His main research concerns Algorithm, Fault detection and isolation, Fault coverage, Automatic test pattern generation and Combinational logic. The concepts of his Algorithm study are interwoven with issues in Fault and Probabilistic logic. Edward J. McCluskey combines subjects such as Transformation, Electronic circuit, Error detection and correction and Computer engineering with his study of Fault detection and isolation.
His work deals with themes such as Real-time computing, Overhead, Pseudorandom number generator and Stuck-at fault, which intersect with Fault coverage. His Automatic test pattern generation research is multidisciplinary, relying on both Iddq testing, Design for testing and Electronic engineering, Built-in self-test. His studies deal with areas such as High-level synthesis and Logic simulation as well as Combinational logic.
His primary areas of study are Algorithm, Fault coverage, Electronic engineering, Automatic test pattern generation and Embedded system. His Algorithm research includes elements of Electronic circuit, Built-in self-test and Fault detection and isolation. The study incorporates disciplines such as Logic synthesis and Computer engineering in addition to Electronic circuit.
His research integrates issues of Computer hardware, Overhead, Reliability engineering, Pseudorandom number generator and Test set in his study of Fault coverage. His Automatic test pattern generation research incorporates themes from Automatic test equipment and Stuck-at fault. His Embedded system study integrates concerns from other disciplines, such as Fault tolerance, Software and Error detection and correction.
His scientific interests lie mostly in Algorithm, Automatic test pattern generation, Embedded system, Fault coverage and Error detection and correction. His Algorithm study combines topics from a wide range of disciplines, such as Process, Metric and Fault detection and isolation. His Automatic test pattern generation research integrates issues from Electronic engineering and Built-in self-test.
His research in Embedded system intersects with topics in Fault tolerance, Logic synthesis and Software. His Fault coverage research is multidisciplinary, incorporating elements of Computer hardware, Overhead, Computer engineering, Reliability engineering and Stuck-at fault. He focuses mostly in the field of Error detection and correction, narrowing it down to topics relating to Data integrity and, in certain cases, Implementation and Energy consumption.
E. J. McCluskey
A. Mahmood;E.J. McCluskey
N. Oh;P.P. Shirvani;E.J. McCluskey
N. Oh;P.P. Shirvani;E.J. McCluskey
K.P. Parker;E.J. McCluskey
Edward J. McCluskey
S.C. Ma;P. Franco;E.J. McCluskey
S. Mitra;E.J. McCluskey
William F. Atchison;Samuel D. Conte;John W. Hamblen;Thomas E. Hull
Edward J. McCluskey
N. Oh;S. Mitra;E.J. McCluskey
Edward J. McCluskey
N.A. Touba;E.J. McCluskey
H. Hao;E.J. McCluskey
E.J. McCluskey;Chao-Wen Tseng
E.J. McCluskey;F.W. Clegg
N.A. Touba;E.J. McCluskey;E.J. McCluskey
P.P. Shirvani;N.R. Saxena;E.J. McCluskey
S.D. Millman;E.J. McCluskey;J.M. Acken
Hong Hao;E.J. McCluskey
E. McCluskey;S. Bozorgui-Nesbat
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Montpellier Laboratory of Informatics, Robotics and Microelectronics
Publications: 33
