World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
45
Citations
8117
World Ranking
3553
National Ranking
54

Research.com Recognitions

  • 2015 - IEEE Fellow For contributions to power-aware testing of VLSI circuits

Overview

Patrick Girard is affiliated with the Montpellier Laboratory of Informatics, Robotics and Microelectronics in France. Their research spans primarily the field of Engineering, with a focus on Electrical and Electronic Engineering. Additional subfields include Hardware and Architecture, Atomic and Molecular Physics and Optics, Astronomy and Astrophysics, and Computational Theory and Mathematics.

The main topics covered in their work include Radiation Effects in Electronics, VLSI and Analog Circuit Testing, Semiconductor Materials and Devices, Low-power High-performance VLSI Design, Advanced Memory and Neural Computing, Integrated Circuits and Semiconductor Failure Analysis, and Advancements in Semiconductor Devices and Circuit Design.

Patrick Girard's recent publications illustrate the focus of their research in circuit design, reliability, and fault tolerance in electronic systems. Notable papers include:

  • IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-I: REGULAR PAPERS, 2022, IEEE Transactions on Circuits and Systems I Regular Papers
  • Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment, 2020, IEEE Transactions on Computers
  • Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments, 2020, IEEE Transactions on Emerging Topics in Computing
  • IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-I: REGULAR PAPERS, 2022, IEEE Transactions on Circuits and Systems I Regular Papers
  • Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets, 2020, IEEE Transactions on Circuits and Systems I Regular Papers

The frequent co-authors in Patrick Girard's collaborations reflect a network of researchers specializing in related domains. These include:

  • Aibin Yan
  • Xiaoqing Wen
  • Zhengfeng Huang
  • Jie Cui
  • Tianming Ni

Publication venues where Patrick Girard has contributed extensively include:

  • IEEE Transactions on Circuits and Systems I Regular Papers
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • IEEE Transactions on Aerospace and Electronic Systems
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Electronics

Throughout the career, Patrick Girard has been recognized as an IEEE Fellow in 2015 for contributions to power-aware testing of VLSI circuits.

Best Publications

  • Survey of low-power testing of VLSI circuits

    P. Girard

  • Observation of exclusive deeply virtual Compton scattering in polarized electron beam asymmetry measurements

    S. Stepanyan;S. Stepanyan;S. Barrow;J.R. Calarco;A. Empl

  • Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions

    Unknown

  • IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—I: REGULAR PAPERS

    Sankar Basu;Guanrong Chen;Andreas G. Andreou

  • A test vector inhibiting technique for low energy BIST design

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • A modified clock scheme for a low power BIST test pattern generator

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • A gated clock scheme for low power scan testing of logic ICs or embedded cores

    Y. Bonhomme;P. Girard;L. Guiller;C. Landrault

  • Characterization of an SRAM based particle detector for mixed-field radiation environments

    G. Tsiligiannis;L. Dilillo;A. Bosio;P. Girard

  • Reducing power consumption during test application by test vector ordering

    P. Girard;C. Landrault;S. Pravossoudovitch;D. Severac

  • Power-Aware Testing and Test Strategies for Low Power Devices

    Dimitris Gizopoulos;Kaushik Roy;Patrick Girard;Nicola Nicolici

  • Power driven chaining of flip-flops in scan architectures

    Y. Bonhomme;P. Girard;C. Landrault;S. Pravossoudovitch

  • Low Power BIST by Filtering Non-Detecting Vectors

    S. Manich;A. Gabarró;M. Lopez;J. Figueras

  • A test vector ordering technique for switching activity reduction during test operation

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • Low power testing of VLSI circuits: problems and solutions

    P. Girard

  • Power-Aware Testing and Test Strategies for Low Power Devices

    Patrick Girard;Nicola Nicolici;Xiaoqing Wen

  • Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • Efficient scan chain design for power minimization during scan testing under routing constraint

    Y. Borthomme;P. Girard;L. Guiller;C. Landrault

  • A novel scheme to reduce power supply noise for high-quality at-speed scan testing

    Xiaoqing Wen;K. Miyase;S. Kajihara;T. Suzuki

  • A Study of Tapered 3-D TSVs for Power and Thermal Integrity

    A. Todri;S. Kundu;P. Girard;A. Bosio

  • Quadruple and Sextuple Cross-Coupled SRAM Cell Designs With Optimized Overhead for Reliable Applications

    Unknown

  • Circuit partitioning for low power BIST design with minimized peak power consumption

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • Low power BIST design by hypergraph partitioning: methodology and architectures

    P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch

  • On calculating efficient LFSR seeds for built-in self test

    C. Fagot;O. Gascuel;P. Girard;C. Landrault

  • Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment

    Aibin Yan;Yuanjie Hu;Jie Cui;Zhili Chen

Frequent Co-Authors

Volker D. Burkert
Volker D. Burkert Thomas Jefferson National Accelerator Facility
M. Guidal
M. Guidal University of Paris-Saclay
K. Hicks
K. Hicks Ohio University
R. A. Schumacher
R. A. Schumacher Carnegie Mellon University
S. E. Kuhn
S. E. Kuhn Old Dominion University
J. Napolitano
J. Napolitano Temple University

If you think any of the details on this page are incorrect, let us know.

Report an issue

We appreciate your kind effort to assist us to improve this page, it would be helpful providing us with as much detail as possible in the text box below:

Related Online Degrees & Career Pathways

For those studying Electronics and Electrical Engineering in the USA, exploring related online degrees can broaden career opportunities. Short certificate programs that pay well online offer a fast-track option to gain specialized skills and boost employability without a long-term commitment.

Many roles in engineering and technology suit introverts, leveraging analytical skills and attention to detail. Identifying good jobs for introverts can help students align their personality with career paths that promote job satisfaction and success.

Project management is another field closely connected to engineering disciplines. An accelerated online project management degree provides a flexible way to develop leadership and organizational expertise, valuable in managing complex engineering projects.

Completing a project management bachelor degree online can further enhance career prospects by combining technical knowledge with managerial skills. This integrated approach prepares graduates for diverse roles in engineering and beyond, emphasizing the value of continuous learning in dynamic industries.

Best Scientists Citing Patrick Girard

Trending Scientists