World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
47
Citations
6847
World Ranking
3283
National Ranking
1220

Lee D. Whetsel publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Lee D. Whetsel sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 163 publications — 18th percentile

18% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Lee D. Whetsel D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Lee D. Whetsel sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 47 D-Index — 54th percentile

54% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

What is he best known for?

The fields of study he is best known for:

  • Operating system
  • Integrated circuit
  • Electrical engineering

Computer hardware, Integrated circuit, Electronic engineering, Electronic circuit and Embedded system are his primary areas of study. His Computer hardware research is multidisciplinary, relying on both Controller, Multiplexer and Interface. The study incorporates disciplines such as Domain and Debugging in addition to Interface.

His Integrated circuit research is multidisciplinary, incorporating elements of Test data and Signal. His Electronic engineering research incorporates themes from Wafer, Industrial design, Circuit switching, Automatic test pattern generation and Boundary scan. His study focuses on the intersection of Embedded system and fields such as Mixed-signal integrated circuit with connections in the field of Automatic test equipment, Built-in self-test, Boundary scan description language and Microcontroller.

His most cited work include:

  • An analysis of power reduction techniques in scan testing (176 citations)
  • An IEEE 1149.1 based test access architecture for ICs with embedded cores (155 citations)
  • Towards a standard for embedded core test: an example (154 citations)

What are the main themes of his work throughout his whole career to date?

His main research concerns Computer hardware, Integrated circuit, Embedded system, Electronic circuit and Electronic engineering. His Computer hardware research includes themes of Signal, Controller, Interface and Boundary scan. He combines subjects such as Test data, Control theory and Finite-state machine with his study of Integrated circuit.

His Embedded system study frequently draws parallels with other fields, such as Automatic test equipment. The Electronic circuit study combines topics in areas such as Digital signal processing, Die, Multi-core processor and Test response. Lee D. Whetsel usually deals with Electronic engineering and limits it to topics linked to Multiplexer and Distributor.

He most often published in these fields:

  • Computer hardware (68.57%)
  • Integrated circuit (29.14%)
  • Embedded system (27.43%)

What were the highlights of his more recent work (between 2015-2021)?

  • Computer hardware (68.57%)
  • Controller (20.14%)
  • Die (14.43%)

In recent papers he was focusing on the following fields of study:

Lee D. Whetsel focuses on Computer hardware, Controller, Die, Signal and Interface. His biological study spans a wide range of topics, including Electronic circuit, Boundary scan, Integrated circuit and Router. His work carried out in the field of Boundary scan brings together such families of science as Multiplexer, Electronic engineering, Interconnection and Scan chain.

His Die study also includes

  • Stack that connect with fields like Embedded system,
  • Wafer that intertwine with fields like Transceiver and Overhead,
  • Analog signal, which have a strong connection to Comparator. His work on Signal edge as part of general Signal research is frequently linked to Access port, bridging the gap between disciplines. His studies deal with areas such as Test data, Debugging, Finite-state machine and Voltage as well as Interface.

Between 2015 and 2021, his most popular works were:

  • IC interposer with TAP controller and output boundary scan cell (14 citations)
  • Programmable test compression architecture input/output shift register coupled to sci/sco/pco (4 citations)
  • 2-pin interface data input and output, controller and instruction circuitry (1 citations)

In his most recent research, the most cited papers focused on:

  • Operating system
  • Electrical engineering
  • Integrated circuit

His scientific interests lie mostly in Computer hardware, Die, Controller, Interface and Signal. The Register research Lee D. Whetsel does as part of his general Computer hardware study is frequently linked to other disciplines of science, such as Interposer, therefore creating a link between diverse domains of science. His Die study incorporates themes from Wafer, Buffer, Electrical engineering and Stack.

He works mostly in the field of Controller, limiting it down to topics relating to Serial communication and, in certain cases, Domain, Path and Mixed-signal integrated circuit. His Interface research incorporates elements of Debugging, Integrated circuit, Boundary scan and Clock signal. His studies deal with areas such as Port, Port and Parallel arrangement as well as Signal.

Best Publications

  • An IEEE 1149.1 based test access architecture for ICs with embedded cores

    L. Whetsel

  • Towards a standard for embedded core test: an example

    E.J. Marinissen;Y. Zorian;R. Kapur;T. Taylor

  • Addressable shadow port circuit

    Lee D. Whetsel

  • An analysis of power reduction techniques in scan testing

    J. Saxena;K.M. Butler;L. Whetsel

  • Selectively accessing test access ports in a multiple test access port environment

    Lee D. Whetsel

  • Tap linking module test access port controller with enable input

    Lee D. Whetsel

  • Integrated circuits carrying intellectual property cores and test ports

    Lee D. Whetsel

  • System scan path architecture

    Lee D. Whetsel

  • Probeless testing of pad buffers on wafer

    Lee D. Whetsel

  • Overview of the IEEE P1500 standard

    F. DaSilva;Y. Zorian;L. Whetsel;K. Arabi

  • Addressable test ports an approach to testing embedded cores

    L. Whetsel

  • Multiplexer coupled to second core output and first core input

    Lee D. Whetsel

  • Method and apparatus for streamlined testing of electrical circuits

    Lee D. Whetsel

  • Parallel scan distributors and collectors and process of testing integrated circuits

    Lee D. Whetsel

  • Core circuitry, input and output buffers, and four bypass switches

    Lee D. Whetsel

  • System scan path architecture with remote bus controller

    Lee D. Whetsel

  • Functional, tap, trace circuitry with multiplexed tap, trace data output

    Lee D. Whetsel

  • Control I/O coupling scan test port to test access port

    Lee D. Whetsel

  • Low overhead input and output boundary scan cells

    Lee D. Whetsel

  • Event qualified testing protocols for integrated circuits

    Lee D. Whetsel

  • Method and apparatus for selectable parallel execution of test operations

    Lee D. Whetsel

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