Michael Nicolaidis mainly investigates Fault tolerance, Embedded system, Built-in self-test, Electronic engineering and Error detection and correction. His Fault tolerance research is multidisciplinary, incorporating perspectives in Soft error, Redundancy, Systems design, Fault injection and Automotive electronics. His Embedded system course of study focuses on Computer hardware and Aliasing.
Michael Nicolaidis combines subjects such as Algorithm and Fault coverage with his study of Built-in self-test. Michael Nicolaidis studies Electronic engineering, namely Integrated circuit design. His biological study spans a wide range of topics, including Dispose pattern and Single event upset, Static random-access memory.
Michael Nicolaidis mainly focuses on Electronic engineering, Embedded system, Fault tolerance, Built-in self-test and Electronic circuit. His Electronic engineering research incorporates elements of Integrated circuit, Error detection and correction and Reliability. His work investigates the relationship between Embedded system and topics such as Fault that intersect with problems in Real-time computing.
Combinational logic is closely connected to Soft error in his research, which is encompassed under the umbrella topic of Fault tolerance. His research integrates issues of Computer hardware, Very-large-scale integration, Fault coverage and Parallel computing in his study of Built-in self-test. His studies in Electronic circuit integrate themes in fields like Set and Computer engineering.
Embedded system, Distributed computing, Fault tolerance, Reliability engineering and Reliability are his primary areas of study. His research in the fields of System on a chip overlaps with other disciplines such as Leverage. The study incorporates disciplines such as Very-large-scale integration, Chip and Overhead in addition to Fault tolerance.
He has included themes like Set, Electronic design automation, Real-time computing, Electronic engineering and Reliability in his Reliability engineering study. His Reliability research integrates issues from Electronic circuit, CMOS and Maintenance engineering. His studies deal with areas such as Design for testing and Integrated circuit as well as Integrated circuit design.
His main research concerns Embedded system, Reliability, Reliability engineering, CMOS and System on a chip. His Embedded system research is multidisciplinary, relying on both Memory test and Computer architecture. His work in the fields of Reliability engineering, such as Dependable computing, overlaps with other areas such as Internal noise.
His study in CMOS is interdisciplinary in nature, drawing from both Integrated circuit design, Design for testing, Reduction and Reliability. His Reduction research also works with subjects such as
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Upset hardened memory design for submicron CMOS technology
T. Calin;M. Nicolaidis;R. Velazco.
IEEE Transactions on Nuclear Science (1996)
Upset hardened memory design for submicron CMOS technology
T. Calin;M. Nicolaidis;R. Velazco.
IEEE Transactions on Nuclear Science (1996)
Time redundancy based soft-error tolerance to rescue nanometer technologies
M. Nicolaidis.
vlsi test symposium (1999)
Time redundancy based soft-error tolerance to rescue nanometer technologies
M. Nicolaidis.
vlsi test symposium (1999)
Design for soft error mitigation
M. Nicolaidis.
IEEE Transactions on Device and Materials Reliability (2005)
Design for soft error mitigation
M. Nicolaidis.
IEEE Transactions on Device and Materials Reliability (2005)
On-Line Testing for VLSI—A Compendium of Approaches
M. Nicolaidis;Y. Zorian.
Journal of Electronic Testing (1998)
On-Line Testing for VLSI—A Compendium of Approaches
M. Nicolaidis;Y. Zorian.
Journal of Electronic Testing (1998)
Soft Errors in Modern Electronic Systems
Michael Nicolaidis.
TAEBC-2011 (2010)
Soft Errors in Modern Electronic Systems
Michael Nicolaidis.
TAEBC-2011 (2010)
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