World's Best Scientists 2026 revealed!

D-Index & Metrics

Computer Science

D-Index
30
Citations
4015
World Ranking
14074
National Ranking
235

Seiji Kajihara publication distribution in Computer Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Computer Science in 2026. The highlighted bar marks where Seiji Kajihara sits on this spectrum.

32–41 publications: 7 scientists 42–51 publications: 22 scientists 52–61 publications: 82 scientists 62–71 publications: 134 scientists 72–81 publications: 249 scientists 82–91 publications: 324 scientists 92–101 publications: 421 scientists 102–111 publications: 420 scientists 112–121 publications: 497 scientists 122–131 publications: 544 scientists 132–141 publications: 555 scientists 142–151 publications: 609 scientists 152–161 publications: 559 scientists 162–171 publications: 534 scientists 172–181 publications: 556 scientists 182–191 publications: 583 scientists 192–201 publications: 519 scientists 202–211 publications: 508 scientists 212–221 publications: 490 scientists 222–231 publications: 437 scientists 232–241 publications: 423 scientists 242–251 publications: 408 scientists 252–261 publications: 377 scientists 262–271 publications: 301 scientists 272–281 publications: 335 scientists 282–291 publications: 320 scientists 292–301 publications: 293 scientists 302–311 publications: 250 scientists 312–321 publications: 238 scientists 322–331 publications: 206 scientists 332–341 publications: 209 scientists 342–351 publications: 208 scientists 352–361 publications: 162 scientists 362–371 publications: 176 scientists 372–381 publications: 127 scientists 382–391 publications: 158 scientists 392–401 publications: 128 scientists 402–411 publications: 104 scientists 412–421 publications: 94 scientists 422–431 publications: 99 scientists 432–441 publications: 83 scientists 442–451 publications: 108 scientists 452–461 publications: 73 scientists 462–471 publications: 77 scientists 472–481 publications: 69 scientists 482–491 publications: 84 scientists 492–501 publications: 62 scientists 502–511 publications: 54 scientists 512–521 publications: 57 scientists 522–531 publications: 51 scientists 532–541 publications: 51 scientists 542–551 publications: 32 scientists 552–561 publications: 38 scientists 562–571 publications: 28 scientists 572–581 publications: 43 scientists 582–591 publications: 33 scientists 592–601 publications: 41 scientists 602–611 publications: 32 scientists 612–621 publications: 28 scientists 622–631 publications: 25 scientists 632–641 publications: 27 scientists 642–651 publications: 17 scientists 652–661 publications: 20 scientists 662–671 publications: 17 scientists 672–681 publications: 15 scientists 682–691 publications: 14 scientists 692–701 publications: 21 scientists 702–711 publications: 13 scientists 712–721 publications: 12 scientists 722–731 publications: 19 scientists 732–741 publications: 14 scientists 742–751 publications: 12 scientists 752–761 publications: 10 scientists 762–771 publications: 10 scientists 772–781 publications: 11 scientists 782–791 publications: 10 scientists 792–801 publications: 11 scientists 802–811 publications: 8 scientists 812–821 publications: 8 scientists 822–831 publications: 7 scientists 832–841 publications: 11 scientists 842–851 publications: 10 scientists 852–861 publications: 5 scientists 862–871 publications: 9 scientists 872–881 publications: 4 scientists 882–891 publications: 6 scientists 892–901 publications: 3 scientists 902–911 publications: 6 scientists 912–921 publications: 3 scientists 922–931 publications: 2 scientists 932–941 publications: 2 scientists 942–951 publications: 2 scientists 952–961 publications: 3 scientists 962–971 publications: 3 scientists 972–981 publications: 3 scientists 982–990 publications: 5 scientists 991+ publications: 100 scientists
32 publications 991+

This scientist: 217 publications — 52nd percentile

52% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 991 publications or more.

Seiji Kajihara D-index placement in Computer Science in 2026

The chart shows the D-index (discipline H-index) distribution of Computer Science scientists ranked by Research.com in 2026. The highlighted bar marks where Seiji Kajihara sits on this spectrum.

30–31 D-Index: 879 scientists 32–33 D-Index: 983 scientists 34–35 D-Index: 918 scientists 36–37 D-Index: 990 scientists 38–39 D-Index: 968 scientists 40–41 D-Index: 907 scientists 42–43 D-Index: 821 scientists 44–45 D-Index: 763 scientists 46–47 D-Index: 689 scientists 48–49 D-Index: 543 scientists 50–51 D-Index: 543 scientists 52–53 D-Index: 518 scientists 54–55 D-Index: 500 scientists 56–57 D-Index: 458 scientists 58–59 D-Index: 400 scientists 60–61 D-Index: 337 scientists 62–63 D-Index: 308 scientists 64–65 D-Index: 292 scientists 66–67 D-Index: 249 scientists 68–69 D-Index: 213 scientists 70–71 D-Index: 192 scientists 72–73 D-Index: 189 scientists 74–75 D-Index: 165 scientists 76–77 D-Index: 139 scientists 78–79 D-Index: 119 scientists 80–81 D-Index: 121 scientists 82–83 D-Index: 113 scientists 84–85 D-Index: 88 scientists 86–87 D-Index: 87 scientists 88–89 D-Index: 75 scientists 90–91 D-Index: 69 scientists 92–93 D-Index: 57 scientists 94–95 D-Index: 46 scientists 96–97 D-Index: 38 scientists 98–99 D-Index: 34 scientists 100–101 D-Index: 36 scientists 102–103 D-Index: 27 scientists 104–105 D-Index: 37 scientists 106–107 D-Index: 18 scientists 108–109 D-Index: 31 scientists 110–111 D-Index: 19 scientists 112–113 D-Index: 16 scientists 114–115 D-Index: 12 scientists 116–117 D-Index: 20 scientists 118–119 D-Index: 15 scientists 120–121 D-Index: 5 scientists 122–123 D-Index: 20 scientists 124–125 D-Index: 8 scientists 126–127 D-Index: 5 scientists 128–129 D-Index: 7 scientists 130 D-Index: 3 scientists 131+ D-Index: 98 scientists
30 D-Index 131+

This scientist: 30 D-Index — 3rd percentile

3% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 131 D-Index or more.

Overview

Seiji Kajihara is affiliated with the Kyushu Institute of Technology in Japan. Their research activity primarily spans the fields of engineering and computer science, with notable contributions in electrical and electronic engineering, biomedical engineering, hardware and architecture, signal processing, and information systems.

Their published works focus on various specialized topics within integrated circuit technologies and related areas. Main topics include:

  • Advancements in PLL and VCO Technologies
  • Optical Network Technologies
  • Radio Frequency Integrated Circuit Design
  • Photonic and Optical Devices
  • Analog and Mixed-Signal Circuit Design
  • VLSI and Analog Circuit Testing
  • Integrated Circuits and Semiconductor Failure Analysis

Their recent papers demonstrate a focus on precise timing and signal processing in FPGA and integrated circuits. Selected publications are:

  • High-Precision PLL Delay Matrix With Overclocking and Double Data Rate for Accurate FPGA Time-to-Digital Converters, 2020, IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • A 1-ps Bin Size 4.87-ps Resolution FPGA Time-to-Digital Converter Based on Phase Wrapping Sorting and Selection, 2022, IEEE Access
  • On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption, 2021, IEICE Transactions on Information and Systems
  • Area Efficient 0.009-mm2 28.1-ppm/°C 11.3-MHz ALL-MOS Relaxation Oscillator, 2024, IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Frequent venues for publication include:

  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • IEEE Access
  • IEICE Transactions on Information and Systems

Collaborative research is evident through several frequent coauthors, including:

  • Poki Chen
  • Tetsushi Ohki
  • Masakatsu Nishigaki
  • Ruei-Ting Wang
  • Y. Miyake

Seiji Kajihara's body of work contributes to the development and understanding of timing precision in FPGA technology, power integrity in integrated circuit testing, and oscillator design, among other areas related to advanced electronics and circuit systems.

Best Publications

  • Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits

    S. Kajihara;I. Pomeranz;K. Kinoshita;S.M. Reddy

  • On test data volume reduction for multiple scan chain designs

    Sudhakar M. Reddy;Kohei Miyase;Seiji Kajihara;Irith Pomeranz

  • On low-capture-power test generation for scan testing

    Xiaoqing Wen;Y. Yamashita;S. Kajihara;Laung-Terng Wang

  • Invisible delay quality - SDQM model lights up what could not be seen

    Y. Sato;S. Hamada;T. Maeda;A. Takatori

  • Low-capture-power test generation for scan-based at-speed testing

    Xiaoqing Wen;Y. Yamashita;S. Morishima;S. Kajihara

  • XID: Don't care identification of test patterns for combinational circuits

    K. Miyase;S. Kajihara

  • Test vector modification for power reduction during scan testing

    S. Kajihara;K. Ishida;K. Miyase

  • A new ATPG method for efficient capture power reduction during scan testing

    Xiaoqing Wen;S. Kajihara;K. Miyase;T. Suzuki

  • On identifying don't care inputs of test patterns for combinational circuits

    Seiji Kajihara;Kohei Miyase

  • A novel scheme to reduce power supply noise for high-quality at-speed scan testing

    Xiaoqing Wen;K. Miyase;S. Kajihara;T. Suzuki

  • Compact test sets for high defect coverage

    S.M. Reddy;I. Pomeranz;S. Kajihara

  • Selection of potentially testable path delay faults for test generation

    A. Murakami;S. Kajihara;T. Sasao;I. Pomeranz

  • Evaluation of the statistical delay quality model

    Yasuo Sato;Shuji Hamada;Toshiyuki Maeda;Atsuo Takatori

  • Critical-path-aware X-filling for effective IR-drop reduction in at-speed scan testing

    Xiaoqing Wen;Kohei Miyase;Tatsuya Suzuki;Seiji Kajihara

  • Random access scan: a solution to test power, test data volume and test time

    Dong Hyun Baik;K.K. Saluja;S. Kajihara

  • A method for identifying robust dependent and functionally unsensitizable paths

    S. Kajihara;K. Kinoshita;I. Pomeranz;S.M. Reddy

  • On the effects of test compaction on defect coverage

    S.M. Reddy;I. Pomeranz;S. Kajihara

  • On selecting testable paths in scan designs

    Yun Shao;S.M. Reddy;I. Pomeranz;S. Kajihara

  • A Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation

    Xiaoqing Wen;Kohei Miyase;Tatsuya Suzuki;Yuta Yamato

  • On testing of interconnect open defects in combinational logic circuits with stems of large fanout

    S.M. Reddy;I. Pomeranz;Huaxing Tang;S. Kajihara

  • On compacting test sets by addition and removal of test vectors

    S. Kajihara;I. Pomeranz;K. Kinoshita;S.M. Reddy

  • On per-test fault diagnosis using the X-fault model

    Xiaoqing Wen;Tokiharu Miyoshi;Seiji Kajihara;Laung-Terng Wang

  • An efficient method to identify untestable path delay faults

    Yun Shao;S.M. Reddy;S. Kajihara;I. Pomeranz

Frequent Co-Authors

Xiaoqing Wen
Xiaoqing Wen Kyushu Institute of Technology
Kewal K. Saluja
Kewal K. Saluja University of Wisconsin–Madison
Sudhakar M. Reddy
Sudhakar M. Reddy University of Iowa
Irith Pomeranz
Irith Pomeranz Purdue University West Lafayette
Hans-Joachim Wunderlich
Hans-Joachim Wunderlich University of Stuttgart
Patrick Girard
Patrick Girard Montpellier Laboratory of Informatics, Robotics and Microelectronics
Mohammad Tehranipoor
Mohammad Tehranipoor University of Florida
Krishnendu Chakrabarty
Krishnendu Chakrabarty Arizona State University
Satoshi Fukumoto
Satoshi Fukumoto Tohoku University
Bernd Becker
Bernd Becker University of Freiburg

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