World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
33
Citations
6141
World Ranking
5952
National Ranking
1998

Overview

Yiorgos Makris is affiliated with The University of Texas at Dallas in the United States. Their academic work spans multiple fields, primarily focusing on computer science and engineering.

The scientist's research includes significant contributions to the following main fields of study:

  • Computer Science
  • Engineering

Within these fields, the key subfields of study addressed in their work are:

  • Electrical and Electronic Engineering
  • Hardware and Architecture
  • Artificial Intelligence
  • Molecular Biology
  • Signal Processing

Makris's research topics cover a range of specialized areas including:

  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Integrated Circuits and Semiconductor Failure Analysis
  • Advanced Malware Detection Techniques
  • CRISPR and Genetic Engineering
  • Security and Verification in Computing
  • VLSI and Analog Circuit Testing
  • Industrial Vision Systems and Defect Detection

Their frequent coauthors include:

  • Mohammad Mahdi Bidmeshki
  • Leonidas Bleris
  • Gaurav Rajavendra Reddy
  • Liwei Zhou
  • Mustafa Shihab

Makris's publications have appeared primarily in recognized venues such as:

  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • arXiv (Cornell University)
  • IEEE Design and Test
  • IEEE Journal on Emerging and Selected Topics in Circuits and Systems
  • IEEE Access

Recent papers authored or coauthored by Makris include:

  • Improved Static Hand Gesture Classification on Deep Convolutional Neural Networks Using Novel Sterile Training Technique (2021, IEEE Access)
  • Amplitude-Modulating Analog/RF Hardware Trojans in Wireless Networks: Risks and Remedies (2020, IEEE Transactions on Information Forensics and Security)
  • Efficient CNN-Based Super Resolution Algorithms for Mmwave Mobile Radar Imaging (2022, 2022 IEEE International Conference on Image Processing (ICIP))
  • Unlocking Hardware Security Assurance: The Potential of LLMs (2023, arXiv (Cornell University))
  • Automated Die Inking (2020, IEEE Transactions on Device and Materials Reliability)

Best Publications

  • Hardware Trojan detection using path delay fingerprint

    Yier Jin;Y. Makris

  • Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain

    Ujjwal Guin;Ke Huang;Daniel DiMase;Jr . John M. Carulli

  • Experiences in Hardware Trojan design and implementation

    Yier Jin;Nathan Kupp;Yiorgos Makris

  • Proof-Carrying Hardware Intellectual Property: A Pathway to Trusted Module Acquisition

    Eric Love;Yier Jin;Yiorgos Makris

  • Error Moderation in Low-Cost Machine-Learning-Based Analog/RF Testing

    H.-G. Stratigopoulos;Y. Makris

  • Hardware Trojans in Wireless Cryptographic ICs

    Y. Jin;Y. Makris

  • Hardware Trojan Detection through Golden Chip-Free Statistical Side-Channel Fingerprinting

    Yu Liu;Ke Huang;Yiorgos Makris

  • What to Lock?: Functional and Parametric Locking

    Muhammad Yasin;Abhrajit Sengupta;Benjamin Carrion Schafer;Yiorgos Makris

  • Silicon Demonstration of Hardware Trojan Design and Detection in Wireless Cryptographic ICs

    Yu Liu;Yier Jin;Aria Nosratinia;Yiorgos Makris

  • Parametric counterfeit IC detection via Support Vector Machines

    Ke Huang;John M Carulli;Yiorgos Makris

  • Non-RF to RF Test Correlation Using Learning Machines: A Case Study

    H.-G.D. Stratigopoulos;P. Drineas;M. Slamani;Y. Makris

  • Proof carrying-based information flow tracking for data secrecy protection and hardware trust

    Yier Jin;Yiorgos Makris

  • Instruction-Level Impact Analysis of Low-Level Faults in a Modern Microprocessor Controller

    M. Maniatakos;N. Karimi;C. Tirumurti;A. Jas

  • Hardware Trojans in wireless cryptographic ICs: silicon demonstration & detection method evaluation

    Yu Liu;Yier Jin;Yiorgos Makris

  • RF Specification Test Compaction Using Learning Machines

    Haralampos-G Stratigopoulos;Petros Drineas;Mustapha Slamani;Yiorgos Makris

  • Nonlinear decision boundaries for testing analog circuits

    H.-G.D. Stratigopoulos;Y. Makris

  • Soft Error Mitigation Through Selective Addition of Functionally Redundant Wires

    S. Almukhaizim;Y. Makris

  • Counterfeit electronics: A rising threat in the semiconductor manufacturing industry

    Ke Huang;John M. Carulli;Yiorgos Makris

  • Cycle-accurate information assurance by proof-carrying based signal sensitivity tracing

    Yier Jin;Bo Yang;Yiorgos Makris

  • Independent test sequence compaction through integer programming

    P. Drineas;Y. Makris

  • Seamless Integration of SER in Rewiring-Based Design Space Exploration

    Sobeeh Almukhaizim;Yiorgos Makris;Yu-shen Yang;Andreas Veneris

  • Entropy-driven parity-tree selection for low-overhead concurrent error detection in finite state machines

    S. Almukhaizim;P. Drineas;Y. Makris

Frequent Co-Authors

Yier Jin
Yier Jin University of Florida
Ozgur Sinanoglu
Ozgur Sinanoglu New York University Abu Dhabi
Jeyavijayan Rajendran
Jeyavijayan Rajendran Texas A&M University
Aria Nosratinia
Aria Nosratinia The University of Texas at Dallas
Ramesh Karri
Ramesh Karri New York University
Farinaz Koushanfar
Farinaz Koushanfar University of California, San Diego
Anand Raghunathan
Anand Raghunathan Purdue University West Lafayette
Steven M. Nowick
Steven M. Nowick Columbia University
Michael Nicolaidis
Michael Nicolaidis TIMA Laboratory
Swarup Bhunia
Swarup Bhunia University of Florida

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