2007 - IEEE Fellow For contributions to testing analog and mixed signal circuits
The scientist’s investigation covers issues in Electronic engineering, Electronic circuit, Analogue electronics, Radio frequency and Built-in self-test. Abhijit Chatterjee incorporates Electronic engineering and Test method in his studies. Abhijit Chatterjee has included themes like System on a chip, Noise, Node, Very-large-scale integration and CMOS in his Electronic circuit study.
His studies deal with areas such as Mixed-signal integrated circuit, Integrated circuit, Computer engineering and Fault, Automatic test pattern generation as well as Analogue electronics. His Built-in self-test research is multidisciplinary, incorporating perspectives in Low-noise amplifier and Waveform. His Baseband research incorporates themes from Transmitter and Modulation.
Abhijit Chatterjee focuses on Electronic engineering, Electronic circuit, Radio frequency, Algorithm and Electrical engineering. His work on CMOS as part of his general Electronic engineering study is frequently connected to Test method, thereby bridging the divide between different branches of science. His work on Mixed-signal integrated circuit as part of general Electronic circuit study is frequently linked to Signature, bridging the gap between disciplines.
His research investigates the connection between Algorithm and topics such as Automatic test pattern generation that intersect with issues in Analogue electronics. In his research on the topic of Signal, Sampling is strongly related with Jitter. His Transmitter research integrates issues from Wireless and Transceiver.
Abhijit Chatterjee spends much of his time researching Electronic engineering, Electronic circuit, Control theory, Algorithm and Mixed-signal integrated circuit. Digital signal processing is the focus of his Electronic engineering research. His Electronic circuit research is multidisciplinary, incorporating elements of Computer hardware, Embedded system, CMOS and Integrated circuit.
Abhijit Chatterjee works mostly in the field of Control theory, limiting it down to topics relating to Control engineering and, in certain cases, Servomotor, Actuator and Reinforcement learning, as a part of the same area of interest. His work on Algorithm design and Time complexity as part of general Algorithm research is frequently linked to Sparse model and Parametric model, bridging the gap between disciplines. His biological study spans a wide range of topics, including Physical design, Signal integrity, Test case and Fault detection and isolation.
Abhijit Chatterjee mostly deals with Electronic engineering, Communication channel, Electronic circuit, Error detection and correction and Radio frequency. His Electronic engineering study focuses on Static random-access memory in particular. In his work, Bit error rate is strongly intertwined with Adaptive system, which is a subfield of Communication channel.
Abhijit Chatterjee combines subjects such as Controllability, Chip, Node, Embedded system and Observability with his study of Electronic circuit. His Error detection and correction research includes themes of Redundancy and Analogue electronics. His Radio frequency study combines topics in areas such as Computerized adaptive testing, Automatic test pattern generation and Detector.
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
Prediction of analog performance parameters using fast transient testing
P.N. Variyam;S. Cherubal;A. Chatterjee.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2002)
Prediction of analog performance parameters using fast transient testing
P.N. Variyam;S. Cherubal;A. Chatterjee.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2002)
Low-cost alternate EVM test for wireless receiver systems
A. Haider;A. Chatterjee.
vlsi test symposium (2005)
Low-cost alternate EVM test for wireless receiver systems
A. Haider;A. Chatterjee.
vlsi test symposium (2005)
Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits
Yuvraj Singh Dhillon;Abdulkadir Utku Diril;Abhijit Chatterjee.
design, automation, and test in europe (2005)
Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits
Yuvraj Singh Dhillon;Abdulkadir Utku Diril;Abhijit Chatterjee.
design, automation, and test in europe (2005)
Signature Testing of Analog and RF Circuits: Algorithms and Methodology
R. Voorakaranam;S.S. Akbay;S. Bhattacharya;S. Cherubal.
IEEE Transactions on Circuits and Systems I-regular Papers (2007)
Signature Testing of Analog and RF Circuits: Algorithms and Methodology
R. Voorakaranam;S.S. Akbay;S. Bhattacharya;S. Cherubal.
IEEE Transactions on Circuits and Systems I-regular Papers (2007)
A Signature Test Framework for Rapid Production Testing of RF Circuits
R. Voorakaranam;S. Cherubal;A. Chatterjee.
design, automation, and test in europe (2002)
A Signature Test Framework for Rapid Production Testing of RF Circuits
R. Voorakaranam;S. Cherubal;A. Chatterjee.
design, automation, and test in europe (2002)
If you think any of the details on this page are incorrect, let us know.
We appreciate your kind effort to assist us to improve this page, it would be helpful providing us with as much detail as possible in the text box below:
The University of Texas at Austin
Georgia Institute of Technology
Purdue University West Lafayette
Arizona State University
Georgia Institute of Technology
Intel (United States)
Georgia Institute of Technology
Duke University
University of California, Irvine
Delft University of Technology
Carlos III University of Madrid
University of Bath
Toyota Motor Corporation (Switzerland)
University of Kentucky
National Institute of Standards and Technology
Murdoch University
Max Planck Society
University of Zurich
Stockholm Resilience Centre
Metropolitan Water District of Southern California
Virginia Tech
National Institutes of Health
National Academies of Sciences, Engineering, and Medicine
Columbia University
Oregon Health & Science University
Colorado State University