World's Best Scientists 2026 revealed!
Edward J. McCluskey

Edward J. McCluskey

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
68
Citations
16127
World Ranking
1028
National Ranking
436

Computer Science

D-Index
71
Citations
19355
World Ranking
1782
National Ranking
903

Edward J. McCluskey publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Edward J. McCluskey sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 276 publications — 52nd percentile

52% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Edward J. McCluskey D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Edward J. McCluskey sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 68 D-Index — 86th percentile

86% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2012 - IEEE John von Neumann Medal “For fundamental contributions that shaped the design and testing of digital systems.”
  • 1994 - ACM Fellow
  • 1967 - Fellow of the American Association for the Advancement of Science (AAAS)

Overview

What is he best known for?

The fields of study he is best known for:

  • Algorithm
  • Statistics
  • Programming language

His main research concerns Algorithm, Fault detection and isolation, Fault coverage, Automatic test pattern generation and Combinational logic. The concepts of his Algorithm study are interwoven with issues in Fault and Probabilistic logic. Edward J. McCluskey combines subjects such as Transformation, Electronic circuit, Error detection and correction and Computer engineering with his study of Fault detection and isolation.

His work deals with themes such as Real-time computing, Overhead, Pseudorandom number generator and Stuck-at fault, which intersect with Fault coverage. His Automatic test pattern generation research is multidisciplinary, relying on both Iddq testing, Design for testing and Electronic engineering, Built-in self-test. His studies deal with areas such as High-level synthesis and Logic simulation as well as Combinational logic.

His most cited work include:

  • Minimization of Boolean functions (981 citations)
  • Concurrent error detection using watchdog processors-a survey (542 citations)
  • Control-flow checking by software signatures (490 citations)

What are the main themes of his work throughout his whole career to date?

His primary areas of study are Algorithm, Fault coverage, Electronic engineering, Automatic test pattern generation and Embedded system. His Algorithm research includes elements of Electronic circuit, Built-in self-test and Fault detection and isolation. The study incorporates disciplines such as Logic synthesis and Computer engineering in addition to Electronic circuit.

His research integrates issues of Computer hardware, Overhead, Reliability engineering, Pseudorandom number generator and Test set in his study of Fault coverage. His Automatic test pattern generation research incorporates themes from Automatic test equipment and Stuck-at fault. His Embedded system study integrates concerns from other disciplines, such as Fault tolerance, Software and Error detection and correction.

He most often published in these fields:

  • Algorithm (28.86%)
  • Fault coverage (19.13%)
  • Electronic engineering (18.46%)

What were the highlights of his more recent work (between 1996-2010)?

  • Algorithm (28.86%)
  • Automatic test pattern generation (17.45%)
  • Embedded system (13.76%)

In recent papers he was focusing on the following fields of study:

His scientific interests lie mostly in Algorithm, Automatic test pattern generation, Embedded system, Fault coverage and Error detection and correction. His Algorithm study combines topics from a wide range of disciplines, such as Process, Metric and Fault detection and isolation. His Automatic test pattern generation research integrates issues from Electronic engineering and Built-in self-test.

His research in Embedded system intersects with topics in Fault tolerance, Logic synthesis and Software. His Fault coverage research is multidisciplinary, incorporating elements of Computer hardware, Overhead, Computer engineering, Reliability engineering and Stuck-at fault. He focuses mostly in the field of Error detection and correction, narrowing it down to topics relating to Data integrity and, in certain cases, Implementation and Energy consumption.

Between 1996 and 2010, his most popular works were:

  • Control-flow checking by software signatures (490 citations)
  • Error detection by duplicated instructions in super-scalar processors (485 citations)
  • Which concurrent error detection scheme to choose (238 citations)

Best Publications

  • Minimization of Boolean functions

    E. J. McCluskey

  • Concurrent error detection using watchdog processors-a survey

    A. Mahmood;E.J. McCluskey

  • Error detection by duplicated instructions in super-scalar processors

    N. Oh;P.P. Shirvani;E.J. McCluskey

  • Control-flow checking by software signatures

    N. Oh;P.P. Shirvani;E.J. McCluskey

  • Probabilistic Treatment of General Combinational Networks

    K.P. Parker;E.J. McCluskey

  • Built-In Self-Test Techniques

    Edward J. McCluskey

  • An experimental chip to evaluate test techniques experiment results

    S.C. Ma;P. Franco;E.J. McCluskey

  • Which concurrent error detection scheme to choose

    S. Mitra;E.J. McCluskey

  • Curriculum 68: Recommendations for academic programs in computer science: a report of the ACM curriculum committee on computer science

    William F. Atchison;Samuel D. Conte;John W. Hamblen;Thomas E. Hull

  • Logic Design Principles: With Emphasis on Testable Semicustom Circuits

    Edward J. McCluskey

  • ED/sup 4/I: error detection by diverse data and duplicated instructions

    N. Oh;S. Mitra;E.J. McCluskey

  • Introduction to the theory of switching circuits

    Edward J. McCluskey

  • Altering a pseudo-random bit sequence for scan-based BIST

    N.A. Touba;E.J. McCluskey

  • Very-low-voltage testing for weak CMOS logic ICs

    H. Hao;E.J. McCluskey

  • Stuck-fault tests vs. actual defects

    E.J. McCluskey;Chao-Wen Tseng

  • Fault Equivalence in Combinational Logic Networks

    E.J. McCluskey;F.W. Clegg

  • Logic synthesis of multilevel circuits with concurrent error detection

    N.A. Touba;E.J. McCluskey;E.J. McCluskey

  • Software-implemented EDAC protection against SEUs

    P.P. Shirvani;N.R. Saxena;E.J. McCluskey

  • Diagnosing CMOS bridging faults with stuck-at fault dictionaries

    S.D. Millman;E.J. McCluskey;J.M. Acken

  • "RESISTIVE SHORTS" WITHIN CMOS GATES

    Hong Hao;E.J. McCluskey

  • Design for autonomous test

    E. McCluskey;S. Bozorgui-Nesbat

Frequent Co-Authors

Nur A. Touba
Nur A. Touba The University of Texas at Austin
Hong Hao
Hong Hao Curtin University
Daniel P. Siewiorek
Daniel P. Siewiorek Carnegie Mellon University
Gene H. Golub
Gene H. Golub Stanford University
Bruce A. Wooley
Bruce A. Wooley Stanford University
Janusz Rajski
Janusz Rajski Siemens (Germany)
Mehdi B. Tahoori
Mehdi B. Tahoori Karlsruhe Institute of Technology

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Related Online Degrees & Career Pathways

For students pursuing Electronics and Electrical Engineering in the USA, exploring related online degrees can open diverse career pathways. Programs such as instructional design offer specialized knowledge to create educational materials, which is increasingly valuable in technical training and corporate settings.

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For those eager to begin studies without delay, many online colleges that start immediately offer rolling admissions and weekly start dates. This flexibility ensures students can align education with personal and professional commitments seamlessly.

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