World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
42
Citations
6591
World Ranking
4145
National Ranking
8

Jerzy Tyszer publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Jerzy Tyszer sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 195 publications — 28th percentile

28% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Jerzy Tyszer D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Jerzy Tyszer sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 42 D-Index — 42nd percentile

42% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2013 - IEEE Fellow For contributions to digital VLSI circuit testing and test compression

Overview

Jerzy Tyszer is affiliated with the Poznań University of Technology in Poland. Their research contributions span across fields centered on computer science and engineering, with a strong focus on electrical and electronic engineering, and hardware and architecture.

The main fields of study covered by their work include:

  • Computer Science
  • Engineering

Subfields of interest involve:

  • Electrical and Electronic Engineering
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Control and Systems Engineering
  • Artificial Intelligence

Tyszer's research topics primarily address:

  • VLSI and Analog Circuit Testing
  • Integrated Circuits and Semiconductor Failure Analysis
  • Radiation Effects in Electronics
  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Chaos-based Image/Signal Encryption
  • Engineering and Test Systems
  • Advanced Steganography and Watermarking Techniques

The scientist has published extensively in IEEE journals, with frequent contributions to these venues:

  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • IEEE Design and Test
  • IEEE Transactions on Circuits and Systems I Regular Papers
  • Journal of Electronic Testing

Recent publications include:

  • "A Lightweight True Random Number Generator for Root of Trust Applications", 2023, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • "The Future of Design for Test and Silicon Lifecycle Management", 2023, IEEE Design and Test
  • "Time and Area Optimized Testing of Automotive ICs", 2020, IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • "LBIST for Automotive ICs With Enhanced Test Generation", 2021, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • "X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan", 2021, IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Frequent co-authors collaborating with Tyszer include:

  • Janusz Rajski
  • Bartosz Włodarczak
  • Maciej Trawka
  • Nilanjan Mukherjee
  • Grzegorz Mrugalski

Tyszer received the IEEE Fellow award in 2013 for contributions to digital VLSI circuit testing and test compression.

Best Publications

  • Embedded deterministic test

    J. Rajski;J. Tyszer;M. Kassab;N. Mukherjee

  • Embedded deterministic test for low cost manufacturing test

    J. Rajski;J. Tyszer;M. Kassab;N. Mukherjee

  • Arithmetic built-in self-test of multiple scan-based integrated circuits

    Janusz Rajski;Jerzy Tyszer

  • Arithmetic Built-In Self-Test for Embedded Systems

    Janusz Rajski;Jerzy Tyszer

  • Test pattern compression for an integrated circuit test environment

    Janusz Rajski;Mark Kassab;Nilanjan Mukherjee;Jerzy Tyszer

  • Convolutional compaction of test responses

    J. Rajski;J. Tyszer;Chen Wang;S.M. Reddy

  • Test responses compaction in accumulators with rotate carry adders

    J. Rajski;J. Tyszer

  • Test data decompression for multiple scan designs with boundary scan

    J. Rajski;J. Tyszer;N. Zacharia

  • On-chip comparison and response collection tools and techniques

    Nilanjan Mukherjee;Janusz Rajski;Jerzy Tyszer

  • Parallel decompressor and related methods and apparatuses

    Janusz Rajski;Jerzy Tyszer

  • Decompression of test data using variable-length seed LFSRs

    N. Zacharia;J. Rajski;J. Tyszer

  • Ring generators - new devices for embedded test applications

    G. Mrugalski;J. Rajski;J. Tyszer

  • Accumulator-based compaction of test responses

    J. Rajski;J. Tyszer

  • Diagnosis of scan cells in BIST environment

    J. Rajski;J. Tyszer

  • Automated synthesis of phase shifters for built-in self-test applications

    J. Rajski;N. Tamarapalli;J. Tyszer

  • Finite memory test response compactors for embedded test applications

    J. Rajski;J. Tyszer;Chen Wang;S.M. Reddy

  • Arithmetic additive generators of pseudo-exhaustive test patterns

    S. Gupta;J. Rajski;J. Tyszer

  • Automated synthesis of large phase shifters for built-in self-test

    J. Rajski;N. Tamarapalli;J. Tyszer

  • Two-dimensional test data decompressor for multiple scan designs

    N. Zacharia;J. Rajski;J. Tyszer;J.A. Waicukauski

  • Low-Power Scan Operation in Test Compression Environment

    D. Czysz;M. Kassab;Xijiang Lin;G. Mrugalski

  • Continuous application and decompression of test patterns to a circuit-under-test

    Janusz Rajski;Jerzy Tyszer;Mark Kassab;Nilanjan Mukherjee

  • Embedded deterministic test for low-cost manufacturing

    J. Rajski;M. Kassab;N. Mukherjee;N. Tamarapalli

  • New test data decompressor for low power applications

    Grzegorz Mrugalski;Janusz Rajski;Dariusz Czysz;Jerzy Tyszer

  • Low Power Scan Shift and Capture in the EDT Environment

    D. Czysz;M. Kassab;X. Lin;G. Mrugalski

Frequent Co-Authors

Janusz Rajski
Janusz Rajski Siemens (Germany)
Sudhakar M. Reddy
Sudhakar M. Reddy University of Iowa
Wu-Tung Cheng
Wu-Tung Cheng Mentor Graphics
Yu Huang
Yu Huang University of California, Los Angeles
Irith Pomeranz
Irith Pomeranz Purdue University West Lafayette
Michel Renovell
Michel Renovell Montpellier Laboratory of Informatics, Robotics and Microelectronics
Krishnendu Chakrabarty
Krishnendu Chakrabarty Arizona State University
Abhijit Chatterjee
Abhijit Chatterjee Georgia Institute of Technology

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Related Online Degrees & Career Pathways

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Finally, those eager to start quickly may benefit from online colleges starting soon, which provide frequent enrollment dates to accommodate varying schedules. This flexibility is valuable when launching or advancing a career in a fast-evolving field like electronics and electrical engineering.

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