World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
55
Citations
9471
World Ranking
2218
National Ranking
869

Computer Science

D-Index
55
Citations
9506
World Ranking
4396
National Ranking
2053

Nur A. Touba publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Nur A. Touba sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 183 publications — 24th percentile

24% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Nur A. Touba D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Nur A. Touba sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 55 D-Index — 69th percentile

69% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2009 - IEEE Fellow For contributions to data compression and built-in self-test for integrated circuits

Overview

Nur A. Touba is affiliated with The University of Texas at Austin in the United States. Their research spans multiple domains within computer science and engineering, with a focus on areas related to electrical and electronic engineering.

Their main fields of study include:

  • Computer Science
  • Engineering

In terms of subfields, Nur A. Touba's work primarily covers:

  • Electrical and Electronic Engineering
  • Computer Networks and Communications
  • Hardware and Architecture

Their research topics encompass a range of technical areas such as:

  • Parallel Computing and Optimization Techniques
  • Advanced Data Storage Technologies
  • Advanced Memory and Neural Computing
  • Radiation Effects in Electronics
  • Low-power high-performance VLSI design
  • Interconnection Networks and Systems

Nur A. Touba has contributed to scientific literature through multiple publications. Notable papers include:

  • "CEnT: An Efficient Architecture to Eliminate Intra-Array Write Disturbance in PCM", 2021, published in IEEE Transactions on Computers
  • "A Single Error Correcting Code with One-Step Group Partitioned Decoding Based on Shared Majority-Vote", 2020, published in Electronics

Their frequent co-authors include:

  • Muhammad Imran
  • Taehyun Kwon
  • Joon-Sung Yang
  • Abhishek Das

Nur A. Touba's publication venues reflect their research interests and include:

  • IEEE Transactions on Computers
  • Electronics

In recognition of their work, Nur A. Touba was named an IEEE Fellow in 2009 for contributions to data compression and built-in self-test for integrated circuits.

Best Publications

  • Survey of Test Vector Compression Techniques

    N.A. Touba

  • Static compaction techniques to control scan vector power dissipation

    R. Sankaralingam;R.R. Oruganti;N.A. Touba

  • Scan vector compression/decompression using statistical coding

    A. Jas;J. Ghosh-Dastidar;N.A. Touba

  • Test vector decompression via cyclical scan chains and its application to testing core-based designs

    A. Jas;N.A. Touba

  • An efficient test vector compression scheme using selective Huffman coding

    A. Jas;J. Ghosh-Dastidar;Mom-Eng Ng;N.A. Touba

  • Cost-effective approach for reducing soft error failure rate in logic circuits

    K. Mohanram;N.A. Touba

  • Test vector encoding using partial LFSR reseeding

    C.V. Krishna;A. Jas;N.A. Touba

  • Altering a pseudo-random bit sequence for scan-based BIST

    N.A. Touba;E.J. McCluskey

  • Reducing test data volume using LFSR reseeding with seed compression

    C.V. Krishna;N.A. Touba

  • Multiple Bit Upset Tolerant Memory Using a Selective Cycle Avoidance Based SEC-DED-DAEC Code

    A. Dutta;N.A. Touba

  • Logic synthesis of multilevel circuits with concurrent error detection

    N.A. Touba;E.J. McCluskey;E.J. McCluskey

  • Reducing power dissipation during test using scan chain disable

    R. Sankaralingam;B. Pouya;N.A. Touba

  • Test point insertion based on path tracing

    N.A. Touba;E.J. McCluskey

  • Synthesis of circuits with low-cost concurrent error detection based on Bose-Lin codes

    D. Das;N.A. Touba

  • Weight-based codes and their application to concurrent error detection of multilevel circuits

    D. Das;N.A. Touba

  • Reducing test data volume using external/LBIST hybrid test patterns

    D. Das;N.A. Touba

  • System-on-Chip Test Architectures: Nanometer Design for Testability

    Laung-Terng Wang;Charles E. Stroud;Nur Touba

  • Controlling peak power during scan testing

    R. Sankaralingam;N.A. Touba

  • Virtual scan chains: a means for reducing scan length in cores

    A. Jas;B. Pouya;N.A. Touba

  • Test data compression using dictionaries with selective entries and fixed-length indices

    Lei Li;Krishnendu Chakrabarty;Nur A. Touba

Frequent Co-Authors

Edward J. McCluskey
Edward J. McCluskey Stanford University
Kartik Mohanram
Kartik Mohanram University of Pittsburgh
Eric MacDonald
Eric MacDonald Youngstown State University
Xiaoqing Wen
Xiaoqing Wen Kyushu Institute of Technology
Krishnendu Chakrabarty
Krishnendu Chakrabarty Arizona State University
Charles E. Stroud
Charles E. Stroud Auburn University
Hans-Joachim Wunderlich
Hans-Joachim Wunderlich University of Stuttgart
Patrick Girard
Patrick Girard Montpellier Laboratory of Informatics, Robotics and Microelectronics

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