World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
48
Citations
8735
World Ranking
3089
National Ranking
41

Computer Science

D-Index
54
Citations
11310
World Ranking
4587
National Ranking
32

Sy-Yen Kuo publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Sy-Yen Kuo sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 447 publications — 80th percentile

80% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Sy-Yen Kuo D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Sy-Yen Kuo sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 48 D-Index — 56th percentile

56% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2001 - IEEE Fellow For contributions to dependable computing and software reliability engineering.

Overview

Sy-Yen Kuo is affiliated with National Taiwan University in Taiwan. Their research primarily focuses on computer science and engineering, with extensive publications in related subfields.

The main fields of study covered by their work include:

  • Computer Science
  • Engineering

Their work explores several subfields such as:

  • Computer Vision and Pattern Recognition
  • Artificial Intelligence
  • Electrical and Electronic Engineering
  • Media Technology
  • Hardware and Architecture

Key topics in their research include:

  • Image Enhancement Techniques
  • Video Surveillance and Tracking Methods
  • Advanced Image Fusion Techniques
  • Advanced Image Processing Techniques
  • Advanced Neural Network Applications
  • Advanced Vision and Imaging
  • Quantum Computing Algorithms and Architecture

The scientist has published extensively, with papers appearing in venues such as:

  • arXiv (Cornell University)
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • IEEE Nanotechnology Magazine
  • 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
  • IEEE Access

Notable recent papers include:

  • ALL Snow Removed: Single Image Desnowing Algorithm Using Hierarchical Dual-tree Complex Wavelet Representation and Contradict Channel Loss, 2021, 2021 IEEE/CVF International Conference on Computer Vision (ICCV)
  • Learning Multiple Adverse Weather Removal via Two-stage Knowledge Learning and Multi-contrastive Regularization: Toward a Unified Model, 2022, 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
  • NTIRE 2022 Spectral Recovery Challenge and Data Set, 2022, 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
  • PMHLD: Patch Map-Based Hybrid Learning DehazeNet for Single Image Haze Removal, 2020, IEEE Transactions on Image Processing
  • DesnowGAN: An Efficient Single Image Snow Removal Framework Using Cross-Resolution Lateral Connection and GANs, 2020, IEEE Transactions on Circuits and Systems for Video Technology

Frequent co-authors in their research include:

  • Wei-Ting Chen
  • Jian-Jiun Ding
  • Hao-Hsiang Yang
  • Fabrizio Lombardi
  • David Lomet

Sy-Yen Kuo has been recognized as an IEEE Fellow since 2001 for contributions to dependable computing and software reliability engineering.

Best Publications

  • Securing web application code by static analysis and runtime protection

    Yao-Wen Huang;Fang Yu;Christian Hang;Chung-Hung Tsai

  • Efficient Spare Allocation for Reconfigurable Arrays

    Sy-Yen Kuo;W. Kent Fuchs

  • A unified scheme of some Nonhomogenous Poisson process models for software reliability estimation

    Chin-Yu Huang;M.R. Lyu;Sy-Yen Kuo

  • An Assessment of Testing-Effort Dependent Software Reliability Growth Models

    Chin-Yu Huang;Sy-yen Kuo;M.R. Lyu

  • Analysis of incorporating logistic testing-effort function into software reliability modeling

    Chin-Yu Huang;Sy-Yen Kuo

  • Determining terminal-pair reliability based on edge expansion diagrams using OBDD

    Sy-Yen Kuo;Shyue-Kung Lu;Fu-Min Yeh

  • Resource Allocation with Interference Avoidance in OFDMA Femtocell Networks

    Yu-Shan Liang;Wei-Ho Chung;Guo-Kai Ni;Ing-Yi Chen

  • Dithering Skip Modulation, Width and Dead Time Controllers in Highly Efficient DC-DC Converters for System-On-Chip Applications

    Hong-Wei Huang;Ke-Horng Chen;Sy-Yen Kuo

  • ALL Snow Removed: Single Image Desnowing Algorithm Using Hierarchical Dual-Tree Complex Wavelet Representation and Contradict Channel Loss

    Wei-Ting Chen;Hao-Yu Fang;Cheng-Lin Hsieh;Cheng-Che Tsai

  • Framework for modeling software reliability, using various testing-efforts and fault-detection rates

    Sy-Yen Kuo;Chin-Yu Huang;M.R. Lyu

  • System and method for securing web application code and verifying correctness of software

    Yao-Wen Huang;Fang Yu;Chung-hung Tsai;Christian Hang

  • Fault Tolerance Techniques for Systolic Arrays

    Abraham;Banerjee;Chien-Yi Chen;Fuchs

  • OBDD-based evaluation of k-terminal network reliability

    Fu-Min Yeh;Shyue-Kung Lu;Sy-Yen Kuo

  • JSTASR: Joint Size and Transparency-Aware Snow Removal Algorithm Based on Modified Partial Convolution and Veiling Effect Removal

    Wei-Ting Chen;Hao-Yu Fang;Jian-Jiun Ding;Cheng-Che Tsai

  • Efficient and Exact Reliability Evaluation for Networks With Imperfect Vertices

    Sy-yen Kuo;Fu-Min Yeh;Hung-Yau Lin

  • An XQDD-Based Verification Method for Quantum Circuits

    Shiou-An Wang;Chin-Yung Lu;I-Ming Tsai;Sy-Yen Kuo;Sy-Yen Kuo

  • A testing framework for Web application security assessment

    Yao-Wen Huang;Chung-Hung Tsai;Tsung-Po Lin;Shih-Kun Huang

  • Efficient Spare Allocation in Reconfigurable Arrays

    Sy-Yen Kuo;W. Kent Fuchs

  • Compressed Sensing Detector Design for Space Shift Keying in MIMO Systems

    Chia-Mu Yu;Sung-Hsien Hsieh;Han-Wen Liang;Chun-Shien Lu

  • Gatekeeper: Monitoring Auto-Start Extensibility Points (ASEPs) for Spyware Management

    Yi-Min Wang;Roussi Roussev;Chad Verbowski;Aaron Johnson

Frequent Co-Authors

Shih-Chia Huang
Shih-Chia Huang National Taipei University of Technology
Chun-Shien Lu
Chun-Shien Lu Academia Sinica
Yennun Huang
Yennun Huang Research Center for Information Technology Innovation, Academia Sinica
Hongke Zhang
Hongke Zhang Beijing Jiaotong University
Michael R. Lyu
Michael R. Lyu Chinese University of Hong Kong
David S. L. Wei
David S. L. Wei Fordham University
Ke-Horng Chen
Ke-Horng Chen National Yang Ming Chiao Tung University
Han-Chieh Chao
Han-Chieh Chao Fo Guang University
Der-Tsai Lee
Der-Tsai Lee Academia Sinica
Yao-Wen Chang
Yao-Wen Chang National Taiwan University

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Related Online Degrees & Career Pathways

Pursuing a degree in Electronics and Electrical Engineering opens up a variety of career opportunities, especially when paired with flexible online education options. Many students benefit from online universities with multiple start dates, allowing them to begin their studies without waiting for traditional semester cycles.

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