World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
39
Citations
5603
World Ranking
4744
National Ranking
1663

Computer Science

D-Index
39
Citations
5656
World Ranking
9845
National Ranking
4146

Wu-Tung Cheng publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Wu-Tung Cheng sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 215 publications — 34th percentile

34% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Wu-Tung Cheng D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Wu-Tung Cheng sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 39 D-Index — 33rd percentile

33% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2000 - IEEE Fellow For contributions to the area of automatic test pattern generation and fault simulation for digital circuits.

Overview

Wu-Tung Cheng is affiliated with Mentor Graphics in the United States and has contributed to research primarily in the fields of engineering and computer science. Their work spans key subfields including electrical and electronic engineering, hardware and architecture, and applied mathematics.

The scientist's research interests focus on topics related to VLSI and analog circuit testing, integrated circuits and semiconductor failure analysis, VLSI and FPGA design techniques, mathematics education and pedagogy, as well as electrostatic discharge in electronics.

Wu-Tung Cheng's publication record includes articles in several notable venues:

  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • arXiv (Cornell University)
  • IEEE Design and Test

Recent papers authored or coauthored by Wu-Tung Cheng include:

  • "Efficient Test Compression Configuration Selection," 2021, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • "A Theoretical Review on Solving Algebra Problems," 2024, arXiv (Cornell University)
  • "Scan Integrity Tests for EDT Compression," 2020, IEEE Design and Test

Frequent collaborators in Cheng's research are Janusz Rajski, Chong-Siao Ye, Shi-Xuan Zheng, Fong-Jyun Tsai, and Chen Wang. Janusz Rajski stands out as a notable coauthor with multiple joint publications.

Wu-Tung Cheng has been recognized with the IEEE Fellow award in 2000, specifically acknowledging contributions to automatic test pattern generation and fault simulation for digital circuits.

Best Publications

  • PROOFS: a fast, memory-efficient sequential circuit fault simulator

    T.M. Niermann;Wu-Tung Cheng;J.H. Patel

  • Gentest: an automatic test-generation system for sequential circuits

    W.-T. Cheng;T.J. Chakraborty

  • Optimal core wrapper width selection and SOC test scheduling based on 3-D bin packing algorithm

    Yu Huang;S.M. Reddy;Wu-Tung Cheng;P. Reuter

  • On-chip comparison and response collection tools and techniques

    Nilanjan Mukherjee;Janusz Rajski;Jerzy Tyszer

  • Resource allocation and test scheduling for concurrent test of core-based SOC design

    Yu Huang;Wu-Tung Cheng;Chien-Chung Tsai;N. Mukherjee

  • Full-speed BIST controller for testing embedded synchronous memories

    Wu-Tung Cheng;Christopher John Hill;Omar Kebichi

  • Differential Fault Simulation - A Fast Method Using Minimal Memory

    Wu-Tung Cheng;Meng-Lin Yu

  • Diagnosis for wiring interconnects

    W.-T. Cheng;J.L. Lewandowski;E. Wu

  • Sequential Circuit Test Generator (STG) benchmark results

    W.-T. Cheng;S. Davidson

  • Testing embedded memories in an integrated circuit

    Don E. Ross;Xiaogang Du;Wu-Tung Cheng;Joseph C. Rayhawk

  • Survey of Scan Chain Diagnosis

    Yu Huang;Ruifeng Guo;Wu-Tung Cheng;J.C.-M. Li

  • Oscillation-Based Prebond TSV Test

    Li-Ren Huang;Shi-Yu Huang;Stephen Sunter;Kun-Han Tsai

  • X-filter: filtering unknowns from compacted test responses

    Manish Sharma;Wu-Tung Cheng

  • Full-speed field-programmable memory BIST architecture

    Xiaogang Du;N. Mukherjee;Wu-Tung Cheng;S.M. Reddy

  • Small delay testing for TSVs in 3-D ICs

    Shi-Yu Huang;Yu-Hsiang Lin;Kun-Han (Hans) Tsai;Wu-Tung Cheng

  • Statistical diagnosis for intermittent scan chain hold-time fault

    Yu Huang;Wu-Tung Cheng;S.M. Reddy;Cheng-Ju Hsieh

  • Compactor independent direct diagnosis

    Wu-Tung Cheng;Kun-Han Tsai;Yu Huang;N. Tamarapalli

  • SPLIT circuit model for test generation

    Wu-Tung Cheng

  • Using constrained scan cells to test integrated circuits

    Thomas Hans Rinderknecht;Wu-Tung Cheng

  • Compression mode diagnosis enables high volume monitoring diagnosis flow

    A. Leininger;P. Muhmenthaler;Wu-Tung Cheng;N. Tamarapalli

  • Reduced-pin-count-testing architectures for applying test patterns

    Nilanjan Mukherjee;Jay Jahangiri;Ronald Press;Wu-Tung Cheng

Frequent Co-Authors

Sudhakar M. Reddy
Sudhakar M. Reddy University of Iowa
Janusz Rajski
Janusz Rajski Siemens (Germany)
Jerzy Tyszer
Jerzy Tyszer Poznań University of Technology
Janak H. Patel
Janak H. Patel University of Illinois at Urbana-Champaign
Yu Hu
Yu Hu Institute Of Computing Technology
Bernd Becker
Bernd Becker University of Freiburg
Ilia Polian
Ilia Polian University of Stuttgart
Irith Pomeranz
Irith Pomeranz Purdue University West Lafayette

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Related Online Degrees & Career Pathways

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