D-Index & Metrics Best Publications

D-Index & Metrics D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines.

Discipline name D-index D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines. Citations Publications World Ranking National Ranking
Electronics and Electrical Engineering D-index 45 Citations 6,882 389 World Ranking 2181 National Ranking 66
Computer Science D-index 45 Citations 6,640 379 World Ranking 4657 National Ranking 212

Research.com Recognitions

Awards & Achievements

2021 - IEEE Fellow For contributions to resilient nanoscale integrated circuits

Overview

What is he best known for?

The fields of study he is best known for:

  • Operating system
  • Integrated circuit
  • Artificial intelligence

The scientist’s investigation covers issues in Electronic engineering, Embedded system, Soft error, Field-programmable gate array and Logic synthesis. His studies deal with areas such as Fault tolerance and Cellular automaton as well as Electronic engineering. His work deals with themes such as Very-large-scale integration, Nanoelectronics, Computer engineering and Dependability, which intersect with Fault tolerance.

His Embedded system study combines topics from a wide range of disciplines, such as Trojan, Magnetoresistive random-access memory and Cryptography. His Soft error research incorporates themes from Real-time computing, Sequential logic, Algorithm, Propagation of uncertainty and Fault injection. His Field-programmable gate array research includes elements of Fault, Interconnection and Application-specific integrated circuit.

His most cited work include:

  • Reliable on-chip systems in the nano-era: lessons learnt and future trends (151 citations)
  • Testing of quantum cellular automata (146 citations)
  • Characterization, test, and logic synthesis of and-or-inverter (AOI) gate design for QCA implementation (114 citations)

What are the main themes of his work throughout his whole career to date?

Mehdi B. Tahoori spends much of his time researching Electronic engineering, Embedded system, Electronic circuit, Reliability engineering and CMOS. His Electronic engineering research incorporates elements of Fault tolerance and Transistor. Mehdi B. Tahoori works in the field of Embedded system, namely Field-programmable gate array.

His research on Electronic circuit also deals with topics like

  • Voltage together with Efficient energy use and Energy consumption,
  • Chip together with Software and Process. His CMOS research is multidisciplinary, incorporating elements of Negative-bias temperature instability, Overhead, Crossbar switch, Reduction and Process variation. His study looks at the relationship between Soft error and fields such as Real-time computing, as well as how they intersect with chemical problems.

He most often published in these fields:

  • Electronic engineering (30.86%)
  • Embedded system (25.84%)
  • Electronic circuit (15.79%)

What were the highlights of his more recent work (between 2017-2021)?

  • Embedded system (25.84%)
  • Electronic circuit (15.79%)
  • Reliability engineering (15.31%)

In recent papers he was focusing on the following fields of study:

His main research concerns Embedded system, Electronic circuit, Reliability engineering, Transistor and Voltage. Mehdi B. Tahoori studies Embedded system, focusing on Field-programmable gate array in particular. His study in Electronic circuit is interdisciplinary in nature, drawing from both Low voltage, Electronic design automation, Integrated circuit and Electronic engineering, Circuit design.

In his study, which falls under the umbrella issue of Electronic engineering, Fault and CMOS is strongly linked to Scalability. His Reliability engineering research includes themes of Reliability, Magnetoresistive random-access memory, Reliability, Process variation and Degradation. His studies in Transistor integrate themes in fields like Optoelectronics, Silicon, Printed electronics and Logic gate.

Between 2017 and 2021, his most popular works were:

  • An inside job: Remote power analysis attacks on FPGAs (42 citations)
  • FPGAhammer: Remote Voltage Fault Attacks on Shared FPGAs, suitable for DFA on AES (33 citations)
  • Remote inter-chip power analysis side-channel attacks at board-level (20 citations)

This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.

Best Publications

Reliable on-chip systems in the nano-era: lessons learnt and future trends

Jorg Henkel;Lars Bauer;Nikil Dutt;Puneet Gupta.
design automation conference (2013)

229 Citations

Testing of quantum cellular automata

M.B. Tahoori;Jing Huang;M. Momenzadeh;F. Lombardi.
IEEE Transactions on Nanotechnology (2004)

205 Citations

Characterization, test, and logic synthesis of and-or-inverter (AOI) gate design for QCA implementation

M. Momenzadeh;Jing Huang;M.B. Tahoori;F. Lombardi.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2005)

165 Citations

Defects and faults in quantum cellular automata at nano scale

M.B. Tahoori;M. Momenzadeh;Jin Huang;F. Lombardi.
vlsi test symposium (2004)

156 Citations

Evaluation of Hybrid Memory Technologies Using SOT-MRAM for On-Chip Cache Hierarchy

Fabian Oboril;Rajendra Bishnoi;Mojtaba Ebrahimi;Mehdi B. Tahoori.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2015)

154 Citations

Ultra-Fast and High-Reliability SOT-MRAM: From Cache Replacement to Normally-Off Computing

Guillaume Prenat;Kotb Jabeur;Pierre Vanhauwaert;Gregory Di Pendina.
IEEE Transactions on Multi-Scale Computing Systems (2016)

139 Citations

Balancing Performance and Reliability in the Memory Hierarchy

G.-H. Asadi;Vilas Sridharan;M.B. Tahoori;D. Kaeli.
international symposium on performance analysis of systems and software (2005)

136 Citations

An Inside Job: Remote Power Analysis Attacks on FPGAs

Falk Schellenberg;Dennis R. E. Gnad;Amir Moradi;Mehdi B. Tahoori.
IEEE Design & Test of Computers (2021)

117 Citations

ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level

Fabian Oboril;Mehdi B. Tahoori.
dependable systems and networks (2012)

116 Citations

Soft error rate estimation and mitigation for SRAM-based FPGAs

Ghazanfar Asadi;Mehdi B. Tahoori.
field programmable gate arrays (2005)

115 Citations

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