2021 - IEEE Fellow For contributions to resilient nanoscale integrated circuits
The scientist’s investigation covers issues in Electronic engineering, Embedded system, Soft error, Field-programmable gate array and Logic synthesis. His studies deal with areas such as Fault tolerance and Cellular automaton as well as Electronic engineering. His work deals with themes such as Very-large-scale integration, Nanoelectronics, Computer engineering and Dependability, which intersect with Fault tolerance.
His Embedded system study combines topics from a wide range of disciplines, such as Trojan, Magnetoresistive random-access memory and Cryptography. His Soft error research incorporates themes from Real-time computing, Sequential logic, Algorithm, Propagation of uncertainty and Fault injection. His Field-programmable gate array research includes elements of Fault, Interconnection and Application-specific integrated circuit.
Mehdi B. Tahoori spends much of his time researching Electronic engineering, Embedded system, Electronic circuit, Reliability engineering and CMOS. His Electronic engineering research incorporates elements of Fault tolerance and Transistor. Mehdi B. Tahoori works in the field of Embedded system, namely Field-programmable gate array.
His research on Electronic circuit also deals with topics like
His main research concerns Embedded system, Electronic circuit, Reliability engineering, Transistor and Voltage. Mehdi B. Tahoori studies Embedded system, focusing on Field-programmable gate array in particular. His study in Electronic circuit is interdisciplinary in nature, drawing from both Low voltage, Electronic design automation, Integrated circuit and Electronic engineering, Circuit design.
In his study, which falls under the umbrella issue of Electronic engineering, Fault and CMOS is strongly linked to Scalability. His Reliability engineering research includes themes of Reliability, Magnetoresistive random-access memory, Reliability, Process variation and Degradation. His studies in Transistor integrate themes in fields like Optoelectronics, Silicon, Printed electronics and Logic gate.
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
Reliable on-chip systems in the nano-era: lessons learnt and future trends
Jorg Henkel;Lars Bauer;Nikil Dutt;Puneet Gupta.
design automation conference (2013)
Testing of quantum cellular automata
M.B. Tahoori;Jing Huang;M. Momenzadeh;F. Lombardi.
IEEE Transactions on Nanotechnology (2004)
Characterization, test, and logic synthesis of and-or-inverter (AOI) gate design for QCA implementation
M. Momenzadeh;Jing Huang;M.B. Tahoori;F. Lombardi.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2005)
Defects and faults in quantum cellular automata at nano scale
M.B. Tahoori;M. Momenzadeh;Jin Huang;F. Lombardi.
vlsi test symposium (2004)
Evaluation of Hybrid Memory Technologies Using SOT-MRAM for On-Chip Cache Hierarchy
Fabian Oboril;Rajendra Bishnoi;Mojtaba Ebrahimi;Mehdi B. Tahoori.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2015)
Ultra-Fast and High-Reliability SOT-MRAM: From Cache Replacement to Normally-Off Computing
Guillaume Prenat;Kotb Jabeur;Pierre Vanhauwaert;Gregory Di Pendina.
IEEE Transactions on Multi-Scale Computing Systems (2016)
Balancing Performance and Reliability in the Memory Hierarchy
G.-H. Asadi;Vilas Sridharan;M.B. Tahoori;D. Kaeli.
international symposium on performance analysis of systems and software (2005)
An Inside Job: Remote Power Analysis Attacks on FPGAs
Falk Schellenberg;Dennis R. E. Gnad;Amir Moradi;Mehdi B. Tahoori.
IEEE Design & Test of Computers (2021)
ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level
Fabian Oboril;Mehdi B. Tahoori.
dependable systems and networks (2012)
Soft error rate estimation and mitigation for SRAM-based FPGAs
Ghazanfar Asadi;Mehdi B. Tahoori.
field programmable gate arrays (2005)
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