World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
47
Citations
6847
World Ranking
3283
National Ranking
1219

Overview

What is he best known for?

The fields of study he is best known for:

  • Operating system
  • Integrated circuit
  • Electrical engineering

Computer hardware, Integrated circuit, Electronic engineering, Electronic circuit and Embedded system are his primary areas of study. His Computer hardware research is multidisciplinary, relying on both Controller, Multiplexer and Interface. The study incorporates disciplines such as Domain and Debugging in addition to Interface.

His Integrated circuit research is multidisciplinary, incorporating elements of Test data and Signal. His Electronic engineering research incorporates themes from Wafer, Industrial design, Circuit switching, Automatic test pattern generation and Boundary scan. His study focuses on the intersection of Embedded system and fields such as Mixed-signal integrated circuit with connections in the field of Automatic test equipment, Built-in self-test, Boundary scan description language and Microcontroller.

His most cited work include:

  • An analysis of power reduction techniques in scan testing (176 citations)
  • An IEEE 1149.1 based test access architecture for ICs with embedded cores (155 citations)
  • Towards a standard for embedded core test: an example (154 citations)

What are the main themes of his work throughout his whole career to date?

His main research concerns Computer hardware, Integrated circuit, Embedded system, Electronic circuit and Electronic engineering. His Computer hardware research includes themes of Signal, Controller, Interface and Boundary scan. He combines subjects such as Test data, Control theory and Finite-state machine with his study of Integrated circuit.

His Embedded system study frequently draws parallels with other fields, such as Automatic test equipment. The Electronic circuit study combines topics in areas such as Digital signal processing, Die, Multi-core processor and Test response. Lee D. Whetsel usually deals with Electronic engineering and limits it to topics linked to Multiplexer and Distributor.

He most often published in these fields:

  • Computer hardware (68.57%)
  • Integrated circuit (29.14%)
  • Embedded system (27.43%)

What were the highlights of his more recent work (between 2015-2021)?

  • Computer hardware (68.57%)
  • Controller (20.14%)
  • Die (14.43%)

In recent papers he was focusing on the following fields of study:

Lee D. Whetsel focuses on Computer hardware, Controller, Die, Signal and Interface. His biological study spans a wide range of topics, including Electronic circuit, Boundary scan, Integrated circuit and Router. His work carried out in the field of Boundary scan brings together such families of science as Multiplexer, Electronic engineering, Interconnection and Scan chain.

His Die study also includes

  • Stack that connect with fields like Embedded system,
  • Wafer that intertwine with fields like Transceiver and Overhead,
  • Analog signal, which have a strong connection to Comparator. His work on Signal edge as part of general Signal research is frequently linked to Access port, bridging the gap between disciplines. His studies deal with areas such as Test data, Debugging, Finite-state machine and Voltage as well as Interface.

Between 2015 and 2021, his most popular works were:

  • IC interposer with TAP controller and output boundary scan cell (14 citations)
  • Programmable test compression architecture input/output shift register coupled to sci/sco/pco (4 citations)
  • 2-pin interface data input and output, controller and instruction circuitry (1 citations)

In his most recent research, the most cited papers focused on:

  • Operating system
  • Electrical engineering
  • Integrated circuit

His scientific interests lie mostly in Computer hardware, Die, Controller, Interface and Signal. The Register research Lee D. Whetsel does as part of his general Computer hardware study is frequently linked to other disciplines of science, such as Interposer, therefore creating a link between diverse domains of science. His Die study incorporates themes from Wafer, Buffer, Electrical engineering and Stack.

He works mostly in the field of Controller, limiting it down to topics relating to Serial communication and, in certain cases, Domain, Path and Mixed-signal integrated circuit. His Interface research incorporates elements of Debugging, Integrated circuit, Boundary scan and Clock signal. His studies deal with areas such as Port, Port and Parallel arrangement as well as Signal.

Best Publications

  • An IEEE 1149.1 based test access architecture for ICs with embedded cores

    L. Whetsel

  • Towards a standard for embedded core test: an example

    E.J. Marinissen;Y. Zorian;R. Kapur;T. Taylor

  • Addressable shadow port circuit

    Lee D. Whetsel

  • An analysis of power reduction techniques in scan testing

    J. Saxena;K.M. Butler;L. Whetsel

  • Selectively accessing test access ports in a multiple test access port environment

    Lee D. Whetsel

  • Tap linking module test access port controller with enable input

    Lee D. Whetsel

  • Integrated circuits carrying intellectual property cores and test ports

    Lee D. Whetsel

  • System scan path architecture

    Lee D. Whetsel

  • Probeless testing of pad buffers on wafer

    Lee D. Whetsel

  • Overview of the IEEE P1500 standard

    F. DaSilva;Y. Zorian;L. Whetsel;K. Arabi

  • Addressable test ports an approach to testing embedded cores

    L. Whetsel

  • Multiplexer coupled to second core output and first core input

    Lee D. Whetsel

  • Method and apparatus for streamlined testing of electrical circuits

    Lee D. Whetsel

  • Parallel scan distributors and collectors and process of testing integrated circuits

    Lee D. Whetsel

  • Core circuitry, input and output buffers, and four bypass switches

    Lee D. Whetsel

  • System scan path architecture with remote bus controller

    Lee D. Whetsel

  • Functional, tap, trace circuitry with multiplexed tap, trace data output

    Lee D. Whetsel

  • Control I/O coupling scan test port to test access port

    Lee D. Whetsel

  • Low overhead input and output boundary scan cells

    Lee D. Whetsel

  • Event qualified testing protocols for integrated circuits

    Lee D. Whetsel

  • Method and apparatus for selectable parallel execution of test operations

    Lee D. Whetsel

Frequent Co-Authors

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