World's Best Scientists 2026 revealed!
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Electronics and Electrical Engineering
USA
2025

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
97
Citations
31969
World Ranking
220
National Ranking
110

Dennis Sylvester publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Dennis Sylvester sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 671 publications — 93rd percentile

93% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Dennis Sylvester D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Dennis Sylvester sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 97 D-Index — 97th percentile

97% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2025 - Research.com Electronics and Electrical Engineering in United States Leader Award
  • 2011 - IEEE Fellow For contributions to energy-efficient integrated circuits

Overview

Dennis Sylvester is affiliated with the University of Michigan-Ann Arbor in the United States. Their research output spans several subfields within engineering, with a primary focus on electrical and electronic engineering.

The scientist's work engages with a variety of topics, notable among which are:

  • Advanced Memory and Neural Computing
  • Analog and Mixed-Signal Circuit Design
  • CCD and CMOS Imaging Sensors
  • Low-power high-performance VLSI design
  • Advancements in Semiconductor Devices and Circuit Design
  • Neuroscience and Neural Engineering
  • Advancements in PLL and VCO Technologies

Dennis Sylvester has contributed extensively to research published in key venues such as:

  • IEEE Journal of Solid-State Circuits
  • IEEE Solid-State Circuits Letters
  • arXiv (Cornell University)
  • 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
  • 2022 IEEE International Solid-State Circuits Conference (ISSCC)

Selected recent papers from their publications include:

  • A Light-Tolerant Wireless Neural Recording IC for Motor Prediction With Near-Infrared-Based Power and Data Telemetry, 2022, IEEE Journal of Solid-State Circuits
  • RRAM-DNN: An RRAM and Model-Compression Empowered All-Weights-On-Chip DNN Accelerator, 2020, IEEE Journal of Solid-State Circuits
  • A Power-Efficient Brain-Machine Interface System With a Sub-mw Feature Extraction and Decoding ASIC Demonstrated in Nonhuman Primates, 2022, IEEE Transactions on Biomedical Circuits and Systems
  • Reference Oversampling PLL Achieving −256-dB FoM and −78-dBc Reference Spur, 2021, IEEE Journal of Solid-State Circuits
  • An Open-Source and Autonomous Temperature Sensor Generator Verified With 64 Instances in SkyWater 130 nm for Comprehensive Design Space Exploration, 2022, IEEE Solid-State Circuits Letters

Frequent collaborators in their research include:

  • David Blaauw
  • Hun-Seok Kim
  • Qirui Zhang
  • Hyochan An
  • Kyojin Choo

The main field of study for Dennis Sylvester is engineering, supported by a significant volume of publications in electrical and electronic engineering and biomedical engineering. Their research also intersects areas such as artificial intelligence, cellular and molecular neuroscience, and hardware and architecture.

Recognition of their contributions includes being named an IEEE Fellow in 2011 for work related to energy-efficient integrated circuits.

Best Publications

  • Near-Threshold Computing: Reclaiming Moore's Law Through Energy Efficient Integrated Circuits

    R.G. Dreslinski;M. Wieckowski;D. Blaauw;D. Sylvester

  • New paradigm of predictive MOSFET and interconnect modeling for early circuit simulation

    Y. Cao;T. Sato;M. Orshansky;D. Sylvester

  • Theoretical and practical limits of dynamic voltage scaling

    Bo Zhai;David Blaauw;Dennis Sylvester;Krisztian Flautner

  • A Portable 2-Transistor Picowatt Temperature-Compensated Voltage Reference Operating at 0.5 V

    Mingoo Seok;Gyouho Kim;D. Blaauw;D. Sylvester

  • Getting to the bottom of deep submicron

    Dennis Sylvester;Kurt Keutzer

  • Statistical Analysis and Optimization for VLSI: Timing and Power

    Ashish Srivastava;Dennis Sylvester;David Blaauw

  • Neural cache: bit-serial in-cache acceleration of deep neural networks

    Charles Eckert;Xiaowei Wang;Jingcheng Wang;Arun Subramaniyan

  • A 28 nm Configurable Memory (TCAM/BCAM/SRAM) Using Push-Rule 6T Bit Cell Enabling Logic-in-Memory

    Supreet Jeloka;Naveen Bharathwaj Akesh;Dennis Sylvester;David Blaauw

  • A highly resilient routing algorithm for fault-tolerant NoCs

    David Fick;Andrew DeOrio;Gregory Chen;Valeria Bertacco

  • Analysis and mitigation of variability in subthreshold design

    Bo Zhai;Scott Hanson;David Blaauw;Dennis Sylvester

  • Ultralow-voltage, minimum-energy CMOS

    S. Hanson;B. Zhai;K. Bernstein;D. Blaauw

  • A2: Analog Malicious Hardware

    Kaiyuan Yang;Matthew Hicks;Qing Dong;Todd Austin

  • Millimeter-scale nearly perpetual sensor system with stacked battery and solar cells

    Gregory Chen;Matthew Fojtik;Daeyeon Kim;David Fick

  • A cubic-millimeter energy-autonomous wireless intraocular pressure monitor

    G Chen;H Ghaed;R Haque;M Wieckowski

  • Tool for modifying mask design layout

    Andrew B. Kahng;Puneet Gupta;Dennis Sylvester;Jie Yang

  • A Fully-Integrated 71 nW CMOS Temperature Sensor for Low Power Wireless Sensor Nodes

    Seokhyeon Jeong;Zhiyoong Foo;Yoonmyung Lee;Jae-Yoon Sim

  • Toward a methodology for manufacturability-driven design rule exploration

    L. Capodlieci;P. Gulpta;A.B. Kahng;D. Sylvester

  • Vicis: a reliable network for unreliable silicon

    David Fick;Andrew DeOrio;Jin Hu;Valeria Bertacco

  • Statistical analysis of subthreshold leakage current for VLSI circuits

    R. Rao;A. Srivastava;D. Blaauw;D. Sylvester

  • A global wiring paradigm for deep submicron design

    D. Sylvester;K. Keutzer

  • Energy-Efficient Subthreshold Processor Design

    Bo Zhai;S. Pant;L. Nazhandali;S. Hanson

Frequent Co-Authors

David Blaauw
David Blaauw University of Michigan–Ann Arbor
Yoonmyung Lee
Yoonmyung Lee Sungkyunkwan University
Trevor Mudge
Trevor Mudge University of Michigan–Ann Arbor
Mingoo Seok
Mingoo Seok Columbia University
Ronald G. Dreslinski
Ronald G. Dreslinski University of Michigan–Ann Arbor
Chenming Hu
Chenming Hu University of California, Berkeley
Andrew B. Kahng
Andrew B. Kahng University of California, San Diego
Puneet Gupta
Puneet Gupta University of California, Los Angeles
Yu Cao
Yu Cao University of Minnesota
Richard B. Brown
Richard B. Brown University of Utah

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