2013 - IEEE Charles Proteus Steinmetz Award “For contributions to and leadership in the development of guides, recommended practices, and standards for power system protection.”
1983 - IEEE Fellow For contributions to computer applications for power system analysis and protection.
Manoj Sachdev mainly focuses on Electronic engineering, CMOS, Low-power electronics, Voltage and Transistor. His Electronic engineering research is multidisciplinary, relying on both Electrical engineering and Reliability. His work carried out in the field of CMOS brings together such families of science as Digital electronics, Electronic circuit, Integrated circuit design, Comparator and Circuit design.
His study in Low-power electronics is interdisciplinary in nature, drawing from both Energy consumption, Logic synthesis, Efficient energy use and Low voltage. His Voltage research integrates issues from Spice and Chip. His research integrates issues of Iddq testing, Semiconductor device modeling and Leakage in his study of Transistor.
His primary areas of investigation include Electronic engineering, CMOS, Electrical engineering, Voltage and Transistor. His Electronic engineering research includes elements of Electronic circuit and Low-power electronics. His CMOS research incorporates themes from Low voltage, Integrated circuit design, Chip, Leakage and Integrated circuit.
His research investigates the connection with Transistor and areas like Optoelectronics which intersect with concerns in Thin-film transistor. His research in Logic gate tackles topics such as Pass transistor logic which are related to areas like Logic optimization. He interconnects Soft error, Sense amplifier and Sram cell in the investigation of issues within Static random-access memory.
His primary areas of study are Electronic engineering, Transistor, CMOS, Optoelectronics and Electrical engineering. The concepts of his Electronic engineering study are interwoven with issues in Wafer, Magnetoresistive random-access memory and Sense. His work deals with themes such as Computer data storage, Electronic circuit and Flip-flop, which intersect with Transistor.
He combines subjects such as Soft error, NMOS logic, Static random-access memory and Leakage with his study of CMOS. His Static random-access memory study integrates concerns from other disciplines, such as Sense amplifier and Input offset voltage. His Optoelectronics study combines topics in areas such as Pixel and Thin-film transistor.
Manoj Sachdev focuses on Transistor, CMOS, Optoelectronics, Thin-film transistor and Electronic engineering. Manoj Sachdev has included themes like Electronic circuit, Inverter and Static random-access memory in his Transistor study. His studies deal with areas such as Soft error and NMOS logic, Emitter-coupled logic as well as CMOS.
The study incorporates disciplines such as Threshold voltage and Voltage in addition to Optoelectronics. His work in Thin-film transistor addresses subjects such as Capacitor, which are connected to disciplines such as Capacitance, Scaling circuits, Integrated circuit layout, Common noise and Leakage. Manoj Sachdev has researched Electronic engineering in several fields, including Decoupling capacitor, Pass transistor logic, Delay line oscillator and Delay calculation.
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test
Andrei Pavlov;Manoj Sachdev.
(2008)
Comparative delay and energy of single edge-triggered and dual edge-triggered pulsed flip-flops for high-performance microprocessors
James Tschanz;Siva Narendra;Zhanping Chen;Shekhar Borkar.
international symposium on low power electronics and design (2001)
A digitally programmable delay element: design and analysis
M. Maymandi-Nejad;M. Sachdev.
IEEE Transactions on Very Large Scale Integration Systems (2003)
A Soft Error Tolerant 10T SRAM Bit-Cell With Differential Read Capability
S.M. Jahinuzzaman;D.J. Rennie;M. Sachdev.
IEEE Transactions on Nuclear Science (2009)
A monotonic digitally controlled delay element
M. Maymandi-Nejad;M. Sachdev.
IEEE Journal of Solid-state Circuits (2005)
Impact of self-heating effect on long-term reliability and performance degradation in CMOS circuits
O. Semenov;A. Vassighi;M. Sachdev.
IEEE Transactions on Device and Materials Reliability (2006)
Variation-Aware Adaptive Voltage Scaling System
M. Elgebaly;M. Sachdev.
IEEE Transactions on Very Large Scale Integration Systems (2007)
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
M. Sachdev;P. Janssen;V. Zieren.
international test conference (1998)
Thermal and power management of integrated circuits
Arman Vassighi;Manoj Sachdev.
(2006)
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Andrei Pavlov;Manoj Sachdev.
(2008)
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