World's Best Scientists 2026 revealed!
Janusz Rajski

Janusz Rajski

Award Badge
Computer Science
Germany
2025

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
64
Citations
14423
World Ranking
1313
National Ranking
37

Computer Science

D-Index
67
Citations
14987
World Ranking
2227
National Ranking
93

Janusz Rajski publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Janusz Rajski sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 357 publications — 68th percentile

68% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Janusz Rajski D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Janusz Rajski sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 64 D-Index — 82nd percentile

82% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2025 - Research.com Computer Science in Germany Leader Award
  • 2023 - Research.com Computer Science in Germany Leader Award
  • 2022 - Research.com Computer Science in Germany Leader Award
  • 2012 - IEEE Fellow For contributions to digital VLSI circuit testing and test compression

Overview

Janusz Rajski is affiliated with Siemens in Germany. Their research primarily centers on engineering and computer science, with a notable focus on electrical and electronic engineering and hardware and architecture. Additional subfields include computer vision and pattern recognition, control and systems engineering, and artificial intelligence.

The scientist's work extensively covers the following topics:

  • VLSI and Analog Circuit Testing
  • Integrated Circuits and Semiconductor Failure Analysis
  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Radiation Effects in Electronics
  • Chaos-based Image/Signal Encryption
  • VLSI and FPGA Design Techniques
  • Engineering and Test Systems

Rajski has published in several frequently appearing venues, including:

  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • IEEE Design and Test
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • IEEE Transactions on Circuits and Systems I Regular Papers
  • Journal of Electronic Testing

Some of the recent papers authored or co-authored by Janusz Rajski include:

  • "Defect-Oriented Test: Effectiveness in High Volume Manufacturing," 2020, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • "A Lightweight True Random Number Generator for Root of Trust Applications," 2023, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • "The Future of Design for Test and Silicon Lifecycle Management," 2023, IEEE Design and Test
  • "Time and Area Optimized Testing of Automotive ICs," 2020, IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • "LBIST for Automotive ICs With Enhanced Test Generation," 2021, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Frequent collaborators in their research include Jerzy Tyszer, Bartosz Włodarczak, Nilanjan Mukherjee, Maciej Trawka, and Grzegorz Mrugalski.

Janusz Rajski was recognized as an IEEE Fellow in 2012 for contributions to digital VLSI circuit testing and test compression.

Best Publications

  • Embedded deterministic test

    J. Rajski;J. Tyszer;M. Kassab;N. Mukherjee

  • Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers

    S. Hellebrand;J. Rajski;S. Tarnick;S. Venkataraman

  • Embedded deterministic test for low cost manufacturing test

    J. Rajski;J. Tyszer;M. Kassab;N. Mukherjee

  • Logic BIST for large industrial designs: real issues and case studies

    G. Hetherington;T. Fryars;N. Tamarapalli;M. Kassab

  • Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers

    Sybille Hellebrand;Steffen Tarnick;Bernard Courtois;Janusz Rajski

  • Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs

    Santiago Remersaro;Xijiang Lin;Zhuo Zhang;Sudhakar Reddy

  • Testing and diagnosis of interconnects using boundary scan architecture

    A. Hassan;J. Rajski;V.K. Agarwal

  • Arithmetic built-in self-test of multiple scan-based integrated circuits

    Janusz Rajski;Jerzy Tyszer

  • Arithmetic Built-In Self-Test for Embedded Systems

    Janusz Rajski;Jerzy Tyszer

  • Impact of multiple-detect test patterns on product quality

    B. Benware;C. Schuermyer;N. Tamarapalli;Kun-Han Tsai

  • High-frequency, at-speed scan testing

    Xijiiang Lin;R. Press;J. Rajski;P. Reuter

  • Test pattern compression for an integrated circuit test environment

    Janusz Rajski;Mark Kassab;Nilanjan Mukherjee;Jerzy Tyszer

  • Cell-Aware Test

    Friedrich Hapke;Wilfried Redemund;Andreas Glowatz;Janusz Rajski

  • Decompressor/PRPG for applying pseudo-random and deterministic test patterns

    Janusz Rajski;Jerzy Tyszer;Mark Kassab;Nilanjan Mukherjee

  • A method of fault analysis for test generation and fault diagnosis

    H. Cox;J. Rajski

  • Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects

    Xijiang Lin;Kun-Han Tsai;Chen Wang;M. Kassab

  • Fault dictionaries for integrated circuit yield and quality analysis methods and systems

    Janusz Rajski;Gang Chen;Martin Keim;Nagesh Tamarapalli

  • Constructive multi-phase test point insertion for scan-based BIST

    N. Tamarapalli;J. Rajski

  • Convolutional compaction of test responses

    J. Rajski;J. Tyszer;Chen Wang;S.M. Reddy

  • GENERATION OF VECTOR PATTTERNS THROUGH RESEEDING OF MUETIPLE-POLYNOMIAL LINEAR FEEDBACK SHIFT REGIST

    S. Hellebrand;S. Tarnick;J. Rajski;B. Courtois

Frequent Co-Authors

Jerzy Tyszer
Jerzy Tyszer Poznań University of Technology
Sudhakar M. Reddy
Sudhakar M. Reddy University of Iowa
Wu-Tung Cheng
Wu-Tung Cheng Mentor Graphics
Irith Pomeranz
Irith Pomeranz Purdue University West Lafayette
Malgorzata Marek-Sadowska
Malgorzata Marek-Sadowska University of California, Santa Barbara
Wojciech Maly
Wojciech Maly Carnegie Mellon University
Bashir M. Al-Hashimi
Bashir M. Al-Hashimi King's College London
Edward J. McCluskey
Edward J. McCluskey Stanford University
Sujit Dey
Sujit Dey University of California, San Diego
Miodrag Potkonjak
Miodrag Potkonjak University of California, Los Angeles

If you think any of the details on this page are incorrect, let us know.

Report an issue

We appreciate your kind effort to assist us to improve this page, it would be helpful providing us with as much detail as possible in the text box below:

Related Online Degrees & Career Pathways

For students pursuing Electronics and Electrical Engineering, exploring related online degrees can expand career options. Many professionals seek roles that match their work style, and fields like engineering and project management often offer high paying jobs for introverts, highlighting the potential for rewarding careers while working independently.

Project management skills are particularly valuable in engineering projects. Students and professionals can benefit from a bachelor degree in project management available online. These programs provide foundational knowledge to oversee complex engineering tasks efficiently.

For those balancing work and study, degree programs for working adults offer flexible scheduling and pacing. Accelerated formats like the best online accelerated project management degree programs enable learners to gain relevant qualifications faster without pausing their careers.

Integrating engineering expertise with project management qualifications can open up diverse career pathways and leadership roles in technology-driven industries. Online degrees provide a strategic advantage by combining technical and managerial skills.

Best Scientists Citing Janusz Rajski

Trending Scientists

Recently Published Articles