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Hans-Joachim Wunderlich

Hans-Joachim Wunderlich

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
43
Citations
8739
World Ranking
3858
National Ranking
111

Computer Science

D-Index
43
Citations
8762
World Ranking
7916
National Ranking
386

Hans-Joachim Wunderlich publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Hans-Joachim Wunderlich sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 324 publications — 62nd percentile

62% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Hans-Joachim Wunderlich D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Hans-Joachim Wunderlich sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 43 D-Index — 45th percentile

45% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Hans-Joachim Wunderlich is affiliated with the University of Stuttgart in Germany, focusing on research at the intersection of engineering and computer science. Their work primarily addresses topics within electrical and electronic engineering, hardware and architecture, and control and systems engineering.

The scientist's research concentrates on several key areas:

  • VLSI and Analog Circuit Testing
  • Integrated Circuits and Semiconductor Failure Analysis
  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Radiation Effects in Electronics
  • Semiconductor Materials and Devices
  • Advanced Memory and Neural Computing
  • Fault Detection and Control Systems

Hans-Joachim Wunderlich has published extensively in specialized venues, contributing mainly to:

  • Journal of Electronic Testing
  • IEEE Design and Test
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
  • Applied and Environmental Microbiology

Recent publications authored or co-authored by Wunderlich include:

  • Stress-Aware Periodic Test of Interconnects, 2021, Journal of Electronic Testing
  • Identifying Resistive Open Defects in Embedded Cells under Variations, 2023, Journal of Electronic Testing
  • Workload-Aware Periodic Interconnect BIST, 2023, IEEE Design and Test
  • SCAR: Security Compliance Analysis and Resynthesis of Reconfigurable Scan Networks, 2022, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Robust Reconfigurable Scan Networks, 2022, 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)

The scientist frequently collaborates with researchers including Sybille Hellebrand, Natalia Lylina, Chih-Hao Wang, Somayeh Sadeghi-Kohan, and Zahra Paria Najafi-Haghi.

Best Publications

  • Minimized Power Consumption for Scan-Based BIST

    Stefan Gerstendörfer;Hans-Joachim Wunderlich

  • Multiple distributions for biased random test patterns

    H.-J. Wunderlich

  • A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters

    Sybille Hellebrand;Hua-Guo Liang;Hans-Joachim Wunderlich

  • Bit-flipping BIST

    Hans-Joachim Wunderlich;Gundolf Kiefer

  • Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST

    Hua-Guo Liang;Sybille Hellebrand;Hans-Joachim Wunderlich

  • Mixed-Mode BIST Using Embedded Processors

    Sybille Hellebrand;Hans-Joachim Wunderlich;Andre Hertwig

  • A modified clock scheme for a low power BIST test pattern generator

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • Pattern generation for a deterministic BIST scheme

    Sybille Hellebrand;Birgit Reeb;Steffen Tarnick;Hans-Joachim Wunderlich

  • PROTEST: A Tool for Probabilistic Testability Analysis

    Hans-Joachim Wunderlich

  • Adaptive Debug and Diagnosis without Fault Dictionaries

    S. Hoist;H.-J. Wunderlich

  • Adaptive Debug and Diagnosis Without Fault Dictionaries

    Stefan Holst;Hans-Joachim Wunderlich

  • X-masking during logic BIST and its impact on defect coverage

    Yuyi Tang;H.-J. Wunderlich;Piet Engelke;I. Polian

  • Self test using unequiprobable random patterns

    Hans-Joachim Wunderlich

  • An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy

    P. Ohler;S. Hellebrand;H.-J. Wunderlich

  • Application of deterministic logic BIST on industrial circuits

    G. Kiefer;H. Vranken;E.J. Marinissen;H.-J. Wunderlich

  • Design and architectures for dependable embedded systems

    Jörg Henkel;Lars Bauer;Joachim Becker;Oliver Bringmann

  • An analytical approach to the partial scan problem

    Unknown

  • Accumulator based deterministic BIST

    R. Dorsch;H.-J. Wunderlich

  • Tailoring ATPG for embedded testing

    R. Dorsch;H.J. Wunderlich

  • Deterministic BIST with Multiple Scan Chains

    Gundolf Kiefer;Hans-Joachim Wunderlich

  • Using BIST control for pattern generation

    G. Kiefer;H.-J. Wunderlich

Frequent Co-Authors

Bernd Becker
Bernd Becker University of Freiburg
Jorg Henkel
Jorg Henkel Karlsruhe Institute of Technology
Ilia Polian
Ilia Polian University of Stuttgart
Patrick Girard
Patrick Girard Montpellier Laboratory of Informatics, Robotics and Microelectronics
Xiaoqing Wen
Xiaoqing Wen Kyushu Institute of Technology
Jürgen Teich
Jürgen Teich University of Erlangen-Nuremberg
Seiji Kajihara
Seiji Kajihara Kyushu Institute of Technology
Wolfgang Rosenstiel
Wolfgang Rosenstiel University of Tübingen
Mehdi B. Tahoori
Mehdi B. Tahoori Karlsruhe Institute of Technology
Norbert Wehn
Norbert Wehn Technical University of Kaiserslautern

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Related Online Degrees & Career Pathways

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Additionally, innovative learning models like competency based universities offer flexible options for students to progress based on skill mastery rather than traditional credit hours, making it an appealing pathway for tech professionals aiming to enhance their education efficiently.

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