World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
44
Citations
7698
World Ranking
3741
National Ranking
1350

Research.com Recognitions

  • 2007 - IEEE Fellow For contributions to testing analog and mixed signal circuits

Overview

Abhijit Chatterjee is affiliated with the Georgia Institute of Technology in the United States. Their research spans several fields, primarily focusing on Engineering and Computer Science, with significant contributions in the subfields of Artificial Intelligence, Electrical and Electronic Engineering, Control and Systems Engineering, Hardware and Architecture, and Aerospace Engineering.

The scientist's research topics cover a broad spectrum, including VLSI and Analog Circuit Testing, Atmospheric Chemistry and Aerosols, Fault Detection and Control Systems, Integrated Circuits and Semiconductor Failure Analysis, Air Quality Monitoring and Forecasting, Air Quality and Health Impacts, and Gaussian Processes and Bayesian Inference.

Recent publications by Abhijit Chatterjee include:

  • Multi-stage optimization framework of satellite scheduling for large areas of interest, 2023, Advances in Space Research
  • Drivers of PM2.5 Episodes and Exceedance in India: A Synthesis From the COALESCE Network, 2024, Journal of Geophysical Research Atmospheres
  • Spatial Distribution in Surface Aerosol Light Absorption Across India, 2024, Geophysical Research Letters

Other notable papers from the related network of recent work are:

  • eCloud: A Vision for the Evolution of the Edge-Cloud Continuum, 2021, Computer
  • Gaussian Control Barrier Functions: Non-Parametric Paradigm to Safety, 2022, IEEE Access

Abhijit Chatterjee frequently collaborates with several researchers. Frequent co-authors include:

  • Chandramouli Amarnath
  • Mohamed Mejri
  • Mouhyemen Khan
  • Kwondo Ma
  • Suhasini Komarraju

Their works are often published in key venues such as arXiv (Cornell University), IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Journal of Electronic Testing, IEEE Instrumentation & Measurement Magazine, and the 2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS).

Abhijit Chatterjee has been recognized as an IEEE Fellow since 2007 for contributions to testing analog and mixed signal circuits.

Best Publications

  • Prediction of analog performance parameters using fast transient testing

    P.N. Variyam;S. Cherubal;A. Chatterjee

  • Low-cost alternate EVM test for wireless receiver systems

    A. Haider;A. Chatterjee

  • Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits

    Yuvraj Singh Dhillon;Abdulkadir Utku Diril;Abhijit Chatterjee

  • Signature Testing of Analog and RF Circuits: Algorithms and Methodology

    R. Voorakaranam;S.S. Akbay;S. Bhattacharya;S. Cherubal

  • Enhancing test effectiveness for analog circuits using synthesized measurements

    P.N. Variyam;A. Chatterjee

  • A Signature Test Framework for Rapid Production Testing of RF Circuits

    R. Voorakaranam;S. Cherubal;A. Chatterjee

  • Fault-based automatic test generator for linear analog circuits

    Naveena Nagi;Abhijit Chatterjee;Ashok Balivada;Jacob A. Abraham

  • DSP-Driven Self-Tuning of RF Circuits for Process-Induced Performance Variability

    Donghoon Han;Byung Sung Kim;A. Chatterjee

  • Use of embedded sensors for built-in-test RF circuits

    S. Bhattacharya;A. Chatterjee

  • Analysis and optimization of nanometer CMOS circuits for soft-error tolerance

    Y.S. Dhillon;A.U. Diril;A. Chatterjee;A.D. Singh

  • Low-cost test of embedded RF/analog/mixed-signal circuits in SOPs

    S.S. Akbay;A. Halder;A. Chatterjee;D. Keezer

  • A system-level alternate test approach for specification test of RF transceivers in loopback mode

    A. Haider;S. Bhattacharya;G. Srinivasan;A. Chatterjee

  • Automatic multitone alternate test-generaton for rf circuits using behavioral models

    A. HaIder;S. Bhattacharya;A. Chatterjee

  • Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums

    Unknown

  • Switching activity generation with automated BIST synthesis for performance testing of interconnects

    R. Pendurkar;A. Chatterjee;Y. Zorian

  • A New Self-Healing Methodology for RF Amplifier Circuits Based on Oscillation Principles

    A. Goyal;M. Swaminathan;A. Chatterjee;D. C. Howard

  • Simultaneous power supply, threshold voltage, and transistor size optimization for low-power operation of CMOS circuits

    P. Pant;V.K. De;A. Chatterjee

  • A built-in loopback test methodology for RF transceiver circuits using embedded sensor circuits

    S. Bhattacharya;A. Chatterjee

  • Synthesis of low power linear DSP circuits using activity metrics

    A. Chatterjee;R.K. Roy

  • Built-in test of RF components using mapped feature extraction sensors

    S. Sermet Akbay;A. Chatterjee

  • A signature analyzer for analog and mixed-signal circuits

    N. Nagi;A. Chatterjee;J.A. Abraham

Frequent Co-Authors

Shreyas Sen
Shreyas Sen Purdue University West Lafayette
Jacob A. Abraham
Jacob A. Abraham The University of Texas at Austin
Madhavan Swaminathan
Madhavan Swaminathan Pennsylvania State University
Vivek De
Vivek De Intel (United States)
Kaushik Roy
Kaushik Roy Purdue University West Lafayette
Krishnendu Chakrabarty
Krishnendu Chakrabarty Arizona State University
John D. Cressler
John D. Cressler Georgia Institute of Technology
Nan Marie Jokerst
Nan Marie Jokerst Duke University
Fadi J. Kurdahi
Fadi J. Kurdahi University of California, Irvine

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