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Engineering and Technology

D-Index
42
Citations
7996
World Ranking
6484
National Ranking
131

Overview

Said Hamdioui is affiliated with Delft University of Technology in the Netherlands. The primary research fields include Engineering and Computer Science, with a focus on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Artificial Intelligence among other related subfields.

The research emphasizes various specialized topics such as:

  • Ferroelectric and Negative Capacitance Devices
  • Advanced Memory and Neural Computing
  • Magnetic properties of thin films
  • Quantum and electron transport phenomena
  • Semiconductor materials and devices
  • Neuroscience and Neural Engineering
  • Physical Unclonable Functions (PUFs) and Hardware Security

Some of the recent publications authored or co-authored by Said Hamdioui include:

  • Advances in Magnetics Roadmap on Spin-Wave Computing, 2022, IEEE Transactions on Magnetics
  • A Classification of Memory-Centric Computing, 2020, ACM Journal on Emerging Technologies in Computing Systems
  • Fan-out enabled spin wave majority gate, 2020, AIP Advances
  • Defects, Fault Modeling, and Test Development Framework for RRAMs, 2022, ACM Journal on Emerging Technologies in Computing Systems
  • Tutorial on memristor-based computing for smart edge applications, 2023, Memories - Materials Devices Circuits and Systems

Said Hamdioui has collaborated frequently with several researchers, including:

  • Mottaqiallah Taouil
  • Florin Ciubotaru
  • Sorin Cotöfană
  • Christoph Adelmann
  • Abdulqader Mahmoud

The scientist's work is often published in venues such as:

  • arXiv (Cornell University)
  • ACM Journal on Emerging Technologies in Computing Systems
  • IEEE Access
  • IEEE Transactions on Circuits and Systems I Regular Papers
  • Journal of Electronic Testing

Overall, Said Hamdioui's research spans across multiple facets of electronic engineering and computing, addressing both theoretical and applied aspects within the scope of hardware, materials, and neural systems.

Best Publications

  • Roadmap on Spin-Wave Computing.

    A. V. Chumak;P. Kabos;M. Wu;C. Abert

  • An Introduction to Spin Wave Computing

    Abdulqader Mahmoud;Florin Ciubotaru;Frederic Vanderveken;Andrii V. Chumak

  • Introduction to spin wave computing

    Abdulqader Mahmoud;Florin Ciubotaru;Frederic Vanderveken;Andrii V. Chumak

  • Why is CMOS scaling coming to an END

    N.Z. Haron;S. Hamdioui

  • March SS: a test for all static simple RAM faults

    S. Hamdioui;A.J. van de Goor;M. Rodgers

  • Testing static and dynamic faults in random access memories

    S. Hamdioui;Z. Al-Ars;Ad.J. van de Goor

  • An experimental analysis of spot defects in SRAMs: realistic fault models and tests

    S. Hamdioui;A.J. Van De Goor

  • Memristor based computation-in-memory architecture for data-intensive applications

    Said Hamdioui;Lei Xie;Hoang Anh Du Nguyen;Mottaqiallah Taouil

  • Memristor for computing: Myth or reality?

    Said Hamdioui;Shahar Kvatinsky;Gert Cauwenberghs;Lei Xie

  • The state-of-art and future trends in testing embedded memories

    S. Hamdioui;G. Gaydadjiev;A.J. van de Goor

  • Testing Open Defects in Memristor-Based Memories

    Said Hamdioui;Mottaqiallah Taouil;Nor Zaidi Haron

  • Scouting Logic: A Novel Memristor-Based Logic Design for Resistive Computing

    Lei Xie;H.A. Du Nguyen;Jintao Yu;Ali Kaichouhi

  • Modeling SRAM start-up behavior for Physical Unclonable Functions

    Mafalda Cortez;Apurva Dargar;Said Hamdioui;Geert-Jan Schrijen

  • On Defect Oriented Testing for Hybrid CMOS/Memristor Memory

    Nor Zaidi Haron;Said Hamdioui

  • Linked faults in random access memories: concept, fault models, test algorithms, and industrial results

    S. Hamdioui;Z. Al-Ars;A.J. van de Goor;M. Rodgers

  • Reliability challenges of real-time systems in forthcoming technology nodes

    Said Hamdioui;Dimitris Gizopoulos;Groeseneken Guido;Michael Nicolaidis

  • Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

    Said Hamdioui

  • Importance of dynamic faults for new SRAM technologies

    S. Hamdioui;R. Wadsworth;J. Delos Reyes;A.J. van de Goor

  • Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates

    Halil Kukner;Seyab Khan;Pieter Weckx;Praveen Raghavan

  • Testing Static Random Access Memories

    Said Hamdioui

  • Memristor based memories: Technology, design and test

    Said Hamdioui;Hassan Aziza;Georgios Ch. Sirakoulis

  • Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests

    Said Hamdioui;Zaid Al-Ars;Ad J. Van De Goor;Mike Rodgers

  • Test Cost Analysis for 3D Die-to-Wafer Stacking

    Mottaqiallah Taouil;Said Hamdioui;Kees Beenakker;Erik Jan Marinissen

Frequent Co-Authors

Koen Bertels
Koen Bertels Delft University of Technology
Wim Dehaene
Wim Dehaene KU Leuven
Matteo Sonza Reorda
Matteo Sonza Reorda Polytechnic University of Turin
Mehdi B. Tahoori
Mehdi B. Tahoori Karlsruhe Institute of Technology
Henk Corporaal
Henk Corporaal Eindhoven University of Technology

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