D-Index & Metrics Best Publications

D-Index & Metrics D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines.

Discipline name D-index D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines. Citations Publications World Ranking National Ranking
Electronics and Electrical Engineering D-index 37 Citations 5,676 367 World Ranking 3319 National Ranking 1280

Research.com Recognitions

Awards & Achievements

2007 - IEEE Fellow For contributions to testing analog and mixed signal circuits

Overview

What is he best known for?

The fields of study he is best known for:

  • Electrical engineering
  • Integrated circuit
  • Electronic engineering

The scientist’s investigation covers issues in Electronic engineering, Electronic circuit, Analogue electronics, Radio frequency and Built-in self-test. Abhijit Chatterjee incorporates Electronic engineering and Test method in his studies. Abhijit Chatterjee has included themes like System on a chip, Noise, Node, Very-large-scale integration and CMOS in his Electronic circuit study.

His studies deal with areas such as Mixed-signal integrated circuit, Integrated circuit, Computer engineering and Fault, Automatic test pattern generation as well as Analogue electronics. His Built-in self-test research is multidisciplinary, incorporating perspectives in Low-noise amplifier and Waveform. His Baseband research incorporates themes from Transmitter and Modulation.

His most cited work include:

  • Prediction of analog performance parameters using fast transient testing (231 citations)
  • Low-cost alternate EVM test for wireless receiver systems (170 citations)
  • Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits (113 citations)

What are the main themes of his work throughout his whole career to date?

Abhijit Chatterjee focuses on Electronic engineering, Electronic circuit, Radio frequency, Algorithm and Electrical engineering. His work on CMOS as part of his general Electronic engineering study is frequently connected to Test method, thereby bridging the divide between different branches of science. His work on Mixed-signal integrated circuit as part of general Electronic circuit study is frequently linked to Signature, bridging the gap between disciplines.

His research investigates the connection between Algorithm and topics such as Automatic test pattern generation that intersect with issues in Analogue electronics. In his research on the topic of Signal, Sampling is strongly related with Jitter. His Transmitter research integrates issues from Wireless and Transceiver.

He most often published in these fields:

  • Electronic engineering (68.48%)
  • Electronic circuit (17.93%)
  • Radio frequency (14.40%)

What were the highlights of his more recent work (between 2013-2021)?

  • Electronic engineering (68.48%)
  • Electronic circuit (17.93%)
  • Control theory (7.34%)

In recent papers he was focusing on the following fields of study:

Abhijit Chatterjee spends much of his time researching Electronic engineering, Electronic circuit, Control theory, Algorithm and Mixed-signal integrated circuit. Digital signal processing is the focus of his Electronic engineering research. His Electronic circuit research is multidisciplinary, incorporating elements of Computer hardware, Embedded system, CMOS and Integrated circuit.

Abhijit Chatterjee works mostly in the field of Control theory, limiting it down to topics relating to Control engineering and, in certain cases, Servomotor, Actuator and Reinforcement learning, as a part of the same area of interest. His work on Algorithm design and Time complexity as part of general Algorithm research is frequently linked to Sparse model and Parametric model, bridging the gap between disciplines. His biological study spans a wide range of topics, including Physical design, Signal integrity, Test case and Fault detection and isolation.

Between 2013 and 2021, his most popular works were:

  • Yield Recovery of RF Transceiver Systems Using Iterative Tuning-Driven Power-Conscious Performance Optimization (18 citations)
  • Self-Learning RF Receiver Systems: Process Aware Real-Time Adaptation to Channel Conditions for Low Power Operation (16 citations)
  • Process-Variation Tolerant Channel-Adaptive Virtually Zero-Margin Low-Power Wireless Receiver Systems (14 citations)

In his most recent research, the most cited papers focused on:

  • Electrical engineering
  • Integrated circuit
  • Algorithm

Abhijit Chatterjee mostly deals with Electronic engineering, Communication channel, Electronic circuit, Error detection and correction and Radio frequency. His Electronic engineering study focuses on Static random-access memory in particular. In his work, Bit error rate is strongly intertwined with Adaptive system, which is a subfield of Communication channel.

Abhijit Chatterjee combines subjects such as Controllability, Chip, Node, Embedded system and Observability with his study of Electronic circuit. His Error detection and correction research includes themes of Redundancy and Analogue electronics. His Radio frequency study combines topics in areas such as Computerized adaptive testing, Automatic test pattern generation and Detector.

This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.

Best Publications

Prediction of analog performance parameters using fast transient testing

P.N. Variyam;S. Cherubal;A. Chatterjee.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2002)

358 Citations

Prediction of analog performance parameters using fast transient testing

P.N. Variyam;S. Cherubal;A. Chatterjee.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2002)

358 Citations

Low-cost alternate EVM test for wireless receiver systems

A. Haider;A. Chatterjee.
vlsi test symposium (2005)

210 Citations

Low-cost alternate EVM test for wireless receiver systems

A. Haider;A. Chatterjee.
vlsi test symposium (2005)

210 Citations

Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits

Yuvraj Singh Dhillon;Abdulkadir Utku Diril;Abhijit Chatterjee.
design, automation, and test in europe (2005)

167 Citations

Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits

Yuvraj Singh Dhillon;Abdulkadir Utku Diril;Abhijit Chatterjee.
design, automation, and test in europe (2005)

167 Citations

Signature Testing of Analog and RF Circuits: Algorithms and Methodology

R. Voorakaranam;S.S. Akbay;S. Bhattacharya;S. Cherubal.
IEEE Transactions on Circuits and Systems I-regular Papers (2007)

145 Citations

Signature Testing of Analog and RF Circuits: Algorithms and Methodology

R. Voorakaranam;S.S. Akbay;S. Bhattacharya;S. Cherubal.
IEEE Transactions on Circuits and Systems I-regular Papers (2007)

145 Citations

A Signature Test Framework for Rapid Production Testing of RF Circuits

R. Voorakaranam;S. Cherubal;A. Chatterjee.
design, automation, and test in europe (2002)

140 Citations

A Signature Test Framework for Rapid Production Testing of RF Circuits

R. Voorakaranam;S. Cherubal;A. Chatterjee.
design, automation, and test in europe (2002)

140 Citations

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