World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
47
Citations
10575
World Ranking
3175
National Ranking
86

Computer Science

D-Index
48
Citations
10747
World Ranking
6125
National Ranking
140

Matteo Sonza Reorda publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Matteo Sonza Reorda sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 594 publications — 90th percentile

90% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Matteo Sonza Reorda D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Matteo Sonza Reorda sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 47 D-Index — 54th percentile

54% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Matteo Sonza Reorda is affiliated with the Polytechnic University of Turin in Italy. Their research primarily spans the fields of Computer Science and Engineering, with a particular focus on Electrical and Electronic Engineering and Hardware and Architecture. Their work also engages with subfields such as Software, Artificial Intelligence, and Computer Networks and Communications.

Their research topics cover a range of specialized areas including:

  • Radiation Effects in Electronics
  • VLSI and Analog Circuit Testing
  • Parallel Computing and Optimization Techniques
  • Integrated Circuits and Semiconductor Failure Analysis
  • Advanced Neural Network Applications
  • Adversarial Robustness in Machine Learning
  • Software Testing and Debugging Techniques

Matteo Sonza Reorda has published extensively in various venues. Their frequent publication venues include:

  • Electronics
  • IEEE Access
  • arXiv (Cornell University)
  • Microelectronics Reliability
  • IEEE Design and Test

Some recent papers illustrating their research contributions are:

  • "Efficient Hardware Architectures for Accelerating Deep Neural Networks: Survey," 2022, IEEE Access
  • "FlexGripPlus: An improved GPGPU model to support reliability analysis," 2020, Microelectronics Reliability
  • "Characterizing a Neutron-Induced Fault Model for Deep Neural Networks," 2022, IEEE Transactions on Nuclear Science
  • "Multilevel Simulation Methodology for FMECA Study Applied to a Complex Cyber-Physical System," 2020, Electronics
  • "An On-Line Testing Technique for the Scheduler Memory of a GPGPU," 2020, IEEE Access

Their frequent co-authors include:

  • Josie E. Rodriguez Condia
  • Juan-David Guerrero-Balaguera
  • Robert Limas Sierra
  • Riccardo Cantoro
  • Fernando Fernandes dos Santos

Best Publications

  • RT-level ITC'99 benchmarks and first ATPG results

    F. Corno;M.S. Reorda;G. Squillero

  • Microprocessor Software-Based Self-Testing

    Mihalis Psarakis;Dimitris Gizopoulos;Ernesto Sanchez;Matteo Sonza Reorda

  • Soft-error detection using control flow assertions

    O. Goloubeva;M. Rebaudengo;M. Sonza Reorda;M. Violante

  • On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based FPGAs

    F.L. Kastensmidt;L. Sterpone;L. Carro;M.S. Reorda

  • Soft-error detection through software fault-tolerance techniques

    M. Rebaudengo;M. Sonza Reorda;M. Torchiano;M. Violante

  • Software-Implemented Hardware Fault Tolerance

    Olga Goloubeva;Maurizio Rebaudengo;Matteo Sonza Reorda;Massimo Violante

  • Automatic test program generation: a case study

    F. Corno;E. Sanchez;M.S. Reorda;G. Squillero

  • GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits

    F. Corno;P. Prinetto;M. Rebaudengo;M. Sonza Reorda

  • Low power BIST via non-linear hybrid cellular automata

    F. Corno;M. Rebaudengo;M.S. Reorda;G. Squillero

  • A test pattern generation methodology for low power consumption

    E. Corno;P. Prinetto;M. Rebaudengo;M.S. Reorda

  • A source-to-source compiler for generating dependable software

    M. Rebaudengo;M.S. Reorda;M. Violante;M. Torchiano

  • An automatic test pattern generator for large sequential circuits based on Genetic Algorithms

    P. Prinetto;M. Rebaudengo;M. Sonza Reorda

  • Evaluating the effects of SEUs affecting the configuration memory of an SRAM-based FPGA

    M. Bellato;P. Bernardi;D. Bortolato;A. Candelori

  • An FPGA-Based Approach for Speeding-Up Fault Injection Campaigns on Safety-Critical Circuits

    P. Civera;L. Macchiarulo;M. Rebaudengo;M. Sonza Reorda

  • Exploiting circuit emulation for fast hardness evaluation

    P. Civera;L. Macchiarulo;M. Rebaudengo;M.S. Reorda

  • Using Benchmarks for Radiation Testing of Microprocessors and FPGAs

    Heather Quinn;William H. Robinson;Paolo Rech;Miguel Aguirre

  • On the test of microprocessor IP cores

    F. Corno;M. Sonza Reorda;G. Squillero;M. Violante

  • A new hybrid fault detection technique for systems-on-a-chip

    P. Bernardi;L.M.V. Bolzani;M. Rebaudengo;M.S. Reorda

  • A diagnostic test pattern generation algorithm

    Unknown

  • Fully automatic test program generation for microprocessor cores

    Unknown

  • GALLO: a genetic algorithm for floorplan area optimization

    M. Rebaudengo;M.S. Reorda

  • An Accurate Analysis of the Effects of Soft Errors in the Instruction and Data Caches of a Pipelined Microprocessor

    M. Rebaudengo;M.S. Reorda;M. Violante

Frequent Co-Authors

Maurizio Rebaudengo
Maurizio Rebaudengo Polytechnic University of Turin
Fulvio Corno
Fulvio Corno Polytechnic University of Turin
Massimo Violante
Massimo Violante Polytechnic University of Turin
Zebo Peng
Zebo Peng Linköping University
Luigi Carro
Luigi Carro Federal University of Rio Grande do Sul
Said Hamdioui
Said Hamdioui Delft University of Technology
Bernd Becker
Bernd Becker University of Freiburg
Patrick Girard
Patrick Girard Montpellier Laboratory of Informatics, Robotics and Microelectronics
Alessandro Paccagnella
Alessandro Paccagnella University of Padua
Fernanda Lima Kastensmidt
Fernanda Lima Kastensmidt Federal University of Rio Grande do Sul

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