World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
51
Citations
8481
World Ranking
2713
National Ranking
1028

Wojciech Maly publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Wojciech Maly sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 216 publications — 34th percentile

34% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Wojciech Maly D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Wojciech Maly sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 51 D-Index — 63rd percentile

63% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Wojciech Maly is affiliated with Carnegie Mellon University in the United States. Their academic profile reflects involvement in research activities associated with this institution.

Details about recent papers, including titles, years of publication, and venues, are not available.

There is no publicly listed information regarding frequent co-authors or recurrent publication venues attributed to Wojciech Maly.

Information on book publications or specific publishers related to Wojciech Maly's work is not provided.

No data is available on the main fields of study or subfields in which Wojciech Maly conducts research, nor are there specified main topics of their work.

No awards or honors have been documented in the provided data.

Best Publications

  • Inductive Fault Analysis of MOS Integrated Circuits

    John P. Shen;W. Maly;F. Joel Ferguson

  • Realistic Fault Modeling for VLSI Testing

    W. Maly

  • CMOS bridging fault detection

    T.M. Storey;W. Maly

  • Test generation for current testing (CMOS ICs)

    P. Nigh;W. Maly

  • Modeling of Lithography Related Yield Losses for CAD of VLSI Circuits

    W. Maly

  • Built-in current testing-feasibility study

    W. Maly;P. Nigh

  • VLSI Yield Prediction and Estimation: A Unified Framework

    W. Maly;A.J. Strojwas

  • Yield estimation model for VLSI artwork evaluation

    Wojciech Maly;J. Deszczka

  • Testing oriented analysis of CMOS ICs with opens

    W. Maly;P.K. Nag;P. Nigh

  • Current signatures [VLSI circuit testing]

    A.E. Gattiker;W. Maly

  • Stacked 3-dimensional 6T SRAM cell with independent double gate transistors

    Marcus Weis;Andrzej Pfitzner;Dominik Kasprowicz;Rainer Emling

  • Interconnect characteristics of 2.5-D system integration scheme

    Yangdong Deng;Wojciech P. Maly

  • Current signatures: application

    A.E. Gattiker;W. Maly

  • Systematic characterization of physical defects for fault analysis of MOS IC cells

    W. Maly;F. J. Ferguson;J. P. Shen

  • Integrated circuit device, system, and method of fabrication

    Wojciech P. Maly

  • FAULT MODELING FOR THE TESTING OF MIXED INTEGRATED CIRCUITS

    A. Meixner;W. Maly

  • Built-in current testing

    W. Maly;M. Patyra

  • Current sensing for built-in testing of CMOS circuits

    D.B.I. Feltham;P.J. Nigh;L.R. Carley;W. Maly

  • Limitations and challenges of computer-aided design technology for CMOS VLSI

    R.E. Bryant;Kwang-Ting Cheng;A.B. Kahng;K. Keutzer

  • So what is an optimal test mix? A discussion of the SEMATECH methods experiment

    P. Nigh;W. Needham;K. Butler;P. Maxwell

  • Test generation for current testing

    P. Nigh;W. Maly

Frequent Co-Authors

Malgorzata Marek-Sadowska
Malgorzata Marek-Sadowska University of California, Santa Barbara
Janusz Rajski
Janusz Rajski Siemens (Germany)
Navab Singh
Navab Singh Agency for Science, Technology and Research
John Paul Shen
John Paul Shen Carnegie Mellon University
L.R. Carley
L.R. Carley Carnegie Mellon University
Guo-Qiang Lo
Guo-Qiang Lo Global Foundries
Michael Nicolaidis
Michael Nicolaidis TIMA Laboratory
Daniel P. Siewiorek
Daniel P. Siewiorek Carnegie Mellon University
Dim-Lee Kwong
Dim-Lee Kwong National University of Singapore

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