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Hans-Joachim Wunderlich

Hans-Joachim Wunderlich

D-Index & Metrics

Computer Science

D-Index
43
Citations
8762
World Ranking
7917
National Ranking
385

Electronics and Electrical Engineering

D-Index
43
Citations
8739
World Ranking
3858
National Ranking
112

Overview

Hans-Joachim Wunderlich is affiliated with the University of Stuttgart in Germany, focusing on research at the intersection of engineering and computer science. Their work primarily addresses topics within electrical and electronic engineering, hardware and architecture, and control and systems engineering.

The scientist's research concentrates on several key areas:

  • VLSI and Analog Circuit Testing
  • Integrated Circuits and Semiconductor Failure Analysis
  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Radiation Effects in Electronics
  • Semiconductor Materials and Devices
  • Advanced Memory and Neural Computing
  • Fault Detection and Control Systems

Hans-Joachim Wunderlich has published extensively in specialized venues, contributing mainly to:

  • Journal of Electronic Testing
  • IEEE Design and Test
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
  • Applied and Environmental Microbiology

Recent publications authored or co-authored by Wunderlich include:

  • Stress-Aware Periodic Test of Interconnects, 2021, Journal of Electronic Testing
  • Identifying Resistive Open Defects in Embedded Cells under Variations, 2023, Journal of Electronic Testing
  • Workload-Aware Periodic Interconnect BIST, 2023, IEEE Design and Test
  • SCAR: Security Compliance Analysis and Resynthesis of Reconfigurable Scan Networks, 2022, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Robust Reconfigurable Scan Networks, 2022, 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)

The scientist frequently collaborates with researchers including Sybille Hellebrand, Natalia Lylina, Chih-Hao Wang, Somayeh Sadeghi-Kohan, and Zahra Paria Najafi-Haghi.

Best Publications

  • Minimized Power Consumption for Scan-Based BIST

    Stefan Gerstendörfer;Hans-Joachim Wunderlich

  • Multiple distributions for biased random test patterns

    H.-J. Wunderlich

  • A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters

    Sybille Hellebrand;Hua-Guo Liang;Hans-Joachim Wunderlich

  • Bit-flipping BIST

    Hans-Joachim Wunderlich;Gundolf Kiefer

  • Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST

    Hua-Guo Liang;Sybille Hellebrand;Hans-Joachim Wunderlich

  • Mixed-Mode BIST Using Embedded Processors

    Sybille Hellebrand;Hans-Joachim Wunderlich;Andre Hertwig

  • A modified clock scheme for a low power BIST test pattern generator

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • Pattern generation for a deterministic BIST scheme

    Sybille Hellebrand;Birgit Reeb;Steffen Tarnick;Hans-Joachim Wunderlich

  • PROTEST: A Tool for Probabilistic Testability Analysis

    Hans-Joachim Wunderlich

  • Adaptive Debug and Diagnosis without Fault Dictionaries

    S. Hoist;H.-J. Wunderlich

  • Adaptive Debug and Diagnosis Without Fault Dictionaries

    Stefan Holst;Hans-Joachim Wunderlich

  • X-masking during logic BIST and its impact on defect coverage

    Yuyi Tang;H.-J. Wunderlich;Piet Engelke;I. Polian

  • Self test using unequiprobable random patterns

    Hans-Joachim Wunderlich

  • An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy

    P. Ohler;S. Hellebrand;H.-J. Wunderlich

  • Application of deterministic logic BIST on industrial circuits

    G. Kiefer;H. Vranken;E.J. Marinissen;H.-J. Wunderlich

  • Design and architectures for dependable embedded systems

    Jörg Henkel;Lars Bauer;Joachim Becker;Oliver Bringmann

  • An analytical approach to the partial scan problem

    Unknown

  • Accumulator based deterministic BIST

    R. Dorsch;H.-J. Wunderlich

  • Tailoring ATPG for embedded testing

    R. Dorsch;H.J. Wunderlich

  • Deterministic BIST with Multiple Scan Chains

    Gundolf Kiefer;Hans-Joachim Wunderlich

  • Using BIST control for pattern generation

    G. Kiefer;H.-J. Wunderlich

Frequent Co-Authors

Bernd Becker
Bernd Becker University of Freiburg
Jorg Henkel
Jorg Henkel Karlsruhe Institute of Technology
Ilia Polian
Ilia Polian University of Stuttgart
Patrick Girard
Patrick Girard Montpellier Laboratory of Informatics, Robotics and Microelectronics
Xiaoqing Wen
Xiaoqing Wen Kyushu Institute of Technology
Jürgen Teich
Jürgen Teich University of Erlangen-Nuremberg
Seiji Kajihara
Seiji Kajihara Kyushu Institute of Technology
Wolfgang Rosenstiel
Wolfgang Rosenstiel University of Tübingen
Mehdi B. Tahoori
Mehdi B. Tahoori Karlsruhe Institute of Technology
Norbert Wehn
Norbert Wehn Technical University of Kaiserslautern

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