World's Best Scientists 2026 revealed!

D-Index & Metrics

Discipline name D-Index World Ranking Current World Ranking National Ranking Current National Ranking Publications Citations
Electronics and Electrical Engineering 45 3522 3381 1304 1217 207 8886
Computer Science 46 6824 6625 3001 2887 222 9212

Yier Jin publications per year

The chart shows the history of publications by Yier Jin between 2006 and 2025, highlighting the no. of papers published in each year and offering an overview of the publication velocity of this scholar. Yier Jin published across 20 years, from 2006 to 2025, averaging 13.5 papers a year. Output peaked at 30 publications in 2017. 39 of the 269 publications appeared in the last two years.

No. of publications
10 20 30
Bar chart. Horizontal axis: year, 2006 to 2025. Vertical axis: number of publications, 0 to 30. Peak 30 publications in 2017. 2006: 5 publications 2007: 1 publication 2008: 3 publications 2009: 1 publication 2010: 3 publications 2011: 3 publications 2012: 6 publications 2013: 6 publications 2014: 7 publications 2015: 13 publications 2016: 29 publications 2017: 30 publications 2018: 19 publications 2019: 20 publications 2020: 29 publications 2021: 22 publications 2022: 15 publications 2023: 18 publications 2024: 20 publications 2025: 19 publications
2006 2025

269 publications in total across all disciplines

View publications per year as a table
Yier Jin: publications per year, 2006 to 2025
Year Publications
2006 5
2007 1
2008 3
2009 1
2010 3
2011 3
2012 6
2013 6
2014 7
2015 13
2016 29
2017 30
2018 19
2019 20
2020 29
2021 22
2022 15
2023 18
2024 20
2025 19
Total 269
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Yier Jin publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Yier Jin sits on this spectrum.

No. of scientists
100 200 300 400
Bar chart with 53 bars. Horizontal axis: publications, 34–53 to 1,065+. Vertical axis: number of scientists, 0 to 445. Most scientists, 445, have 174–193 publications. The last bar groups every scientist with 1,065 publications or more. The highlighted bar, 194–213 publications, is where this scientist sits. 34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34–53 publications 1,065+

This scientist: 207 publications — 31st percentile

31% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

View publications distribution as a table
Number of Electronics and Electrical Engineering scientists by publication count, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
Publications Scientists This scientist
34–53 24
54–73 52
74–93 114
94–113 203
114–133 269
134–153 355
154–173 403
174–193 445
194–213 430 207
214–233 431
234–253 399
254–273 366
274–293 335
294–313 300
314–333 276
334–353 250
354–373 214
374–393 187
394–413 152
414–433 169
434–453 147
454–473 111
474–493 117
494–513 103
514–533 99
534–553 92
554–573 75
574–593 58
594–613 69
614–633 50
634–653 62
654–673 54
674–693 44
694–713 37
714–733 28
734–753 26
754–773 26
774–793 19
794–813 23
814–833 20
834–853 16
854–873 20
874–893 11
894–913 11
914–933 16
934–953 13
954–973 10
974–993 11
994–1,013 9
1,014–1,033 9
1,034–1,053 10
1,054–1,064 6
1,065+ 99
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Yier Jin D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Yier Jin sits on this spectrum.

No. of scientists
50 100 150 200 250
Bar chart with 82 bars. Horizontal axis: D-Index, 30 to 111+. Vertical axis: number of scientists, 0 to 263. Most scientists, 263, have 32 D-Index. The last bar groups every scientist with 111 D-Index or more. The highlighted bar, 45 D-Index, is where this scientist sits. 30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 45 D-Index — 50th percentile

50% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

View D-Index distribution as a table
Number of Electronics and Electrical Engineering scientists by D-index, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
D-Index Scientists This scientist
30 178
31 257
32 263
33 262
34 244
35 236
36 211
37 220
38 214
39 214
40 205
41 187
42 194
43 201
44 155
45 189 45
46 148
47 160
48 134
49 130
50 141
51 156
52 108
53 130
54 112
55 97
56 111
57 102
58 108
59 120
60 103
61 93
62 92
63 74
64 77
65 73
66 64
67 69
68 60
69 39
70 57
71 59
72 46
73 49
74 38
75 35
76 32
77 35
78 31
79 22
80 34
81 31
82 34
83 23
84 18
85 30
86 19
87 19
88 20
89 8
90 17
91 7
92 14
93 9
94 15
95 10
96 12
97 10
98 10
99 12
100 16
101 5
102 7
103 7
104 8
105 9
106 13
107 4
108 5
109 10
110 8
111+ 96
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Overview

Yier Jin is affiliated with the University of Florida in the United States and has a research focus primarily in Computer Science and Engineering. Their work spans multiple subfields including Artificial Intelligence, Hardware and Architecture, Electrical and Electronic Engineering, Signal Processing, and Computer Networks and Communications.

Their research addresses a range of topics, notably:

  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Advanced Malware Detection Techniques
  • Cryptographic Implementations and Security
  • Security and Verification in Computing
  • Smart Grid Security and Resilience
  • Chaos-based Image/Signal Encryption
  • Adversarial Robustness in Machine Learning

Yier Jin has published extensively in various venues, frequently contributing to:

  • arXiv (Cornell University)
  • IEEE Transactions on Information Forensics and Security
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Proceedings of the AAAI Conference on Artificial Intelligence
  • ACM Journal on Emerging Technologies in Computing Systems

Their recent papers include:

  • "Robust Adversarial Objects against Deep Learning Models," 2020, Proceedings of the AAAI Conference on Artificial Intelligence
  • "Design and Analysis of Secure Distributed Estimator for Vehicular Platooning in Adversarial Environment," 2020, IEEE Transactions on Intelligent Transportation Systems
  • "Beyond Digital Domain: Fooling Deep Learning Based Recognition System in Physical World," 2020, Proceedings of the AAAI Conference on Artificial Intelligence
  • "On Sensor Security in the Era of IoT and CPS," 2021, SN Computer Science
  • "A Review and Comparison of AI-enhanced Side Channel Analysis," 2022, ACM Journal on Emerging Technologies in Computing Systems

Yier Jin has frequently collaborated with several researchers, including:

  • Xiaolong Guo
  • Jiaji He
  • Yaodan Hu
  • Yiqiang Zhao
  • Haocheng Ma

Best Publications

  • Hardware Trojan detection using path delay fingerprint

    Yier Jin;Y. Makris

  • Hardware Trojans: Lessons Learned after One Decade of Research

    K. Xiao;D. Forte;Y. Jin;R. Karri

  • Privacy and Security in Internet of Things and Wearable Devices

    Orlando Arias;Jacob Wurm;Khoa Hoang;Yier Jin

  • AppSAT: Approximately deobfuscating integrated circuits

    Kaveh Shamsi;Meng Li;Travis Meade;Zheng Zhao

  • Security analysis on consumer and industrial IoT devices

    Jacob Wurm;Khoa Hoang;Orlando Arias;Ahmad-Reza Sadeghi

  • Experiences in Hardware Trojan design and implementation

    Yier Jin;Nathan Kupp;Yiorgos Makris

  • Provably Secure Camouflaging Strategy for IC Protection

    Meng Li;Kaveh Shamsi;Travis Meade;Zheng Zhao

  • HAFIX: hardware-assisted flow integrity extension

    Lucas Davi;Matthias Hanreich;Debayan Paul;Ahmad-Reza Sadeghi

  • Internet-of-Things Security and Vulnerabilities: Taxonomy, Challenges, and Practice

    Kejun Chen;Shuai Zhang;Zhikun Li;Yi Zhang

  • Proof-Carrying Hardware Intellectual Property: A Pathway to Trusted Module Acquisition

    Eric Love;Yier Jin;Yiorgos Makris

  • Cyclic Obfuscation for Creating SAT-Unresolvable Circuits

    Kaveh Shamsi;Meng Li;Travis Meade;Zheng Zhao

  • Hardware Trojan Detection Through Chip-Free Electromagnetic Side-Channel Statistical Analysis

    Jiaji He;Yiqiang Zhao;Xiaolong Guo;Yier Jin

  • Hardware Trojans in Wireless Cryptographic ICs

    Y. Jin;Y. Makris

  • The Changing Computing Paradigm With Internet of Things: A Tutorial Introduction

    Sandip Ray;Yier Jin;Arijit Raychowdhury

  • CloudLeak: Large-Scale Deep Learning Models Stealing Through Adversarial Examples.

    Honggang Yu;Kaichen Yang;Teng Zhang;Yun-Yun Tsai

  • AVFSM: a framework for identifying and mitigating vulnerabilities in FSMs

    Adib Nahiyan;Kan Xiao;Kun Yang;Yeir Jin

  • Robust Adversarial Objects against Deep Learning Models

    Tzungyu Tsai;Kaichen Yang;Tsung-Yi Ho;Yier Jin

  • Silicon Demonstration of Hardware Trojan Design and Detection in Wireless Cryptographic ICs

    Yu Liu;Yier Jin;Aria Nosratinia;Yiorgos Makris

  • DeepEM: Deep Neural Networks Model Recovery through EM Side-Channel Information Leakage

    Honggang Yu;Haocheng Ma;Kaichen Yang;Yiqiang Zhao

Frequent Co-Authors

Yiorgos Makris
Yiorgos Makris The University of Texas at Dallas
David Z. Pan
David Z. Pan The University of Texas at Austin
Mark Tehranipoor
Mark Tehranipoor University of Florida
Ahmad-Reza Sadeghi
Ahmad-Reza Sadeghi Technical University of Darmstadt
Michael Niemier
Michael Niemier University of Notre Dame
Tsung-Yi Ho
Tsung-Yi Ho Chinese University of Hong Kong
Lucas Davi
Lucas Davi University of Duisburg-Essen
Pierre-Emmanuel Gaillardon
Pierre-Emmanuel Gaillardon University of Utah
Xinwen Fu
Xinwen Fu University of Massachusetts Lowell
Gang Quan
Gang Quan Florida International University

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