D-Index & Metrics Best Publications

D-Index & Metrics

Discipline name D-index D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines. Citations Publications World Ranking National Ranking
Computer Science D-index 30 Citations 3,690 125 World Ranking 8233 National Ranking 3826
Electronics and Electrical Engineering D-index 31 Citations 3,378 122 World Ranking 3278 National Ranking 1281

Research.com Recognitions

Awards & Achievements

2000 - IEEE Fellow For contributions to the area of automatic test pattern generation and fault simulation for digital circuits.

Overview

What is he best known for?

The fields of study he is best known for:

  • Integrated circuit
  • Artificial intelligence
  • Electrical engineering

Wu-Tung Cheng spends much of his time researching Scan chain, Fault, Computer hardware, Electronic engineering and Embedded system. He combines subjects such as Fault coverage and Boundary scan with his study of Scan chain. The Fault study combines topics in areas such as Chain and Real-time computing.

His work deals with themes such as Reference data, Pipeline and Circuit design, which intersect with Computer hardware. His study in Electronic engineering is interdisciplinary in nature, drawing from both Design for testing, Resistor and Integrated circuit. His work is dedicated to discovering how Embedded system, Automatic test pattern generation are connected with Volume, Automatic test equipment and Computer engineering and other disciplines.

His most cited work include:

  • Optimal core wrapper width selection and SOC test scheduling based on 3-D bin packing algorithm (151 citations)
  • Resource allocation and test scheduling for concurrent test of core-based SOC design (135 citations)
  • Full-speed BIST controller for testing embedded synchronous memories (89 citations)

What are the main themes of his work throughout his whole career to date?

His scientific interests lie mostly in Scan chain, Fault, Electronic engineering, Algorithm and Automatic test pattern generation. The various areas that Wu-Tung Cheng examines in his Scan chain study include Chain, Computer hardware, Real-time computing, Artificial intelligence and Boundary scan. The concepts of his Computer hardware study are interwoven with issues in Test, Built-in self-test and Integrated circuit.

His Fault model study, which is part of a larger body of work in Fault, is frequently linked to Uncompressed video, bridging the gap between disciplines. His research in the fields of Logic gate overlaps with other disciplines such as Circuit extraction and Interposer. As a member of one scientific family, Wu-Tung Cheng mostly works in the field of Automatic test pattern generation, focusing on Fault coverage and, on occasion, Stuck-at fault.

He most often published in these fields:

  • Scan chain (26.17%)
  • Fault (23.83%)
  • Electronic engineering (22.90%)

What were the highlights of his more recent work (between 2015-2021)?

  • Scan chain (26.17%)
  • Algorithm (20.56%)
  • Fault (23.83%)

In recent papers he was focusing on the following fields of study:

Wu-Tung Cheng mostly deals with Scan chain, Algorithm, Fault, Chain and Artificial intelligence. His Scan chain study combines topics in areas such as Artificial neural network, Real-time computing and Benchmark. His Algorithm research includes elements of Volume, Memory array and Automatic test pattern generation.

He merges Fault with Pattern generation in his research. His research investigates the connection between Data mining and topics such as Integrated circuit that intersect with problems in Computer hardware. His biological study spans a wide range of topics, including Embedded system, Timing failure and Boundary scan.

Between 2015 and 2021, his most popular works were:

  • Scan Chain Diagnosis Based on Unsupervised Machine Learning (8 citations)
  • Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data (7 citations)
  • Volume diagnosis data mining (6 citations)

In his most recent research, the most cited papers focused on:

  • Statistics
  • Electrical engineering
  • Artificial intelligence

Wu-Tung Cheng mainly focuses on Fault, Chip, Pattern recognition, Artificial intelligence and Scan chain. His studies deal with areas such as Computer hardware, Clock signal and Integrated circuit as well as Fault. His work carried out in the field of Chip brings together such families of science as Design for testing, Static random-access memory, Test compression, Semiconductor device fabrication and Transistor.

His Pattern recognition research includes themes of Artificial neural network, Algorithm design, Key and Domain knowledge. Wu-Tung Cheng has included themes like Probabilistic analysis of algorithms, Statistical classification, Unsupervised learning, Code coverage and Root cause analysis in his Algorithm design study. His study in Scan chain is interdisciplinary in nature, drawing from both Load modeling, Silicon debug and Resolution.

This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.

Best Publications

Optimal core wrapper width selection and SOC test scheduling based on 3-D bin packing algorithm

Yu Huang;S.M. Reddy;Wu-Tung Cheng;P. Reuter.
international test conference (2002)

202 Citations

Resource allocation and test scheduling for concurrent test of core-based SOC design

Yu Huang;Wu-Tung Cheng;Chien-Chung Tsai;N. Mukherjee.
asian test symposium (2001)

181 Citations

Full-speed BIST controller for testing embedded synchronous memories

Wu-Tung Cheng;Christopher John Hill;Omar Kebichi.
(2001)

135 Citations

X-filter: filtering unknowns from compacted test responses

Manish Sharma;Wu-Tung Cheng.
international test conference (2005)

97 Citations

Using constrained scan cells to test integrated circuits

Thomas Hans Rinderknecht;Wu-Tung Cheng.
(2004)

96 Citations

Statistical diagnosis for intermittent scan chain hold-time fault

Yu Huang;Wu-Tung Cheng;S.M. Reddy;Cheng-Ju Hsieh.
international test conference (2003)

91 Citations

Testing embedded memories in an integrated circuit

Don E. Ross;Xiaogang Du;Wu-Tung Cheng;Joseph C. Rayhawk.
(2004)

89 Citations

Compactor independent direct diagnosis

Wu-Tung Cheng;Kun-Han Tsai;Yu Huang;N. Tamarapalli.
asian test symposium (2004)

86 Citations

Compactor independent direct diagnosis of test hardware

Yu Huang;Wu-Tung Cheng;Janusz Rajski.
(2005)

80 Citations

Survey of Scan Chain Diagnosis

Yu Huang;Ruifeng Guo;Wu-Tung Cheng;J.C.-M. Li.
IEEE Design & Test of Computers (2008)

77 Citations

Best Scientists Citing Wu-Tung Cheng

Irith Pomeranz

Irith Pomeranz

Purdue University West Lafayette

Publications: 89

Krishnendu Chakrabarty

Krishnendu Chakrabarty

Duke University

Publications: 84

Janusz Rajski

Janusz Rajski

Siemens (Germany)

Publications: 62

Sudhakar M. Reddy

Sudhakar M. Reddy

University of Iowa

Publications: 44

Janak H. Patel

Janak H. Patel

University of Illinois at Urbana-Champaign

Publications: 39

Jerzy Tyszer

Jerzy Tyszer

Poznań University of Technology

Publications: 36

Hans-Joachim Wunderlich

Hans-Joachim Wunderlich

University of Stuttgart

Publications: 28

Lee D. Whetsel

Lee D. Whetsel

Texas Instruments (United States)

Publications: 28

Erik Jan Marinissen

Erik Jan Marinissen

KU Leuven

Publications: 22

Xiaoqing Wen

Xiaoqing Wen

Kyushu Institute of Technology

Publications: 20

Bernd Becker

Bernd Becker

University of Freiburg

Publications: 20

Zebo Peng

Zebo Peng

Linköping University

Publications: 18

Niraj K. Jha

Niraj K. Jha

Princeton University

Publications: 18

Michael S. Hsiao

Michael S. Hsiao

Virginia Tech

Publications: 17

Vishwani D. Agrawal

Vishwani D. Agrawal

Auburn University

Publications: 17

Profile was last updated on December 6th, 2021.
Research.com Ranking is based on data retrieved from the Microsoft Academic Graph (MAG).
The ranking d-index is inferred from publications deemed to belong to the considered discipline.

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