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Siva G. Narendra

Siva G. Narendra

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
59
Citations
13858
World Ranking
1740
National Ranking
696

Overview

What is he best known for?

The fields of study he is best known for:

  • Electrical engineering
  • Operating system
  • Transistor

His scientific interests lie mostly in Electronic engineering, Electrical engineering, CMOS, Leakage and Voltage. His study in Electronic engineering is interdisciplinary in nature, drawing from both Electronic circuit, Chip, Low-power electronics, Transistor and Biasing. His work on Subthreshold conduction, Buck converter, Ćuk converter and Buck–boost converter as part of general Electrical engineering study is frequently connected to Chemistry, therefore bridging the gap between diverse disciplines of science and establishing a new relationship between them.

He works in the field of CMOS, namely Semiconductor device modeling. His Leakage research incorporates elements of Leakage power, Capacitance probe, Optoelectronics, Gate dielectric and Gate oxide. His Voltage research is multidisciplinary, relying on both Microprocessor and Semiconductor.

His most cited work include:

  • Parameter variations and impact on circuits and microarchitecture (1309 citations)
  • Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage (726 citations)
  • System and method for securing financial transactions (340 citations)

What are the main themes of his work throughout his whole career to date?

Siva G. Narendra mainly investigates Electrical engineering, Electronic engineering, Computer hardware, Mobile device and Card reader. His study in Electrical engineering focuses on Voltage, Transistor, Leakage and Biasing. Siva G. Narendra is involved in the study of Electronic engineering that focuses on CMOS in particular.

Siva G. Narendra works mostly in the field of CMOS, limiting it down to concerns involving Low-power electronics and, occasionally, AC power. The various areas that Siva G. Narendra examines in his Mobile device study include Computer security, Computer network and Encryption. His work in Card reader addresses issues such as Smart card, which are connected to fields such as Controller.

He most often published in these fields:

  • Electrical engineering (38.00%)
  • Electronic engineering (27.20%)
  • Computer hardware (18.80%)

What were the highlights of his more recent work (between 2013-2021)?

  • Computer hardware (18.80%)
  • Mobile device (16.40%)
  • Computer security (9.60%)

In recent papers he was focusing on the following fields of study:

Siva G. Narendra mainly focuses on Computer hardware, Mobile device, Computer security, Electrical engineering and Card reader. Siva G. Narendra combines subjects such as EMI, Electromagnetic interference, Transaction account, Optoelectronics and Encryption with his study of Mobile device. Siva G. Narendra works mostly in the field of Computer security, limiting it down to topics relating to Digital identity and, in certain cases, Fingerprint, World Wide Web and Access control, as a part of the same area of interest.

In his articles, Siva G. Narendra combines various disciplines, including Electrical engineering and Conductor. His work carried out in the field of Card reader brings together such families of science as Controller, Subscriber identity module, Smart card and Host. His research integrates issues of Electronic engineering and Lightning in his study of Printed circuit board.

Between 2013 and 2021, his most popular works were:

  • Visible Emission Line Coronagraph on Aditya-L1 (23 citations)
  • Mobile remote deposit capture (3 citations)
  • Token based multifactor authentication (2 citations)

In his most recent research, the most cited papers focused on:

  • Electrical engineering
  • Operating system
  • Transistor

The scientist’s investigation covers issues in Computer security, Computer hardware, Mobile device, Authentication and Encryption. In his study, World Wide Web, Cloud computing, Fingerprint and Access control is strongly linked to Digital identity, which falls under the umbrella field of Computer security. His Computer hardware study combines topics from a wide range of disciplines, such as Controller and Integrated circuit.

His work investigates the relationship between Mobile device and topics such as Generator that intersect with problems in Communication source. His Authentication study integrates concerns from other disciplines, such as Cryptocurrency, Radio Link Protocol, Blockchain, The Internet and Hardware security module. His research integrates issues of Cryptography and Digital signature in his study of Encryption.

Best Publications

  • Parameter variations and impact on circuits and microarchitecture

    Shekhar Borkar;Tanay Karnik;Siva Narendra;Jim Tschanz

  • Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage

    J.W. Tschanz;J.T. Kao;S.G. Narendra;R. Nair

  • MOBILE PHONE WITH MAGNETIC CARD EMULATION

    Narendra Siva G;Spitzer Thomas N;Tadepalli Prabhakar

  • System and method for securing financial transactions

    Thomas N. Spitzer;Prabhakar Tadepalli;Siva G. Narendra

  • Scaling of stack effect and its application for leakage reduction

    S. Narendra;S. Borkar;V. De;D. Antoniadis

  • Dynamic-sleep transistor and body bias for active leakage power control of microprocessors

    J.W. Tschanz;S.G. Narendra;Y. Ye;B.A. Bloechel

  • A 233-MHz 80%-87% efficient four-phase DC-DC converter utilizing air-core inductors on package

    P. Hazucha;G. Schrom;Jaehong Hahn;B.A. Bloechel

  • Subthreshold leakage modeling and reduction techniques

    James Kao;Siva Narendra;Anantha Chandrakasan

  • Comparative delay and energy of single edge-triggered and dual edge-triggered pulsed flip-flops for high-performance microprocessors

    James Tschanz;Siva Narendra;Zhanping Chen;Shekhar Borkar

  • Leakage in Nanometer CMOS Technologies

    Siva G. Narendra;Anantha P. Chandrakasan

  • MTCMOS hierarchical sizing based on mutual exclusive discharge patterns

    James Kao;Siva Narendra;Anantha Chandrakasan

  • Adaptive Frequency and Biasing Techniques for Tolerance to Dynamic Temperature-Voltage Variations and Aging

    J. Tschanz;Nam Sung Kim;S. Dighe;J. Howard

  • Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs

    A. Keshavarzi;S. Ma;S. Narendra;B. Bloechel

  • Multiple well transistor circuits having forward body bias

    Vivek K. De;Ali Keshavarzi;Siva G. Narendra;Shekhar Y. Borkar

  • Measurements and analysis of SER-tolerant latch in a 90-nm dual-V/sub T/ CMOS process

    P. Hazucha;T. Karnik;S. Walstra;B.A. Bloechel

  • Effectiveness of adaptive supply voltage and body bias for reducing impact of parameter variations in low power and high performance microprocessors

    J.W. Tschanz;S. Narendra;R. Nair;V. De

  • Full-chip subthreshold leakage power prediction and reduction techniques for sub-0.18-/spl mu/m CMOS

    S. Narendra;V. De;S. Borkar;D.A. Antoniadis

  • Forward body bias for microprocessors in 130-nm technology generation and beyond

    S. Narendra;A. Keshavarzi;B.A. Bloechel;S. Borkar

  • Low-voltage-swing monolithic dc-dc conversion

    V. Kursun;S.G. Narendra;V.K. De;E.G. Friedman

  • A 480-MHz, multi-phase interleaved buck DC-DC converter with hysteretic control

    G. Schrom;P. Hazucha;J. Hahn;D.S. Gardner

  • Die-to-Die and Within-Die Parameter Variations on Microprocessor Frequency and Leakage

    James Tschanz;James Kao;Siva Narendra;Raj Nair

Frequent Co-Authors

Vivek De
Vivek De Intel (United States)
James W. Tschanz
James W. Tschanz Intel (United States)
Ali Keshavarzi
Ali Keshavarzi Stanford University
Shekhar Borkar
Shekhar Borkar Qualcomm (United States)
Tanay Karnik
Tanay Karnik Intel (United States)
Volkan Kursun
Volkan Kursun Bilkent University
Donald S. Gardner
Donald S. Gardner Intel (United States)
Eby G. Friedman
Eby G. Friedman University of Rochester
Dinesh Somasekhar
Dinesh Somasekhar Intel (United States)

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