World's Best Scientists 2026 revealed!

D-Index & Metrics

Computer Science

D-Index
32
Citations
4177
World Ranking
13199
National Ranking
637

Overview

Ilia Polian is affiliated with the University of Stuttgart in Germany and has a substantial research portfolio focused primarily on computer science and engineering. Their work spans a wide array of specialized topics within these fields, emphasizing areas such as quantum computing, hardware security, and artificial intelligence.

The scientist's main fields of study include:

  • Computer Science
  • Engineering

Within these fields, Polian has contributed extensively to several subfields, including:

  • Artificial Intelligence
  • Electrical and Electronic Engineering
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Atomic and Molecular Physics, and Optics

The primary research topics covered by Polian's work are:

  • Quantum Computing Algorithms and Architecture
  • Quantum Information and Cryptography
  • Advanced Memory and Neural Computing
  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Quantum and electron transport phenomena
  • Ferroelectric and Negative Capacitance Devices
  • Cryptographic Implementations and Security

Among the recent papers authored or coauthored by Polian are:

  • "Benchmarking the performance of portfolio optimization with QAOA," 2022, Quantum Information Processing
  • "Low-power emerging memristive designs towards secure hardware systems for applications in internet of things," 2021, Nano Materials Science
  • "Protecting artificial intelligence IPs: a survey of watermarking and fingerprinting for machine learning," 2021, CAAI Transactions on Intelligence Technology
  • "Optimal Partitioning of Quantum Circuits Using Gate Cuts and Wire Cuts," 2023, IEEE Transactions on Quantum Engineering
  • "Optimal Mapping for Near-Term Quantum Architectures based on Rydberg Atoms," 2021, 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD)

Polian frequently collaborates with several researchers, including:

  • Sebastian Brandhofer
  • Nan Du
  • Yanjun Ji
  • Xianyue Zhao
  • Ziang Chen

The venues where Polian has most frequently published their research include:

  • arXiv (Cornell University)
  • IEEE Transactions on Nanotechnology
  • IEEE Transactions on Quantum Engineering
  • Scientific Reports
  • Physical Review A

Best Publications

  • A Definition and Classification of Timing Anomalies

    Jan Reineke;Björn Wachter;Stephan Thesing;Reinhard Wilhelm

  • A Family of Logical Fault Models for Reversible Circuits

    I. Polian;T. Fiehn;B. Becker;J.P. Hayes

  • Testing for missing-gate faults in reversible circuits

    J.P. Hayes;I. Polian;B. Becker

  • X-masking during logic BIST and its impact on defect coverage

    Yuyi Tang;H.-J. Wunderlich;Piet Engelke;I. Polian

  • Simulating Resistive-Bridging and Stuck-At Faults

    Piet Engelke;I. Polian;M. Renovell;B. Becker

  • Fault-tolerant, high-level quantum circuits: form, compilation and description

    Alexandru Paler;Ilia Polian;Kae Nemoto;Simon J Devitt

  • Power Droop Testing

    I. Polian;A. Czutro;S. Kundu;B. Becker

  • Parametric Trojans for Fault-Injection Attacks on Cryptographic Hardware

    Raghavan Kumar;Philipp Jovanovic;Wayne Burleson;Ilia Polian

  • A fault attack on the LED block cipher

    Philipp Jovanovic;Martin Kreuzer;Ilia Polian

  • Adaptive voltage over-scaling for resilient applications

    Philipp Klaus Krause;Ilia Polian

  • An Analysis Framework for Transient-Error Tolerance

    J.P. Hayes;I. Polian;B. Becker

  • Selective Hardening: Toward Cost-Effective Error Tolerance

    I Polian;J P Hayes

  • Power Droop Testing

    I. Polian;A. Czutro;S. Kundu;B. Becker

  • Analysis and optimization of fault-tolerant embedded systems with hardened processors

    Viacheslav Izosimov;Ilia Polian;Paul Pop;Petru Eles

  • A Simulator of Small-Delay Faults Caused by Resistive-Open Defects

    A. Czutro;N. Houarche;P. Engelke;I. Polian

  • Functional Constraints vs. Test Compression in Scan-Based Delay Testing

    Ilia Polian;Hideo Fujiwara

  • Small-delay-fault ATPG with waveform accuracy

    Matthias Sauer;Alexander Czutro;Ilia Polian;Bernd Becker

  • Automatic Test Pattern Generation for Interconnect Open Defects

    S. Spinner;I. Polian;P. Engelke;B. Becker

  • Resistive Bridge fault model evolution from conventional to ultra deep submicron

    I. Polian;P. Engelke;B. Becker;S. Kundu

  • Functional Constraints vs. Test Compression in Scan-Based Delay Testing

    I. Polian;H. Fujiwara

  • Low-power emerging memristive designs towards secure hardware systems for applications in internet of things

    Nan Du;Heidemarie Schmidt;Ilia Polian

  • A study of cognitive resilience in a JPEG compressor

    D. Nowroth;I. Polian;B. Becker

  • TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis

    Alejandro Czutro;Ilia Polian;Matthew Lewis;Piet Engelke

Frequent Co-Authors

Bernd Becker
Bernd Becker University of Freiburg
Michel Renovell
Michel Renovell Montpellier Laboratory of Informatics, Robotics and Microelectronics
John P. Hayes
John P. Hayes University of Michigan–Ann Arbor
Francesco Regazzoni
Francesco Regazzoni Polytechnic University of Milan
Sudhakar M. Reddy
Sudhakar M. Reddy University of Iowa
Hans-Joachim Wunderlich
Hans-Joachim Wunderlich University of Stuttgart
Sandip Kundu
Sandip Kundu University of Massachusetts Amherst
Raghavan Kumar
Raghavan Kumar Intel (United States)
Oliver Paul
Oliver Paul University of Freiburg
Irith Pomeranz
Irith Pomeranz Purdue University West Lafayette

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