: 64 scientists 428–437 publications: 55 scientists 438–447 publications: 54 scientists 448–457 publications: 60 scientists 458–467 publications: 47 scientists 468–477 publications: 40 scientists 478–487 publications: 30 scientists 488–497 publications: 29 scientists 498–507 publications: 38 scientists 508–517 publications: 40 scientists 518–527 publications: 32 scientists 528–537 publications: 23 scientists 538–547 publications: 28 scientists 548–557 publications: 23 scientists 558–567 publications: 19 scientists 568–577 publications: 16 scientists 578–587 publications: 17 scientists 588–597 publications: 18 scientists 598–607 publications: 22 scientists 608–617 publications: 15 scientists 618–627 publications: 9 scientists 628–637 publications: 11 scientists 638–647 publications: 21 scientists 648–657 publications: 12 scientists 658–667 publications: 9 scientists 668–677 publications: 11 scientists 678–687 publications: 9 scientists 688–697 publications: 6 scientists 698–707 publications: 14 scientists 708–717 publications: 7 scientists 718–727 publications: 8 scientists 728–737 publications: 10 scientists 738–747 publications: 9 scientists 748–757 publications: 5 scientists 758–767 publications: 5 scientists 768–777 publications: 11 scientists 778–787 publications: 7 scientists 788–797 publications: 2 scientists 798–803 publications: 4 scientists 804+ publications: 100 scientists
38 publications 804+

This scientist: 273 publications — 70th percentile

70% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 804 publications or more.

Xiaoqing Wen D-index placement in Engineering and Technology in 2026

The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where Xiaoqing Wen sits on this spectrum.

30 D-Index: 59 scientists 31 D-Index: 114 scientists 32 D-Index: 129 scientists 33 D-Index: 189 scientists 34 D-Index: 200 scientists 35 D-Index: 262 scientists 36 D-Index: 311 scientists 37 D-Index: 312 scientists 38 D-Index: 350 scientists 39 D-Index: 385 scientists 40 D-Index: 348 scientists 41 D-Index: 362 scientists 42 D-Index: 426 scientists 43 D-Index: 380 scientists 44 D-Index: 310 scientists 45 D-Index: 341 scientists 46 D-Index: 301 scientists 47 D-Index: 306 scientists 48 D-Index: 271 scientists 49 D-Index: 246 scientists 50 D-Index: 210 scientists 51 D-Index: 253 scientists 52 D-Index: 213 scientists 53 D-Index: 221 scientists 54 D-Index: 195 scientists 55 D-Index: 186 scientists 56 D-Index: 170 scientists 57 D-Index: 167 scientists 58 D-Index: 166 scientists 59 D-Index: 144 scientists 60 D-Index: 152 scientists 61 D-Index: 141 scientists 62 D-Index: 138 scientists 63 D-Index: 131 scientists 64 D-Index: 118 scientists 65 D-Index: 114 scientists 66 D-Index: 119 scientists 67 D-Index: 95 scientists 68 D-Index: 87 scientists 69 D-Index: 77 scientists 70 D-Index: 89 scientists 71 D-Index: 69 scientists 72 D-Index: 54 scientists 73 D-Index: 46 scientists 74 D-Index: 55 scientists 75 D-Index: 54 scientists 76 D-Index: 49 scientists 77 D-Index: 53 scientists 78 D-Index: 46 scientists 79 D-Index: 28 scientists 80 D-Index: 39 scientists 81 D-Index: 36 scientists 82 D-Index: 24 scientists 83 D-Index: 26 scientists 84 D-Index: 36 scientists 85 D-Index: 18 scientists 86 D-Index: 25 scientists 87 D-Index: 19 scientists 88 D-Index: 26 scientists 89 D-Index: 27 scientists 90 D-Index: 23 scientists 91 D-Index: 15 scientists 92 D-Index: 12 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 13 scientists 97 D-Index: 13 scientists 98 D-Index: 9 scientists 99 D-Index: 7 scientists 100 D-Index: 7 scientists 101 D-Index: 8 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 9 scientists 105 D-Index: 6 scientists 106 D-Index: 9 scientists 107+ D-Index: 99 scientists
30 D-Index 107+

This scientist: 44 D-Index — 42nd percentile

42% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 107 D-Index or more.

Overview

Xiaoqing Wen is affiliated with the Kyushu Institute of Technology in Japan and has contributed extensively to research in engineering and computer science. Their publication record spans several subfields including electrical and electronic engineering, hardware and architecture, computer networks and communications, computational theory and mathematics, and molecular biology.

Their research primarily focuses on topics related to radiation effects in electronics, VLSI and analog circuit testing, semiconductor materials and devices, integrated circuits and semiconductor failure analysis, low-power high-performance VLSI design, advancements in semiconductor devices and circuit design, and physical unclonable functions (PUFs) and hardware security.

Wen has authored or co-authored numerous papers with frequent collaborators including Aibin Yan, Zhengfeng Huang, Tianming Ni, Patrick Girard, and Jie Cui.

They have published in a variety of reputable outlets, with frequent publications in:

  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems (14 publications)
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (13 publications)
  • IEEE Transactions on Aerospace and Electronic Systems (8 publications)
  • Microelectronics Journal (4 publications)
  • SSRN Electronic Journal (4 publications)

Representative papers include:

  • A Secure and Multiobjective Virtual Machine Placement Framework for Cloud Data Center, 2021, IEEE Systems Journal
  • Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment, 2020, IEEE Transactions on Computers
  • Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments, 2020, IEEE Transactions on Emerging Topics in Computing
  • Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets, 2020, IEEE Transactions on Circuits and Systems I Regular Papers
  • Quadruple and Sextuple Cross-Coupled SRAM Cell Designs With Optimized Overhead for Reliable Applications, 2022, IEEE Transactions on Device and Materials Reliability

Best Publications

  • VLSI Test Principles and Architectures: Design for Testability

    Laung-Terng Wang;Cheng-Wen Wu;Xiaoqing Wen

  • VLSI Test Principles and Architectures

    Laung Terng Wang;Cheng Wen Wu;Xiaoqing Wen

  • On low-capture-power test generation for scan testing

    Xiaoqing Wen;Y. Yamashita;S. Kajihara;Laung-Terng Wang

  • Computer-aided design system to automate scan synthesis at register-transfer level

    Laung-Terng Wang;Xiaoqing Wen

  • Low-capture-power test generation for scan-based at-speed testing

    Xiaoqing Wen;Y. Yamashita;S. Morishima;S. Kajihara

  • VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

    Laung-Terng Wang;Cheng-Wen Wu;Xiaoqing Wen

  • Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (dfd) techniques

    Laung-Terng (L.-T.) Wang;Ming-Tung Chang;Shyh-Horng Lin;Hao-Jan Chao

  • Power-Aware Testing and Test Strategies for Low Power Devices

    Dimitris Gizopoulos;Kaushik Roy;Patrick Girard;Nicola Nicolici

  • Design for Testability

    Laung-Terng (L.-T.) Wang;Xiaoqing Wen;Khader S. Abdel-Hafez

  • VirtualScan: a new compressed scan technology for test cost reduction

    L.-T. Wang;Xiaoqing Wen;H. Furukawa;Fei-Sheng Hsu

  • A new ATPG method for efficient capture power reduction during scan testing

    Xiaoqing Wen;S. Kajihara;K. Miyase;T. Suzuki

  • Multiple-capture dft system for detecting or locating crossing clock-domain faults during self-test or scan test

    Laung-Terng Wang;Po-Ching Hsu;Shih-Chia F No. Kao;Meng-Chyi Lin

  • Power-Aware Testing and Test Strategies for Low Power Devices

    Patrick Girard;Nicola Nicolici;Xiaoqing Wen

  • Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits

    Khader S. Abdel-Hafez;Xiaoqing Wen;Laung-Terng Wang;Po-Ching Hsu

  • A novel scheme to reduce power supply noise for high-quality at-speed scan testing

    Xiaoqing Wen;K. Miyase;S. Kajihara;T. Suzuki

  • Mask network design for scan-based integrated circuits

    Laung-Terng L-T Wang;Khader S Abdel-Hafez;Xiaoqing Wen;Boryau Jack Sheu

  • Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS

    Aibin Yan;Chaoping Lai;Yinlei Zhang;Jie Cui

  • Quadruple and Sextuple Cross-Coupled SRAM Cell Designs With Optimized Overhead for Reliable Applications

    Unknown

  • Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment

    Aibin Yan;Yuanjie Hu;Jie Cui;Zhili Chen

  • Mehrfacherfassungs-dft-system für integrierte schaltungen auf scan-basis

    Laung-Terng Wang;Shih-Chia Kao;Meng-Chyi Lin;Hsin-Po Wang

  • Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments

    Aibin Yan;Xiangfeng Feng;Yuanjie Hu;Chaoping Lai

  • Critical-path-aware X-filling for effective IR-drop reduction in at-speed scan testing

    Xiaoqing Wen;Kohei Miyase;Tatsuya Suzuki;Seiji Kajihara

Frequent Co-Authors

Seiji Kajihara
Seiji Kajihara Kyushu Institute of Technology
Patrick Girard
Patrick Girard Montpellier Laboratory of Informatics, Robotics and Microelectronics
Kewal K. Saluja
Kewal K. Saluja University of Wisconsin–Madison
Jie Cui
Jie Cui University of Science and Technology of China
Mohammad Tehranipoor
Mohammad Tehranipoor University of Florida
Hans-Joachim Wunderlich
Hans-Joachim Wunderlich University of Stuttgart
Yu Hu
Yu Hu Institute Of Computing Technology
Nicola Nicolici
Nicola Nicolici McMaster University
Tsutomu Sasao
Tsutomu Sasao Meiji University
Bernd Becker
Bernd Becker University of Freiburg

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