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Computer Science

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Electronics and Electrical Engineering

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Research.com Recognitions

  • 2021 - IEEE Fellow For contributions to resilient nanoscale integrated circuits

Overview

Mehdi B. Tahoori is a researcher affiliated with the Karlsruhe Institute of Technology in Germany. Their academic focus spans engineering and computer science, with particular emphasis on electrical and electronic engineering, artificial intelligence, and hardware architecture. Their work also encompasses biomedical engineering and signal processing.

The industrial and academic venues where Mehdi B. Tahoori has published include various IEEE journals and conferences as well as arXiv. Frequent publication venues include:

  • arXiv (Cornell University)
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • IEEE Design and Test
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • IEEE Transactions on Electron Devices

Research topics addressed by Mehdi B. Tahoori cover a range of areas in semiconductor technology and hardware security, notably:

  • Advanced Memory and Neural Computing
  • Ferroelectric and Negative Capacitance Devices
  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Semiconductor materials and devices
  • Low-power high-performance VLSI design
  • Integrated Circuits and Semiconductor Failure Analysis
  • Cryptographic Implementations and Security

Notable recent papers authored or coauthored by Mehdi B. Tahoori include:

  • Hybrid low-voltage physical unclonable function based on inkjet-printed metal-oxide transistors, 2020, Nature Communications
  • A Survey of Test and Reliability Solutions for Magnetic Random Access Memories, 2020, Proceedings of the IEEE
  • A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application, 2020, IEEE Transactions on Circuits & Systems II Express Briefs
  • Voltage-Based Covert Channels Using FPGAs, 2021, ACM Transactions on Design Automation of Electronic Systems
  • LoopBreaker: Disabling Interconnects to Mitigate Voltage-Based Attacks in Multi-Tenant FPGAs, 2021, 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD)

Mehdi B. Tahoori regularly collaborates with a group of frequent coauthors, which include:

  • Michael Hefenbrock
  • Soyed Tuhin Ahmed
  • Jasmin Aghassi-Hagmann
  • Dennis R. E. Gnad
  • Mahta Mayahinia

Their research contributions were formally recognized in 2021 when Mehdi B. Tahoori was named an IEEE Fellow for contributions to resilient nanoscale integrated circuits.

Best Publications

  • Reliable on-chip systems in the nano-era: lessons learnt and future trends

    Jorg Henkel;Lars Bauer;Nikil Dutt;Puneet Gupta

  • Evaluation of Hybrid Memory Technologies Using SOT-MRAM for On-Chip Cache Hierarchy

    Fabian Oboril;Rajendra Bishnoi;Mojtaba Ebrahimi;Mehdi B. Tahoori

  • Testing of quantum cellular automata

    M.B. Tahoori;Jing Huang;M. Momenzadeh;F. Lombardi

  • An Inside Job: Remote Power Analysis Attacks on FPGAs

    Falk Schellenberg;Dennis R. E. Gnad;Amir Moradi;Mehdi B. Tahoori

  • Ultra-Fast and High-Reliability SOT-MRAM: From Cache Replacement to Normally-Off Computing

    Guillaume Prenat;Kotb Jabeur;Pierre Vanhauwaert;Gregory Di Pendina

  • Characterization, test, and logic synthesis of and-or-inverter (AOI) gate design for QCA implementation

    M. Momenzadeh;Jing Huang;M.B. Tahoori;F. Lombardi

  • Defects and faults in quantum cellular automata at nano scale

    M.B. Tahoori;M. Momenzadeh;Jin Huang;F. Lombardi

  • Voltage drop-based fault attacks on FPGAs using valid bitstreams

    Dennis R. E. Gnad;Fabian Oboril;Mehdi B. Tahoori

  • Balancing Performance and Reliability in the Memory Hierarchy

    G.-H. Asadi;Vilas Sridharan;M.B. Tahoori;D. Kaeli

  • ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level

    Fabian Oboril;Mehdi B. Tahoori

  • Soft error rate estimation and mitigation for SRAM-based FPGAs

    Ghazanfar Asadi;Mehdi B. Tahoori

  • Design and architectures for dependable embedded systems

    Jörg Henkel;Lars Bauer;Joachim Becker;Oliver Bringmann

  • An analytical approach for soft error rate estimation in digital circuits

    G. Asadi;M.B. Tahoori

  • An accurate SER estimation method based on propagation probability [soft error rate]

    Ghazanfar Asadi;Mehdi B. Tahoori

  • Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs)

    Mahdi Fazeli;Seyed Nematollah Ahmadian;Seyed Ghassem Miremadi;Hossein Asadi

  • On the defect tolerance of nano-scale two-dimensional crossbars

    Jing Huang;M.B. Tahoori;F. Lombardi

  • Soft error mitigation for SRAM-based FPGAs

    G.-H. Asadi;M.B. Tahoori

  • Read disturb fault detection in STT-MRAM

    Rajendra Bishnoi;Mojtaba Ebrahimi;Fabian Oboril;Mehdi B. Tahoori

  • Soft Error Susceptibility Analysis of SRAM-Based FPGAs in High-Performance Information Systems

    H. Asadi;M.B. Tahoori;B. Mullins;D. Kaeli

  • FPGAhammer: Remote Voltage Fault Attacks on Shared FPGAs, suitable for DFA on AES

    Jonas Krautter;Dennis R. E. Gnad;Mehdi Baradaran Tahoori

Frequent Co-Authors

Krishnendu Chakrabarty
Krishnendu Chakrabarty Arizona State University
Fabrizio Lombardi
Fabrizio Lombardi Northeastern University
David Kaeli
David Kaeli Northeastern University
Michael Beigl
Michael Beigl Karlsruhe Institute of Technology
Amir Moradi
Amir Moradi Technical University of Darmstadt
Said Hamdioui
Said Hamdioui Delft University of Technology
Norbert Wehn
Norbert Wehn Technical University of Kaiserslautern
Jorg Henkel
Jorg Henkel Karlsruhe Institute of Technology
Horst Hahn
Horst Hahn Karlsruhe Institute of Technology
Nikil Dutt
Nikil Dutt University of California, Irvine

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