His primary areas of study are Electronic engineering, Fault, Fault coverage, Static random-access memory and CMOS. In the subject of general Electronic engineering, his work in Logic family is often linked to Stacking, thereby combining diverse domains of study. Said Hamdioui works mostly in the field of Fault, limiting it down to topics relating to Parallel computing and, in certain cases, Port, Nonvolatile BIOS memory and Built-in self-test, as a part of the same area of interest.
His Fault coverage study incorporates themes from Real-time computing, Computer engineering and Conventional memory. His Static random-access memory research integrates issues from Electronic circuit and Embedded system. His research integrates issues of Transistor, Memristor, Logic gate and Reliability in his study of CMOS.
The scientist’s investigation covers issues in Electronic engineering, Embedded system, Fault, Reliability engineering and CMOS. His Electronic engineering research includes elements of Transistor, Voltage and Reliability. The Fault study combines topics in areas such as Spice and Parallel computing.
His Reliability engineering research is multidisciplinary, incorporating perspectives in Reliability, Die and Stack. His CMOS research includes themes of Electronic circuit, Memristor, Energy and Crossbar switch. Said Hamdioui usually deals with Fault coverage and limits it to topics linked to Set and Computer hardware.
His primary areas of investigation include Electronic engineering, CMOS, Computation, Energy and Reliability engineering. His study in Electronic engineering is interdisciplinary in nature, drawing from both Electronic circuit, State, Magnetoresistive random-access memory, Voltage and Interconnection. The study incorporates disciplines such as Field and Logic level in addition to CMOS.
The concepts of his Computation study are interwoven with issues in Computer architecture and Memristor. His Reliability engineering research incorporates elements of Sense amplifier, Parametric statistics, Static random-access memory, Integrated circuit and Degradation. His Fault research is multidisciplinary, relying on both Test and Computer hardware.
Said Hamdioui mainly focuses on Electronic engineering, CMOS, Computation, Logic gate and Electronic circuit. His work often combines Electronic engineering and Tunnel magnetoresistance studies. His studies in Logic gate integrate themes in fields like Energy, Fan-out and Topology.
His Electronic circuit study integrates concerns from other disciplines, such as Normalization, Transducer and Voltage. In his study, Degradation is inextricably linked to Static random-access memory, which falls within the broad field of Random access memory. The various areas that Said Hamdioui examines in his Fault study include Design for testing and Memory testing.
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
March SS: a test for all static simple RAM faults
S. Hamdioui;A.J. van de Goor;M. Rodgers.
memory technology design and testing (2002)
Why is CMOS scaling coming to an END
N.Z. Haron;S. Hamdioui.
2008 3rd International Design and Test Workshop (2008)
Testing static and dynamic faults in random access memories
S. Hamdioui;Z. Al-Ars;Ad.J. van de Goor.
vlsi test symposium (2002)
An experimental analysis of spot defects in SRAMs: realistic fault models and tests
S. Hamdioui;A.J. Van De Goor.
asian test symposium (2000)
Memristor based computation-in-memory architecture for data-intensive applications
Said Hamdioui;Lei Xie;Hoang Anh Du Nguyen;Mottaqiallah Taouil.
design, automation, and test in europe (2015)
The state-of-art and future trends in testing embedded memories
S. Hamdioui;G. Gaydadjiev;A.J. van de Goor.
memory technology, design and testing (2004)
Introduction to spin wave computing
Abdulqader Mahmoud;Florin Ciubotaru;Frederic Vanderveken;Andrii V. Chumak.
Journal of Applied Physics (2020)
Modeling SRAM start-up behavior for Physical Unclonable Functions
Mafalda Cortez;Apurva Dargar;Said Hamdioui;Geert-Jan Schrijen.
defect and fault tolerance in vlsi and nanotechnology systems (2012)
Memristor for computing: Myth or reality?
Said Hamdioui;Shahar Kvatinsky;Gert Cauwenberghs;Lei Xie.
design, automation, and test in europe (2017)
Testing Open Defects in Memristor-Based Memories
Said Hamdioui;Mottaqiallah Taouil;Nor Zaidi Haron.
IEEE Transactions on Computers (2015)
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