What is he best known for?
The fields of study he is best known for:
- Central processing unit
- Electrical engineering
- Algorithm
Cheng-Wen Wu spends much of his time researching Embedded system, Computer hardware, Built-in self-test, Algorithm and Redundancy.
His Embedded system research includes themes of Overhead, Throughput, Fault, CMOS and Testability.
The study incorporates disciplines such as Field-programmable gate array and Logic synthesis in addition to Fault.
His Built-in self-test research is multidisciplinary, incorporating elements of Burn-in, Control theory, System on a chip and Static random-access memory.
His studies in Algorithm integrate themes in fields like Automatic testing, Memory array and Logic testing.
His Redundancy study combines topics in areas such as Spare part, Error detection and correction, Semiconductor memory and Read-write memory.
His most cited work include:
- VLSI Test Principles and Architectures: Design for Testability (304 citations)
- Built-in redundancy analysis for memory yield improvement (165 citations)
- On-Chip TSV Testing for 3D IC before Bonding Using Sense Amplification (134 citations)
What are the main themes of his work throughout his whole career to date?
Cheng-Wen Wu focuses on Embedded system, Built-in self-test, Electronic engineering, Computer hardware and Parallel computing.
His Embedded system research incorporates themes from Design for testing, Fault, Chip and Static random-access memory.
Cheng-Wen Wu interconnects Overhead, Read-write memory, Very-large-scale integration, Redundancy and Scheme in the investigation of issues within Built-in self-test.
Cheng-Wen Wu has researched Redundancy in several fields, including Dram, Spare part and Semiconductor memory.
His research investigates the link between Electronic engineering and topics such as Three-dimensional integrated circuit that cross with problems in Interconnection.
His research in Parallel computing focuses on subjects like Algorithm, which are connected to Arithmetic.
He most often published in these fields:
- Embedded system (28.49%)
- Built-in self-test (20.00%)
- Electronic engineering (18.08%)
What were the highlights of his more recent work (between 2011-2020)?
- Electronic engineering (18.08%)
- Embedded system (28.49%)
- Three-dimensional integrated circuit (4.93%)
In recent papers he was focusing on the following fields of study:
Cheng-Wen Wu mainly investigates Electronic engineering, Embedded system, Three-dimensional integrated circuit, Dram and Reliability engineering.
The Electronic engineering study combines topics in areas such as Fault, Electronic circuit and Chip.
His Chip research includes elements of Integrated circuit layout, Computer hardware and Boundary scan.
His study looks at the intersection of Embedded system and topics like Spare part with Fuse.
His study in Three-dimensional integrated circuit is interdisciplinary in nature, drawing from both NAND gate, Through-silicon via, Design for testing and Interconnection.
His Redundancy study incorporates themes from System on a chip and Parallel computing.
Between 2011 and 2020, his most popular works were:
- RRAM Defect Modeling and Failure Analysis Based on March Test and a Novel Squeeze-Search Scheme (90 citations)
- 3D-IC interconnect test, diagnosis, and repair (31 citations)
- In-Situ Method for TSV Delay Testing and Characterization Using Input Sensitivity Analysis (25 citations)
In his most recent research, the most cited papers focused on:
- Central processing unit
- Electrical engineering
- Integrated circuit
Redundancy, Three-dimensional integrated circuit, Embedded system, Reliability engineering and Built-in self-test are his primary areas of study.
Cheng-Wen Wu has included themes like Parallel computing, Through-silicon via, Maintenance engineering, System on a chip and Error detection and correction in his Redundancy study.
His Three-dimensional integrated circuit research integrates issues from Design for testing, Physical design and Electronic engineering.
His Electronic engineering research is multidisciplinary, incorporating perspectives in Electronic circuit, Random access memory and Shmoo plot.
His Embedded system research is multidisciplinary, relying on both Dram and Spare part.
While working on this project, Cheng-Wen Wu studies both Built-in self-test and Stacking.
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