D-Index & Metrics Best Publications
Michael Nicolaidis

Michael Nicolaidis

D-Index & Metrics D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines.

Discipline name D-index D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines. Citations Publications World Ranking National Ranking
Electronics and Electrical Engineering D-index 39 Citations 8,030 225 World Ranking 2886 National Ranking 46

Overview

What is he best known for?

The fields of study he is best known for:

  • Electrical engineering
  • Programming language
  • Integrated circuit

Michael Nicolaidis mainly investigates Fault tolerance, Embedded system, Built-in self-test, Electronic engineering and Error detection and correction. His Fault tolerance research is multidisciplinary, incorporating perspectives in Soft error, Redundancy, Systems design, Fault injection and Automotive electronics. His Embedded system course of study focuses on Computer hardware and Aliasing.

Michael Nicolaidis combines subjects such as Algorithm and Fault coverage with his study of Built-in self-test. Michael Nicolaidis studies Electronic engineering, namely Integrated circuit design. His biological study spans a wide range of topics, including Dispose pattern and Single event upset, Static random-access memory.

His most cited work include:

  • Upset hardened memory design for submicron CMOS technology (884 citations)
  • Time redundancy based soft-error tolerance to rescue nanometer technologies (459 citations)
  • Design for soft error mitigation (285 citations)

What are the main themes of his work throughout his whole career to date?

Michael Nicolaidis mainly focuses on Electronic engineering, Embedded system, Fault tolerance, Built-in self-test and Electronic circuit. His Electronic engineering research incorporates elements of Integrated circuit, Error detection and correction and Reliability. His work investigates the relationship between Embedded system and topics such as Fault that intersect with problems in Real-time computing.

Combinational logic is closely connected to Soft error in his research, which is encompassed under the umbrella topic of Fault tolerance. His research integrates issues of Computer hardware, Very-large-scale integration, Fault coverage and Parallel computing in his study of Built-in self-test. His studies in Electronic circuit integrate themes in fields like Set and Computer engineering.

He most often published in these fields:

  • Electronic engineering (26.36%)
  • Embedded system (22.09%)
  • Fault tolerance (20.54%)

What were the highlights of his more recent work (between 2010-2020)?

  • Embedded system (22.09%)
  • Distributed computing (9.69%)
  • Fault tolerance (20.54%)

In recent papers he was focusing on the following fields of study:

Embedded system, Distributed computing, Fault tolerance, Reliability engineering and Reliability are his primary areas of study. His research in the fields of System on a chip overlaps with other disciplines such as Leverage. The study incorporates disciplines such as Very-large-scale integration, Chip and Overhead in addition to Fault tolerance.

He has included themes like Set, Electronic design automation, Real-time computing, Electronic engineering and Reliability in his Reliability engineering study. His Reliability research integrates issues from Electronic circuit, CMOS and Maintenance engineering. His studies deal with areas such as Design for testing and Integrated circuit as well as Integrated circuit design.

Between 2010 and 2020, his most popular works were:

  • Reliability challenges of real-time systems in forthcoming technology nodes (50 citations)
  • A fault-tolerant deadlock-free adaptive routing for on chip interconnects (30 citations)
  • A Practical Approach to Single Event Transients Analysis for Highly Complex Designs (24 citations)

In his most recent research, the most cited papers focused on:

  • Electrical engineering
  • Programming language
  • Integrated circuit

His main research concerns Embedded system, Reliability, Reliability engineering, CMOS and System on a chip. His Embedded system research is multidisciplinary, relying on both Memory test and Computer architecture. His work in the fields of Reliability engineering, such as Dependable computing, overlaps with other areas such as Internal noise.

His study in CMOS is interdisciplinary in nature, drawing from both Integrated circuit design, Design for testing, Reduction and Reliability. His Reduction research also works with subjects such as

  • Built-in self-test, which have a strong connection to Electronic circuit,
  • Voltage reduction and related Maintenance engineering and Electronic engineering. Michael Nicolaidis works mostly in the field of Reliability, limiting it down to topics relating to Cycles per instruction and, in certain cases, Soft error.

This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.

Best Publications

Upset hardened memory design for submicron CMOS technology

T. Calin;M. Nicolaidis;R. Velazco.
IEEE Transactions on Nuclear Science (1996)

1401 Citations

Upset hardened memory design for submicron CMOS technology

T. Calin;M. Nicolaidis;R. Velazco.
IEEE Transactions on Nuclear Science (1996)

1401 Citations

Time redundancy based soft-error tolerance to rescue nanometer technologies

M. Nicolaidis.
vlsi test symposium (1999)

655 Citations

Time redundancy based soft-error tolerance to rescue nanometer technologies

M. Nicolaidis.
vlsi test symposium (1999)

655 Citations

Design for soft error mitigation

M. Nicolaidis.
IEEE Transactions on Device and Materials Reliability (2005)

496 Citations

Design for soft error mitigation

M. Nicolaidis.
IEEE Transactions on Device and Materials Reliability (2005)

496 Citations

On-Line Testing for VLSI—A Compendium of Approaches

M. Nicolaidis;Y. Zorian.
Journal of Electronic Testing (1998)

433 Citations

On-Line Testing for VLSI—A Compendium of Approaches

M. Nicolaidis;Y. Zorian.
Journal of Electronic Testing (1998)

433 Citations

Soft Errors in Modern Electronic Systems

Michael Nicolaidis.
TAEBC-2011 (2010)

326 Citations

Soft Errors in Modern Electronic Systems

Michael Nicolaidis.
TAEBC-2011 (2010)

326 Citations

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