H-Index & Metrics Best Publications

H-Index & Metrics

Discipline name H-index Citations Publications World Ranking National Ranking
Engineering and Technology D-index 32 Citations 4,245 248 World Ranking 5098 National Ranking 102

Overview

What is he best known for?

The fields of study he is best known for:

  • Electrical engineering
  • Integrated circuit
  • Central processing unit

His primary areas of study are Electronic engineering, Fault, Fault coverage, Static random-access memory and CMOS. In the subject of general Electronic engineering, his work in Logic family is often linked to Stacking, thereby combining diverse domains of study. Said Hamdioui works mostly in the field of Fault, limiting it down to topics relating to Parallel computing and, in certain cases, Port, Nonvolatile BIOS memory and Built-in self-test, as a part of the same area of interest.

His Fault coverage study incorporates themes from Real-time computing, Computer engineering and Conventional memory. His Static random-access memory research integrates issues from Electronic circuit and Embedded system. His research integrates issues of Transistor, Memristor, Logic gate and Reliability in his study of CMOS.

His most cited work include:

  • Why is CMOS scaling coming to an END (108 citations)
  • March SS: a test for all static simple RAM faults (103 citations)
  • An experimental analysis of spot defects in SRAMs: realistic fault models and tests (102 citations)

What are the main themes of his work throughout his whole career to date?

The scientist’s investigation covers issues in Electronic engineering, Embedded system, Fault, Reliability engineering and CMOS. His Electronic engineering research includes elements of Transistor, Voltage and Reliability. The Fault study combines topics in areas such as Spice and Parallel computing.

His Reliability engineering research is multidisciplinary, incorporating perspectives in Reliability, Die and Stack. His CMOS research includes themes of Electronic circuit, Memristor, Energy and Crossbar switch. Said Hamdioui usually deals with Fault coverage and limits it to topics linked to Set and Computer hardware.

He most often published in these fields:

  • Electronic engineering (30.67%)
  • Embedded system (18.10%)
  • Fault (16.56%)

What were the highlights of his more recent work (between 2018-2021)?

  • Electronic engineering (30.67%)
  • CMOS (15.34%)
  • Computation (6.75%)

In recent papers he was focusing on the following fields of study:

His primary areas of investigation include Electronic engineering, CMOS, Computation, Energy and Reliability engineering. His study in Electronic engineering is interdisciplinary in nature, drawing from both Electronic circuit, State, Magnetoresistive random-access memory, Voltage and Interconnection. The study incorporates disciplines such as Field and Logic level in addition to CMOS.

The concepts of his Computation study are interwoven with issues in Computer architecture and Memristor. His Reliability engineering research incorporates elements of Sense amplifier, Parametric statistics, Static random-access memory, Integrated circuit and Degradation. His Fault research is multidisciplinary, relying on both Test and Computer hardware.

Between 2018 and 2021, his most popular works were:

  • Introduction to spin wave computing (22 citations)
  • Challenges and Solutions in Emerging Memory Testing (20 citations)
  • An Introduction to Spin Wave Computing (18 citations)

In his most recent research, the most cited papers focused on:

  • Electrical engineering
  • Integrated circuit
  • Central processing unit

Said Hamdioui mainly focuses on Electronic engineering, CMOS, Computation, Logic gate and Electronic circuit. His work often combines Electronic engineering and Tunnel magnetoresistance studies. His studies in Logic gate integrate themes in fields like Energy, Fan-out and Topology.

His Electronic circuit study integrates concerns from other disciplines, such as Normalization, Transducer and Voltage. In his study, Degradation is inextricably linked to Static random-access memory, which falls within the broad field of Random access memory. The various areas that Said Hamdioui examines in his Fault study include Design for testing and Memory testing.

This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.

Best Publications

March SS: a test for all static simple RAM faults

S. Hamdioui;A.J. van de Goor;M. Rodgers.
memory technology design and testing (2002)

201 Citations

Why is CMOS scaling coming to an END

N.Z. Haron;S. Hamdioui.
2008 3rd International Design and Test Workshop (2008)

186 Citations

Testing static and dynamic faults in random access memories

S. Hamdioui;Z. Al-Ars;Ad.J. van de Goor.
vlsi test symposium (2002)

164 Citations

An experimental analysis of spot defects in SRAMs: realistic fault models and tests

S. Hamdioui;A.J. Van De Goor.
asian test symposium (2000)

156 Citations

Memristor based computation-in-memory architecture for data-intensive applications

Said Hamdioui;Lei Xie;Hoang Anh Du Nguyen;Mottaqiallah Taouil.
design, automation, and test in europe (2015)

135 Citations

The state-of-art and future trends in testing embedded memories

S. Hamdioui;G. Gaydadjiev;A.J. van de Goor.
memory technology, design and testing (2004)

127 Citations

Modeling SRAM start-up behavior for Physical Unclonable Functions

Mafalda Cortez;Apurva Dargar;Said Hamdioui;Geert-Jan Schrijen.
defect and fault tolerance in vlsi and nanotechnology systems (2012)

89 Citations

Testing Open Defects in Memristor-Based Memories

Said Hamdioui;Mottaqiallah Taouil;Nor Zaidi Haron.
IEEE Transactions on Computers (2015)

88 Citations

Linked faults in random access memories: concept, fault models, test algorithms, and industrial results

S. Hamdioui;Z. Al-Ars;A.J. van de Goor;M. Rodgers.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2004)

86 Citations

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Said Hamdioui.
(2004)

86 Citations

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