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Patrick Girard

D-Index & Metrics

Discipline name D-Index World Ranking Current World Ranking National Ranking Current National Ranking Publications Citations
Electronics and Electrical Engineering 45 3553 3409 54 52 529 8117

Patrick Girard publications per year

The chart shows the history of publications by Patrick Girard between 1976 and 2025, highlighting the no. of papers published in each year and offering an overview of the publication velocity of this scholar. Patrick Girard published across 50 years, from 1976 to 2025, averaging 16.2 papers a year. Output peaked at 54 publications in 2013. 28 of the 812 publications appeared in the last two years.

No. of publications
10 20 30 40 50
Bar chart. Horizontal axis: year, 1976 to 2025. Vertical axis: number of publications, 0 to 54. Peak 54 publications in 2013. 1976: 2 publications 1977: 3 publications 1978: 3 publications 1979: 2 publications 1980: 4 publications 1981: 1 publication 1982: 0 publications 1983: 3 publications 1984: 1 publication 1985: 0 publications 1986: 1 publication 1987: 2 publications 1988: 4 publications 1989: 4 publications 1990: 9 publications 1991: 3 publications 1992: 12 publications 1993: 6 publications 1994: 4 publications 1995: 5 publications 1996: 5 publications 1997: 14 publications 1998: 10 publications 1999: 13 publications 2000: 11 publications 2001: 15 publications 2002: 18 publications 2003: 22 publications 2004: 21 publications 2005: 25 publications 2006: 29 publications 2007: 25 publications 2008: 31 publications 2009: 25 publications 2010: 41 publications 2011: 38 publications 2012: 47 publications 2013: 54 publications 2014: 45 publications 2015: 29 publications 2016: 28 publications 2017: 36 publications 2018: 14 publications 2019: 8 publications 2020: 27 publications 2021: 22 publications 2022: 29 publications 2023: 33 publications 2024: 13 publications 2025: 15 publications
1976 2025

812 publications in total across all disciplines

View publications per year as a table
Patrick Girard: publications per year, 1976 to 2025
Year Publications
1976 2
1977 3
1978 3
1979 2
1980 4
1981 1
1982 0
1983 3
1984 1
1985 0
1986 1
1987 2
1988 4
1989 4
1990 9
1991 3
1992 12
1993 6
1994 4
1995 5
1996 5
1997 14
1998 10
1999 13
2000 11
2001 15
2002 18
2003 22
2004 21
2005 25
2006 29
2007 25
2008 31
2009 25
2010 41
2011 38
2012 47
2013 54
2014 45
2015 29
2016 28
2017 36
2018 14
2019 8
2020 27
2021 22
2022 29
2023 33
2024 13
2025 15
Total 812
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Patrick Girard publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Patrick Girard sits on this spectrum.

No. of scientists
100 200 300 400
Bar chart with 53 bars. Horizontal axis: publications, 34–53 to 1,065+. Vertical axis: number of scientists, 0 to 445. Most scientists, 445, have 174–193 publications. The last bar groups every scientist with 1,065 publications or more. The highlighted bar, 514–533 publications, is where this scientist sits. 34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34–53 publications 1,065+

This scientist: 529 publications — 86th percentile

86% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

View publications distribution as a table
Number of Electronics and Electrical Engineering scientists by publication count, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
Publications Scientists This scientist
34–53 24
54–73 52
74–93 114
94–113 203
114–133 269
134–153 355
154–173 403
174–193 445
194–213 430
214–233 431
234–253 399
254–273 366
274–293 335
294–313 300
314–333 276
334–353 250
354–373 214
374–393 187
394–413 152
414–433 169
434–453 147
454–473 111
474–493 117
494–513 103
514–533 99 529
534–553 92
554–573 75
574–593 58
594–613 69
614–633 50
634–653 62
654–673 54
674–693 44
694–713 37
714–733 28
734–753 26
754–773 26
774–793 19
794–813 23
814–833 20
834–853 16
854–873 20
874–893 11
894–913 11
914–933 16
934–953 13
954–973 10
974–993 11
994–1,013 9
1,014–1,033 9
1,034–1,053 10
1,054–1,064 6
1,065+ 99
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Patrick Girard D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Patrick Girard sits on this spectrum.

No. of scientists
50 100 150 200 250
Bar chart with 82 bars. Horizontal axis: D-Index, 30 to 111+. Vertical axis: number of scientists, 0 to 263. Most scientists, 263, have 32 D-Index. The last bar groups every scientist with 111 D-Index or more. The highlighted bar, 45 D-Index, is where this scientist sits. 30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 45 D-Index — 50th percentile

50% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

View D-Index distribution as a table
Number of Electronics and Electrical Engineering scientists by D-index, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
D-Index Scientists This scientist
30 178
31 257
32 263
33 262
34 244
35 236
36 211
37 220
38 214
39 214
40 205
41 187
42 194
43 201
44 155
45 189 45
46 148
47 160
48 134
49 130
50 141
51 156
52 108
53 130
54 112
55 97
56 111
57 102
58 108
59 120
60 103
61 93
62 92
63 74
64 77
65 73
66 64
67 69
68 60
69 39
70 57
71 59
72 46
73 49
74 38
75 35
76 32
77 35
78 31
79 22
80 34
81 31
82 34
83 23
84 18
85 30
86 19
87 19
88 20
89 8
90 17
91 7
92 14
93 9
94 15
95 10
96 12
97 10
98 10
99 12
100 16
101 5
102 7
103 7
104 8
105 9
106 13
107 4
108 5
109 10
110 8
111+ 96
Download as CSV

Research.com Recognitions

  • 2015 - IEEE Fellow For contributions to power-aware testing of VLSI circuits

Overview

Patrick Girard is affiliated with the Montpellier Laboratory of Informatics, Robotics and Microelectronics in France. Their research spans primarily the field of Engineering, with a focus on Electrical and Electronic Engineering. Additional subfields include Hardware and Architecture, Atomic and Molecular Physics and Optics, Astronomy and Astrophysics, and Computational Theory and Mathematics.

The main topics covered in their work include Radiation Effects in Electronics, VLSI and Analog Circuit Testing, Semiconductor Materials and Devices, Low-power High-performance VLSI Design, Advanced Memory and Neural Computing, Integrated Circuits and Semiconductor Failure Analysis, and Advancements in Semiconductor Devices and Circuit Design.

Patrick Girard's recent publications illustrate the focus of their research in circuit design, reliability, and fault tolerance in electronic systems. Notable papers include:

  • IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-I: REGULAR PAPERS, 2022, IEEE Transactions on Circuits and Systems I Regular Papers
  • Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment, 2020, IEEE Transactions on Computers
  • Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments, 2020, IEEE Transactions on Emerging Topics in Computing
  • IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-I: REGULAR PAPERS, 2022, IEEE Transactions on Circuits and Systems I Regular Papers
  • Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets, 2020, IEEE Transactions on Circuits and Systems I Regular Papers

The frequent co-authors in Patrick Girard's collaborations reflect a network of researchers specializing in related domains. These include:

  • Aibin Yan
  • Xiaoqing Wen
  • Zhengfeng Huang
  • Jie Cui
  • Tianming Ni

Publication venues where Patrick Girard has contributed extensively include:

  • IEEE Transactions on Circuits and Systems I Regular Papers
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • IEEE Transactions on Aerospace and Electronic Systems
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Electronics

Throughout the career, Patrick Girard has been recognized as an IEEE Fellow in 2015 for contributions to power-aware testing of VLSI circuits.

Best Publications

  • Survey of low-power testing of VLSI circuits

    P. Girard

  • Observation of exclusive deeply virtual Compton scattering in polarized electron beam asymmetry measurements

    S. Stepanyan;S. Stepanyan;S. Barrow;J.R. Calarco;A. Empl

  • Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions

    Unknown

  • IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—I: REGULAR PAPERS

    Sankar Basu;Guanrong Chen;Andreas G. Andreou

  • A test vector inhibiting technique for low energy BIST design

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • A modified clock scheme for a low power BIST test pattern generator

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • A gated clock scheme for low power scan testing of logic ICs or embedded cores

    Y. Bonhomme;P. Girard;L. Guiller;C. Landrault

  • Characterization of an SRAM based particle detector for mixed-field radiation environments

    G. Tsiligiannis;L. Dilillo;A. Bosio;P. Girard

  • Reducing power consumption during test application by test vector ordering

    P. Girard;C. Landrault;S. Pravossoudovitch;D. Severac

  • Power-Aware Testing and Test Strategies for Low Power Devices

    Dimitris Gizopoulos;Kaushik Roy;Patrick Girard;Nicola Nicolici

  • Power driven chaining of flip-flops in scan architectures

    Y. Bonhomme;P. Girard;C. Landrault;S. Pravossoudovitch

  • Low Power BIST by Filtering Non-Detecting Vectors

    S. Manich;A. Gabarró;M. Lopez;J. Figueras

  • A test vector ordering technique for switching activity reduction during test operation

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • Low power testing of VLSI circuits: problems and solutions

    P. Girard

  • Power-Aware Testing and Test Strategies for Low Power Devices

    Patrick Girard;Nicola Nicolici;Xiaoqing Wen

  • Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • Efficient scan chain design for power minimization during scan testing under routing constraint

    Y. Borthomme;P. Girard;L. Guiller;C. Landrault

  • A novel scheme to reduce power supply noise for high-quality at-speed scan testing

    Xiaoqing Wen;K. Miyase;S. Kajihara;T. Suzuki

  • A Study of Tapered 3-D TSVs for Power and Thermal Integrity

    A. Todri;S. Kundu;P. Girard;A. Bosio

  • Quadruple and Sextuple Cross-Coupled SRAM Cell Designs With Optimized Overhead for Reliable Applications

    Unknown

  • Circuit partitioning for low power BIST design with minimized peak power consumption

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • Low power BIST design by hypergraph partitioning: methodology and architectures

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • On calculating efficient LFSR seeds for built-in self test

    C. Fagot;O. Gascuel;P. Girard;C. Landrault

  • Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment

    Aibin Yan;Yuanjie Hu;Jie Cui;Zhili Chen

Frequent Co-Authors

Volker D. Burkert
Volker D. Burkert Thomas Jefferson National Accelerator Facility
M. Guidal
M. Guidal University of Paris-Saclay
K. Hicks
K. Hicks Ohio University
R. A. Schumacher
R. A. Schumacher Carnegie Mellon University
S. E. Kuhn
S. E. Kuhn Old Dominion University
J. Napolitano
J. Napolitano Temple University

External Links

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Completing a project management bachelor degree online can further enhance career prospects by combining technical knowledge with managerial skills. This integrated approach prepares graduates for diverse roles in engineering and beyond, emphasizing the value of continuous learning in dynamic industries.

Best Scientists Citing Patrick Girard

Volker D. Burkert

Volker D. Burkert

Thomas Jefferson National Accelerator Facility

Publications: 76

G. Rosner

G. Rosner

University of Glasgow

Publications: 59

Xiaoqing Wen

Xiaoqing Wen

Kyushu Institute of Technology

Publications: 57

Irith Pomeranz

Irith Pomeranz

Purdue University West Lafayette

Publications: 53

Krishnendu Chakrabarty

Krishnendu Chakrabarty

Arizona State University

Publications: 50

Janusz Rajski

Janusz Rajski

Siemens (Germany)

Publications: 49

R. A. Schumacher

R. A. Schumacher

Carnegie Mellon University

Publications: 48

M. Guidal

M. Guidal

University of Paris-Saclay

Publications: 45

K. Livingston

K. Livingston

University of Glasgow

Publications: 43

K. Hicks

K. Hicks

Ohio University

Publications: 43

Said Hamdioui

Said Hamdioui

Delft University of Technology

Publications: 39

Sudhakar M. Reddy

Sudhakar M. Reddy

University of Iowa

Publications: 39

Seiji Kajihara

Seiji Kajihara

Kyushu Institute of Technology

Publications: 36

E. Klempt

E. Klempt

University of Bonn

Publications: 36

S. E. Kuhn

S. E. Kuhn

Old Dominion University

Publications: 34

Jerzy Tyszer

Jerzy Tyszer

Poznań University of Technology

Publications: 28

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