World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
45
Citations
8117
World Ranking
3553
National Ranking
54

Patrick Girard publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Patrick Girard sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 529 publications — 86th percentile

86% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Patrick Girard D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Patrick Girard sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 45 D-Index — 50th percentile

50% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2015 - IEEE Fellow For contributions to power-aware testing of VLSI circuits

Overview

Patrick Girard is affiliated with the Montpellier Laboratory of Informatics, Robotics and Microelectronics in France. Their research spans primarily the field of Engineering, with a focus on Electrical and Electronic Engineering. Additional subfields include Hardware and Architecture, Atomic and Molecular Physics and Optics, Astronomy and Astrophysics, and Computational Theory and Mathematics.

The main topics covered in their work include Radiation Effects in Electronics, VLSI and Analog Circuit Testing, Semiconductor Materials and Devices, Low-power High-performance VLSI Design, Advanced Memory and Neural Computing, Integrated Circuits and Semiconductor Failure Analysis, and Advancements in Semiconductor Devices and Circuit Design.

Patrick Girard's recent publications illustrate the focus of their research in circuit design, reliability, and fault tolerance in electronic systems. Notable papers include:

  • IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-I: REGULAR PAPERS, 2022, IEEE Transactions on Circuits and Systems I Regular Papers
  • Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment, 2020, IEEE Transactions on Computers
  • Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments, 2020, IEEE Transactions on Emerging Topics in Computing
  • IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-I: REGULAR PAPERS, 2022, IEEE Transactions on Circuits and Systems I Regular Papers
  • Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets, 2020, IEEE Transactions on Circuits and Systems I Regular Papers

The frequent co-authors in Patrick Girard's collaborations reflect a network of researchers specializing in related domains. These include:

  • Aibin Yan
  • Xiaoqing Wen
  • Zhengfeng Huang
  • Jie Cui
  • Tianming Ni

Publication venues where Patrick Girard has contributed extensively include:

  • IEEE Transactions on Circuits and Systems I Regular Papers
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • IEEE Transactions on Aerospace and Electronic Systems
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Electronics

Throughout the career, Patrick Girard has been recognized as an IEEE Fellow in 2015 for contributions to power-aware testing of VLSI circuits.

Best Publications

  • Survey of low-power testing of VLSI circuits

    P. Girard

  • Observation of exclusive deeply virtual Compton scattering in polarized electron beam asymmetry measurements

    S. Stepanyan;S. Stepanyan;S. Barrow;J.R. Calarco;A. Empl

  • Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions

    Unknown

  • IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—I: REGULAR PAPERS

    Sankar Basu;Guanrong Chen;Andreas G. Andreou

  • A test vector inhibiting technique for low energy BIST design

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • A modified clock scheme for a low power BIST test pattern generator

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • A gated clock scheme for low power scan testing of logic ICs or embedded cores

    Y. Bonhomme;P. Girard;L. Guiller;C. Landrault

  • Characterization of an SRAM based particle detector for mixed-field radiation environments

    G. Tsiligiannis;L. Dilillo;A. Bosio;P. Girard

  • Reducing power consumption during test application by test vector ordering

    P. Girard;C. Landrault;S. Pravossoudovitch;D. Severac

  • Power-Aware Testing and Test Strategies for Low Power Devices

    Dimitris Gizopoulos;Kaushik Roy;Patrick Girard;Nicola Nicolici

  • Power driven chaining of flip-flops in scan architectures

    Y. Bonhomme;P. Girard;C. Landrault;S. Pravossoudovitch

  • Low Power BIST by Filtering Non-Detecting Vectors

    S. Manich;A. Gabarró;M. Lopez;J. Figueras

  • A test vector ordering technique for switching activity reduction during test operation

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • Low power testing of VLSI circuits: problems and solutions

    P. Girard

  • Power-Aware Testing and Test Strategies for Low Power Devices

    Patrick Girard;Nicola Nicolici;Xiaoqing Wen

  • Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • Efficient scan chain design for power minimization during scan testing under routing constraint

    Y. Borthomme;P. Girard;L. Guiller;C. Landrault

  • A novel scheme to reduce power supply noise for high-quality at-speed scan testing

    Xiaoqing Wen;K. Miyase;S. Kajihara;T. Suzuki

  • A Study of Tapered 3-D TSVs for Power and Thermal Integrity

    A. Todri;S. Kundu;P. Girard;A. Bosio

  • Quadruple and Sextuple Cross-Coupled SRAM Cell Designs With Optimized Overhead for Reliable Applications

    Unknown

  • Circuit partitioning for low power BIST design with minimized peak power consumption

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • Low power BIST design by hypergraph partitioning: methodology and architectures

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • On calculating efficient LFSR seeds for built-in self test

    C. Fagot;O. Gascuel;P. Girard;C. Landrault

  • Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment

    Aibin Yan;Yuanjie Hu;Jie Cui;Zhili Chen

Frequent Co-Authors

Volker D. Burkert
Volker D. Burkert Thomas Jefferson National Accelerator Facility
M. Guidal
M. Guidal University of Paris-Saclay
K. Hicks
K. Hicks Ohio University
R. A. Schumacher
R. A. Schumacher Carnegie Mellon University
S. E. Kuhn
S. E. Kuhn Old Dominion University
J. Napolitano
J. Napolitano Temple University

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