What is he best known for?
The fields of study he is best known for:
- Algorithm
- Programming language
- Artificial intelligence
His primary areas of study are Algorithm, Theoretical computer science, Binary decision diagram, Boolean function and Data structure.
His studies in Algorithm integrate themes in fields like Fault, Markov chain and Stuck-at fault.
His work in the fields of Automatic test pattern generation overlaps with other areas such as Voltage droop.
His Theoretical computer science study combines topics from a wide range of disciplines, such as Development, Boolean circuit, Circuit minimization for Boolean functions, Boolean network and CAD.
The Binary decision diagram study combines topics in areas such as Bisimulation, State space and Minification.
His Boolean function study integrates concerns from other disciplines, such as Logic synthesis, Representation, Kronecker delta and Genetic algorithm.
His most cited work include:
- Efficient Representation and Manipulation of Switching Functions Based on Ordered Kronecker Functional Decision Diagrams (176 citations)
- Neurologic, neuropsychologic, and computed cranial tomography scan abnormalities in 2- to 10-year survivors of small-cell lung cancer. (163 citations)
- Binary Decision Diagrams: Theory and Implementation (154 citations)
What are the main themes of his work throughout his whole career to date?
The scientist’s investigation covers issues in Algorithm, Theoretical computer science, Automatic test pattern generation, Fault and Boolean function.
His Algorithm research is multidisciplinary, relying on both Electronic circuit and Solver.
His Automatic test pattern generation study combines topics in areas such as Electronic engineering, Computer engineering, Fault coverage and Fault detection and isolation.
His research investigates the connection with Fault coverage and areas like Stuck-at fault which intersect with concerns in Fault model.
The study incorporates disciplines such as Testability and Benchmark in addition to Fault.
His work carried out in the field of Boolean function brings together such families of science as Logic synthesis, Kronecker delta, Data structure and Minification.
He most often published in these fields:
- Algorithm (36.16%)
- Theoretical computer science (17.51%)
- Automatic test pattern generation (15.44%)
What were the highlights of his more recent work (between 2014-2021)?
- Algorithm (36.16%)
- Automatic test pattern generation (15.44%)
- Theoretical computer science (17.51%)
In recent papers he was focusing on the following fields of study:
Bernd Becker mostly deals with Algorithm, Automatic test pattern generation, Theoretical computer science, Embedded system and Fault.
His biological study spans a wide range of topics, including Solver, Set and Minification.
The various areas that he examines in his Automatic test pattern generation study include Testability, Fault coverage and Logic gate.
His Fault coverage research includes elements of Reliability engineering and Stuck-at fault.
In the field of Theoretical computer science, his study on Model checking and Logic in computer science overlaps with subjects such as Property.
His Fault study incorporates themes from Boolean satisfiability problem, Very-large-scale integration, Computer engineering and Cipher.
Between 2014 and 2021, his most popular works were:
- SC2 : Satisfiability Checking Meets Symbolic Computation (36 citations)
- Finite-State Controllers of POMDPs using Parameter Synthesis (34 citations)
- Towards Verification of Artificial Neural Networks. (33 citations)
In his most recent research, the most cited papers focused on:
- Algorithm
- Programming language
- Artificial intelligence
His main research concerns Theoretical computer science, Algorithm, Embedded system, Model checking and Dependency.
His Theoretical computer science research integrates issues from Range, Bitwise operation and Counterexample.
Bernd Becker combines subjects such as Solver, Polynomial and Benchmark with his study of Algorithm.
He has included themes like Logic synthesis, Formal verification, Debugging and Chip in his Embedded system study.
His Model checking research incorporates elements of Software, Large set, Probabilistic logic and Automatic test pattern generation.
The concepts of his Automatic test pattern generation study are interwoven with issues in Feature, Stuck-at fault, Fault detection and isolation, Very-large-scale integration and Test set.
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