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Michael Nicolaidis

Michael Nicolaidis

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
41
Citations
8782
World Ranking
4229
National Ranking
72

Michael Nicolaidis publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Michael Nicolaidis sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 252 publications — 45th percentile

45% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Michael Nicolaidis D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Michael Nicolaidis sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 41 D-Index — 39th percentile

39% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Michael Nicolaidis is affiliated with the TIMA Laboratory in France. Their research is situated within the broad field of Engineering, with a specialization in Electrical and Electronic Engineering.

Their scholarly work has primarily addressed topics related to semiconductor technologies and electronic systems. Key areas of focus include:

  • Semiconductor materials and devices
  • Radiation Effects in Electronics
  • Advanced Memory and Neural Computing
  • Advancements in Semiconductor Devices and Circuit Design

Michael Nicolaidis has contributed to the scientific community through publications in peer-reviewed venues. Notably, their work appears in the IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Their recent publication history includes the following paper:

  • "Reducing Power Dissipation in Memory Repair for High Fault Rates," 2023, IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Collaboration has been an element of their research efforts. Frequent coauthors include:

  • Panagiota Papavramidou
  • Lorena Anghel

This cooperation reflects interdisciplinary and multi-author approaches common in their research domain, particularly in studies related to VLSI systems and memory technologies.

Best Publications

  • Upset hardened memory design for submicron CMOS technology

    T. Calin;M. Nicolaidis;R. Velazco

  • Time redundancy based soft-error tolerance to rescue nanometer technologies

    M. Nicolaidis

  • Design for soft error mitigation

    M. Nicolaidis

  • On-Line Testing for VLSI—A Compendium of Approaches

    M. Nicolaidis;Y. Zorian

  • Soft Errors in Modern Electronic Systems

    Michael Nicolaidis

  • Cost reduction and evaluation of a temporary faults detecting technique

    Lorena Anghel;Michael Nicolaidis

  • Embedded robustness IPs for transient-error-free ICs

    E. Dupont;M. Nicolaidis;P. Rohr

  • Carry checking/parity prediction adders and ALUs

    M. Nicolaidis

  • Evaluation of a Soft Error Tolerance Technique Based on Time and/or Space Redundancy

    L. Anghel;D. Alexandrescu;M. Nicolaidis

  • An SFS Berger check prediction ALU and its application to self-checking processor designs

    J.-C. Lo;S. Thanawastien;T.R.N. Rao;M. Nicolaidis

  • SEU-tolerant SRAM design based on current monitoring

    F. Vargas;M. Nicolaidis

  • Theory of transparent BIST for RAMs

    M. Nicolaidis

  • Efficient implementations of self-checking adders and ALUs

    M. Nicolaidis

  • TRANSPARENT BIST FOR RAMS

    M. Nicolaidis

  • Strongly code disjoint checkers

    M. Nicolaidis;B. Courtois

  • Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors

    M. Nicolaidis;R. Perez;D. Alexandrescu

  • Fault-secure parity prediction arithmetic operators

    M. Nicolaidis;R.O. Duarte;S. Manich;J. Figueras

  • New methods for evaluating the impact of single event transients in VDSM ICs

    D. Alexandrescu;L. Anghel;M. Nicolaidis

  • An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories

    Balkaran Gill;Michael Nicolaidis;Francis Wolff;Chris Papachristou

  • Self-exercising checkers for unified built-in self-test (UBIST)

    M. Nicolaidis

Frequent Co-Authors

Dimitris Gizopoulos
Dimitris Gizopoulos National and Kapodistrian University of Athens
Pierre Jarron
Pierre Jarron European Organization for Nuclear Research
Ravishankar K. Iyer
Ravishankar K. Iyer University of Illinois at Urbana-Champaign
Jacob A. Abraham
Jacob A. Abraham The University of Texas at Austin
Alessandro Paccagnella
Alessandro Paccagnella University of Padua
James W. Tschanz
James W. Tschanz Intel (United States)
Muhammad M. Khellah
Muhammad M. Khellah Intel (United States)
Wojciech Maly
Wojciech Maly Carnegie Mellon University
Yiorgos Makris
Yiorgos Makris The University of Texas at Dallas

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