2011 - Member of Academia Europaea
2008 - IEEE Fellow For contributions to the development of algorithms and data structures for testing and verification of integrated circuits
His primary areas of study are Algorithm, Theoretical computer science, Binary decision diagram, Boolean function and Data structure. His studies in Algorithm integrate themes in fields like Fault, Markov chain and Stuck-at fault. His work in the fields of Automatic test pattern generation overlaps with other areas such as Voltage droop.
His Theoretical computer science study combines topics from a wide range of disciplines, such as Development, Boolean circuit, Circuit minimization for Boolean functions, Boolean network and CAD. The Binary decision diagram study combines topics in areas such as Bisimulation, State space and Minification. His Boolean function study integrates concerns from other disciplines, such as Logic synthesis, Representation, Kronecker delta and Genetic algorithm.
The scientist’s investigation covers issues in Algorithm, Theoretical computer science, Automatic test pattern generation, Fault and Boolean function. His Algorithm research is multidisciplinary, relying on both Electronic circuit and Solver. His Automatic test pattern generation study combines topics in areas such as Electronic engineering, Computer engineering, Fault coverage and Fault detection and isolation.
His research investigates the connection with Fault coverage and areas like Stuck-at fault which intersect with concerns in Fault model. The study incorporates disciplines such as Testability and Benchmark in addition to Fault. His work carried out in the field of Boolean function brings together such families of science as Logic synthesis, Kronecker delta, Data structure and Minification.
Bernd Becker mostly deals with Algorithm, Automatic test pattern generation, Theoretical computer science, Embedded system and Fault. His biological study spans a wide range of topics, including Solver, Set and Minification. The various areas that he examines in his Automatic test pattern generation study include Testability, Fault coverage and Logic gate.
His Fault coverage research includes elements of Reliability engineering and Stuck-at fault. In the field of Theoretical computer science, his study on Model checking and Logic in computer science overlaps with subjects such as Property. His Fault study incorporates themes from Boolean satisfiability problem, Very-large-scale integration, Computer engineering and Cipher.
His main research concerns Theoretical computer science, Algorithm, Embedded system, Model checking and Dependency. His Theoretical computer science research integrates issues from Range, Bitwise operation and Counterexample. Bernd Becker combines subjects such as Solver, Polynomial and Benchmark with his study of Algorithm.
He has included themes like Logic synthesis, Formal verification, Debugging and Chip in his Embedded system study. His Model checking research incorporates elements of Software, Large set, Probabilistic logic and Automatic test pattern generation. The concepts of his Automatic test pattern generation study are interwoven with issues in Feature, Stuck-at fault, Fault detection and isolation, Very-large-scale integration and Test set.
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
Binary Decision Diagrams: Theory and Implementation
Bernd Becker;Rolf Drechsler.
How robust is the n-cube?
Bernd Becker;Hans-Ulrich Simon.
Information & Computation (1988)
Efficient Representation and Manipulation of Switching Functions Based on Ordered Kronecker Functional Decision Diagrams
R. Drechsler;A. Sarabi;M. Theobald;B. Becker.
design automation conference (1994)
A Definition and Classification of Timing Anomalies
Jan Reineke;Björn Wachter;Stephan Thesing;Reinhard Wilhelm.
worst case execution time analysis (2006)
Neurologic, neuropsychologic, and computed cranial tomography scan abnormalities in 2- to 10-year survivors of small-cell lung cancer.
B E Johnson;B Becker;W B Goff nd;N Petronas.
Journal of Clinical Oncology (1985)
Genetic algorithm for variable ordering of OBDDs
R. Drechsler;B. Becker;N. Gockel.
IEE Proceedings - Computers and Digital Techniques (1996)
Neurologic, computed cranial tomographic, and magnetic resonance imaging abnormalities in patients with small-cell lung cancer: further follow-up of 6- to 13-year survivors.
B E Johnson;N Patronas;W Hayes;J Grayson.
Journal of Clinical Oncology (1990)
A Family of Logical Fault Models for Reversible Circuits
I. Polian;T. Fiehn;B. Becker;J.P. Hayes.
asian test symposium (2005)
Multi-objective Optimisation Based on Relation Favour
Nicole Drechsler;Rolf Drechsler;Bernd Becker.
international conference on evolutionary multi criterion optimization (2001)
Testing for missing-gate faults in reversible circuits
J.P. Hayes;I. Polian;B. Becker.
asian test symposium (2004)
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